Active measurement for multiple link failures diagnosis in ip networks

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Agilent E4406A 矢量信号分析仪商品说明书

Agilent E4406A 矢量信号分析仪商品说明书

1981Agilent E4406AVector Signal AnalyzerAccuracyS p e e d2Fast and accurate measurements To stay competitive, wireless equipment manufacturers need flexible test equipment capable of testing different formats with little change in set-up. The Agilent E4406A vector signal analyzer (VSA) is the perfect fit, offering the best combination of speed and accuracy for making one-button,standards-based measurements.2.5G and 3G formatsFor engineers developing next-generation wireless components and systems, the E4406A provides W-CDMA, cdma2000,1xEV-DO and EDGE/GSM formats. Using one-button measurements, engineers can quickly verify conformance to these new formats. As the standards have evolved, we have continued to enhance existing measurement personalities, and add new ones. The modular architecture of the E4406A makes it simple for you to upgrade and be ready for the latest standards.You develop the wireless future…Easy to useMulti-format3…we provide the signal analysis.An investment for your future The number of wireless technologies deployed around the world is growing and the demand for any particular format can change quickly. The E4406A offers format and frequency flexibility.Comprehensive signal analysis Speeding up production means being ready to manufacture anything and lose no time doing it. The E4406A easily adapts to virtually any popular format:•W-CDMA •cdma2000•1xEV-DO •cdmaOne •EDGE •GSM •NADC •PDC •iDEN •Spectrum •Waveform“We have decreased the (transmitter power calibration)test time by 25%.”–T est Systems Designer4Built for speed…Fast standards-based measurements As a wireless system or componentmanufacturer, you are under pressure to increase throughput while minimizing capital investments. Long test times can severely limit your manufacturing throughput, so we designed the E4406A.Since its introduction, progressive enhancements to the E4406A ensure its performance keeps pace with the ever-increasing need for speed.Today's E4406A is faster than ever. For example, the W-CDMA adjacent channel power ratio (ACPR) measurement is now nearly eight times faster than it used to be.Output radio frequency spectrum (ORFS) is two times faster, W-CDMA code domain power (CDP) is five times faster, and other measurements have improved as well.The E4406A transmitter power calibration uses time record data and built-in algorithms to provide complete transmitter level calibration with incredible speed – with all the accuracy you expect from the affordably-priced E4406A.In addition to high-speed throughput and accuracy in the manufacturing environment,the E4406A is designed to allow research and development engineers to quickly obtain results with minimal keystrokes.The E4406A delivers a logical user interface and a wealth of quick “one button” measurments, enabling designers to quickly try multiple test without getting bogged down in crypitic menus. The E4406A interface provides the edge needed to expediently evaluate new designs and successfully meet the demands of today's competitive environment.Base station transceiver suite of testsTypical spectrum analyzerNow even faster…without giving up accuracy.Fast spectrum measurementsThe E4406A features pre-configured, one-button measurements for many cellular standards and can also be used for narrowband spectrum measurements. Manufacturers can expect to make inter-modulation distortion and other amplitude measurements up to three times faster using the E4406A. AccuracyYou don’t need to reduce measurementspeed to get accurate results. Superiorabsolute level accuracy of ±0.6 dB(±0.4 dB typical) provides unmatchedperformance and minimizes test uncertainty.Combined with a linearity of ±0.25 dBover a 76 dB range, the E4406A is astate-of-the-art measurement tool.Absolute level accuracyNarrow span spectrum measurement over GPIB E4406A VSA spectrum analyzer25 updates/second Typicalspectrumanalyzer56The E4406A VSA…Focused applications including EDGE, GSM,W-CDMA, cdma2000, 1xEV-DO, cdmaOne,and NADC as well as narrow-span spectrum and waveform analysisBaseband measurements with balanced/unbalanced multiple impedance inputsLarge,high-resolution, color display makes viewing multiple traces easyZoomfeature allows users to display selected measurement windowsAutomatic alignment ensures accurate measurement resultsOne-button,standards-based measurements7…comprehensive signal analysis.High-speed LAN, parallel, and GPIB ports provide speed and flexibility whenIntuitive key strokesBuilt-in floppy disk drive provides PC compatibility and data archivingManufacturing8Standards complianceIn manufacturing, you need straightforward pass/fail verification of critical specifications.With built-in test limits you don ’t have to keep track of every standard. The E4406A performs tests to the requirements of current industry standards with free, easy-to-install, firmware updates.Speed and throughputIn the world of high-speed manufacturing every millisecond counts. Identify your throughput restrictions and if measurement speed is creating a bottleneck, consider the significant speed advantage of the E4406A.Transmitter and receiver testingIn combination with the Agilent E4438C ESG vector signal generator, the E4406A offers base station receiver and transmitter testing for major 2G, 2.5G, and 3G wireless formats.The E4406A combined with an E4438C is a test solution that provides the required flexibility, without compromising accuracy, for maximum throughput in base station production with the ability to migrate to new formats.Designed for manufacturing…Development9Verify next-generation designs For R&D engineers developing next-generation wireless components and systems, the E4406A is a low-cost tool that quickly verifies conformance. Your investment is secure because the E4406A has a modular architecture – making it easy to upgrade to the latest standards.Characterize using leading test methodsDigital modulation presents new challenges to amplifier manufacturers.Designers need effective methods to quickly characterize digital signals. The E4406A ’s complementary cumulative-distribution function (CCDF) is useful for determining a signal ’s power statistics,revealing the power peaks relative to the average power for assessing linearity requirements.Flexible power measurements Multicarrier power amplifier (MCPA)designers are faced with new measurement challenges. Designers must characterize intermodulation distortion at many frequency offsets and evaluate the effects of different modulation formats over a wide dynamic range. The E4406A features a fully-configurable ACP measurement that can test up to five frequency offsets and be optimized for dynamic range or speed.…and product development.10GSM with EDGE (Option 202)The EDGE measurement personality performs the latest standards-based measurements, including:•Error vector magnitude (EVM)•Multi-slot power versus time (PvT)•ORFS •IQ offset•Channel plans for 400, 800, 900, 1800, 1900 MHz•GSM measurements from Option BAH The EVM measurement features a unique algorithm to simultaneously display the EVM numerical results and the EDGE constellation diagram using the industry-specified measurement filter.GSM (Option BAH)The GSM measurement personality lets you quickly perform measurements to the latest ETSI standards:•Mean transmitter carrier power •Multi-slot PvT •ORFS•Phase and frequency error (PFER)•IQ offset•Transmitter band spurious•Channel plans for 400, 700, 800, 900, 1800, 1900 MHzThe personality features easy channel and timeslot selections, configurable PvT masks,and a typical ORFS dynamic range of 90 dB.NADC and PDC (Option BAE)Both the North American Digital Cellular (NADC) and Personal Digital Cellular (PDC)measurement personalities are included in this option. The NADC measurements are structured according to the IS-136 TDMA standard. Measurements included in this option are:•ACP •EVM•Occupied bandwidth (for PDC)The personalities feature base station and mobile radio mode set-ups, as well as sync word search capability.iDEN (Option HN1)The iDEN measurement personality performs measurements to the Motorola iDEN specialized mobile radio format. •Occupied bandwidth (OBW)•ACPR•Transmitter bit error rate (BER)TDMA measurement personalities…11W-CDMA (Option BAF)The complexity of W-CDMA demands the flexibility and depth of demodulation capability provided by this personality.Perform the following measurements on the HPSK uplink or downlink QPSK signals:•Code domain •QPSK EVM•Modulation accuracy (composite rho and EVM)•Channel power•Adjacent channel power leakage ratio (ACLR)•Power control •PvT•Intermodulation distortion •Multicarrier power•Spectrum emission mask •OBW •CCDFThis personality has the ability toautomatically determine active channels,to synchronize with any W-CDMA channel,to display code domain power in a multi-rate view, and to demodulate down to the symbol level. Variable capture intervals and pre-defined test models enable the user to perform fast, accurate measurements for manufacturing or in-depth analysis for R&D.cdma2000 (Option B78)The cdma2000 measurement personality offers the logical upgrade path from IS-95 to IS-2000 testing. Measurements support the forward and reverse links.•Code domain •QPSK EVM•Modulation accuracy (composite rho and EVM)•Channel power •ACPR•Intermodulation distortion •Spectrum emission mask •OBW •CCDFAdvanced code domain analysis algorithms display Walch codes for either Hadamard or OVSF coding schemes in a multi-rate view. Other capability includes code domain power error, symbol EVM,symbol power versus time, active channel identification, variable PN offset, quasi-orthogonal functions and demodulated symbol bit displays after de-spreading.… and CDMA measurement personalities.12Expanding measurement potential…cdmaOne (Option BAC)Built on Agilent ’s pioneering efforts in CDMA measurement techniques,this personality provides quick and easy measurement set-ups for the TIA/EIA-95, J-STD-008,IS-97D, and IS-98D band classes:•Modulation accuracy (rho)•Code domain •Channel power •ACPR•Close-in spuriousAlong with the world ’s fastest ACPR measurements, this personality features PN (pseudo-noise sequence) search, time offset, and carrier feed-through analysis.1xEV-DO (Option 204)With digital demodulation analysis, the 1xEV-DO measurement personality provides the most comprehensive, easy-to-use,1xEV-DO measurement solution available in an analyzer. This personality, which performs measurements for both forward link and reverse link signals, provides key transmitter measurements for analyzing systems based on the 3GPP2 and TIA/EIA/IS-856 standards.Forward link•Channel power•Power versus time mask •Spurious emissions and ACP •Intermodulation distortion •OBW•Code domain•Modulation accuracy (composite rho)•QPSK EVM•Power statistics (CCDF)Reverse link •Code domain•Modulation accuracy (composite rho)For forward link, the PvT mask and spurious emissions/ACP measurements support both the idle slot (burst signal) and active slot (full power signal). With the auto-burst search function, you can see the standard-based time mask for the 1xEV-DO idle slot in PvT. Code domain, modulation accuracy (composite rho), and QPSK EVM can also measure for each channel ’s Pilot, MAC, and Data in QPSK/8PSK/16QAM. Designed with flexibility in mind, this personality supports the unique 1xEV-DO forward link signals ’feature of time divisions multiplex (TDM). For reverse link, code domain, and modulation accuracy provide powerful modulation analysis functions for transmitter tests.13IQ inputs (Option B7C)Capitalize on the E4406A ’s demodulation capabilities by extending the measurement range to baseband. The baseband IQ input option enables engineers to measure the complete signal path of a receiver or transmitter and directly compare signals both before and after frequency conversion and IQ (de)modulation.Ideally suited for R&D engineers and manufacturing environments, this option allows measurement of baseband I and Q signals in either balanced or unbalanced systems. Input configurations include 50-ohm unbalanced, 600-ohm balanced, and 1-Mohm balanced or unbalanced –enabling a variety of systems to be directly tested without cumbersome and error-inducing conversion networks.Applicable in-band 3GPP W-CDMA,cdma2000, EDGE/GSM, and Basic mode measurements are supported via RF and IQ inputs, enabling engineers to track down signal degradation both before and after RF/IF conversion.Additional features include auto calibration of input signals, variable dc offsets and a dc to 5-MHz input frequency range (10 MHz in I + jQ mode)....tailored to user requirements.14E4406A VSA/89601Asoftware combinationThe standards-based, one-button test capabilities of the E4406A can be expanded with the flexible digital demodulation and analysis capabilities of the Agilent 89601A PC software. This teaming provides fast and accurate data acquisition with powerful,flexible modulation analysis tools for, both common and evolving communications standards.The 89601A vector signal analysis software is the heart of the Agilent 89600 series of vector signal analyzers. This software provides flexible tools for demodulating and analyzing even the most advanced digital modulations, whether or not they are contained in an established standard. Features include variable block size signal acquisition with user-selectable pulse search and synch words, and a user-con-trollable adaptive equalizer. Filter types include cosine (raised and square-root raised), Gaussian, and low-pass – all with configurable alpha/BT. Supported modula-tion formats for both continuous and burst carriers include FSK (2, 4, 8, and 16 level),BPSK, QPSK, OQPSK, DQPSK, p/4DQPSK,8PSK, QAM (16 to 256 level), VSB (8 and 16 level), EDGE, and MSK.The software also provides signal capture and analysis features, such as the capability to download signal capture files for playback through signal generators,and display high-speed spectrograms.The 89601A software runs on a PC connected to the E4406A, via LAN or GPIB,and provides hardware control and results displays along with modulation analysis.Coupling speed and power…15/find/vsa…with Agilent’s tradition of excellence.Service and supportThe speed and accuracy of the E4406A VSA is only a small part of what you get from Agilent. We strive to provide complete solutions that go beyond our customers ’expectations. Only Agilent offers the depth and breadth of enhancements, software, services, connectivity, accessibility, and support to help you reach your measurement objectives. For more information on the E4406A VSA, including product and application literature, visit our Web site at /find/vsaPre-sales service• rentals, leasing, and financing • application engineering services Post-sales service• standard 3-year global warranty • Worldwide Call Center and Service Center support network • one-year calibration intervals • firmware upgrades downloadable from the Web PC connectivity • 10 baseT LAN port • floppy disk drive • GPIB interface• VXI Plug and Play driversPeripheral and product interfaces • parallel printer port • printer support • VGA monitor output• Agilent E4438C ESG vector signal generator•Agilent 89601A vector signal analysis softwareTraining and access to information • on-site user training • factory service training• Web-based support of frequently asked questions• manuals on CD-ROM and on the Web Software• programming examples on CD-ROM • SCPI (Standard Commands for Programmable Instruments)• PC-based performance verification and adjustment softwareOrdering Array informationE4406A vector signal analyzerModel DescriptionE4406A7 MHz to 4 GHzOption DescriptionDigital Demodulation MeasurementsE4406A-202EDGE with GSM measurementpersonalityE4406A-2041xEV-DO measurementpersonalityE4406A-B78cdma2000 measurementpersonalityE4406A-BAC cdmaOne measurementpersonalityE4406A-BAE NADC, PDC measurementpersonalityE4406A-BAF W-CDMA measurementpersonalityE4406A-BAH GSM measurement personality E4406A-HN1IDEN measurementpersonalityInputs and outputsE4406A-300321.4 MHz IF outputBBIQE4406A-B7C I/Q inputsCalibration documentationE4406A-UK6Commercial calibrationcertificate with test data AccessoriesE4406A-1CM Rack mount kitE4406A-1CN Handle kitE4406A-1CP Rack mount and handle kitE4406A-1CR Rack slide kit* Includes English manual set.。

