半导体领域常用的英文简写

Acronym/Abbreviation Term

S.A.Sense Amplifier

S/D Source/Drain

S/M Solder Mask

S/N Singal / Noise

S/L Short Loop

SAB Salicide Block

SAC Self-Aligned Contact

SAC oxide Sacrifice Oxide

Salicide Self Alignment Silicide

SAM Sonic Accoustic Microscope; Scanning Auger Microscopy SAM Scanning Auger Microscopy

SAPD strategic approach to product design

SAT Scanning Acoustic Tomograph

SB soft bake

SBC Solder Ball Connection

SBC Statistical bin control

SBIR Site back side reference indicator reading

SBIT Single Bit Fail

SBL Statistical bin limit

SC Standard Cleaning

SCA sneak circuit analysis

SCAR Supplier CAR

SCCM Standard Cubic Centimeters Per Minute, flow rate

SCH scaled cumulative hazard

SCIC Secondary Change Inspect Committee

SCP Single Chip Package

SCQI Supplier Continuous Quality Improvement

scrap

scratch

Scrubber high pressure washer of wafers

SDA Software Defect Analysis

SDIP Shrink Dual In-line Package

SDIST Short Cycle Disturb Test

SDS slurry dispense system

SE Secondary Electron

SECC Single Edge Contact Cartridge

SED statistically experimental design

Selectivity ratio of etch rates from one substance to other

SEM Scanning Electron Microscope

SER soft-error rate

SFPD site focal plane deviation

SGHE Secondarily Generated Hot-Electron injection (HCI)

SH-DIP Srink DIP

SHE Substrate Hot-Electron injection (HCI)

SIA Semiconnector Industry Association

SIF Self ionized plasma (for target, PVD)

Sigma(σ)Standard deviation

Silicide TiSi2 reduces resistance of the silicon

SIMBGA SIM Ball Grid Array

SIMM Single In-line Memory Module

SIMS Second Ion Mass Spectrometry

SIN Silicon Nitride

SINTER anneal metal to make better contacts

SIP self-ionized plasma

SK-DIP Skinny Dual Inline Package

SLC Surface Laminar Circuits

SL-DIP Slim DIP

SLED shelf life elongation disposition

SLI Single Lot Identifier

SLICC Slightly Large than IC Carrier (by Motorola)

SLLN strong law of large number

SLM Scanning Light Microscope

SM Stress Migration

SMC Single Chip Module

SMD Solder Mask Defined

SMD Surface Mount Device

SMIF Standard Mechanism Interface

SMOBC Solder Mask Over Bare Coppor

SMS Semiconductor Manufacturing System

SMS Shifted Measurement Scals

SMT Surface Mount Technology

SMU Source Measurement Unit

SNR Signal to Noise Analysis

SO/SOP Small Outline Package

SOA Safe Operating Area

SOC System On Chip

SOG Spin-On Glass

SOG sample outgoing

SOI Silicon On Insulator

SOIC Small Outline Integrated Circuit

SOJ Small Outline J-Lead Package

SOP Small Outline Package

SOP Standard Operation Procedure

SOS Silicon On Sapphire

SOW statement of work

SPC Statistical Process Control

SPD Silicon Product Division (TI Sherman)

SPDC Semiconductor Process Design Center in TI

spec

SPECS Semiconductor Process Evaluation Core Software

SPEED System Product Engineering and ECO (Engineering Change Order) Database SPLRS super Long Ras Cycle Tesrt

SPM Mixture of Sulfuric Acid Solution and hydrogen peroxide (H2SO4 H2O2) sulfuric acid hydrogen peroxide mixture

Sputter metals deposition

SQA software quality assurance

SQC Statistical Quality Control

SQRR Supplier quality & reliability requirements SRAM Static Random Access Memory

SRD Spin, Rinse, Dry

SRM Solvent Rinse Module

SRO Silicon Rich Oxide

SRP Surface Resistance Profiling

SRR Supplier Rating & Ranking

SS Sample Size

SSER System Soft Error Rate

SSI Small-scale integration

SSOP Shrink Small Outline Package

STD Standard

Step Coverage amount of a step covered on a deposition

STI Shallow Trench Isolation

STIR site total indicator reading

STM Scanning Tunneling Microscope

STR Special Test Request

STS ship to stock

STVS Simultaneous TVS

SUTT Start-Up Test Team

SVP Small Vertical package

SWEAT Standard Wafer-level Electromigration Acceleration Test SWOX Side Wall Oxide

SWR Special Work Request

Definition or meaning

牺牲氧化

(typically at 80-100 degrees Celsius) to drive

报废

刮伤

洗刷

标准机械操作界面

规格

溅射

浅沟槽隔绝技术特殊测试要求