STGP12NB60HD;中文规格书,Datasheet资料
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October 2003STGP12NB60HD
N-CHANNEL 18A -600V TO-220
PowerMESH?IGBT
s HIGH INPUT IMPEDANCE
s LOW ON-VOLTAGE DROP (V cesat )
s OFF LOSSES INCLUDE TAIL CURRENT s LOW GATE CHARGE
s HIGH CURRENT CAPABILITY
s VERY HIGH FREQUENCY OPERATION s
CO-PACKAGED WITH TURBOSWITCHT ANTIPARALLEL DIODE
DESCRIPTION
Using the latest high voltage technology based on a patented strip layout,STMicroelectronics has de-signed an advanced family of
IGBTs,the Power-MESH?IGBTs,with outstanding perfomances.The suffix "H"identifies a family optimized for high frequency applications (up to 50kHz)in order to achieve very high switching performances (reduced tfall)mantaining a low
voltage drop.
APPLICATIONS
s HIGH FREQUENCY MOTOR CONTROLS
s SMPS and PFC IN BOTH HARD SWITCH AND RESONANT TOPOLOGIES s UPS
ORDERING INFORMATION
TYPE V CES V CE(sat)
(Max)@25°C
I C
@100°C
STGP12NB60HD
600V
<2.8 V 18A
SALES TYPE MARKING PACKAGE PACKAGING
STGP12NB60HD
GP12NB60HD
TO-220
TUBE
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ABSOLUTE MAXIMUM RATINGS
( )Pulse width limited by safe operating area
THERMAL DATA
ELECTRICAL CHARACTERISTICS (T CASE =25°C UNLESS OTHERWISE SPECIFIED)OFF
ON (1)
DYNAMIC
Symbol Parameter
Value Unit V CES Collector-Emitter Voltage (V GS =0)600V V ECR Emitter-Collector Voltage 20V V GE Gate-Emitter Voltage
±20V I C Collector Current (continuous)at T C =25°C (#)30A I C Collector Current (continuous)at T C =100°C (#)18A I CM ( )Collector Current (pulsed)60A P TOT Total Dissipation at T C =25°C 125W Derating Factor 1.0W/°C T stg Storage Temperature
–65to 150
°C T j
Max.Operating Junction Temperature
150
°C
Rthj-case Thermal Resistance Junction-case Max 1.0°C/W Rthj-amb
Thermal Resistance Junction-ambient Max
62.5
°C/W
Symbol Parameter
Test Conditions
Min.Typ.
Max.
Unit V BR(CES)Collector-Emitter Breakdown Voltage I C =250μA,V GE =0
600V I CES Collector cut-off (V GE =0)
V CE =Max Rating,T C =25°C 50μA V CE =Max Rating,T C =125°C
100
μA I GES
Gate-Emitter Leakage Current (V CE =0)
V GE =±20V ,V CE =0
±100
nA
Symbol Parameter
Test Conditions
Min.Typ.Max.Unit V GE(th)Gate Threshold Voltage
V CE =V GE ,I C =250μA 3
5V V CE(sat)
Collector-Emitter Saturation Voltage
V GE =15V,I C =12A
2.0 2.8
V V GE =15V,I C =12A,Tj =125°C
1.7
V
Symbol Parameter Test Conditions
Min.Typ.Max.Unit g fs
Forward Transconductance V CE =15V ,I C =12A
10S C ies
Input Capacitance V CE =25V,f =1MHz,V GE =0
920pF C oes Output Capacitance 120pF C res Reverse Transfer Capacitance
27
pF Q g Q ge Q gc Total Gate Charge Gate-Emitter Charge Gate-Collector Charge V CE =480V,I C =12A,V GE =15V
681030
nC
nC nC I CL
Latching Current
V clamp =480V , Tj =150°C R G =10?
48
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STGP12NB60HD
ELECTRICAL CHARACTERISTICS (CONTINUED)SWITCHING ON
SWITCHING OFF
COLLECTOR-EMITTER DIODE
Note: 1.Pulsed:Pulse duration =300μs,duty cycle 1.5%.
2.Pulse width limited by max.junction temperature.(**)Losses include Also the Tail (Jedec Standardization)
(#)Calculated according to the iterative formula:
Symbol Parameter
Test Conditions
Min.
Typ.Max.
Unit t d(on)t r Turn-on Delay Time Rise Time
V CC =480V,I C =12A R G =10?,V GE =15V 546ns ns (di/dt)on Eon
Turn-on Current Slope Turn-on Switching Losses
V CC =480V,I C =12A R G =10?,V GE =15V,Tj =125°C
700290
A/μs μJ
Symbol Parameter
Test Conditions
Min.
Typ.Max.
Unit t c Cross-over Time V cc =480V,I C =12A,R GE =10?,V GE =15V
150ns t r (V off )Off Voltage Rise Time 27ns t d (off )Delay Time 91ns t f Fall Time
100ns
E off (**)Turn-off Switching Loss 0.21m J E ts Total Switching Loss 0.49m J
t c Cross-over Time V cc =480V,I C =12A,R GE =10?,V GE =15V Tj =125°C
230ns t r (V off )Off Voltage Rise Time 76ns t d (off )Delay Time 95
ns t f Fall Time
200
ns
E off (**)Turn-off Switching Loss 0.45m J E ts
Total Switching Loss
0.74
m J
Symbol
Parameter
Test Conditions
Min.
Typ.Max.Unit I f I fm Forward Current
Forward Current pulsed 12
48
A A V f Forward On-Voltage
I f =6A
I f =6A,Tj =125°C
1.31.1 1.9
V V t rr Q rr I rrm
Reverse Recovery Time Reverse Recovery Charge Reverse Recovery Current
I f =6A ,V R =50V,
Tj =125°C,di/dt =100A/μs
802405.5
ns nC A
I C T C ()T JMAX T C
–R THJ C –V CESAT MAX ()T C I C ,()
×--------------------------------------------------------------------------------------=
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Normalized Breakdown Voltage vs Temperature
Total Switching Losses vs Temperature
Gate Charge vs Gate-Emitter Voltage Total Switching Losses vs Collector Current
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STGP12NB60HD
Fig.2:Test Circuit For Inductive Load Switching
Fig.1:Gate Charge test Circuit
STGP12NB60HD
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STGP12NB60HD
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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STGP12NB60HD