PROfLINE 2100 谐振与闪烁测试系统用户手册说明书

PROfLINE 2100 谐振与闪烁测试系统用户手册说明书

PROfLINE 2100HArMonICS & FLICKEr, CondUCTEd IMMUnITy TEST SySTEMS1981HArMonICS & FLICKEr, CondUCTEd IMMUnITy TEST SySTEMS3PROfLINE 2100 OvERvIEwThe ProfLine 2100 system is a complete and cost effective harmonics and flicker measurement test system to the latest IEC/EN standards. The programmable power generation capability of up to 45 kVA (90 kVA and 145 kVA sources comprise multiple 45 kVA units) provides more than ample power to cater for a wide range of Equipment Under Test (EUT). In addition to harmonics and flicker testing capability the AC/DC power source used in the system is capable of testing to a wide range of power quality immunity tests. In short, this system is a one stop power quality testing station that will help you meet your EMC responsibilities for compliance testing.Harmonics standard:IEC 61000-3-2 < 16 A per phaseIEC 61000-3-12 > 16 to 75 A per phaseFlicker standard:IEC 61000-3-3 < 16 A per phaseIEC 61000-3-11 < 75 A per phaseVoltage dip, interruption & variation:IEC 61000-4-11 < 16 A per phaseIEC 61000-4-34 > 16 A per phaseother immunity tests:IEC 61000-4-8 Power line magnetic fieldIEC 61000-4-13 Immunity to harmonics & inter-harmonicsIEC 61000-4-14 Repetitive voltage variationsIEC 61000-4-17 Ripple on DC input power portsIEC 61000-4-27 Voltage & Phase unbalance immunityIEC 61000-4-28 Frequency variationsIEC 61000-4-29 DC dips, variation and short interruptionALL ThE POwER LEvELS YOU NEED designed and widely used for compliance testing of equipment up to 45 kVA (90kVA and 145 kVA sources comprise multiple 45 kVA units), Teseq’s ProfLine 2100system is ideal for:Test houses requiring high precision tools for compliance and pre-compliance testing Manufacturers requiring AC & DC test tools for both in-house/self certification and product developmentRental companies requiring precise, reliable, portable harmonics & flicker systems for on-site customer testingProfLine 2100: highly modular compliance test power capability Programmable IEC compliant AC power sources accommodate wide range of 1- and 3-phase power levelsUltra-fast digital power analyzer provides high resolution acquisition for accuratemeasurementIEC 60725-compliant reference impedance ensures accurate flicker measurementAll electrical data is stored for complete evaluation and test replay analysisWindows-based operation speeds set-up, analysis, display and reportingContinuous pass/fail status monitoring4The high repetitive peak current. AC power source is designed for demanding non-linear load applications such as white goods, air-conditioners and other products with inductive or capacitive loads. The 45 kVA (90 kVA and 145 kVA sources comprise multiple 45 kVA units) source is specially designed with regenerative load withstand capability. It can handle power generated back to the source which is common in AC motor and motor control applications.3 kVA test system. Ideal for manufacturer not requiring the full 16 amps of the standard require-ments.5 kVA to 15 kVA test systems. Cater for manufacturers, test houses and rental companies requiring the full 16 amp range.1- and 3-phase configuration up to 45 kVA. This power house is ideal for the manufacturerand test houses that require the full range of low and high current testing such as required forcompressors, air conditioners and machine tools. ArrayFully featured 3x5 kVA harmonics and flickersystem including 3 phase power quality testingAC switch for compliant IEC 61000-4-11 testingdC to 500 Hz fundamental frequencyLow output impedanceSupports power magnetics applicationsIEC 61000-4-13 testing5hIGh ACCURACYMEASUREMENT vERIfIEDAt the heart of the ProfLine 2100 system is a fully compliant harmonics analyzer and flickermeter. DSP-based 1 M sample per second, no-gap/no overlap 200 mS data acquisition and powerful FFT analysis ensures full compliance harmonics testing based on IEC 61000-4-7. Direct PC bus access ensures higher data throughput than is found on most single box IEEE-488-based test system. Streaming real-time data display and storage allows measured data to be replayed and analyzed in complete confidence, speeding up fault detection.All EUT electrical parameters are monitored and stored continuously. Distortion, current har-monics and power consumption are checked against relevant IEC class test limits for pass/fail detection and dynamic class C and D test limit calculation.Independent verification has confirmed the following is correctly implemented: Measurement accuracy for electrical parameters such as voltage, current, harmonics and flickermeter is as per IEC requirementSoftware applies relaxation as and when the situation warrants it for pass/fail decision Compliance to all test equipment requirements as per IEC 61000-4-7 and IEC 61000-4-15A true measure of class. The unique concept for the ProfLine 2100 system measurement section is a cutting edge PC based analyzer. The measurement section is split into two parts, one being the advanced coupling unit CCN 1000 whilst the PC provides the digitization of the analogue signals, data processing and analysis. This approach has been extremely successful in keeping up with changes to the standards that demanded major increase in data processing and analysis capability.CCn 1000. This advanced coupling unit provides quick and easy single cable connection between the AC power source output and the EUT, plus the required isolation and signal con-ditioning. Precision, no-burden, active hall-effect current transformers ensure accurate current sensing over 4 A, 16 A and 40 A ranges simultaneously with 200 A peak capability for maximum resolution.6data Acquisition Unit Input ChannelsAll harmonics tests can be accessed from the ProfLine 2100’s single control and data display window on the PC. With a few mouse clicks the test can be set up and run quickly and easily.The operator is presented with a simple screen that shows the type of test to be run and the test duration, with clearly labelled buttons for the test to start or stop. Voltage and current time domain waveform displays are updated in real time during the test. All power analyzer parameters such as Vrms, Irms, Ifundemental, Ipeak, crest factor, real power, apparent power and power factor are clearly displayed throughout the test and updated in real time.The harmonics window displays instantaneous current harmonics and a line marking the appli-cable test limits. AC source voltage and EUT power are also monitored continuously throughout the entire test. Voltage distortion and current harmonics are checked against the IEC class limits for preliminary pass/fail detection. The continuous monitoring of EUT power consumption allows class C and D limits to be calculated dynamically.Harmonics analysis is implemented using the high performance DSP based plug-in A/D card connected directly to the CCN 1000 signal conditioning unit through a shielded cable. Each Power phase has four dedicated measurement channels- a total of 12 in 3-phase systems – ensuring accurate full compliance to the harmonics standard.The software will also automatically apply any relaxation of limits (e.g. POHC) should the situation warrant it and will indicate this in the test report.78All IEC harmonics tests can be accessed from ProfLine 2100’s single control and data display window on the PC. Steady state harmonic, transitory harmonic and inter-harmonic tests can be set up and run quickly and easily.Simple buttons start and stop automated testKey EUT electrical parameters updated continuouslyUser selectable test limitsTest progress clearly indicated, with preliminary pass/fail indication throughout AC voltage distortion continuously monitoredComplete test documentation including Word™ and Excel™ compatible data files Voltage and current waveform shown together in real timeUser-selectable real time display of individual current harmonicsEUT description and operator identification can be added to the test reportUser selectable measurement of inter-harmonics per IEC 61000-4-7Harmonics AnalysishARMONICS TEST SOfTwARE wIN 21009Seven simple steps to configure a harmonic test, configurationcan be saved for single step test start.Parameters required:1 Select harmonic test2 Select class A, B, C, D3 Select frequency 50/60 Hz4 Select test voltage5 Select limit, European or Japanese6 Select single or three phase7 Select test durationAll test parameters are displayed in real time, includingharmonic spectrum viewed against limit, test progress, voltage andcurrent waveforms.report can be viewed in Word™ format using inbuilt standardtemplate. Data files can be viewed with Excel™.fLICkER TEST MADE EASYFlicker tests are run from the same user interface as the harmonics module, making it familiar to the user. Set up is minimal and tests run can be started quickly.during each test run two graphical windows are displayed and updated continuously. One window will display the Vrms whilst the other can be user selected to display absolute voltage deviation or percentage, dt, dmax, dc, instantaneous Pst or Plt against their respective limits. At the end of the test sequence, both short-term flicker (Pst) and long-term (Plt) are calculated and a clear pass/fail indication is provided.Embedded in the ProfLine 2100 software is an IEC 61000-4-15 compliant single/three-channel flickermeter for 1- and 3-phase application. Single phase output configuration can use both the programmable and real IEC 60725-compliant output impedance to perform flicker measurement. Lumped reference impedance for 1- and 3-phase system impedances with varying current carrying capacity are available as an option.Power Source Reference Impendance Analyzer/Flickermeter EUTFlicker Test SoftwareStart and stop flicker tests with a single mouse clickTest progress clearly indicated with pass/fail indication throughoutPeak values displayed and updated in real timeUser-selectable test timeUser selectable parameters and data display optionCustomizable test limits for pre-compliance applicationReal time display of Vrms and one user selectable parameterEUT description and operator identification can be entered for inclusion in the test report24 dmax and inrush current test10Flicker Analysisreference impedance. For single phase systems the impedance is programmed into the source, therefore no physical impedance is required thus making the system more simple and lower costs. This approach is not possible in the three phase systems as it is not possible to separate the line and neutral impedances. Therefore the appropriate three phase impedance unit is supplied as part of the system.Test reports and data Logging. Reports can be printed at the end of each test report or retrospectively to support CE approval or for inclusion in a Technical Report File. The results file includes voltage and current waveform graphs, current harmonics spectrum and class limits and a complete flicker test analysis. The graph can be printed or stored in ASCII format on disc along with timing waveform data for use in detailed reporting or for further analysis using applications such as Excel.1112nSG 2200 AC Switch unit for complaint -4-11 and -4-34 testing. Available as either singleor three phase, these units use solid state IGBTs to rapidly switch between two sources of ACsupply. Typically this will be between the mains supply and a programmable AC source. TheAC source will be set at the lower voltage required for the test with the mains supplying thehigher.Controlled by Teseq WIN 2120 software and able to switch within the required 5 μs this deviceenables the standard to be fully met. Since the higher voltage level is supplied by the usersmains system, the inrush current is limited only by the mains supply and not by the equipment.The NSG 2200 is able to handle 50 amps rms current continuously and up to 500 amps inrush current.AC fast switching unit for standards specifiedin the IEC 61000-4-11Unit has two inputs, AC source and AC MainsAllows for single- or three-phase mode testingAC SwitchAC SwITChING UNIT13Magnetic field immunity testing. The power sources in the ProfLine 2100 systems makean ideal source for mains frequency magnetic field testing. Used in conjunction with the TeseqINA 2170 test coil and interface unit the supplies can be controlled by the WIN 2120 software togenerate the required fields and frequencies.Use of the clean sinusoidal programmable supply ensures that tests can be performed witheither 50 Hz or 60 Hz for different regions. Both the continuous and short duration tests can beeasily programmed at levels up to 100 A/m continuous and 300 A/m short duration dependingon the selection of source.Magnetic coilsIEC 61000-4-8 power frequency fieldAutomated test softwareAdjustable single loop antenna in 3 positionsNote: maximum and continuous coil field strengths can only be achieved using the correctlyspecified NSG 1007 AC/DC Power Source. INA 2170 coils can also be used for IEC 61000-4-9testing in conjunction with Teseq’s nSG 3060 generators.MAGNETIC fIELDIMMUNITY TEST COILSPROfLINE 2100: MORE ThANjUST hARMONICS & fLICkERProfLine 2100 has the hardware and software flexibility to test to beyond harmon-ics and flicker emission. The fully programmable AC power source with arbitrary waveform generation capability can be used in standalone mode in various applications for IEC 61000-4-X testing at pre or full-compliance. The ProfLine system has built in IEC 61000-4-13 immunity testing to harmonics and inter-harmonics standard which sets this system apart as a fully equipped test station for power quality.IEC 61000-4-8: Power frequency magnetic field immunity. Using the power source built into the ProfLine 2100 system the frequency and test level can be accurately controlled. This is ideal if your target market uses a different mains system to your local supply.Loop antenna, interface unit and control software (WIN 2120) are available as options.IEC 61000-4-11: AC Voltage dips, short interruptions and variations. The 1–5 µs rise and fall time and the 500 amp inrush current requirements of the standard for voltage dips and interruptions mean that a power source alone cannot meet the standard.The NSG 2200 AC switch can switch between a power source and the mains supply within the required time enabling the user to meet both requirements.IEC 61000-4-13: Immunity to harmonics and inter-harmonics. ProfLine 2100’s built in sweep generator provides full compliance testing to IEC 61000-4-13. Simple pre-programmed test levels at various test classes makes testing simple. At a click of the start button the two digitally controlled generators superimpose harmonics and inter-harmonics up to the 40th harmonics order (2 kHz for 50 Hz and 2.4 kHz for 60 Hz). The programmable AC power source generates combination waveforms better known as the flat top, overswing and meister curve, tests individual harmonics, and does a sweep to check for resonance points. The user can then go back to those resonance frequencies and test again. The operator can record any unusual behaviour at the observation section which will be included in the report. Pass/fail decision will be determined by the user based on the evaluation of the EUT during the test.1415IEC 61000-4-14: Voltage Fluctuation. A simple screen allows the operator to select the levelof severity of test to be run and the desired nominal test voltage and frequency. All voltagefluctuation test parameters can be customized by the user as required, ensuring the ProfLine2100 fully meets the standard. During testing, the EUT load current is measured continuously tohelp the operator observe and diagnose potential unit failures.IEC 61000-4-17: Ripple on DC input power ports. The test sequence implemented by thistest consists of the application of an AC ripple of specified peak to peak value as a percentageof the DC voltage and at a frequency determined as a multiple of the AC Line frequency. Theripple waveform consists of a sinusoidal linear waveshape. The user selectable severity levelscan easily meet the multiple of the power frequency of 1, 2, 3, 6 and at the user specified levelup to a staggering 20 times the power frequency at 25% Vdc-peak-peak.IEC 61000-4-27: Voltage and phase unbalance. This test is only for three-phase systemsas it involves voltage and phase unbalance between phases of a three phase supply network.Voltage unbalances are applied at different levels depending on product categories. The usermust determine the product class and select the appropriate test level. During the test run,voltage and phase changes are applied. The voltage levels and phase shifts are determined bythe values set in the data entry grid. Predefined test level are also provided to help the operatorwith the settings.Note: The ProfLine 2100 does not fully meet the IEC 61000-4-27 in respect of this particular test,1–5 µs rise fall rate not achievable and maximum output voltage is 300 V. So whilst it can meetthe 110% of U nom required by the product standards (110% of 230 V is 253 V) it does not reachthe 150% of U nom mentioned in the equipment standard (150% of 230 V is 345 V). 45 kVA unitshave a 400 Volt option.16IEC 61000-4-28: Frequency variation. The system provides an open field for the operator toenter the amount of frequency variation or simply load and amend the predefined tests levelprovided. Test parameters for the duration and frequency deviation can be easily customized,enabling ProfLine 2100 to meet this standard should there be changes to it in the future.IEC 61000-4-29: dC dips, variations and short interruptions. Pre-compliance test for DCvoltage dips can be set up quickly using the software. The test sequence implemented by this testconsists of a series of DC voltage dips (to less than DC nominal) or interruptions (dip to 0 V). It isalso possible to select voltage variations which cause the DC voltage to change at a programmedrate to a specified level and then return at the same or a different rate to the nominal DC level.These dips and variations can be applied at different levels and durations for different productcategories. The user must determine the product class and select the appropriate test file. Theselected levels and durations are visible on screen and can be edited and saved to a new setup fileif needed. This allows a library of test files for specific product categories to be created. Accordingto the standard, the use of a test generator with higher or lower voltage or current capability isallowed provided that the other specifications are preserved. The test generator steady statepower/current capability shall be at least 20% greater than the EUT power/current ratings.This means that for many EUT’s a 25 A capable generator is not needed. However, since the riseand fall time requirements may not be met under all circumstances, this is a pre-compliancetest only.IEC 61000-4-34: AC Voltage dips, short interruptions and variations. Similar to IEC61000-4-11 but applying to equipment requiring greater than 16 amps per phase, this standardcan be met by the higher power models in the range. Teseq is ready to advise you on the idealconfiguration and to discuss the limitations on the maximum current due to the selection of thevarious units in the system.SYSTEM SELECTION ChART1Requires option 2/32Current limited by source to 37 amps at 230 volts3Current limited by source to 62 amps at 230 volts4Requires option 8 (100 A/m continuous field)5Requires option 8 (100 A/m continuous field and 300 a/m for 3 seconds)6Requires option 117Pre-Compliance only, generator is not fully compliant with all aspects of the standard 816 to 37 amps at 230 volts916 to 62 amps at 230 volts PL 2115 plus option 11-3* Figures quoted are the maximum current available from the system. The current limit is in some cases due to the source and in some cases due to other equipment in the system. For information on the maximum power available from the sources please contact your local Teseq office.PL 2103/PL 210517Specifications subject to change without notice.All trademarks recognized.Teseq is an ISO-registered company. Its products are designed and manufactured under the strict quality and environmental requirements of the ISO 9001. This document has been carefully checked. However, Teseq does not assume any liability for errors, inaccuracies or changes due to technical developments.。

