Derating test report

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QE检验标准

QE检验标准

QE验标准
1.0目的
产品工程规格遵循标准,提供给工程测试判定使用。

且在预期作业条件下评估其产品性能,包含其产品特性、兼容性、安全性、可靠性…等,以及在应用上之适合性。

2.0 范围
公司自行开发LCD Monitor 成品/半成品或外购相关产品,有关特性、兼容性、安全性、可靠性…等测试均属之。

3.0 内容
测试标准内容,包含测试项目名称(Item)、测试条件(Test Condition)、判定标准(Criteria),等三项标准。

在任何一项测试作业时,需依据下列条件执行及判定;若客户有其它测试条件要求或标准判定变更时,则依客户要求条件下作业。

3.2 测试项目区分为六类,由A ~ F
3.2.1 A类:General 一般测试项目
3.2.2 B类:Performance 功能特性测试
3.2.3 C类:Environmental 环境测试
3.2.4 D类:Reliability 信赖性测试
3.2.5 E类:安全性测试
3.2.6 F类:幅射防护安全测试
4.0 相关资料

5.0 参考数据
5.1 机种Internal Specification
5.2 机种External Specification。

电源板测试报告

电源板测试报告

VDss VGss Is (V)(V)(A)U4AP4511GH 2203520NA U6AP4511GH 2203520NALdRC Tc (hrs)(mA)(oC )Waste Warning元点位料号规格型号供应商电源供电(V)Waste Warning点位料号规格型号供应商电源供电(V)元4.测试方法:参照相关的作业指导书,即Derating Test SOP5.判定标准:具体参见各零件之工程规格2.测试条件:2.1环境温度:室温(25℃), 温度测试前, 必须烧机4小时;2.2供电电压:90V/60Hz and 264V/50Hz(测试power 点位90V/264V 均需测试,其它回路只需选择一种电压2.3测试负载:测试机器最大&最小功耗测试3.测试仪器:示波器、AC 变频器、温度计、电流计、信号发生器、导热胶、冷凝剂等通过此项测试,根据Derating 测试判定标准评估各零件之设计欲度,作为后续提出改善之依据。

台数:1#1.测试目的:客户:七星华创 Inverter Board 阶段:DVT专显型号:BSF1#1742-69A Derating北京京东方专用显示科技有限公司BeiJing BOE Special Display Technology Co.,Ltd类型:电解电容C1470uf/25V SAMXON 22030001210105Vstart-rms Vstart-surge Istart-rms Istart-surge (V)(V)(mA)(mA)Component Spec Ta=40℃Ta=25℃Result <70℃T12208555.6844.0965.5T22208556.145.166新送样Inverter Board(将C1点位电容由470uf/25V改为1000uf/2LdRC Tc (hrs)(mA)(o C)C11000uf/25V SAMXON 2203000821105Waste Warning2009-3-17元点位料号规格型号供应商电源供电(V)T(℃)T ℃Requiremen t 100(%)Location PartNumber&TypeSupplier Waste WarningPower supply(V)Measure data Location Part Number&TypeSupplier Power supply(V)BIT3715Compo 4220884Waste WarningU1PWM ICInductor0uf/25V)(%)e(%)。

西门子SIRIUS温度监控继电器3RS1040-1GW50说明书

西门子SIRIUS温度监控继电器3RS1040-1GW50说明书
装入/固定/外廓尺寸
3RS10401GW50 1/3
SIRIUS 温度监控继电器 2 个阈值,数字可调 3RS10
4W 7 V·A K
-50 °C 500 °C 01.05.2012
是的 是的 PT100/1000; KTY83/84;NTC(电阻触头) 200 °C 0.3 mA
AC/DC
24 ... 240 V 24 ... 240 V
产品品牌名称 产品名称 产品的规格 产品类型名称 综合技术数据 损耗功率 [W] 最大值 损耗功率 [V∙A] 最大值 参考标示 符合 IEC 81346-2:2009 可测温度
● 初始值 ● 终值 RoHS 指令(日期) 产品功能 ● 故障储存 ● 外部的复位 传感器规格 可连接 可测温度 利用 KTY 传感器 最大值 传感器电流 利用 KTY 传感器 控制电路/控制 电压类型 控制馈电电压 1 AC 时 ● 50 Hz 时 ● 60 Hz 时 控制馈电电压 1 ● DC 时 供电电压频率 用于辅助和控制电路 测量回路的数目 辅助电路 常闭触点数量 用于辅助触点 常开触点数量 用于辅助触点 转换器数量 用于辅助触点 接口/ 接线端子 电气连接规格 用于辅助和控制电路 电气连接规格 插座
图片数据库 (产品照片, 2D比例图, 3D模型, 设备电路图, EPLAN Makros, …) /bilddb/cax_de.aspx?mlfb=3RS1040-1GW50&lang=en
特性曲线: Derating https:///cs/ww/en/ps/3RS1040-1GW50/manual
数据页
3RS1040-1GW50
温度监控继电器 PT100/1000,KTY83/84,NTC 2 个阈值 数字,可调节 50 °C 至 500 °C 24 - 240 V AC/DC 2 x 1 W + 1 NO,宽度 45 mm 螺栓型 端子 !!!停产产品!!! 首选的后继者为 3RS2600-1BW30

