IS41LV8512-50T中文资料

.EATURESExtended Data-Out (EDO) Page Mode access cycle TTL compatible inputs and outputs; tristate I/ORefresh Interval: 1024 cycles /16 msRefresh Mode: RAS-Only, CAS-before-RAS (CBR), HiddenJEDEC standard pinoutSingle power supply:5V ± 10% (IS41C8512)3.3V ± 10% (IS41LV8512)Byte Write and Byte Read operation via CASIndustrail Temperature Range -40o C to 85o C DESCRIPTIONThe 1+51 IS41C8512 and IS41LV8512 is a 524,288 x 8-bit high-performance CMOS Dynamic Random Access Memories. The IS41C8512 offer an accelerated cycle access called EDO Page Mode. EDO Page Mode allows 512 random accesses within a single row with access cycle time as short as 10 ns per 8-bit.These features make the IS41C8512and IS41LV8512 ideally suited for high-bandwidth graphics, digital signal processing, high-performance computing systems, and peripheral applications.The IS41C8512 is packaged in a 28-pin 400mil SOJ and 400mil TSOP-2.IS41C8512IS41LV8512512K x 8 (4-MBIT) DYNAMIC RAMWITH EDO PAGE MODEKEY TIMING PARAMETERSParameter-35-50-60UnitMax. RAS Access Time (t RAC)355060nsCACAAPCMin. Read/Write Cycle Time (t RC)6090110nsPIN CON.IGURATIONS28 Pin SOJ, TSOP-2PIN DESCRIPTIONSA0-A9Address InputsI/O0-7Data Inputs/OutputsWE Write EnableOE Output EnableRAS Row Address StrobeCAS Column Address StrobeVcc PowerGND GroundNC No ConnectionICSI reserves the right to make changes to its products at any time without notice in order to improve design and supply the best possible product. We assume no responsibility for any errors which may appear in this publication. © Copyright 2000, Integrated Circuit Solution Inc.IS41C8512IS41LV85122Integrated Circuit Solution Inc.TRUTH TABLE.unction RAS CAS WE OE Address t R /t C I/OStandby H H X X X High-Z ReadL L H L ROW/COL D OUT Write: Word (Early Write)L L L X ROW/COL D IN Read-Write L L H →L L →H ROW/COL D OUT , D IN Hidden Refresh Read L →H →L L H L ROW/COL D OUT Write (1)L →H →LL L X ROW/COL D OUT RAS -Only Refresh L H X X ROW/NA High-ZCBR RefreshH →L L X X X High-ZNote:1.EARLY WRITE only.IS41C8512IS41LV8512.unctional DescriptionThe IS41C8512 and IS41LV8512 is a CMOS DRAM optimized for high-speed bandwidth, low power applications. During READ or WRITE cycles, each bit is uniquely addressed through the 10 address bits. These are entered ten bits (A0-A9) at a time. The row address is latched by the Row Address Strobe (RAS). The column address is latched by the Column Address Strobe (CAS). RAS is used to latch the first ten bits and CAS is used the latter nine bits.Memory CycleA memory cycle is initiated by bring RAS LOW and it is terminated by returning both RAS and CAS HIGH. To ensures proper device operation and data integrity any memory cycle, once initiated, must not be ended or aborted before the minimum t RAS time has expired. A new cycle must not be initiated until the minimum precharge time t RP, t CP has elapsed.Read CycleA read cycle is initiated by the falling edge of CAS or OE, whichever occurs last, while holding WE HIGH. The column address must be held for a minimum time specified by t AR. Data Out becomes valid only when t RAC, t AA, t CAC and t OEA are all satisfied. As a result, the access time is dependent on the timing relationships between these parameters.Write CycleA write cycle is initiated by the falling edge of CAS and WE, whichever occurs last. The input data must be valid at or before the falling edge of CAS or WE, whichever occurs first.Refresh CycleTo retain data, 1024 refresh cycles are required in each 16 ms