NI PXI定时与同步模块说明书

NI PXI定时与同步模块说明书

CONTENTSPXI Timing and Synchronization Modules Detailed View of PXIe-6674TKey FeaturesNI-Sync Application Programming Interface (API) Platform-Based Approach to Test and Measurement PXI InstrumentationHardware ServicesPXI Timing and Synchronization Modules PXIe-6674T, PXIe-6672, PXI-6683 and PXI-6683H•Generate high-stability PXI system reference clocks and high-resolution sample clocks •Minimize skew through access to PXI-star and PXIe-Dstar chassis trigger lines •Import and export system reference clocks for synchronization between multiple chassis orexternal devices •Achieve synchronization over large distance through GPS, IEEE 1588,IRIG-B or PPS•Develop advanced timing and sync applications with NI-Sync and NI-TClk softwarePowerful, Reliable Timing and SynchronizationNI’s PXI timing and synchronization modules enable a higher level of synchronization on the PXI platform through high-stability clocks, high-precision triggering and advanced signal routing. Implementing timing and synchronization hardware can vastly improve the accuracy of measurements, provide advanced triggering schemes, and allow synchronization of multiple devices for extremely high-channel-count applications. NI’s portfolio includes both signal-based and time-based solutions to deliver the advantages of synchronization to numerous applications.Table 1. NI offers various PXI modules to meet a range of timing and synchronization requirements.*Accuracy within one year of calibration adjustment within 0 ºC and 55 ºC operating temperature rangeDetailed View of PXIe-6674TSlot Compatibility PXI Timing or Peripheral Slot PXI or PXIe Hybrid Peripheral Slot PXIe System TimingSlot PXIe System TimingSlot Oscillator Accuracy*TCXO / 3.5 ppm TCXO / 3.5 ppm TCXO / 3.5 ppm OCXO / 80 ppb DDS Clock Generation Range Not available Not available DC to 105 MHz 0.3 Hz to 1 GHzDDS Clock Generation Resolution Not availableNot available0.075 Hz2.84 µHzPXI 10MHz Backplane Clock Override ● ● ● Clock Import Capability ● ● ● Clock Export Capability● ● ● ● Time-Based Synchronization (GPS, IEEE 1588, IRIG-B, PPS)● ● PXI Trigger Access (PXI_TRIG) ● ● ● ● PXI-Star Trigger Access (PXI_STAR) ●● ● PXIe-Dstar Trigger Access (PXI_DSTARA/B/C)● Front Panel Physical Connectors SMB, RJ45SMB, RJ45SMB SMA PFI Lines on Front Panel3366Key FeaturesHigh-Stability, High-Accuracy Onboard ClockApplications requiring highly reliable and consistent clock signals require a highly stable oscillator to avoid clock inaccuracies. For an NI PXI Express chassis, the oscillator is accurate to 25 parts per million (ppm). Inserting an NI PXI timing and synchronization module into the system timing slot of the chassis enables the user to replace this backplane system reference clock using the higher accuracy oscillator of the module. The PXIe-6672 and PXI-6683 modules contain a temperature-compensated crystal oscillator (TCXO) which can achieve accuracies better than 4 ppm. The PXIe-6674T features an oven-controlled crystal oscillator (OCXO) with an accuracy of 80 parts-per-billion (ppb). Note that the PXI-6683H contains the same oscillator as the PXI-6683, but due to its hybrid connectivity is not able to override the backplane clock.Figure 1.By referencing the OCXO on the PXIe-6674T, the 10 MHz backplane clock of a PXI chassis achieves muchlower phase noise and thus more clock stability.PXI modular instruments with phased-lock loop circuits, such as high-speed digitizers and waveform generators, can take advantage of the high-precision clock of timing and synchronization modules. When locking to a high-accuracy reference clock, the instrument inherits the accuracy of the clock, achieving sample clock resolutions as low as 0.5 Hz with an OCXO-based module.Skew Reduction with Star and Differential Star LinesDue to the variation in signal path lengths between slots in a PXI chassis, skew may be introduced when sending clocks or triggers to multiple slot destinations over the PXI trigger bus. To address this, all NI PXI chassis also include trace-length-matched star trigger lines accessible from a timing and synchronization module in the system timing slot. Star trigger lines can reduce skew to a maximum of 1 ns. Additionally, PXI Express chassis include differential star trigger lines capable of minimizing slot-to-slot skew to under 150 ps.Figure 2.While every slot of the PXI backplane may access the PXI trigger bus, the star trigger lines and differential star trigger lines are only accessible through the system timing slot.Time-Based Synchronization with GPS, IEEE 1588, IRIG-B or PPSThe NI PXI-6683 and PXI-6683H timing and synchronization modules synchronize PXI and PXI Express systems through time-based technology or protocols. Time-based modules can generate triggers and clock signals at programmable future times and timestamp input events with the synchronized system time including that of real-time systems. For PXI Express systems requiring time-based synchronization with backplane clock discipline or star trigger access, the PXI-6683H can be combined with the PXIe- 6674T or PXIe-6672 to provide a full-featured synchronization solution.Advanced Routing of Clocks and TriggersUsing a PXI timing and synchronization module provides the capability of advanced routing of clock and trigger signals. Through the combination of system timing slot access and FPGA-based routing, many more source-to-destination routes become possible, allowing more flexible designs and efficient use of system resources.Table 2. The PXIe-6674T timing and synchronization module features a wide vaiety of source-to-destination routes bycombining the power of the PXI Express architecture with the signal-routing capabilities of the onboard FPGA.● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ● ●●●●●●●NI-Sync Application Programming Interface (API)The NI-Sync driver allows configuration of system timing and synchronization through LabVIEW, C, or .NET. This includes signal-based synchronization, such as sharing triggers and clocks to be used directly, or time-based synchronization, using time protocols such as IEEE-1588, IRIG, or GPS for non-tethered systems. NI-Sync is designed for use with other NI drivers, such as NI-DAQmx, for advanced timing, high channel count, distributed or multiple-instrument applications.DestinationS o u r c ePlatform-Based Approach to Test and MeasurementWhat Is PXI?Powered by software, PXI is a rugged PC-based platform for measurement and automation systems. PXI combines PCI electrical-bus features with the modular, Eurocard packaging of CompactPCI and then adds specialized synchronization buses and key software features. PXI is both a high-performance and low-cost deployment platform for applications such as manufacturing test, military and aerospace, machine monitoring, automotive, and industrial test. Developed in 1997 and launched in 1998, PXI is an open industry standard governed by the PXI Systems Alliance (PXISA), a group of more than 70 companies chartered to promote the PXI standard, ensure interoperability, and maintain the PXI specification.Integrating the Latest Commercial TechnologyBy leveraging the latest commercial technology for our products, we can continually deliver high-performance and high-quality products to our users at a competitive price. The latest PCI Express Gen 3 switches deliver higher data throughput, the latest Intel multicore processors facilitate faster and more efficient parallel (multisite) testing, the latest FPGAs from Xilinx help to push signal processing algorithms to the edge to accelerate measurements, and the latest data converters from TI and ADI continuallyincrease the measurement range and performance of our instrumentation.PXI InstrumentationNI offers more than 600 different PXI modules ranging from DC to mmWave. Because PXI is an open industry standard, nearly 1,500 products are available from more than 70 different instrument vendors. With standard processing and control functions designated to a controller, PXI instruments need to contain only the actual instrumentation circuitry, which provides effective performance in a small footprint. Combined with a chassis and controller, PXI systems feature high-throughput data movement using PCI Express bus interfaces and sub-nanosecond synchronization with integrated timing and triggering.OscilloscopesSample at speeds up to 12.5 GS/s with 5 GHz of analog bandwidth, featuring numerous triggering modes and deep onboard memoryDigital InstrumentsPerform characterization and production test of semiconductor devices with timing sets and per channel pin parametric measurement unit (PPMU)Frequency Counters Perform counter timer tasks such as event counting and encoder position, period, pulse, and frequency measurementsPower Supplies & Loads Supply programmable DC power, with some modules including isolated channels, output disconnect functionality, and remote senseSwitches (Matrix & MUX) Feature a variety of relay types and row/column configurations to simplify wiring in automated test systemsGPIB, Serial, & Ethernet Integrate non-PXI instruments into a PXI system through various instrument control interfaces Digital MultimetersPerform voltage (up to 1000 V), current (up to 3A), resistance, inductance, capacitance, and frequency/period measurements, as well as diode testsWaveform Generators Generate standard functions including sine, square, triangle, and ramp as well as user-defined, arbitrary waveformsSource Measure Units Combine high-precision source and measure capability with high channel density, deterministic hardware sequencing, and SourceAdapt transient optimizationFlexRIO Custom Instruments & Processing Provide high-performance I/O and powerful FPGAs for applications that require more than standard instruments can offerVector Signal Transceivers Combine a vector signal generator and vector signal analyzer with FPGA-based, real-time signal processing and controlData Acquisition Modules Provide a mix of analog I/O, digital I/O, counter/timer, and trigger functionality for measuring electricalor physical phenomena©2019 National Instruments. All rights reserved. LabVIEW, National Instruments, NI, NI TestStand, and are trademarks of National Instruments. Other product and company names listed are trademarks or trade names of their respective companies. The contents of this Site could contain technical inaccuracies, typographical errors or out-of-date information. Information may be updated or changed at any time, without notice. Visit /manuals for the latest information. Hardware ServicesAll NI hardware includes a one-year warranty for basic repair coverage, and calibration in adherence to NI specifications prior to shipment. PXI Systems also include basic assembly and a functional test. NI offers additional entitlements to improve uptime and lower maintenance costs with service programs for hardware. Learn more at /services/hardware .Program Duration 3 or 5 years3 or 5 years Length of service programExtended Repair Coverage●●NI restores your device’s functionality and includes firmware updates and factory calibration.SystemConfiguration,Assembly, and Test 1 ● ●NI technicians assemble, install software in, and test your system per your custom configuration prior to shipment.Advanced Replacement 2 ●NI stocks replacement hardware that can be shipped immediately if a repair is needed.System Return MaterialAuthorization (RMA)1 ●NI accepts the delivery of fully assembled systems when performing repair services.Calibration Plan (Optional) Standard Expedited 3NI performs the requested level of calibration at the specified calibration interval for the duration of the service program.1This option is only available for PXI, CompactRIO, and CompactDAQ systems.2This option is not available for all products in all countries. Contact your local NI sales engineer to confirm availability. 3Expedited calibration only includes traceable levels.PremiumPlus Service ProgramNI can customize the offerings listed above, or offer additional entitlements such as on-site calibration, custom sparing, and life-cycle services through a PremiumPlus Service Program. Contact your NI sales representative to learn more.Technical SupportEvery NI system includes a 30-day trial for phone and e-mail support from NI engineers, which can be extended through a Software Service Program (SSP) membership. NI has more than 400 support engineers available around the globe to provide local support in more than 30 languages. Additionally, take advantage of NI’s award winning online resources and communities .。

3GPP TS 36.331 V13.2.0 (2016-06)

3GPP TS 36.331 V13.2.0 (2016-06)

