现代电化学研究方法
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第二篇
Techniques Used for The Study of Structure and Dynamics of
Elecrode/Solution Interface
In Situ methods:
1. Transmission Through Optically Transparent Electrodes;
2. Ultraviolet-Visible Reflectance Spectroscopy; Ellipsometry as a spectroscopic tool;
3. Infrared Vibrational Reflectance Spectroscopy;
4. Raman Vibrational Spectroscopy;
5. Photoelectrochemistry or Photocurrent Spectroscopy; Acoustoelectrochemical methods (Photoacoustic Spectroscopy;
6.
Ultrasonic Vibration Potentials);
7. Electron Spin Resonance (ESR);
8. Mössbauer Spectroscopy;
9. Scanning Probe Microscope (SPM) e.g. Scanning Tunneling Spectroscope (STM), Atomic Force Microscope (AFM);
10. EXAFS, X-ray diffraction (X-ray Spectroscopy);
11. Nonlinear Optical Techniques (SHG, SFG, SEHRS);
12. Neutron Diffraction
13. EQCM;
Promising in situ Methods:
14. X-ray Induced X-ray Fluorescence;
15. FT-NMR (high resolution);
16. Positron Annihilation
17. Scanning Near-field Optical Microscope (SNOM), Photon Scanning Tunneling Microscope (PSTM); 18. Near-field Spectroscope;
Ex situ Methods:
1. X-ray Photoelectron Spectroscopy (XPS);
2. Ultraviolet Photoelectron Spectroscopy (UPS);
3. Auger Spectroscopy;
4. Electron Energy Loss Spectroscopy (EELS);
5. Low Energy Electron Diffraction (LEED);
6. Reflection High Energy Electron Diffraction (RHEED);
7. Scan Electron Microscope (SEM);
Energy Dispersion of X-ray (EDX);
8. Transmission Electron Diffraction Microscope;
9. Inelastic Electron Tunneling;
10. Ion Scattering Spectroscopy;
11. Secondary Ion Mass Spectroscopy (SIMS);
透射方法
OTTLE 和电解池
OTE 电解池
o
901≈φ电解池壳体(圆柱形): 材料――全玻璃；塑料Lucite ；玻璃陶瓷Macor ；Teflon
(1)φ
o’M O /M R 《φo’E O /E R (2)φo’M O /M R 》φo’E O /E R (3)φM O /M R 《≈φE O /E R
OTTLE:MV 2+
+e=MV +.
□o’
MV
/MV
□
< □
o’
(i),(ii),(iii)
溶液: (i)MV □
+cyt.CE(O 1)= MV 2+
+ cyt.CE(R 1) □
o’
(i)>0.29V
(ii)MV □
+cyt.C(O)= MV 2+
+ cyt.C(R) □
o’
(ii)=0.25V
(iii)MV □
+cyt.CE(O 2)= MV 2+
+ cyt.CE(R 2) □
o’
(iii)<0.25V
反射界面(两相)电场分布(驻波场)
红外区:
>/ 2 i n > UV/V 光区 λ200-800nm ,n 1=1.333,n 3=2.0,k 3=4.0,Φ1=45° > λ2.5～25μ >/ λ0.2～0.8μ