75N75-TF3-T中文资料
UNISONIC TECHNOLOGIES CO., LTD
75N75
Power MOSFET
75Amps, 75Volts
N-CHANNEL POWER MOSTFET
DESCRIPTION
The UTC 75N75 is n-channel enhancement mode power field effect transistors with stable off-state characteristics, fast
switching speed, low thermal resistance, usually used at telecom and computer application.
FEATURES
* R DS(ON) = 12.5m ? @V GS = 10 V
* Ultra low gate charge ( typical 90 nC ) * Fast switching capability * Avalanche energy Specified
* Improved dv/dt capability, high ruggedness
SYMBOL
1.Gate
TO-220
1
TO-252
TO-251
1
1
1
TO-220F
*Pb-free plating product number: 75N75L
ORDERING INFORMATION
Order Number Pin Assignment
Normal Lead Free Plating Package 1 2 3
Packing
75N75-TA3-T 75N75L-TA3-T TO-220 G D S Tube 75N75-TF3-T 75N75L-TF3-T TO-220F G D S Tube 75N75-TM3-T 75N75L-TM3-T TO-251 G D S Tube 75N75-TN3-R 75N75L-TN3-R TO-252 G D S Tape Reel 75N75-TN3-T 75N75L-TN3-T TO-252 G D S Tube Note: Pin Assignment: G: Gate D: Drain S: Source
ABSOLUTE MAXIMUM RATINGS
PARAMETER SYMBOL RATINGS UNIT
Drain to Source Voltage V DSS 75 V
T C = 25 75 A
Continuous Drain Current
T C = 100 I D 56 A
Drain Current Pulsed (Note 1) I DM 300 A
Gate to Source Voltage V GS ±20 V
Single Pulsed (Note 2)E AS 900 mJ
Avalanche Energy
Repetitive (Note 1) E AR 300
mJ Peak Diode Recovery dv/dt (Note 3) dv/dt 15 V/ns
T C = 25 220 W
Total Power Dissipation Derating above 25 P D
1.4 W/
Junction Temperature T J +150 Storage Temperature T STG -55 ~ +150 Note: Absolute maximum ratings are those values beyond which the device could be permanently damaged.
Absolute maximum ratings are stress ratings only and functional device operation is not implied.
THERMAL DATA
PARAMETER SYMBOL MIN TYP MAX UNIT
Thermal Resistance Junction-Ambient θJA 62.5 /W Thermal Resistance Junction-Case θJC 0.8 /W Thermal Resistance Case-Sink θCS 0.5
/W ELECTRICAL CHARACTERISTICS (T C = 25 , unless otherwise specified)
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNIT
Off Characteristics
Drain-Source Breakdown Voltage BV DSS V GS = 0 V, I D = 250 μA 75 V Breakdown Voltage Temperature Coefficient BV DSS /△T J I D = 1mA,
Referenced to 25
0.08 V/
V DS = 75 V, V GS = 0 V 20 μA
Drain-Source Leakage Current I DSS V DS = 75 V, V GS = 0 V,
T J = 150
250 μA
Gate-Source Leakage Current V GS = 20V, V DS = 0 V 100 nA
Gate-Source Leakage Reverse I GSS
V GS = -20V, V DS = 0 V -100 nA On Characteristics Gate Threshold Voltage V GS(TH) V DS = V GS , I D = 250 μA 2.0 4.0 V Static Drain-Source On-State
Resistance
R DS(ON) V GS = 10 V, I D = 48 A 12.5 15 m ?
Dynamic Characteristics Input Capacitance C ISS 3300 pF
Output Capacitance C OSS 530 pF
Reverse Transfer Capacitance C RSS V GS = 0 V, V DS = 25 V
f = 1MHz
80 pF Switching Characteristics Turn-On Delay Time t D(ON) 12 ns Rise Time t R 79 ns
Turn-Off Delay Time t D(OFF) 80 ns
Fall Time t F V DD = 38V, I D =48A, V GS =10V, (Note 4, 5) 52 ns Total Gate Charge Q G 90 140 nC
Gate-Source Charge Q GS 20 35 nC
Gate-Drain Charge (Miller Charge) Q GD
V DS = 60V, V GS = 10 V
I D = 48A, (Note 4, 5)
30 45 nC
ELECTRICAL CHARACTERISTICS(Cont.)