period. There are two ways to refresh the memory.1.By clocking each of the 1024 row addresses (A0 through A9) with RAS at least once every 16 ms. Any read, write, read-modify-write or RAS-only cycle re-freshes the addressed row.ing a CAS-before-RAS refresh cycle. CAS-before-RAS refresh is activated by the falling edge of RAS, while holding CAS LOW. In CAS-before-RAS refresh cycle, an internal 10-bit counter provides the row ad-dresses and the external address inputs are ignored.CAS-before-RAS is a refresh-only mode and no data access or device selection is allowed. Thus, the output remains in the High-Z state during the cycle.Extended Data Out Page ModeEDO page mode operation permits all 512 columns within a selected row to be randomly accessed at a high data rate.In EDO page mode read cycle, the data-out is held to the next CAS cycle s falling edge, instead of the rising edge. .or this reason, the valid data output time in EDO page mode is extended compared with the fast page mode. In the fast page mode, the valid data output time becomes shorter as the CAS cycle time becomes shorter. Therefore, in EDO page mode, the timing margin in read cycle is larger than that of the fast page mode even if the CAS cycle time becomes shorter.In EDO page mode, due to the extended data function, the CAS cycle time can be shorter than in the fast page mode if the timing margin is the same.The EDO page mode allows both read and write opera-tions during one RAS cycle, but the performance is equiva-lent to that of the fast page mode in that case.Power-OnAfter application of the V CC supply, an initial pause of 200 µs is required followed by a minimum of eight initial-ization cycles (any combination of cycles containing a RAS signal).During power-on, it is recommended that RAS track with V CC or be held at a valid V IH to avoid current surges.IS41C8512IS41LV85124Integrated Circuit Solution Inc.ABSOLUTE MAXIMUM RATINGS (1)Symbol ParametersRating Unit V T Voltage on Any Pin Relative to GND 5V 1.0 to +7.0V 3.3V 0.5 to +4.6V CC Supply Voltage5V 1.0 to +7.0V 3.3V0.5 to +4.6I OUT Output Current 50mA P D Power Dissipation1W T A Commercial Operation Temperature 0 to +70°C Industrial Operationg Temperature 40 to +85°C T STGStorage Temperature55 to +125°CNote:1.Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.RECOMMENDED OPERATING CONDITIONS (Voltages are referenced to GND.)Symbol Parameter Min.Typ.Max.Unit V CC Supply Voltage 5V 4.5 5.0 5.5V 3.3V 3.0 3.3 3.6V IH Input High Voltage 5V 2.4 V CC + 1.0V 3.3V 2.0 V CC + 0.3V IL Input Low Voltage5V 1.0 0.8V 3.3V0.3 0.8T ACommercial Ambient Temperature 0 70°C Industrial Ambient Temperature4085°CCAPACITANCE (1,2)Symbol ParameterMax.Unit C IN 1Input Capacitance: A0-A85p.C IN 2Input Capacitance: RAS , UCAS , LCAS , WE , OE 7p.C IOData Input/Output Capacitance: I/O0-I/O157p.Notes:1. Tested initially and after any design or process changes that may affect these parameters.2. Test conditions: T A = 25°C, f = 1 MHz.IS41C8512IS41LV8512ELECTRICAL CHARACTERISTICS(1)(Recommended Operating Conditions unless otherwise noted.)Symbol Parameter Test Condition Speed Min.Max.Unit I IL Input Leakage Current Any input 0V < V IN < Vcc 1010µAOther inputs not under test = 0VI IO Output Leakage Current Output is disabled (Hi-Z) 1010µA0V < V OUT < VccV OH Output High Voltage Level I OH = 2.5 mA 2.4 VV OL Output Low Voltage Level I OL =+2.1mA 0.4VI CC1Standby Current: TTL RAS, CAS > V IH Commerical5V 3mAIndustrial5V 4Commerical3V 2Industrial3V 3I CC2Standby Current: CMOS RAS, CAS > V CC 0.2V5V 2mA3V 1I CC3Operating Current:RAS, CAS,-35 230mARandom Read/Write(2,3,4)Address Cycling, t RC = t RC (min.)