3GPP TS 36.331 V13.2.0 (2016-06)Technical Specification3rd Generation Partnership Project;Technical Specification Group Radio Access Network;Evolved Universal Terrestrial Radio Access (E-UTRA);Radio Resource Control (RRC);Protocol specification(Release 13)The present document has been developed within the 3rd Generation Partnership Project (3GPP TM) and may be further elaborated for the purposes of 3GPP. The present document has not been subject to any approval process by the 3GPP Organizational Partners and shall not be implemented.This Specification is provided for future development work within 3GPP only. The Organizational Partners accept no liability for any use of this Specification. Specifications and reports for implementation of the 3GPP TM system should be obtained via the 3GPP Organizational Partners' Publications Offices.KeywordsUMTS, radio3GPPPostal address3GPP support office address650 Route des Lucioles - Sophia AntipolisValbonne - FRANCETel.: +33 4 92 94 42 00 Fax: +33 4 93 65 47 16InternetCopyright NotificationNo part may be reproduced except as authorized by written permission.The copyright and the foregoing restriction extend to reproduction in all media.© 2016, 3GPP Organizational Partners (ARIB, ATIS, CCSA, ETSI, TSDSI, TTA, TTC).All rights reserved.UMTS™ is a Trade Mark of ETSI registered for the benefit of its members3GPP™ is a Trade Mark of ETSI registered for the benefit of its Members and of the 3GPP Organizational PartnersLTE™ is a Trade Mark of ETSI currently being registered for the benefit of its Members and of the 3GPP Organizational Partners GSM® and the GSM logo are registered and owned by the GSM AssociationBluetooth® is a Trade Mark of the Bluetooth SIG registered for the benefit of its membersContentsForeword (18)1Scope (19)2References (19)3Definitions, symbols and abbreviations (22)3.1Definitions (22)3.2Abbreviations (24)4General (27)4.1Introduction (27)4.2Architecture (28)4.2.1UE states and state transitions including inter RAT (28)4.2.2Signalling radio bearers (29)4.3Services (30)4.3.1Services provided to upper layers (30)4.3.2Services expected from lower layers (30)4.4Functions (30)5Procedures (32)5.1General (32)5.1.1Introduction (32)5.1.2General requirements (32)5.2System information (33)5.2.1Introduction (33)5.2.1.1General (33)5.2.1.2Scheduling (34)5.2.1.2a Scheduling for NB-IoT (34)5.2.1.3System information validity and notification of changes (35)5.2.1.4Indication of ETWS notification (36)5.2.1.5Indication of CMAS notification (37)5.2.1.6Notification of EAB parameters change (37)5.2.1.7Access Barring parameters change in NB-IoT (37)5.2.2System information acquisition (38)5.2.2.1General (38)5.2.2.2Initiation (38)5.2.2.3System information required by the UE (38)5.2.2.4System information acquisition by the UE (39)5.2.2.5Essential system information missing (42)5.2.2.6Actions upon reception of the MasterInformationBlock message (42)5.2.2.7Actions upon reception of the SystemInformationBlockType1 message (42)5.2.2.8Actions upon reception of SystemInformation messages (44)5.2.2.9Actions upon reception of SystemInformationBlockType2 (44)5.2.2.10Actions upon reception of SystemInformationBlockType3 (45)5.2.2.11Actions upon reception of SystemInformationBlockType4 (45)5.2.2.12Actions upon reception of SystemInformationBlockType5 (45)5.2.2.13Actions upon reception of SystemInformationBlockType6 (45)5.2.2.14Actions upon reception of SystemInformationBlockType7 (45)5.2.2.15Actions upon reception of SystemInformationBlockType8 (45)5.2.2.16Actions upon reception of SystemInformationBlockType9 (46)5.2.2.17Actions upon reception of SystemInformationBlockType10 (46)5.2.2.18Actions upon reception of SystemInformationBlockType11 (46)5.2.2.19Actions upon reception of SystemInformationBlockType12 (47)5.2.2.20Actions upon reception of SystemInformationBlockType13 (48)5.2.2.21Actions upon reception of SystemInformationBlockType14 (48)5.2.2.22Actions upon reception of SystemInformationBlockType15 (48)5.2.2.23Actions upon reception of SystemInformationBlockType16 (48)5.2.2.24Actions upon reception of SystemInformationBlockType17 (48)5.2.2.25Actions upon reception of SystemInformationBlockType18 (48)5.2.2.26Actions upon reception of SystemInformationBlockType19 (49)5.2.3Acquisition of an SI message (49)5.2.3a Acquisition of an SI message by BL UE or UE in CE or a NB-IoT UE (50)5.3Connection control (50)5.3.1Introduction (50)5.3.1.1RRC connection control (50)5.3.1.2Security (52)5.3.1.2a RN security (53)5.3.1.3Connected mode mobility (53)5.3.1.4Connection control in NB-IoT (54)5.3.2Paging (55)5.3.2.1General (55)5.3.2.2Initiation (55)5.3.2.3Reception of the Paging message by the UE (55)5.3.3RRC connection establishment (56)5.3.3.1General (56)5.3.3.1a Conditions for establishing RRC Connection for sidelink communication/ discovery (58)5.3.3.2Initiation (59)5.3.3.3Actions related to transmission of RRCConnectionRequest message (63)5.3.3.3a Actions related to transmission of RRCConnectionResumeRequest message (64)5.3.3.4Reception of the RRCConnectionSetup by the UE (64)5.3.3.4a Reception of the RRCConnectionResume by the UE (66)5.3.3.5Cell re-selection while T300, T302, T303, T305, T306, or T308 is running (68)5.3.3.6T300 expiry (68)5.3.3.7T302, T303, T305, T306, or T308 expiry or stop (69)5.3.3.8Reception of the RRCConnectionReject by the UE (70)5.3.3.9Abortion of RRC connection establishment (71)5.3.3.10Handling of SSAC related parameters (71)5.3.3.11Access barring check (72)5.3.3.12EAB check (73)5.3.3.13Access barring check for ACDC (73)5.3.3.14Access Barring check for NB-IoT (74)5.3.4Initial security activation (75)5.3.4.1General (75)5.3.4.2Initiation (76)5.3.4.3Reception of the SecurityModeCommand by the UE (76)5.3.5RRC connection reconfiguration (77)5.3.5.1General (77)5.3.5.2Initiation (77)5.3.5.3Reception of an RRCConnectionReconfiguration not including the mobilityControlInfo by theUE (77)5.3.5.4Reception of an RRCConnectionReconfiguration including the mobilityControlInfo by the UE(handover) (79)5.3.5.5Reconfiguration failure (83)5.3.5.6T304 expiry (handover failure) (83)5.3.5.7Void (84)5.3.5.7a T307 expiry (SCG change failure) (84)5.3.5.8Radio Configuration involving full configuration option (84)5.3.6Counter check (86)5.3.6.1General (86)5.3.6.2Initiation (86)5.3.6.3Reception of the CounterCheck message by the UE (86)5.3.7RRC connection re-establishment (87)5.3.7.1General (87)5.3.7.2Initiation (87)5.3.7.3Actions following cell selection while T311 is running (88)5.3.7.4Actions related to transmission of RRCConnectionReestablishmentRequest message (89)5.3.7.5Reception of the RRCConnectionReestablishment by the UE (89)5.3.7.6T311 expiry (91)5.3.7.7T301 expiry or selected cell no longer suitable (91)5.3.7.8Reception of RRCConnectionReestablishmentReject by the UE (91)5.3.8RRC connection release (92)5.3.8.1General (92)5.3.8.2Initiation (92)5.3.8.3Reception of the RRCConnectionRelease by the UE (92)5.3.8.4T320 expiry (93)5.3.9RRC connection release requested by upper layers (93)5.3.9.1General (93)5.3.9.2Initiation (93)5.3.10Radio resource configuration (93)5.3.10.0General (93)5.3.10.1SRB addition/ modification (94)5.3.10.2DRB release (95)5.3.10.3DRB addition/ modification (95)5.3.10.3a1DC specific DRB addition or reconfiguration (96)5.3.10.3a2LWA specific DRB addition or reconfiguration (98)5.3.10.3a3LWIP specific DRB addition or reconfiguration (98)5.3.10.3a SCell release (99)5.3.10.3b SCell addition/ modification (99)5.3.10.3c PSCell addition or modification (99)5.3.10.4MAC main reconfiguration (99)5.3.10.5Semi-persistent scheduling reconfiguration (100)5.3.10.6Physical channel reconfiguration (100)5.3.10.7Radio Link Failure Timers and Constants reconfiguration (101)5.3.10.8Time domain measurement resource restriction for serving cell (101)5.3.10.9Other configuration (102)5.3.10.10SCG reconfiguration (103)5.3.10.11SCG dedicated resource configuration (104)5.3.10.12Reconfiguration SCG or split DRB by drb-ToAddModList (105)5.3.10.13Neighbour cell information reconfiguration (105)5.3.10.14Void (105)5.3.10.15Sidelink dedicated configuration (105)5.3.10.16T370 expiry (106)5.3.11Radio link failure related actions (107)5.3.11.1Detection of physical layer problems in RRC_CONNECTED (107)5.3.11.2Recovery of physical layer problems (107)5.3.11.3Detection of radio link failure (107)5.3.12UE actions upon leaving RRC_CONNECTED (109)5.3.13UE actions upon PUCCH/ SRS release request (110)5.3.14Proximity indication (110)5.3.14.1General (110)5.3.14.2Initiation (111)5.3.14.3Actions related to transmission of ProximityIndication message (111)5.3.15Void (111)5.4Inter-RAT mobility (111)5.4.1Introduction (111)5.4.2Handover to E-UTRA (112)5.4.2.1General (112)5.4.2.2Initiation (112)5.4.2.3Reception of the RRCConnectionReconfiguration by the UE (112)5.4.2.4Reconfiguration failure (114)5.4.2.5T304 expiry (handover to E-UTRA failure) (114)5.4.3Mobility from E-UTRA (114)5.4.3.1General (114)5.4.3.2Initiation (115)5.4.3.3Reception of the MobilityFromEUTRACommand by the UE (115)5.4.3.4Successful completion of the mobility from E-UTRA (116)5.4.3.5Mobility from E-UTRA failure (117)5.4.4Handover from E-UTRA preparation request (CDMA2000) (117)5.4.4.1General (117)5.4.4.2Initiation (118)5.4.4.3Reception of the HandoverFromEUTRAPreparationRequest by the UE (118)5.4.5UL handover preparation transfer (CDMA2000) (118)5.4.5.1General (118)5.4.5.2Initiation (118)5.4.5.3Actions related to transmission of the ULHandoverPreparationTransfer message (119)5.4.5.4Failure to deliver the ULHandoverPreparationTransfer message (119)5.4.6Inter-RAT cell change order to E-UTRAN (119)5.4.6.1General (119)5.4.6.2Initiation (119)5.4.6.3UE fails to complete an inter-RAT cell change order (119)5.5Measurements (120)5.5.1Introduction (120)5.5.2Measurement configuration (121)5.5.2.1General (121)5.5.2.2Measurement identity removal (122)5.5.2.2a Measurement identity autonomous removal (122)5.5.2.3Measurement identity addition/ modification (123)5.5.2.4Measurement object removal (124)5.5.2.5Measurement object addition/ modification (124)5.5.2.6Reporting configuration removal (126)5.5.2.7Reporting configuration addition/ modification (127)5.5.2.8Quantity configuration (127)5.5.2.9Measurement gap configuration (127)5.5.2.10Discovery signals measurement timing configuration (128)5.5.2.11RSSI measurement timing configuration (128)5.5.3Performing measurements (128)5.5.3.1General (128)5.5.3.2Layer 3 filtering (131)5.5.4Measurement report triggering (131)5.5.4.1General (131)5.5.4.2Event A1 (Serving becomes better than threshold) (135)5.5.4.3Event A2 (Serving becomes worse than threshold) (136)5.5.4.4Event A3 (Neighbour becomes offset better than PCell/ PSCell) (136)5.5.4.5Event A4 (Neighbour becomes better than threshold) (137)5.5.4.6Event A5 (PCell/ PSCell becomes worse than threshold1 and neighbour becomes better thanthreshold2) (138)5.5.4.6a Event A6 (Neighbour becomes offset better than SCell) (139)5.5.4.7Event B1 (Inter RAT neighbour becomes better than threshold) (139)5.5.4.8Event B2 (PCell becomes worse than threshold1 and inter RAT neighbour becomes better thanthreshold2) (140)5.5.4.9Event C1 (CSI-RS resource becomes better than threshold) (141)5.5.4.10Event C2 (CSI-RS resource becomes offset better than reference CSI-RS resource) (141)5.5.4.11Event W1 (WLAN becomes better than a threshold) (142)5.5.4.12Event W2 (All WLAN inside WLAN mobility set becomes worse than threshold1 and a WLANoutside WLAN mobility set becomes better than threshold2) (142)5.5.4.13Event W3 (All WLAN inside WLAN mobility set becomes worse than a threshold) (143)5.5.5Measurement reporting (144)5.5.6Measurement related actions (148)5.5.6.1Actions upon handover and re-establishment (148)5.5.6.2Speed dependant scaling of measurement related parameters (149)5.5.7Inter-frequency RSTD measurement indication (149)5.5.7.1General (149)5.5.7.2Initiation (150)5.5.7.3Actions related to transmission of InterFreqRSTDMeasurementIndication message (150)5.6Other (150)5.6.0General (150)5.6.1DL information transfer (151)5.6.1.1General (151)5.6.1.2Initiation (151)5.6.1.3Reception of the DLInformationTransfer by the UE (151)5.6.2UL information transfer (151)5.6.2.1General (151)5.6.2.2Initiation (151)5.6.2.3Actions related to transmission of ULInformationTransfer message (152)5.6.2.4Failure to deliver ULInformationTransfer message (152)5.6.3UE capability transfer (152)5.6.3.1General (152)5.6.3.2Initiation (153)5.6.3.3Reception of the UECapabilityEnquiry by the UE (153)5.6.4CSFB to 1x Parameter transfer (157)5.6.4.1General (157)5.6.4.2Initiation (157)5.6.4.3Actions related to transmission of CSFBParametersRequestCDMA2000 message (157)5.6.4.4Reception of the CSFBParametersResponseCDMA2000 message (157)5.6.5UE Information (158)5.6.5.1General (158)5.6.5.2Initiation (158)5.6.5.3Reception of the UEInformationRequest message (158)5.6.6 Logged Measurement Configuration (159)5.6.6.1General (159)5.6.6.2Initiation (160)5.6.6.3Reception of the LoggedMeasurementConfiguration by the UE (160)5.6.6.4T330 expiry (160)5.6.7 Release of Logged Measurement Configuration (160)5.6.7.1General (160)5.6.7.2Initiation (160)5.6.8 Measurements logging (161)5.6.8.1General (161)5.6.8.2Initiation (161)5.6.9In-device coexistence indication (163)5.6.9.1General (163)5.6.9.2Initiation (164)5.6.9.3Actions related to transmission of InDeviceCoexIndication message (164)5.6.10UE Assistance Information (165)5.6.10.1General (165)5.6.10.2Initiation (166)5.6.10.3Actions related to transmission of UEAssistanceInformation message (166)5.6.11 Mobility history information (166)5.6.11.1General (166)5.6.11.2Initiation (166)5.6.12RAN-assisted WLAN interworking (167)5.6.12.1General (167)5.6.12.2Dedicated WLAN offload configuration (167)5.6.12.3WLAN offload RAN evaluation (167)5.6.12.4T350 expiry or stop (167)5.6.12.5Cell selection/ re-selection while T350 is running (168)5.6.13SCG failure information (168)5.6.13.1General (168)5.6.13.2Initiation (168)5.6.13.3Actions related to transmission of SCGFailureInformation message (168)5.6.14LTE-WLAN Aggregation (169)5.6.14.1Introduction (169)5.6.14.2Reception of LWA configuration (169)5.6.14.3Release of LWA configuration (170)5.6.15WLAN connection management (170)5.6.15.1Introduction (170)5.6.15.2WLAN connection status reporting (170)5.6.15.2.1General (170)5.6.15.2.2Initiation (171)5.6.15.2.3Actions related to transmission of WLANConnectionStatusReport message (171)5.6.15.3T351 Expiry (WLAN connection attempt timeout) (171)5.6.15.4WLAN status monitoring (171)5.6.16RAN controlled LTE-WLAN interworking (172)5.6.16.1General (172)5.6.16.2WLAN traffic steering command (172)5.6.17LTE-WLAN aggregation with IPsec tunnel (173)5.6.17.1General (173)5.7Generic error handling (174)5.7.1General (174)5.7.2ASN.1 violation or encoding error (174)5.7.3Field set to a not comprehended value (174)5.7.4Mandatory field missing (174)5.7.5Not comprehended field (176)5.8MBMS (176)5.8.1Introduction (176)5.8.1.1General (176)5.8.1.2Scheduling (176)5.8.1.3MCCH information validity and notification of changes (176)5.8.2MCCH information acquisition (178)5.8.2.1General (178)5.8.2.2Initiation (178)5.8.2.3MCCH information acquisition by the UE (178)5.8.2.4Actions upon reception of the MBSFNAreaConfiguration message (178)5.8.2.5Actions upon reception of the MBMSCountingRequest message (179)5.8.3MBMS PTM radio bearer configuration (179)5.8.3.1General (179)5.8.3.2Initiation (179)5.8.3.3MRB establishment (179)5.8.3.4MRB release (179)5.8.4MBMS Counting Procedure (179)5.8.4.1General (179)5.8.4.2Initiation (180)5.8.4.3Reception of the MBMSCountingRequest message by the UE (180)5.8.5MBMS interest indication (181)5.8.5.1General (181)5.8.5.2Initiation (181)5.8.5.3Determine MBMS frequencies of interest (182)5.8.5.4Actions related to transmission of MBMSInterestIndication message (183)5.8a SC-PTM (183)5.8a.1Introduction (183)5.8a.1.1General (183)5.8a.1.2SC-MCCH scheduling (183)5.8a.1.3SC-MCCH information validity and notification of changes (183)5.8a.1.4Procedures (184)5.8a.2SC-MCCH information acquisition (184)5.8a.2.1General (184)5.8a.2.2Initiation (184)5.8a.2.3SC-MCCH information acquisition by the UE (184)5.8a.2.4Actions upon reception of the SCPTMConfiguration message (185)5.8a.3SC-PTM radio bearer configuration (185)5.8a.3.1General (185)5.8a.3.2Initiation (185)5.8a.3.3SC-MRB establishment (185)5.8a.3.4SC-MRB release (185)5.9RN procedures (186)5.9.1RN reconfiguration (186)5.9.1.1General (186)5.9.1.2Initiation (186)5.9.1.3Reception of the RNReconfiguration by the RN (186)5.10Sidelink (186)5.10.1Introduction (186)5.10.1a Conditions for sidelink communication operation (187)5.10.2Sidelink UE information (188)5.10.2.1General (188)5.10.2.2Initiation (189)5.10.2.3Actions related to transmission of SidelinkUEInformation message (193)5.10.3Sidelink communication monitoring (195)5.10.6Sidelink discovery announcement (198)5.10.6a Sidelink discovery announcement pool selection (201)5.10.6b Sidelink discovery announcement reference carrier selection (201)5.10.7Sidelink synchronisation information transmission (202)5.10.7.1General (202)5.10.7.2Initiation (203)5.10.7.3Transmission of SLSS (204)5.10.7.4Transmission of MasterInformationBlock-SL message (205)5.10.7.5Void (206)5.10.8Sidelink synchronisation reference (206)5.10.8.1General (206)5.10.8.2Selection and reselection of synchronisation reference UE (SyncRef UE) (206)5.10.9Sidelink common control information (207)5.10.9.1General (207)5.10.9.2Actions related to reception of MasterInformationBlock-SL message (207)5.10.10Sidelink relay UE operation (207)5.10.10.1General (207)5.10.10.2AS-conditions for relay related sidelink communication transmission by sidelink relay UE (207)5.10.10.3AS-conditions for relay PS related sidelink discovery transmission by sidelink relay UE (208)5.10.10.4Sidelink relay UE threshold conditions (208)5.10.11Sidelink remote UE operation (208)5.10.11.1General (208)5.10.11.2AS-conditions for relay related sidelink communication transmission by sidelink remote UE (208)5.10.11.3AS-conditions for relay PS related sidelink discovery transmission by sidelink remote UE (209)5.10.11.4Selection and reselection of sidelink relay UE (209)5.10.11.5Sidelink remote UE threshold conditions (210)6Protocol data units, formats and parameters (tabular & ASN.1) (210)6.1General (210)6.2RRC messages (212)6.2.1General message structure (212)–EUTRA-RRC-Definitions (212)–BCCH-BCH-Message (212)–BCCH-DL-SCH-Message (212)–BCCH-DL-SCH-Message-BR (213)–MCCH-Message (213)–PCCH-Message (213)–DL-CCCH-Message (214)–DL-DCCH-Message (214)–UL-CCCH-Message (214)–UL-DCCH-Message (215)–SC-MCCH-Message (215)6.2.2Message definitions (216)–CounterCheck (216)–CounterCheckResponse (217)–CSFBParametersRequestCDMA2000 (217)–CSFBParametersResponseCDMA2000 (218)–DLInformationTransfer (218)–HandoverFromEUTRAPreparationRequest (CDMA2000) (219)–InDeviceCoexIndication (220)–InterFreqRSTDMeasurementIndication (222)–LoggedMeasurementConfiguration (223)–MasterInformationBlock (225)–MBMSCountingRequest (226)–MBMSCountingResponse (226)–MBMSInterestIndication (227)–MBSFNAreaConfiguration (228)–MeasurementReport (228)–MobilityFromEUTRACommand (229)–Paging (232)–ProximityIndication (233)–RNReconfiguration (234)–RNReconfigurationComplete (234)–RRCConnectionReconfiguration (235)–RRCConnectionReconfigurationComplete (240)–RRCConnectionReestablishment (241)–RRCConnectionReestablishmentComplete (241)–RRCConnectionReestablishmentReject (242)–RRCConnectionReestablishmentRequest (243)–RRCConnectionReject (243)–RRCConnectionRelease (244)–RRCConnectionResume (248)–RRCConnectionResumeComplete (249)–RRCConnectionResumeRequest (250)–RRCConnectionRequest (250)–RRCConnectionSetup (251)–RRCConnectionSetupComplete (252)–SCGFailureInformation (253)–SCPTMConfiguration (254)–SecurityModeCommand (255)–SecurityModeComplete (255)–SecurityModeFailure (256)–SidelinkUEInformation (256)–SystemInformation (258)–SystemInformationBlockType1 (259)–UEAssistanceInformation (264)–UECapabilityEnquiry (265)–UECapabilityInformation (266)–UEInformationRequest (267)–UEInformationResponse (267)–ULHandoverPreparationTransfer (CDMA2000) (273)–ULInformationTransfer (274)–WLANConnectionStatusReport (274)6.3RRC information elements (275)6.3.1System information blocks (275)–SystemInformationBlockType2 (275)–SystemInformationBlockType3 (279)–SystemInformationBlockType4 (282)–SystemInformationBlockType5 (283)–SystemInformationBlockType6 (287)–SystemInformationBlockType7 (289)–SystemInformationBlockType8 (290)–SystemInformationBlockType9 (295)–SystemInformationBlockType10 (295)–SystemInformationBlockType11 (296)–SystemInformationBlockType12 (297)–SystemInformationBlockType13 (297)–SystemInformationBlockType14 (298)–SystemInformationBlockType15 (298)–SystemInformationBlockType16 (299)–SystemInformationBlockType17 (300)–SystemInformationBlockType18 (301)–SystemInformationBlockType19 (301)–SystemInformationBlockType20 (304)6.3.2Radio resource control information elements (304)–AntennaInfo (304)–AntennaInfoUL (306)–CQI-ReportConfig (307)–CQI-ReportPeriodicProcExtId (314)–CrossCarrierSchedulingConfig (314)–CSI-IM-Config (315)–CSI-IM-ConfigId (315)–CSI-RS-Config (317)–CSI-RS-ConfigEMIMO (318)–CSI-RS-ConfigNZP (319)–CSI-RS-ConfigNZPId (320)–CSI-RS-ConfigZP (321)–CSI-RS-ConfigZPId (321)–DMRS-Config (321)–DRB-Identity (322)–EPDCCH-Config (322)–EIMTA-MainConfig (324)–LogicalChannelConfig (325)–LWA-Configuration (326)–LWIP-Configuration (326)–RCLWI-Configuration (327)–MAC-MainConfig (327)–P-C-AndCBSR (332)–PDCCH-ConfigSCell (333)–PDCP-Config (334)–PDSCH-Config (337)–PDSCH-RE-MappingQCL-ConfigId (339)–PHICH-Config (339)–PhysicalConfigDedicated (339)–P-Max (344)–PRACH-Config (344)–PresenceAntennaPort1 (346)–PUCCH-Config (347)–PUSCH-Config (351)–RACH-ConfigCommon (355)–RACH-ConfigDedicated (357)–RadioResourceConfigCommon (358)–RadioResourceConfigDedicated (362)–RLC-Config (367)–RLF-TimersAndConstants (369)–RN-SubframeConfig (370)–SchedulingRequestConfig (371)–SoundingRS-UL-Config (372)–SPS-Config (375)–TDD-Config (376)–TimeAlignmentTimer (377)–TPC-PDCCH-Config (377)–TunnelConfigLWIP (378)–UplinkPowerControl (379)–WLAN-Id-List (382)–WLAN-MobilityConfig (382)6.3.3Security control information elements (382)–NextHopChainingCount (382)–SecurityAlgorithmConfig (383)–ShortMAC-I (383)6.3.4Mobility control information elements (383)–AdditionalSpectrumEmission (383)–ARFCN-ValueCDMA2000 (383)–ARFCN-ValueEUTRA (384)–ARFCN-ValueGERAN (384)–ARFCN-ValueUTRA (384)–BandclassCDMA2000 (384)–BandIndicatorGERAN (385)–CarrierFreqCDMA2000 (385)–CarrierFreqGERAN (385)–CellIndexList (387)–CellReselectionPriority (387)–CellSelectionInfoCE (387)–CellReselectionSubPriority (388)–CSFB-RegistrationParam1XRTT (388)–CellGlobalIdEUTRA (389)–CellGlobalIdUTRA (389)–CellGlobalIdGERAN (390)–CellGlobalIdCDMA2000 (390)–CellSelectionInfoNFreq (391)–CSG-Identity (391)–FreqBandIndicator (391)–MobilityControlInfo (391)–MobilityParametersCDMA2000 (1xRTT) (393)–MobilityStateParameters (394)–MultiBandInfoList (394)–NS-PmaxList (394)–PhysCellId (395)–PhysCellIdRange (395)–PhysCellIdRangeUTRA-FDDList (395)–PhysCellIdCDMA2000 (396)–PhysCellIdGERAN (396)–PhysCellIdUTRA-FDD (396)–PhysCellIdUTRA-TDD (396)–PLMN-Identity (397)–PLMN-IdentityList3 (397)–PreRegistrationInfoHRPD (397)–Q-QualMin (398)–Q-RxLevMin (398)–Q-OffsetRange (398)–Q-OffsetRangeInterRAT (399)–ReselectionThreshold (399)–ReselectionThresholdQ (399)–SCellIndex (399)–ServCellIndex (400)–SpeedStateScaleFactors (400)–SystemInfoListGERAN (400)–SystemTimeInfoCDMA2000 (401)–TrackingAreaCode (401)–T-Reselection (402)–T-ReselectionEUTRA-CE (402)6.3.5Measurement information elements (402)–AllowedMeasBandwidth (402)–CSI-RSRP-Range (402)–Hysteresis (402)–LocationInfo (403)–MBSFN-RSRQ-Range (403)–MeasConfig (404)–MeasDS-Config (405)–MeasGapConfig (406)–MeasId (407)–MeasIdToAddModList (407)–MeasObjectCDMA2000 (408)–MeasObjectEUTRA (408)–MeasObjectGERAN (412)–MeasObjectId (412)–MeasObjectToAddModList (412)–MeasObjectUTRA (413)–ReportConfigEUTRA (422)–ReportConfigId (425)–ReportConfigInterRAT (425)–ReportConfigToAddModList (428)–ReportInterval (429)–RSRP-Range (429)–RSRQ-Range (430)–RSRQ-Type (430)–RS-SINR-Range (430)–RSSI-Range-r13 (431)–TimeToTrigger (431)–UL-DelayConfig (431)–WLAN-CarrierInfo (431)–WLAN-RSSI-Range (432)–WLAN-Status (432)6.3.6Other information elements (433)–AbsoluteTimeInfo (433)–AreaConfiguration (433)–C-RNTI (433)–DedicatedInfoCDMA2000 (434)–DedicatedInfoNAS (434)–FilterCoefficient (434)–LoggingDuration (434)–LoggingInterval (435)–MeasSubframePattern (435)–MMEC (435)–NeighCellConfig (435)–OtherConfig (436)–RAND-CDMA2000 (1xRTT) (437)–RAT-Type (437)–ResumeIdentity (437)–RRC-TransactionIdentifier (438)–S-TMSI (438)–TraceReference (438)–UE-CapabilityRAT-ContainerList (438)–UE-EUTRA-Capability (439)–UE-RadioPagingInfo (469)–UE-TimersAndConstants (469)–VisitedCellInfoList (470)–WLAN-OffloadConfig (470)6.3.7MBMS information elements (472)–MBMS-NotificationConfig (472)–MBMS-ServiceList (473)–MBSFN-AreaId (473)–MBSFN-AreaInfoList (473)–MBSFN-SubframeConfig (474)–PMCH-InfoList (475)6.3.7a SC-PTM information elements (476)–SC-MTCH-InfoList (476)–SCPTM-NeighbourCellList (478)6.3.8Sidelink information elements (478)–SL-CommConfig (478)–SL-CommResourcePool (479)–SL-CP-Len (480)–SL-DiscConfig (481)–SL-DiscResourcePool (483)–SL-DiscTxPowerInfo (485)–SL-GapConfig (485)。