产品稳定性测试报告英文

产品稳定性测试报告英文

产品稳定性测试报告英文IntroductionThis report presents the findings of the stability testing conducted on [Product Name]. The purpose of this testing is to ensure that the product functions reliably under normal operating conditions and does not encounter any performance or stability issues. The testing was conducted over a period of [duration of testing], and data was collected and analyzed to evaluate the product's stability.Test EnvironmentThe stability testing was performed in a controlled environment that closely mimics the typical operating conditions. The test environment included the following components: - Hardware: [specify the hardware used]- Operating Systems: [specify the operating systems used]- Networks: [specify the network configuration]- Software versions: [specify the versions of all software used] Test ObjectivesThe stability testing aimed to achieve the following objectives:1. Identify any performance degradation or stability issues in the product under normal operating conditions.2. Assess the product's ability to handle increased loads and stress conditions.3. Evaluate the product's recovery capabilities after encountering exceptions or failures.4. Monitor system resource usage and ensure optimal utilization.Test MethodologyThe stability testing was conducted using a combination of manual testing and automated tools. The following tests were performed:1. Load Testing: The product was tested under different load conditions to evaluate its performance and stability. Various scenarios were created to simulate real-world usage patterns.2. Stress Testing: The product was subjected to extreme loads and stress conditions to determine its tolerance levels. This testassessed the product's stability and performance underhigh-pressure situations.3. Recovery Testing: The product's recovery capabilities were assessed by intentionally introducing failures or exceptions and observing the system's ability to recover without any data loss or instability.4. Longevity Testing: The product was continuously tested for an extended period to assess its stability over time and ensure that there are no gradual performance degradation or stability issues. Test ResultsBased on the stability testing, the following results were observed:1. Performance: The product demonstrated excellent performance under normal operating conditions. It responded promptly to user actions and completed tasks efficiently.2. Stability: The product exhibited high stability throughout the testing period. No crashes or unexpected downtime were observed.3. Load tolerance: The product efficiently handled increased loads without any performance degradation or stability issues. It continued to provide a smooth user experience even under high load conditions.4. Recovery capabilities: The product successfully recovered from failures or exceptions encountered during the testing. No data loss or instability was reported.5. Longevity: The product remained stable and performed consistently over an extended period of testing. No gradual performance degradation or stability issues were observed. RecommendationsBased on the results of the stability testing, the following recommendations are made:1. Further load testing: Conduct additional load testing with even higher loads to ensure the product's performance and stability under extreme conditions.2. Security testing: Conduct security testing to identify any vulnerabilities or potential security risks that could affect thestability of the product.3. Compatibility testing: Perform compatibility testing with a wider range of hardware and software configurations to ensure the product's stability across different environments.ConclusionThe stability testing conducted on [Product Name] demonstrated that the product is stable, performs well under normal and high-load conditions, and has robust recovery capabilities. The observed results indicate that the product is reliable and stable for deployment in real-world scenarios. The recommendations provided will further enhance the stability and reliability of the product.。

Edge Card MEC1 -EM 设计质量测试报告说明书

Edge Card MEC1 -EM 设计质量测试报告说明书
CCCБайду номын сангаас
(TIN PLATING) - Tabulate calculated current at RT, 65°C, 75°C and 95°C after derating 20% and based on 105°C
(GOLD PLATING) - Tabulate calculated current at RT, 85°C, 95°C and 115°C after derating 20% and based on 125°C
Part #: ASP-149559-01 (MEC1-EM)
\ Edge card
Part description: ASP/MEC1-EM
ATTRIBUTE DEFINITIONS The following is a brief, simplified description of attributes.
8) Typically, neighboring contacts (in close proximity to maximize heat build up) are energized. 9) The thermocouple (or temperature measuring probe) will be positioned at a location to sense the maximum
Page 1 of 12
Tracking Code: 183059_Report_Rev_1
Part #: ASP-149559-01 (MEC1-EM)
\ Edge card
Part description: ASP/MEC1-EM
CERTIFICATION