-50 180Average Power Supply Current-60 170I CC4Operating Current:RAS = V IL, CAS,-35 220mAEDO Page Mode(2,3,4)Cycling t PC = t PC (min.)-50 170Average Power Supply Current-60 160I CC5Refresh Current:RAS Cycling, CAS > V IH-35 230mARAS-Only(2,3)t RC = t RC (min.)-50 180Average Power Supply Current-60 170I CC6Refresh Current:RAS, CAS Cycling-35 230mACBR(2,3,5)t RC = t RC (min.)-50 180Average Power Supply Current-60 170 Notes:1. An initial pause of 200 µs is required after power-up followed by eight RAS refresh cycles (RAS-Only or CBR) before proper deviceoperation is assured. The eight RAS cycles wake-up should be repeated any time the t RE. refresh requirement is exceeded.2. Dependent on cycle rates.3. Specified values are obtained with minimum cycle time and the output open.4. Column-address is changed once each EDO page cycle.5. Enables on-chip refresh and address counters.IS41C8512IS41LV85126Integrated Circuit Solution Inc.AC CHARACTERISTICS (1,2,3,4,5,6)(Recommended Operating Conditions unless otherwise noted.)-35-50-60Symbol ParameterMin.Max.Min.Max.Min.Max.Units t RC Random READ or WRITE Cycle Time 60 90 110 ns t RAC Access Time from RAS (6, 7)35 50 60ns t CAC Access Time from CAS (6, 8, 15)10 14 15ns t AA Access Time from Column-Address (6) 18 25 30ns t RAS RAS Pulse Width 3510K 5010K 6010K ns t RP RAS Precharge Time 2030 40 ns t CAS CAS Pulse Width (26)610K 810K 1010K ns t CP CAS Precharge Time (9, 25)5 8 10 ns t CSH CAS Hold Time (21)35 50 60 ns t RCD RAS to CAS Delay Time (10, 20)112819362045ns t ASR Row-Address Setup Time 0 0 0 ns t RAH Row-Address Hold Time6 8 10 ns t ASC Column-Address Setup Time (20)0 0 0 ns t CAH Column-Address Hold Time (20)6 8 10 ns t AR Column-Address Hold Time 30 40 40 ns (referenced to RAS )t RAD RAS to Column-Address Delay Time (11)102014251530ns t RAL Column-Address to RAS Lead Time 18 25 30 ns t RPC RAS to CAS Precharge Time 0 0 0 ns t RSH RAS Hold Time (27)8 14 15 ns t CLZ CAS to Output in Low-Z (15, 29)3 3 3 ns t CRP CAS to RAS Precharge Time (21)5 5 5 ns t OD Output Disable Time (19, 28, 29)312312312ns t OE Output Enable Time (15, 16)010015 15ns t OEHC OE HIGH Hold Time from CAS HIGH 10 10 10 ns t OEP OE HIGH Pulse Width10 10 10 ns t OES OE LOW to CAS HIGH Setup Time 5 5 5 ns t RCS Read Command Setup Time (17, 20)0 0 0 ns t RRH Read Command Hold Time 0 0 0 ns (referenced to RAS )(12)t RCH Read Command Hold Time 0 0 0 ns (referenced to CAS )(12, 17, 21)t WCH Write Command Hold Time (17, 27)5 8 10 ns t WCR Write Command Hold Time 30 40 50 ns (referenced to RAS )(17)t WP Write Command Pulse Width (17)5 8 10 ns t WPZ WE Pulse Widths to Disable Outputs 10 10 10 ns t RWL Write Command to RAS Lead Time (17)8 14 15 ns t CWL Write Command to CAS Lead Time (17, 21)8 14 15 ns t WCS Write Command Setup Time (14, 17, 20)0 0 0 ns t DHRData-in Hold Time (referenced to RAS )304040nsIS41C8512IS41LV8512AC CHARACTERISTICS (Continued)(1,2,3,4,5,6)(Recommended Operating Conditions unless otherwise noted.)