LanTEK II Universal Link Testing说明书

LanTEK II Universal Link Testing说明书

More Ways to SaveChannel and Permanent Link Testing with One AdapterOnly LanTEK allows permanent link and channel certification without changing adapters. The patented DualMODE™ function allows cabling to be certified to two different standards with one press of the Autotest button; half the time it would take with any other certifier.Certify cabling to both Category 6 permanent link and Category 6 channel link standards at the same time, satisfying requirements from cabling manufacturers and end users without costing any more time in the field. Or certify cabling to existing current standards and proposed future standards which eliminates retesting at a later date.Fast Test TimesCategory 5E certification in 11 seconds,Category 6 in 14 seconds, and Category6A in only 16 seconds with graphs! Plusenjoy fiber certification that’s 3x faster and10 gigabit alien crosstalk certificationthat’s 4x faster than the competition.Most Memory CapacityLanTEK II has 7x the storage capacityas competitive certifiers. Save anastonishing 1700 Category 6 resultswith graphs. If the memory fills, simplyoff-load the data to a USB flash drive forportability and er. The main test griddisplay can be customizedto display and sort byvirtually any test parameterallowing for quickidentification of tests thatare below desired performance margins. Quickly scan through plot data by choosing a plot type and scrolling through the test list to instantly refresh the plot for each test. This makes visually scanning through reports and searching for anomalies a breeze. IDC offers many reporting options such as detailed, brief, and single line reports, plus export data in XML, CSV and PDF formats. Plus the unique ability to customized the plots by inverting the scales, toggling linear or log frequencies and even adjusting colors makes IDC the most user friendly and powerful cable reporting software ever.FiberTEK® FDXTime Saving Fiber CertificationThe FiberTEK FDX option allows users to add full Tier 1, standards compliant fiber certification capability to the LanTEK II certifier. Tier 1 certification utilizes a light source and power meter to measure the power loss of optical cabling. FiberTEK FDX modules incorporate dual light sources and a wide range power meter to allow testing loss of fiber links as well as to measure the light emitted from active network equipment for troubleshooting.The full-duplex FiberTEK FDX represents the pinnacle of fiber optic certification, saving time and simplifying documentation by completely eliminating the need to swap launch cords or swap modules. The unique full-duplex operation tests a single strand of fiber at two wavelengths and in both directions, plus measures the length with one press of the Autotest button. This means that for each fiber, five test parameters are saved for each cable ID making it the easiest to use fiber certifier ever.Three types of FiberTEK FDX are available to suit every installation. Multi-mode (850/1300nm) kits are available with either LED light sources for10/100/1000Mbps certification, or VSCEL/laser sources with high dynamic range for certificationof links greater than 2kM in length. Single mode (1310/1550nm) kits feature laser sources as well. Combination multi-mode and single mode kits are available to further increase the FiberTEK FDX value. Simplified TestingUnlike other fiber certification add-ons that requireup to four separate testing steps to test eachfiber at both wavelengths and in both directions,FiberTEK FDX can accomplish this task in one easystep. FiberTEK FDX revolutionizes the whole fibercertification process by utilizing a sophisticated fullduplex optical module that lets each fiber be certifiedin one simple step with no reversing of patch cordsor swapping of optical modules. Four attenuationmeasurements plus length in one press of theAutotest button. The simplest way to certify fiber.FiberTEK® FDX KeyAdvantages• The only solution that completelyeliminates the need to swap fibers ormodules, allowing complete one-stepcertification of horizontal andbackbone cabling.• More than 2x as fast as any otherfiber certification tester• Complies to TIA/ISO/IEC certificationstandards• Available with both LED and VCSEL/laser multimode sources.• Real-time power meter to aid introubleshooting active equipment• Field changeable adapters (SC, ST,FC) eliminate the need to carrymultiple hybrid launch cordsFive results with one Autotest, the fastest fiber certification solutionavailableLanTEK IIHandset Dimensions Height/Width/Depth: 10in. x 5in. x 2.1in. (25.4cm/12.7cm/5.3cm) Handset weight w/battery Display: 2.4lbs/1.1kg; Remote: 2.3lbs/1.0kgBattery Lithium ion, 7.4VDC, 6.6AH; Input: 12V/2A DC; Typical operating time: 18 hours (new battery running a Cat6 test every 2.5 minutes, full backlight); Charge time: 4 hours quick charge with battery removed from handset, 6 hours inside handset.Input power Handset: DC 12-15V, 2A; Line/mains power: AC 110-240V, 50/60Hz Display 4.3” wide screen TFT, 480 x 272 pixel, 95 x 54mm viewable areaConnectivity Adapter port: 168 pin ultra low crosstalk, mini-USB device port, USB host port (display handset only), four pin serial port (service use only), 1/8” talkset jack, power/charging jack Frequency range LanTEK II-350: 1-350MHz, LanTEK II-500: 1-500MHz, LanTEK II-1000: 1-1000MHzMemory Non-volatile flash, storage capacity for 1700 TIA-Cat 6 tests with graphs. Tests can be copied to USB flash drive, up to 64GB.MeasurementsWire map, DC loop resistance length, capacitance, NEXT, insertion loss (formerly attenuation), ACR-N (formerly ACR), return loss, average impedance, propagation delay, delay skew, power sum NEXT, power sum ACR-N (formerly power sum ACR), ACR-F (formerly ELFEXT), power sum ACR-F (formerly power sum ELFEXT), alien crosstalk (with optional AXT testing kit)Length measurement 0-2000 ft.; 1 ft. resolution, +/-(3% + 3 ft.), distance to short/open reportedSupported cable typesTIA/EIA Category 3, 4, 5, 5E, 6 and 6A: 100ΩISO/IEC Class C, D, E, EA, F, FA: 100ΩCat 6/6A Class E/E A RJ-45 permanent link adapters: shielded and un-shielded cable, universal adapters provide channel, permanent link and basic link measurements.Supported connectors Additional adapters: GG45, ARJ45, TERA, EC7 (MMCPRO3000), Coax 50-75Ω (BNC connector), M12 industrialTone generator Integrated into display and remote handset, compatible with standard analog inductive probes, selectable tone (high/low/warble) 500/600 Hz, selectable pin output.Input protection 100V @ 25mAOperating temperature 0°C to 50°C, non-condensing Storage temperature -20°C to 70°C, non-condensing Vibration/shock MIL-PRF-28800 F, Class 3Supported languages Chinese, Czech, Danish, Dutch, English, French, German, Italian, Korean, Norwegian, Polish, Portuguese, Russian, Spanish, Swedish AccuracyBaseline: Certified by ETL to meet IEC 61935 Level III/IIIe/IV; Channel/Permanent link: TIA 568-B.2-2 and IEC 61935 Level III/IIIe/IV Warranty (LanTEK II/FiberTEK FDX)One (1) Year from date of purchaseBatteries and accessories are warranted 90 days from date of purchasePC SoftwareRequirements: Microsoft Windows ® XP or Vista, (32/64 bit) 512MB RAM, 500MB hard disk + 1GB for every 1,500 Category 6 testsFiberTEK FDXCompatability LanTEK ® II (any model)Connector User changeable adapter (SC, FC, ST), 2.5mm ferruleLaser safety Multi-mode 850 VCSEL: class 3, 5mW max; multi-mode 1300 laser: class 3, 5mW max; Single mode 1310 & 1550: class: 3, 5mW max Power meter accuracy ± .5dB from 0dBm to -40dBm 850-1550nm; system dynamic range 40dB Length accuracy ±3%; maximum distance measurement 3000m Display resolutionPower/attenuation: 0.1dB, length: 0.1m/0.1ftSpecificationsSpecifications subject to change without notice.Cat. No.Description33-991LanTEK ® II-350: TIA/EIA Cat6, ISO Class E certifier w/Cat6 adapters 33-992LanTEK ® II-500: TIA/EIA Cat6A, ISO Class E A certifier w/Cat6A adapters 33-993LanTEK ® II-1000: TIA/EIA Cat7A, ISO Class F/F A certifier w/Cat6A adaptersLANTEK10GBKITAlien Crosstalk Testing Kit for 10GbE Certificatioin. Compatible with 33-992 and 33-993.Contents: LanTEK ® II display and remote handset, two smart lithium ion batteries, two 110-240V power adapters with US/EU/UK plugs, lockable semi-rigid carrying case, Cat6A F/FTP patch cords, USB cable, DataCENTER data management and reporting software, two headsets, hanging straps and ETL accuracy certificate.33-990-FA01Multimode (850/1300nm) kit with LED light sources for standard multi-mode fiber, 850nm LED, 1300nm LED 33-990-FA02Multimode (850/1300nm) kit with VCSEL/laser light sources for laser optimized fiber, 850nm VCSEL, 1300nm FP laser 33-990-FA03Single mode (1310/1550nm) kit with laser light sources for single mode fiber, 1310nm FP laser, 1550nm FP laser 33-990-FA04Combination MM/SM kit with LED MM sources and laser SM sources (33-990-FA01 & 33-990-FA03)33-990-FA05Combination MM/SM lit with VCSEL/laser MM sources and laser SM sources (33-990-FA02 & 33-990-FA03)33-993-FA0XCombination of LanTEK II-1000 and FiberTEK FDX; (Substitute 1 through 5 in place of “X” to indicate fiber option from choices above)Contents: Two FiberTEK FDX modules, lockable semi-rigid carrying case, SC, FC, ST adapters for modules (2 ea.), SC-SC patch cords (MM kits: 3x 62.5µm, 3x 50µm; SM kits: 3x 9um SMF) compliant to ISO/IEC 14763-3 standard, quick reference guide, and electronic operation manual.IDEAL INDUSTRIES, INC.Becker Place, Sycamore, IL 60178, USA / 815-895-5181 • 800-435-0705 in USAInternational offices:Australia • Brazil • Canada • China • Germany • Mexico • UKFor complete sales office contact information, visit us at:8/12Printed in U.S.A.Form No. P-2870©2012 IDEAL INDUSTRIES, INC.N12966。