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNIT
Source-Drain Diode Ratings and Characteristics Continuous Source Current I S 75
Pulsed Source Current I SM 300 A
Diode Forward Voltage V SD I S = 48A, V GS = 0 V 1.4 V
Reverse Recovery Time t rr 90 ns Reverse Recovery Charge Q rr I S = 48A, V GS = 0 V dI F / dt = 100 A/μs 300 μC
Note 1. Repeativity rating: pulse width limited by junction temperature
2. L=0.24mH, I AS =48A, R G =20?, Starting T J =25
3. I SD ≤48A, di/dt ≤300A/μs, V DD ≤BV DSS , Starting T J =25
4. Pulse Test: Pulse Width ≤300μs,Duty Cycle ≤2%
5. Essentially independent of operating temperature.
TEST CIRCUITS AND WAVEFORMS
V DD
V GS (Driver)
I SD (D.U.T.)
Body Diode
Forward Voltage Drop
V DS
(D.U.T.)
Fig. 1A Peak Diode Recovery dv/dt Test Circuit
Fig. 1B Peak Diode Recovery dv/dt Waveforms
TEST CIRCUITS AND WAVEFORMS (Cont.)
R L
DD
V DS
90%
10%
V GS
t
Fig. 2A Switching Test Circuit Fig. 2B Switching Waveforms
Fig. 3A Gate Charge Test Circuit
Fig. 3B Gate Charge Waveform
10V
L
V DD
I AS
Fig. 4A Unclamped Inductive Switching Test Circuit Fig. 4B Unclamped Inductive Switching Waveforms
TYPICAL CHARACTERISTICS
10
10101010
10
Drain -Source Voltage , V DS (V)
D r a i n C u r r e n t , I D (A )
On-State Characteristics
Gate-Source Voltage , V GS (V)
Transfer Characteristics
11
0D r a i n -S
o u r c e O n -R
e s i s t a n c e , R D S (O N ) (m Ω)
Drain Current , I D (A)
30708012
13
14
15
On-Resistance Variation vs . Drain
102
10100
0.2Source-Drain Voltage , V SD (V)
R e v e r s e D r a i n C u r r e n t , I S D (A )
Reverse Drain Current vs . Allowable Case
Temperature 1.6
0.40.60.8 1.0 1.2 1.4
1050100
20406090
5Drain-Source Voltage , V DC (V)
C a p a c i t a n c e (p F )
Capacitance Characteristics
1000
10G a t e -t o -S o u r c e V o l t a g e , V G S (V )
Total Gate Charge, Q G (nC)
81012Gate Charge Characteristics
6402515203035
TYPICAL CHARACTERISTICS(Cont.)
-100
D r a i n -S o u r c e B r e a k d o w
n V o l t a g e , B V D S S (N o r m a l i z e d )
Junction Temperature , T J (℃)
-50
50
200
100
150Breakdown Voltage Variation vs .
D r a i n -S o u r c e
O n -R e s i s t a n c e , R D S (O N ), (N o r m a l i z e d )
-10050100150On-Resistance Variation vs . 01.0Junction Temperature , T J (℃)
-50200
0.1
Drain -Source Voltage, V D (V)
D r a i n C u r r e n t , I D ,(A )
Maximum Safe Operating
100
Case Temperature, T C (℃)
Maximum Drain Current vs . Case
Square Wave Pulse Duration , t 1 (sec)
T h e r m a l R e s p o n s e , Z θJ C (t )
11E-50.1
0.1
10Transient Thermal Response Curve
1E-41E-30.01