-35-50-60Symbol Parameter Min.Max.Min.Max.Min.Max.Units t ACH Column-Address Setup Time to CAS15 15 15 ns Precharge during WRITE Cyclet OEH OE Hold Time from WE during8 8 15 ns READ-MODI.Y-WRITE cycle(18)t DS Data-In Setup Time(15, 22)0 0 0 ns t DH Data-In Hold Time(15, 22)6 6 10 ns t RWC READ-MODI.Y-WRITE Cycle Time80 100 140 ns t RWD RAS to WE Delay Time during45 50 80 ns READ-MODI.Y-WRITE Cycle(14)t CWD CAS to WE Delay Time(14, 20)25 30 36 ns t AWD Column-Address to WE Delay Time(14)30 30 49 ns t PC EDO Page Mode READ or WRITE12 15 25 ns Cycle Time(24)t RASP RAS Pulse Width in EDO Page Mode35100K40100K50100K ns t CPA Access Time from CAS Precharge(15) 21 27 34ns t PRWC EDO Page Mode READ-WRITE40 45 56 ns Cycle Time(24)t COH Data Output Hold after CAS LOW5 5 5 ns t O..Output Buffer Turn-Off Delay from315315315ns CAS or RAS(13,15,19, 29)t WHZ Output Disable Delay from WE315315315ns t CLCH Last CAS going LOW to .irst CAS10 10 10 ns returning HIGH(23)t CSR CAS Setup Time (CBR RE.RESH)(30, 20)8 10 10 ns t CHR CAS Hold Time (CBR RE.RESH)(30, 21)8 10 10 ns t ORD OE Setup Time prior to RAS during0 0 0 ns HIDDEN RE.RESH Cyclet RE.Refresh Period (1024 Cycles) 1616 16 ms t T Transition Time (Rise or .all)(2, 3)150150150nsIS41C8512IS41LV85128Integrated Circuit Solution Inc.Notes:1.An initial pause of 200 µs is required after power-up followed by eight RAS refresh cycle (RAS -Only or CBR) before proper deviceoperation is assured. The eight RAS cycles wake-up should be repeated any time the t RE. refresh requirement is exceeded.2.V IH (MIN) and V IL (MAX) are reference levels for measuring timing of input signals. Transition times, are measured between V IHand V IL (or between V IL and V IH ) and assume to be 1 ns for all inputs.3.In addition to meeting the transition rate specification, all input signals must transit between V IH and V IL (or between V IL and V IH )in a monotonic manner.4.If CAS and RAS = V IH , data output is High-Z.5.If CAS = V IL , data output may contain data from the last valid READ cycle.6.Measured with a load equivalent to one TTL gate and 50 p..7.Assumes that t RCD ≤ t RCD (MAX). If t RCD is greater than the maximum recommended value shown in this table, t RAC will increaseby the amount that t RCD exceeds the value shown.8.Assumes that t RCD ≥ t RCD (MAX).9.If CAS is LOW at the falling edge of RAS , data out will be maintained from the previous cycle. To initiate a new cycle and clear thedata output buffer, CAS and RAS must be pulsed for t CP .10.Operation with the t RCD (MAX) limit ensures that t RAC (MAX) can be met. t RCD (MAX) is specified as a reference point only; if t RCDis greater than the specified t RCD (MAX) limit, access time is controlled exclusively by t CAC .11.Operation within the t RAD (MAX) limit ensures that t RCD (MAX) can be met. t RAD (MAX) is specified as a reference point only; if t RADis greater than the specified t RAD (MAX) limit, access time is controlled exclusively by t AA .12.Either t RCH or t RRH must be satisfied for a READ cycle.13.t O.. (MAX) defines the time at which the output achieves the open circuit condition; it is not a reference to V OH or V OL .14.t WCS , t RWD , t AWD and t CWD are restrictive operating parameters in LATE WRITE and READ-MODI.Y-WRITE cycle only. If t WCS ≥ t WCS(MIN), the cycle is an EARLY WRITE cycle and the data output will remain open circuit throughout the entire cycle. If t RWD ≥ t RWD (MIN), t AWD ≥ t AWD (MIN) and t CWD ≥ t CWD (MIN), the cycle is a READ-WRITE cycle and the data output will contain data read from the selected cell. If neither of the above conditions is met, the state of I/O (at access time and until CAS and RAS or OE go back to V IH ) is indeterminate. OE held HIGH and WE taken LOW after CAS goes LOW result in a LATE WRITE (OE -controlled) cycle.15.Output parameter (I/O) is referenced to corresponding CAS input.16.During a READ cycle, if OE is LOW then