SmartLine STT850高性能温度传感器说明书

SmartLine STT850高性能温度传感器说明书

SmartLineTechnical InformationSTT850 SmartLine Temperature Transmitter Specification34-TT-03-14, September 2017IntroductionPart of the SmartLine® family of products, the SmartLine STT850 is a high-performance temperature transmitter offering high accuracy and stability over a wide range of process and ambient temperatures. The SmartLine family is also fully tested and compliant with Experion ® PKS providing the highest level of compatibility assurance and integration capabilities. SmartLine easily meets the most demanding needs for temperature measurement applications.Best in Class Features:Industry leading performanceo Digital Accuracy up to +/- 0.10 Deg C for RTD oStability up to +/- 0.01% of URL per year for ten years o 125 mSec update time for single input models o250 mSec update time for dual input modelsReliable measuremento Built in Galvanic IsolationoDifferential/Averaging/Redundant/Split Range measurements o Dual Compartment Housing o Sensor Break detectiono Comprehensive on-board diagnostic capabilities o Full compliance to SIL 2/3 requirements. o Available with 15 year warrantyo Supports Namur 107 Extended Diagnostics o Supports Namur 89 Wire breakoDirect entry of Callendar-Van Dusen coefficients R 0, α, δ and β for calibrated RTD sensors (not available on DE units)Figure 1– Smartline STT850 Temperature transmitterLower Cost of Ownershipo Universal input o Dual sensor optiono Multiple local display capabilities o Modular constructiono External zero, span, & configuration capability o Polarity insensitive loop wiringoDigital Output Option (only available with HART)Communications/Output Options:o 4-20 mA dco Honeywell Digitally Enhanced (DE) o HART ® (version 7.0)oFOUNDATION™ Fieldbus compliant to ITK 6.1.2All transmitters are available with the above listed communications protocols.DescriptionThe SmartLine Temperature Transmitter is designed and manufactured to deliver very high performance across varying ambient temperature. The total accuracy of the transmitter including the ambient temperature effect in harsh industrial environments, allows the STT850 to replace virtually any competitive transmitter available today.Unique Indication/Display OptionsThe STT850 modular design accommodates a basic alphanumeric LCD display or a unique advanced graphics LCD display with many unparalleled features.Basic Alphanumeric LCD Display Featureso Modular (may be added or removed in the field)o0, 90,180, & 270 degree position adjustmentso Deg C , F, R and Kelvin measurement unitso 2 Lines 16 Characters (4.13H x 1.83W mm)o Up to 8 display screens with similar formatso Configurable screen rotation timing (3 to 30 sec)o Auto/Manual selection for screen rotationo Displays up to 9 Datapoints - Loop PV, CJTemperature, Sensor 1, Sensor 2, Sensor Delta,RTD 1 Resistance, RTD 2 Resistance,Loop output, Percent Loop.o Out of Range Indicationo PV Status and critical fault indicationAdvanced Graphics LCD Display Featureso Modular (may be added or removed in the field)o0, 90, 180, & 270 degree position adjustmentso Up to eight display screens with 3 formats are possible (Large PV with Bar Graph or PV with Trend Graph)o Configurable screen rotation timing (3 to 30 sec)o Provides instant visibility for diagnosticso Multiple language capability. (EN, GE, FR, IT, SP, RU, TR, CN & JP)Configuration ToolsIntegral Three Button Configuration OptionSuitable for all electrical and environmental requirements, SmartLine offers the ability to configure the transmitter and display via three externally accessible buttons when either display option is selected. Zero or span capabilities are also optionally available via these buttons with or without selection of a display option.Hand Held ConfigurationSmartLine transmitters feature two-way communication and configuration capability between the operator and the transmitter. This is accomplished via Honeywell’s field-rated Multiple Communication Configuration tool.The Honeywell Handheld MC Toolkit is capable of field configuring DE and HART Devices and can also be ordered for use in intrinsically safe environments. All Honeywell transmitters are designed and tested for compliance with the offered communication protocols and are designed to operate with any properly validated hand held configuration device.Personal Computer ConfigurationHoneywell’s SCT 3000 Configuration Toolkit provides an easy way to configure Digitally Enhanced (DE) instruments using a personal computer as the configuration interface.Field Device Manager (FDM) Software and FDM Express are also available for managing HART & Fieldbus device configurations.DiagnosticsSmartLine transmitters all offer digitally accessible diagnostics which aid in providing advanced warning of possible failure events minimizing unplanned shutdowns, providing lower overall operational costsSystem Integrationo SmartLine communications protocols all meet the most current published standards for HART/DE/Fieldbus.o Integration with Honeywell’s Experion PKS offers the following unique advantages.o Transmitter messagingo Maintenance mode indicationo Tamper reporting (HART only)o FDM Plant Area Views with Health summarieso All STT850 units are Experion tested to provide the highest level of compatibility assuranceModular DesignTo help contain maintenance & inventory costs, all STT850 transmitters are modular in design supporting the user’s ability to replace temperature boards, add indicators or change electronic modules without affecting overall performance or approval body certifications. Each temperature board is uniquely characterized to provide in-tolerance performance over a wide range of application variations in temperature and due to the Honeywell advanced interface, electronic modules may be swapped with any electronics module without losing in-tolerance performance characteristicsModular Featureso Replace Temperature/Terminal board/Lightning protection*o Exchange/replace electronics/comms modules*o Add or remove integral indicators*o Add or remove external configuration buttons* Field replaceable in all electrical environments (including IS) except flameproof without violating agency approvals.With no performance effects, Honeywell’s unique modularity results in lower inventory needs and lower overall operating costs.Digital Output OptionAn optional Digital Output (open collector type) is available on HART transmitters which can be used to activate external equipment when preset Alarm Setpoints are reached. The Digital Output can be set to monitor two independent setpoints based upon the analog value of the PV or upon device status.The following Alarm Types are available:· PV High· PV Low· Critical Diagnostic Active· Redundant Input Active**· PV Rate of Change Alarm *· PV Deviation Alarm *Alarms can be configured as latching or non-latching. Alarm Blocking is also available which allows start-up without the alarm energizing until it first reaches the operating region.Alarm Hysteresis is configurable from 0 to 100% of PV range.The Digital Output functionality and status is also available over the HART communications link.* These Alarm Types are available as part of the Advanced Diagnostics option. Rate of Change monitors the rate at which the PV is changing, configurable as either increasing or decreasing. Deviation monitors the PV delta from a separately configurable Setpoint value.** Available only via Communications StatusSee the Wiring Diagramsfor further information.Performance Specifications1,322. Total analog accuracy is the sum of digital accuracy and output D/A Accuracy3. Output D/A Accuracy is applicable to the 4 to 20 mA Signal output4. For TC inputs, CJ accuracy shall be added to digital accuracy to calculate the total digital accuracy5. These input types are not available on DE units6. Custom Callendar-van Dusen not available for Pt25 sensorsDifferential Temperature MeasurementSmartLine Temperature supports differential temperature measurements between any two types of sensors.When the loop current mode is set to "Differential" then the input range is from A to B for sensor 1 & 2 whereA = Sensor 1 Minimum - Sensor 2 MaximumB = Sensor 1 Maximum - Sensor 2 MinimumCallendar - van Dusen Algorithm (CVD)The easy to use Callendar - van Dusen (CVD) algorithm allows the use of calibrated Platinum RTD sensors to increase the overall system accuracy. Simply enable the algorithm and then enter the four CVD coefficients supplied with the calibrated RTD sensor into the transmitter.Digital Accuracy for differential temperature measurementIf both the inputs are similar the digital accuracy equals 1.5 times the worst case accuracy of either sensor type.For mixed input types, the digital accuracy is the sum of sensor 1 and sensor 2 digital accuracies.Performance under Rated Conditions – All Models (continued)Parameter DescriptionEMC Compliance EN 61326-1 and EN 61326-3-1 (SIL)Lightning Protection Option Leakage Current: *****************°CImpulse rating: 8/20 uS 5000 A (>10 strikes) 10000 A (1 strike min.)10/1000 uS 200 A (> 300 strikes)Operating Conditions – All ModelsParameter ReferenceConditionRated Condition Operative Limits Transportation andStorage︒C ︒F ︒C ︒F ︒C ︒F ︒C ︒FAmbient Temperature1STT850 25±1 77±2 -40 to 85 -40 to 185 -40 to 85 -40 to 185 -55 to 120 -67 to 248 Humidity %RH 10 to 55 0 to 100 0 to 100 0 to 100Supply Voltage Load Resistance HART Models: 11.8 to 42.4 Vdc at terminals (IS versions limited to 30 Vdc) 0 to 1,400 ohms (as shown in Figure 2)DE Models: 13.8 to 42.4 Vdc at terminals (IS versions limited to 30 Vdc)0 to 1,300 ohms (as shown in Figure 2)FF Models: 9.0 to 32.0 Vdc at terminals1 LCD Display operating temperature -20︒C to +70︒C . Storage temperature -30︒C to 80︒C.Figure 2 - Supply voltage and loop resistance chart & calculations(not applicable for Fieldbus)Communications Protocols & DiagnosticsHART ProtocolVersion:HART 7Power SupplyVoltage: 11.8 to 42.4Vdc at terminalsLoad: Maximum 1400 ohms See figure 2Minimum Load: 0 ohms. (For handheld communications a minimum load of 250 ohms is required)IEC 61508 Safety Certified SIL 2 and SIL 3Honeywell Digitally Enhanced (DE)DE is a Honeywell proprietary protocol which provides digital communications between Honeywell DE enabled field devices and Hosts.Power SupplyVoltage: 13.8 to 42.4Vdc at terminalsLoad: Maximum 1300 ohms See figure 2Foundation Fieldbus (FF)Power Supply RequirementsVoltage: 9.0 to 32.0 Vdc at terminalsSteady State Current: 17.6 mASoftware Download Current: 27.6 mAP = PermanentI = InstantiableThe AI function block allows the user to configure the alarms to HIGH-HIGH, HIGH, LOW, or LOW-LOW with a variety of priority levels and hysteresis settings.All available function blocks adhere to FOUNDATION Fieldbus standards. PID blocks support ideal & robust PID algorithms with full implementation of Auto-tuning. Link Active SchedulerTransmitters can perform as a backup Link Active Scheduler (LAS) and take over when the host is disconnected. Acting as a LAS, the device ensures scheduled data transfers typically used for the regular, cyclic transfer of control loop data between devices on the Fieldbus.Number of Devices/SegmentEntity IS model: 15 devices/segmentSchedule Entries45 maximum schedule entries50 maximum LinksNumber of VCR’s: 50 maxCompliance Testing: Tested according to ITK 6.1.2Software DownloadUtilizes Class-3 of the Common Software Download procedure as per FF-883 which allows any field devices to receive software upgrades from any host.8 STT850 Smart TemperatureStandard DiagnosticsSTT850 top level diagnostics are reported as eithercritical or non-critical as listed below. All diagnostics arereadable via the DD/DTM tools. All critical diagnosticswill appear on the Basic and Advanced integral displays,non-critical diagnostics will appear on the Advancedintegral display.Critical Diagnostics- Sensor Module Fault- Communications Module Fault- Sensor Communications Fault- Input 1 Fault- Input 2 FaultNon Critical Diagnostics (for Advanced Display only)- Cal 1 Correct- Cal 2 Correct- Sensor Temperature- Sensor 1 Health- Sensor 2 Health- Input 1 Range- Input 2 Range- CJ Range- Input 1- Input 2- Input 1 TB5 (For RTD and Ohm types only)- Input 1 TB6 (for RTD and Ohm types only)- Input TB7 (Input 1 or 2, for RTD and Ohm types only)- Input 1 TB8 (for 4-Wire RTD and Ohm types only)- Input 2 TB8 (for RTD and Ohm types only)- Input 2 TB9 (for RTD and Ohm types only)- Factory Calibration- Loop Supply Voltage (not available on Fieldbus)- Communications Module Temperature- DAC Temperature Compensation (not available onFieldbus)- Sensor Communications- Display Setup (not for Fieldbus)- Excess Delta AlertSTT850 Smart Temperature 9 Approval Certifications:10 STT850 Smart Temperature1.Operating Parameters:4-20 mA/DE/HART (Loop Terminal)Voltage= 11 to 42 V Current= 4-20 mA Normal (3.8 – 23 mA Faults)FF (Loop Terminal)Voltage= 9 to 32 V Current= 25 mA2. Intrinsically Safe Entity ParametersTerminals 1 and 2- LOOP: Ui = 30 Vdc, Ii = 225 mA, Pi = 900 mW, Ci = 4 nF, Li = 0 µH Terminals 5, 6, 7, 8, 9- SENSOR: Ci = 4 nF, Li = 0 µHDIGITAL OUTPUT OPTION:Terminals 1 and 2- LOOP: Ui = 30 Vdc, Ii = 225 mA, Pi = 900 mW, Ci = 4 nF, Li = 0 µH Terminals 4 and 9, DO OPTION: Ui = 30 Vdc, Ii = 40 mA, Pi = 500 mW, Ci = 4 nF, Li = 0 µH Terminals 5, 6,7, 8 - SENSOR: Ci = 4 nF, Li = 0 µHSIL 2/3 Certification IEC 61508 SIL 2 for non-redundant use and SIL 3 for redundant use according to EXIDA and TÜV Nord Sys Tec GmbH & Co. KG under the following standards: IEC61508-1: 2010; IEC 61508-2: 2010; IEC61508-3: 2010.MID Approval Issued by NMi Certin B.V. in accordance with WELMEC guide 8.8, OIML R117.1 Edition 2007(E), and EN 12405-1+A2 Edition 2006. Applicable to Pt100 sensor only.MARINE TYPE APPROVAL Lloyd’s Register Certificate Number: 16/60011Environmental categories ENV1, ENV2, ENV3 and ENV5 as defined in Lloyd’s Register Test Specification No. 1, February 2015Wiring DiagramsDE- Single InputWiring DiagramRTD Thermocouple,mV and OhmConnectionsDE- Dual Input WiringDiagram1Thermocouple andRTD Connections1 Not applicable forsingle input sensorHART/FF – Single Input Wiring Diagram RTD Thermocouple, mV and Ohm ConnectionsHART/FF – Dual Input Wiring DiagramRTD Thermocouple, mV and Ohm ConnectionsHART/FF Dual Input Wiring Diagram Remote C/J and Mixed Sensors ConnectionsDigital Output Connections for mA Load (HART only)Digital Output Connections for PLC Counting Input (HART only)Mounting & Dimensional DrawingsTRANSMITTER ENCLOSURE CAN BE ROTATED A TOTAL OF 90O FROM THE STANDARD MOUNTING POSITION Figure 3 – STT850 with adapter housing - Horizontal Wall MountingFigure 4 – STT850 No-Adapter Horizontal Wall MountingFigure 5 – STT850 Pipe Mount with adapter housing - Horizontal & VerticalFigure 6 - STT850 Pipe Mount, Vertical*Note 1: Figures 5 and 6. The housing adapter may not be present on all transmitter models. If the housing adapter is not present, subtract 24,5mm (0,96 inches) from the dimension specified.Mounting & Dimensional DrawingsReference Dimensions:millimetersinchesFigure 7 – STT850 with adapter housing - DimensionsFigure 8 – STT850 no adapter housing dimensionsModel STT850Smart Temperature TransmitterModel Selection Guide:34-44-16-14 Issue 9The Model Selection Guide is subject to change and is inserted into the specification as guidance only.Prior to specifying or ordering a model check for the latest revision Model Selection Guide which is published at: /en-US/pages/default.aspxModel Selection Guide3 NAMUR Output Limits 3.8 - 20.5mAdc can be configured by the customer or select custom configuration Table VcSTT850 Smart Temperature 21For more informationTo learn more about SmartLine Temperature, visit Or contact your Honeywell Account ManagerProcess Solutions Honeywell1250 W Sam Houston Pkwy S Houston, TX 77042Honeywell Control Systems LtdHoneywell House, Skimped Hill Lane Bracknell, England, RG12 1EB34-TT-03-14 September 20172017 Honeywell International Inc.Shanghai City Centre, 100 Jungi Road Shanghai, China 20061Sales and ServiceFor application assistance, current specifications, pricing, or name of the nearest Authorized Distributor, contact one of the offices below.ASIA PACIFICHoneywell Process Solutions, (TAC) hfs-tac-*********************AustraliaHoneywell LimitedPhone: +(61) 7-3846 1255 FAX: +(61) 7-3840 6481 Toll Free 1300-36-39-36 Toll Free Fax: 1300-36-04-70China – PRC - Shanghai Honeywell China Inc.Phone: (86-21) 5257-4568 Fax: (86-21) 6237-2826SingaporeHoneywell Pte Ltd.Phone: +(65) 6580 3278 Fax: +(65) 6445-3033South KoreaHoneywell Korea Co Ltd Phone: +(822) 799 6114 Fax: +(822) 792 9015EMEAHoneywell Process Solutions, Phone: + 80012026455 or +44 (0)1202645583Email: (Sales)***************************or (TAC)*****************************AMERICA’SHoneywell Process Solutions, Phone: (TAC) 1-800-423-9883 or 215/641-3610(Sales) 1-800-343-0228Email: (Sales)*************************** or (TAC)*****************************Specifications are subject to change without notice.。