SPS环境测试作业规范(B-TEST)

SPS环境测试作业规范(B-TEST)
STANDARD PROCEDURE
AW4-050101
文件名稱 制訂單位
(1).新
產品第一次(量2)產.新
產品第一次(量3)產.新
產品第一次(量4)產.新
產品第一次(量5)產.在
上述5000台產品不經
良當時之燒機條不
良品發生1時.7,.方記可錄:
由老化人員每品小保
巡檢人員1每.8兩.標小示
作業:對於1產.9.品不未良
6.測試時間: 所有測試項目
必須依照測試計
7.測試條件: 7.1 依據各機
種規格書此中類規機定種
通用規格進行測 7.2 負載設定:
7.2.1. 對


無特殊規7定.2.,2均. 以
Virbation 7測.2.試3. 根Fa據n
測試的負載以規
Yeou Diann Electric Industrial Factory (Zhongshan Sanxiang)
10. 新產品可量 性(DV1T0).驗1. 証輸實入驗 (IN-PUT)
10.1.1樣品 送樣之
樣品須確認並為由同試 作單位負責工提程供制 樣的樣品不可作
STANDARD PROCEDURE
SPS環境測試作業規範(B-TEST) 品保部
文件編號 版次 總共頁次
QA3-20120605 R0.0
3 OF 30
3.高溫動態測 試 Hig3h.1. Test Equipme3n.1t .:1. rature/Hu3m.1.i2d.ity Electron3ic.1L.3o.aAd C Source
SPS環境測試作業規範(B-TEST) 品保部
文件編號 版次 總共頁次
QA3-20120605 R0.0

元件降额测试工作指引

元件降额测试工作指引

元件降额测试工作指引版次Revision更改详情Change description生效日期Effective Date1 初次发放本 / First Release25-Jul-20002 重新编写﹐加入英语解释 / Revised, add English translation17-Sep-20013 增加瞬态条件﹐以及使用率一览表 / Add transient condition, andderating table.17-Jan-20024 修正错误﹐增加场效应管﹐二极管﹐及稳压管测试方法。

/Correctmistake, add test method to FET, rectifier and zener.11-Jun-20025 修正错误﹐增加集成电路及光偶使用率范围﹐增加静态过载观察项目。

/ Correct mistake, add IC and opto-coupler derating limit, addobservation item in static overload test.16-Aug-20026 改变二极管的电压使用率﹐对塑料电容及磁性元件使用率加备注。

/Change voltage derating for rectifier. Add remark for derating of P-capand magnetics.07-Mar-20037 增加正激式变压器﹐镇流器﹐铁粉芯镇流器之使用率测试。

/ Add derating for forward transformer, choke, iron power choke.DE PD ST DV PMC TE Prepared on 24 November 2020如果受控印章不是蓝色,表示此文件不受控,请参考受控文件。

If the control stamp is not in blue, it means this document is not under control, please refer to controlled document.H:\Dv_dat\Wi&qsp\Wi\1. 目的/Objective元件使用率的测试是检查元件在不同的测试条件下﹐实际使用电压﹑电流和功率跟其额定值的比值﹐这是确保产品没有由于元件超出使用范围而引起损坏。

SSM3J328R_P-CH 超低电压驱动超低内阻

SSM3J328R_P-CH 超低电压驱动超低内阻

2.4±0.1
1.8±0.1
Absolute Maximum Ratings (Ta = 25°C)
Characteristic
Symbol
Rating
Unit
1 0.95
2 0.95
0.8 -+00..0058
Drain-source voltage Gate-source voltage
VDSS
-20


V
(Note 5) -15


V
Drain cut-off current
IDSS VDS = -20 V, VGS = 0 V


-1
μA
Gate leakage current
IGSS VGS = ±8 V, VDS = 0 V


±1
μA
Gate threshold voltage
Vth
Qg Qgs1 Qgd
VDD = -10 V, IDS = -4.0 A, VGS = -4.5 V
⎯ 12.8 ⎯

1.4

nC

3.0

Switching time
Turn-on time Turn-off time
ton
VDD = -10 V, ID = -2.0 A
toff
VGS = 0 to -2.5 V, RG = 4.7 Ω
JEITA TOSHIBA
― 2-3Z1A
absolute maximum ratings. Please design the appropriate reliability upon reviewing the
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