taken HIGH before CAS goes HIGH, I/O goes open. If OE is tied permanently LOW, a LATEWRITE or READ-MODI.Y-WRITE is not possible.17.Write command is defined as WE going low.TE WRITE and READ-MODI.Y-WRITE cycles must have both t OD and t OEH met (OE HIGH during WRITE cycle) in order to ensurethat the output buffers will be open during the WRITE cycle. The I/Os will provide the previously written data if CAS remains LOW and OE is taken back to LOW after t OEH is met.19.The I/Os are in open during READ cycles once t OD or t O.. occur.20.The first χCAS edge to transition LOW.21.The last χCAS edge to transition HIGH.22.These parameters are referenced to CAS leading edge in EARLY WRITE cycles and WE leading edge in LATE WRITE or READ-MODI.Y-WRITE cycles.st falling χCAS edge to first rising χCAS edge.st rising χCAS edge to next cycle s last rising χCAS st rising χCAS edge to first falling χCAS edge.26.Each χCAS must meet minimum pulse st χCAS to go LOW.28.I/Os controlled, regardless CAS .29.The 3 ns minimum is a parameter guaranteed by design.30.Enables on-chip refresh and address counters.IS41C8512IS41LV8512READ CYCLE Array Note:1.t O.. is referenced from rising edge of RAS or CAS, whichever occurs last.IS41C8512IS41LV851210Integrated Circuit Solution Inc.EARLY WRITE CYCLE (OE = DON'T CARE)IS41LV8512READ WRITE CYCLE (LATE WRITE and READ-MODI.Y-WRITE Cycles)IS41LV851212Integrated Circuit Solution Inc.EDO -PAGE -MODE READ CYCLENote:1.t PC can be measured from falling edge of CAS to falling edge of CAS , or from rising edge of CAS to rising edge of CAS . Both measurements must meet the t PC specifications.IS41LV8512EDO-PAGE-MODE EARLY-WRITE CYCLEIS41LV851214Integrated Circuit Solution Inc.EDO -PAGE -MODE READ -WRITE CYCLE (LATE WRITE and READ-MODI.Y WRITE Cycles)Note:1.t PC can be measured from falling edge of CAS to falling edge of CAS , or from rising edge of CAS to rising edge of CAS . Both measurements must meet the t PC specifications.IS41LV8512EDO-PAGE-MODE READ-EARLY-WRITE CYCLE (Psuedo READ-MODI.Y WRITE)IS41LV8512AC WAVE.ORMSREAD CYCLE (With WE-Controlled Disable)4)5-ONLY RE.RESH CYCLE (OE, WE = DON'T CARE)16Integrated Circuit Solution Inc.IS41LV8512HIDDEN RE.RESH CYCLE (1) (WE = HIGH; OE = LOW)+*4 RE.RESH CYCLE (Addresses; WE , OE = DON'T CARE)Notes:1.A Hidden Refresh may also be performed after a Write Cycle. In this case, WE = LOW and OE = HIGH.2.t O.. is referenced from rising edge of RAS or CAS , whichever occurs last.IS41LV851218Integrated Circuit Solution Inc.ORDERING IN.ORMATION IS41C8512Commercial Range: 0°C to 70°CSpeed (ns)Order Part No.Package 35IS41C8512-35K 400mil SOJ IS41C8512-35T 400mil TSOP-2IS41C8512-50T 400mil TSOP-260IS41C8512-60K 400mil SOJ IS41C8512-60T400mil TSOP-2ORDERING IN.ORMATION:IS41LV8512Commercial Range: 0°C to 70°CSpeed (ns)Order Part No.Package 35IS41LV8512-35K 400mil SOJ IS41LV8512-35T 400mil TSOP-2IS41LV8512-50T 400mil TSOP-260IS41LV8512-60K 400mil SOJ IS41LV8512-60T400mil TSOP-2Industrial Range: -40°C to 85°CSpeed (ns)Order Part No.Package 35IS41C8512-35KI 400mil SOJ IS41C8512-35TI 400mil TSOP-250IS41C8512-50KI 400mil SOJ IS41C8512-50TI 400mil TSOP-260IS41C8512-60KI 400mil SOJ IS41C8512-60TI400mil TSOP-2Industrial Range: -40°C to 85°CSpeed (ns)Order Part No.Package 35IS41LV8512-35K 400mil SOJ IS41LV8512-35T 400mil TSOP-2IS41LV8512-50TI 400mil TSOP-260IS41LV8512-60KI 400mil SOJ IS41LV8512-60TI400mil TSOP-2Integrated Circuit Solution Inc.HEADQUARTER:NO.2, TECHNOLOGY RD. 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