西门子流量计产品指南说明书

西门子流量计产品指南说明书

Flow measurement guide/flowComplete flow solutionsThe right flow instrument for every application.Transparency. Connectivity.Intelligence.The eyes and ears of digitalization.Industry 4.0 stands poised to benefit your operations in enormousways. With unparalleled control and access, you now have com-plete knowledge of what’s happening in your plant at all times.But even in this new digital era, you still need accurate, reliableand rugged process instrumentation. If field instruments areunable to supply the right data, even the most sophisticateddigitalization initiative won't help. Siemens gives you the best ofboth worlds: high-performance devices complemented by inno-vative digital solutions.Take the SITRANS F M MAG 8000 electromagnetic flow meter.Connect it to Siemens MindSphere Cloud for Industry and seeyour operations open up before you. An expansive range ofdevice and process data can be sent directly to the cloud, whereit can be accessed and analyzed from anywhere in the world, 24hours a day. This means increased flexibility and efficiency,reduced revenue loss and faster response times – all covered bySiemens cybersecurity protection.With the knowledge that no single technology can address theneeds of all industrial applications, Siemens provides a completerange of flow measurement devices. And all are backed by ourglobal support network, providing experienced sales and techni-cal assistance when and where you need it.2Table of contentsElectromagnetic 4 Coriolis 6 Clamp-on ultrasonic 8 Vortex 10 Differential pressure 12 Sales, support and training 143₁₂"ElectromagneticWith decades of experience in the field complemented by a worldwide installedbase, Siemens is at the top of its class in electromagnetic flow monitoring.SITRANS F M magmeters deliver high-accuracy volume measurement of electri-cally conductive liquid applications.For processes requiring standard modular pulsed DC technology, the SITRANS FM portfolio includes a versatile range of sensors and transmitters with approvalsto suit every standard – not to mention a variety of options for electrode materi-als, housings and communication protocols.Or choose a specialized flow system to fulfill specific industry demands. TheSITRANS F M MAG 8000 battery-powered water meter is ideal for abstraction,distribution, revenue and irrigation – no mains power required. The SITRANS FM TRANSMAG 2 with pulsed AC technology stands up to heavy-duty pulp andpaper or mining applications.4SITRANS F M TRANSMAG 2 911/E SITRANS F M MAG 5100WSITRANS F M MAG 80005CoriolisLook no further than the SITRANS F C Coriolis flowmeter family for reliable moni-toring of liquids and gases in virtually any application. Siemens Coriolis systemsprovide precise multiparameter measurements of direct mass flow rate, volu-metric flow rate, temperature, density, and fraction flow such as Brix and Plato.Our digital Coriolis transmitter platform consists of the space-saving SITRANSFCT010, designed for direct integration into process automation systems, andthe SITRANS FCT030, which delivers exceptional precision, a 100 Hz update rateand a user-friendly digital interface. Both transmitters can be paired with thehigh-performance FCS300 sensor or one of three low-flow sensors for batching,dosing and filling.For compressed natural gas installations, select the ultra-compact SITRANSFCS200 sensor together with the SIFLOW FC070 transmitter, offering custodytransfer approval.6SITRANS FC330SITRANS FC310SITRANS F C MASS 2100 DI 3-15w/ SITRANS FCT010 SITRANS F C MASS 2100 DI 1.5 andSITRANS FC300SITRANS FCS200 w/SIFLOW FC0707Clamp-on ultrasonicWith no pressure drop or energy loss, a wide turndown ratio and non-intrusivesensors that can be installed without cutting into the pipe, SITRANS F S clamp-on ultrasonic flowmeters are a superior choice for accurate, cost-effective liquidflow measurement.For the greatest flexibility in customization, choose the advanced SITRANSFS230 with one- or-two path measurement, multiple I/Os and HART or Modbuscommunication. For more basic measurement and configuration options at alower cost, the SITRANS FS220 is an ideal alternative.All systems measure flow with SITRANS FSS200 clamp-on sensors, which areeasy to install and never come into contact with the medium – perfect for pre-existing pipelines and corrosive, toxic or high-pressure liquids. Available Wide-Beam® transit-time sensor technology increases measurement accuracy byreducing sensitivity to any changes in the fluid.8SITRANS F clamp-on ultrasonic family9VortexThe SITRANS FX330 is an all-in-one vortex solution for flow, pressure and tem-perature measurement of steam, gases and liquids – ideal for HVAC and auxil-iary systems and versatile enough for use in many process applications. Fromsaturated and superheated steam to raw chemicals, from compressed air tocrude oil, measure it all with the FX330.The digitally based flow meter offers fully welded sensor construction, plug-and-play installation and Intelligent Signal Processing for maximum reliability – plusenhanced functions like SIL 2 certification, an integrated heat meter and NAMURNE107 status alarms.10SITRANS FX33011Differential pressureOne of the most widely utilized and accepted methods of flow measurement inthe world, differential pressure (DP) flow meters have been employed for manyyears to measure liquids, gases and steam.The Siemens DP portfolio includes the advanced SITRANS P DS III, P320 and P420digital pressure transmitters. Paired with traditional flow elements such asorifice plates, venturi tubes or averaging pitot tubes, the DS III and P320/P420provide smart transmitter features and performance to new or existing DPmeasurement points. And the P320/P420 are the first pressure transmitters onthe market to feature remote safety handling, reducing commissioning time inapplications where safety is critical.In partnership with Newgate Instruments, Siemens offers the JT400 – the firstultra-low-power multivariable pressure transmitter for the upstream and mid-stream gas production industry. The JT400 features power consumption under 4mW as well as best-in-class DP measurement and static pressure referenceaccuracy.12JT400SITRANS P DS IIISITRANS P320SITRANS P42013Because experience matters.Device integration from the field to the world These days, it’s an absolute must that your process instruments are always accessible – whether a device is local, the centerpiece of a plant or on the other side of the globe. Siemens provides you with the components you need to stay connected and in control.Communication ProtocolsOnly in conjunction with fieldbuses can the advantages of digital communication be fully realized, including better transmission of measured values while maintaining the original accuracy, diagnostic options and remote parameterization. Our process instruments support all major industry standards for modern fieldbus communication, including HART, PROFIBUS, PROFINET, FOUNDATION Field-bus and Modbus – making them suitable for use in all automation systems.SIMATIC PDM (Process Device Manager)SIMATIC PDM is a flexible tool for operation of more than 4,000 different field devices and other automation components over the entire lifecycle of your plant. Featuring a graphical user interface and intuitive Quick Start wizards for configuration, parameteriza-tion, diagnostics and maintenance, PDM can be connected directly to a local field device or universally implemented as a central Maintenance Station.SITRANS LibraryIntelligent process instruments are equipped with smart features previously accessible only with additional programming effort. This gap is being closed by SITRANS Library. Offering device-specific faceplates, SITRANS Library software facilitates the integration of these specialized functions into the SIMATIC PCS 7 process control system for easier operation, faster troubleshooting and a new degree of transparency.MindSphereTo maximize the efficiency of a process or plant, operators must be able to turn real-time data into actionable insights. MindSphere is an open and secure IIoT platform allowing users to create apps that use operational data for predictive maintenance and resource optimization. This data is captured on-site by your instruments and transferred to the MindSphere cloud, where it can be accessed 24/7 by authorized users.14Sales and supportCustom engineeringSiemens brings a wealth of engineering expertise together with an expansive portfolio of products and services. This winning combination enables us to design innovative and cost-effective solutions to resolve your most challenging applications in the process industries.Service around the worldPlants must function reliably at all times – which makes effective, efficient process instrumentation and analytics an indis-pensable requirement.You also need to be certain of fast and competent service from your supplier. Siemens is a global company that reacts locally. Whether you require consulting, quick delivery or installation of new devices, the Siemens net-work of specialists is available to you around the world, wherever your location.Siemens Industry Online Support (SIOS)Our online support system offers rapid, comprehensive assistance regardless of time or location. Manuals, technical data, certificates, downloads, support requests: we have it all.Explore SIOS at: PI trainingMaximize your skills with factory-certified trainingSiemens provides a full schedule of Process Instrumentation training opportunities for Siemens employees, channel partners, and customers. The PI Introductory Training courses are designed for new sales and service employees to learn the product lines, technologies and applications. These courses are also prerequisites for the advanced technol-ogy courses, which provide in-depth application training.Designed for hands-on learning, all courses are led by field-tested instructors who combine extensive application and instrumentation knowledge with seasoned training experience. Our PI Training Center is specifically designed to optimize your classroom time. It is fully equipped with application simulation stations, a full range of PI instruments and complete industrial communication networks.For current information and schedules, visit our website at:/pitraining15Siemens Industry, Inc.Process Industries and Drives 100 Technology Drive Alpharetta, GA 300051-800-365-8766*******************Subject to change without prior notice Order No.: PIBR-00035-0618All rights reserved Printed in USA© 2018 Siemens Industry, Inc.Subject to changes and errors. The information given in this document only contains general descriptions and/or performance features which may not always specifically reflect those described, or which mayundergo modification in the course of further development of the prod-ucts. The requested performance features are binding only when they are expressly agreed upon in the concluded contract.All product designations may be registered trademarks of Siemens AG. All other designations in this document may represent trademarks whose use by third parties for their own purposes may violate the pro-prietary rights of the owner.Follow us on:/siemensii /siemensii /siemens https:///pablogMeasuring everything that matters:/piSiemens Process Instrumentation offers best-in-class measurement and seamless integration into your automation system. We are the total solution provider for flow, level, pressure, temperature, weighing, positioners and more.。

Beta LaserMike BenchMike Pro产品介绍说明书

Beta LaserMike BenchMike Pro产品介绍说明书

► More gauges installed worldwide than all othermanufacturers combined► Measure manufactured cut samples fast and with the highest accuracy in the industry ► Perform reliable, non-contact measurements from run to run ► Benefit from easy-to-use features for simple setup and operation► Get powerful Ethernet connectivity,communication and control capabilitiesBENCHMIKE PROThe Industry’s leading off-line ID/OD/Wall measurement systemNon-contact laser technology, unsurpassed accuracy, and a compact design that allows it to fit almost anywhere have made the Beta LaserMike BenchMike gauge the industry’s leading off-line ID/OD/Wall measurement system. Today, more than 15,000 manufacturing applications worldwide count onBenchMike’s ±0.9 µm accuracy and ±0.25 µm repeatability to help them deliver the superior-quality products their customers demand.The new BenchMike Pro gauge system continues this tradition. In the lab or on the plant floor, the BenchMike Pro’s range of new connectivity, communication, and control features increases its performance capabilities to deliver exceptional accuracy, reliability, and ease of use in the most challenging measurement applications. Ready for service under Industry 4.0, BenchMike Pro offers:No Field Calibration Requiredtechnology providing unmatched accuracy without field calibration. Never has it been easier to incorporate precision measurement on the production line, and since every system includes a programmable RS-232C interface, collecting and sending data to your storage and control system is almost effortless.► E xpanded connectivity options – Ethernet and USB – that simplifyintegrating BenchMike Pro into centralized production networks. This new platform lays the foundation for future connection via WiFi.► F aster communications processing for more efficient data logging andsharing…improved production reporting and analysis…and increased quality control.► M ore I/O connections featuring additional USB resources to provide greaterflexibility in connecting BenchMike Pro to computers, data gathering devices, and USB printers that support the CUPS protocol.► L arger, higher-resolution touch-screen display for easier viewing ofcritical measurement information and more intelligent production decisions.► T ransparent object measurement allowing BenchMike Pro to measure thediameter of transparent material, such as clear plastic products.► L atest diode technology doubles lifetime efficiency and reliability, loweringyour total cost of ownershipYour Information Here Sample Report10/16/2017 10:29Type 2, Inches (in)Sample #1 0.31588Sample #2 0.31588Sample #3 0.31588Sample #4 0.31587Sample #5 0.31588Sample #6 0.31588Sample #7 0.31587Sample #8 0.31587Sample #9 0.31587Sample #10 0.31587Your Information Here Batch Report10/16/2017 10:2Type 2, Inches (in)Average 0.31587Diff/TIR 0.00001Maximum 0.31588Minimum 0.31587Standard Deviation 0.000005Undersize Samples 0Oversize Samples 0Total Number of Samples 10The BenchMike Pro’s touch-screen graphical user interface (GUI) gives operators a quick and simple means of viewing dimensional measurements, accessing gauge and system information, and changing parts. Screen layouts are customized for the needs of the user or application and the “look and feel” is simple for any user familiar with Windows. Simple T ouch-Screen Interface Lets You Easily Access BenchMike Features and FunctionsData Display:BenchMike Pro has advanced displaycapabilities allowing you to displaymeasurement data, access menus toconfigure BenchMike Pro, and displaygeneral information such as presence orabsence of error conditions.Magnified DisplayMagnify measurement items on thescreen for visibility from a distance.Pop-Up MenusQuickly, easily access BenchMike featuresand functions via clear pop-up menus.Library (Part) SelectionUse BenchMike libraries to store andrecall how the measurements are to betaken, and manage other system setupinformation via separate libraries. Bydefining libraries for each product or fordifferent fixtures, you can shorten set-uptimes for various parts or applications.Rotational Cross-Section DisplayWhen using a rotary ID/OD/Wall fixture, create arotary graph that displays the size, position, andminimum and maximum data for measurementsRobust ReportingEasily generate Sample, Batch, and Fixture reports. Use theSample Report when taking a single measurement of multiplee the Batch report to summarize statistical resultsfor all measured parts. Use the Fixture reports to generatesimilar sample and batch details when using automatedpart-positioning fixtures.Pipe and tube manufacturers must ensure that the dimensions of their products are maintained within tight specifications to ensure the quality of the product and the profitability of the company. BenchMike Pro is the ideal solution for fast, simple, and accuratemeasurements of cut samples of extruded pipe and tube. BenchMike Pro is used worldwide on extrusion plant floors and quality control (QC) laboratories to give operators and technicians immediate feedback of product dimensions.BenchMike Pro utilizes the latest in laser gaugingtechnology to provide high-precision OD measurements of pipe and tube within specifications of less than 1µm (0.00004 in.). It is also engineered with the best edge detection technology on the market that is traceable to national standards (NIST).Diameter & Ovality MeasurementsSolutions for Pipe & TubeApplicationsSingle Diameter MeasurementOD = AStep 1: Master on referenceedge and mandrelStep 2: Place product on mandrel and take measurements Wall = A - B OD = CID = OD - (2 x Wall)Step 3: Rotate the product to attain multiple points of measurement as well as concentricity and ovalityOD MeasurementFor precision OD measurements, simply place your pipe or tube sample on the V-block fixture andBenchMike will instantly measure it. Using the V-block and BenchMike, an operator can measure dozens of parts per minute and with a much higher level of accuracy than any other method available for sample inspection. And with the use of laser technology, the measurements will be repeatable from one operator to another.ID/OD/Wall MeasurementFor precision ID, OD, and wall thickness measurements, simply place a pipe or tube sample on the ID/OD/Wall fixture and BenchMike will calculate all of the dimensions. The ID/OD/Wall fixture can also automatically rotate a sample to a pre-defined number of positions for measurements at multiple points around the product. This rotation also allows for the calculation of concentricity and ovality of the product. The graphical user interface has options to view the rotational cross section of the product and a graph that shows deviation or variation at the various rotational degrees of measurement.Measurement SpecificationsGeneral SpecificationsInput/OutputBenchMike Pro provides a variety of input/output connectors to allow flexible integration with other devices.► Two serial ports – DB9 and USB – to link with computers or data gathering devices ► USB port compatible with most inkjet printers that support the CUPS protocol ► Ethernet port for network connection to facilitate easy data access and sharing► Digital I/O port for connection of alarm outputs to indicate out-of-tolerance conditions and other errors, as well asdigital inputs to activate functions remotely► Fixture port for connection to intelligent fixtures capable of moving and rotating the test pieces ► Scan output BNC port for diagnostic access to the laser scan signal*See other sizes in the Options section.Specifications1For ID/OD/Wall applications, maximum OD is dependent on product.2Accuracy of ID/OD/Wall measurement is dependent on product.Modular FixturesReady-To-Mount FlexibilityWe offer an extensive line of ready-to-mount modular fixtures from simple manual fixtures to fully automatic and intelligent fixtures. These fixtures hold workpieces properly and effectively for any gauging need. Simply attach these easy-to-install fixtures to your BenchMike Pro for precise, reliable measurements without calibration.We provide a full line of heavy-duty fixtures to measure small and large parts, along with automatic motorized fixtures for part translation and rotation. For your custom needs, our Special Engineering group excels at developing fixtures forspecial applications.AccuScan High-Speed Diameter and Ovality Measurement SystemsUltraScan ProWall and Concentricity Measurement SystemsLN Detectors Lump and Neckdown Measurement SystemsLaserSpeed Pro Non-Contact Length and Speed Measurement SystemsInControl Process Control and Data Management SystemsIn addition to our BenchMike Pro off-line gauging system, we offer a complete portfolio of measurement and controlsolutions for on-line production applications. Our solutions enable manufacturers to realize a number of performance and production benefits, such as improved product quality, enhanced process reliability, increased productivity, and reducedmanufacturing costs.Other Measurement and Control SolutionsForce Gauge (GA5005-0013)For precision ID, OD, and Wall Thickness measurements on thin-wall small diameter tubing, such as medical tubing, simply place a tube sample on the ID/OD/Wall fixture, apply the desired force on the sample, and BenchMike will calculate all the dimensions.Modular Fixtures, cont.Precision Measurement & Control SolutionsThe Beta LaserMike line of measurement and control solutions from NDC Technologies is designed to increase productivity, improve product quality, and reduce manufacturing costs. These solutions provide in-process dimensional monitoring, control, and sample/part inspection of products such as wire and cable, fiber optics, metals, rubber and plastic, flat rolled goods and tube and pipe to name a few. Every system is backed by NDC’s world-class service and support organization. With offices aroundthe globe, we’re committed to serving your unique measurement application needs.In line with its policy of continuous improvement, NDC reserves the right to revise or replace its products or services without prior notice. The information contained in this document may not represent the latest specification and is for indicative purposes only.NDC AmericasT el: +1 937 233 9935Email:***********************NDC EuropeT el: +44 1621 852244Email:***********************NDC ChinaT el: +86 21 6113 3617Email:***********************NDC SE AsiaT el: +65 91994120Email:***********************NDC IndiaT el: +91 124 2789507Email:***********************Document #: C-BROC-SCAN-BenchMike Pro PT-EN-2017DEC11Date of Issue: December 2017© NDC Technologies 2017。

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In proceedings of Passive and Active Measurement Workshop2004(PAM2004), Lecture Notes of Computer Science,Volume3015,Springer-Verlag,Antibes Juan-les-Pins,France,April2004.1Active Measurement for Multiple Link FailuresDiagnosis in IP NetworksHung X.Nguyen and Patrick ThiranLCA-ISC-I&C EPFL,CH-1015Lausanne,SwitzerlandAbstract.Simultaneous link failures are common in IP networks[1].In this paper,we develop a technique for locating multiple failures inService Provider or Enterprise IP networks using active measurement.We propose a two-phased approach that minimizes both the additionaltraffic due to probe messages and the measurement infrastructure costs.In thefirst phase,using elements from max-plus algebra theory,we showthat the optimal set of probes can be determined in polynomial time,and we provide an algorithm tofind this optimal set of probes.In thesecond phase,given the optimal set of probes,we compute the locationof a minimal set of measurement points(beacons)that can generatethese probes.We show that the beacon placement problem is NP-hardand propose a constant factor approximation algorithm for this problem.We then apply our algorithms to existing ISP networks using topologiesinferred by the Rocketfuel tool[2].We study in particular the differencebetween the number of probes and beacons that are required for multipleand single failure(s)diagnosis.1IntroductionRouting decisions and content distribution require proper connectivity and la-tency information so as to direct traffic in an optimal fashion.The family of Internet protocols collect and distribute only a limited amount of information on the topology,connectivity and state of the network.Hence information of interest for Internet Service Providers(ISPs),such as link delays or link failures, has to be inferred from experimental measurements.The strategy to obtain net-work information through end-to-end measurements,known as Internet tomog-raphy,is therefore of great interest to the research community[2–7].The ma-jority of work on network tomography concentrates on either topology discovery (e.g.[2–4]),or link delay monitoring(e.g.[5]).Some recent research showed that active measurements can also be used to pinpoint failures in IP networks[6,7].In general,an active probing system consists of several measurement points. Each measurement point,called a beacon,can send IP messages to all nodes in the network.Each message sent from a beacon to a network node for the purpose of monitoring is called a probe.To detect failures,the path that each Hung X.Nguyen’s work isfinancially supported by grant DICS1830of the Hasler Foundation,Bern,Switzerland.3 probe actually follows is compared with the path that the probe should follow according to the current network topology information.If the two paths are different,at least one link in the path determined by the current topology has failed[7].The authors in[6,7]study the problem of detecting and locating failures under the assumption that at most one failure can happen at a time.Under this assumption,a set of probes that traverse all links in the network is sufficient to diagnose any such single failure.The objective in[6,7]is to determine the smallest set of beacons whose probes cover all links in the network.This problem is proven to be NP-complete and approximation algorithms are given in[6]for general topologies and in[7]for the current Internet topology.Once the beacons are located,the smallest set of probes must still be determined,Bejerano et. al.[6]show that this problem is also NP-complete.Multiple link failures in IP networks happen much more frequently than one might expect;[1]has recently reported that nearly35%of link failures in the Sprint backbone are multiple failures.Thisfigure emphasizes the need for a failure detection and location scheme that takes into account the existence of multiple failures.Although the active probing scheme in[6]can work under the presence of several link failures,it cannot detect and locate simultaneous link failures.To our knowledge,there are no active monitoring techniques to date that apply to simultaneous failures in IP networks.In this work,we are interested in using active probing to detect and locate link failures,under the assumption that several links can fail at one time.To achieve this goal,a distributed set of beacons running a special software are deployed at key sites across the entire network.A beacon only needs to send probes to other nodes,and see what routes the probes take.Probe messages can be implemented by tools like traceroute[8]or skitter[9].Using probes to pinpoint network faults has several advantages over monitoring routing protocol messages (e.g.,OSPF LSAs),or using SNMP traps to identify failed links.Firstly,probe-based techniques are routing protocol agnostic;as a result,they can be used with a wide range of protocols like OSPF,IS-IS,RIP,etc.Secondly,SNMP trap messages may be unreliable because they use UDP as the transport protocol [6].Note here that by using active probing,we may not be able to detect and locate all failures(single or multiple)uniquely.This is especially true when we consider multiple failures or when there are constraints on the set of nodes where beacons can be deployed.Therefore,instead of looking for a probing system that guarantees to detect and locate all failures uniquely,wefind a probing system that can detect and locate all failures that the most capable probing system, that is a probing system that uses all available beacon nodes and sends probes from the beacons to all nodes in the network,can detect and locate.The cost of using probes for fault diagnosis comprises two components:the additional traffic due to probe packets and the infrastructure cost for beacons. Similarly to[6],we use a two-phased approach to minimize both the number of probes and the number of beacons.Whereas,unlike[6],wefirst minimize the number of probes and next the number of beacons.This enables us to use results from max-plus algebra for the probe selection problem.Our main contributions4are as follows.(i)We show that,contrary to the single failure case[6]and surprisingly so,the optimal set of probes for multiple failures can be found in polynomial time.(ii)However,like the single failure case,we show that the beacon placement problem in the multiple failure case is NP-hard.We provide a constant factor approximation algorithm for the beacon placement problem, which is very close to the best possible bound.(iii)We show that our algorithms perform well on existing networks,and that there is a substantial difference between the number of probes and beacons that are required for multiple failures diagnosis and for single failure diagnosis.The remainder of this paper is organized as follows.Section2introduces the network model.Section3presents the probe selection problem,and Section4 describes the beacon placement problem.Section5contains experiment studies of our algorithms on existing ISP networks.Finally,we conclude the paper in Section6.2Network ModelWe model the network as an undirected graph G(V,E),where the graph nodes, V,denote the network elements and the edges,E,represent the communication links connecting them.The number of nodes and edges is denoted by n=|V| and e=|E|,respectively.Further,we use P s,t to denote the path traversed by an IP packet from a source node s to a destination node t.If there is no failure in the network,an IP packet that is sent from a node s to a destination t will follow the path P s,t.When there is/are failure(s)of links on the path P s,t,the probe has to be rerouted around the failed link(s);Therefore the actual path that the probe takes will be different from P s,t.By comparing the actual path that the probe from s to t takes and P s,t,we can detect if any link in the path P s,t has failed or not.When a probe detects link failure(s)in its path,we say that the probe has failed.For a known topology G=(V,E)and a set of probes P,we can compute which probes will fail when a network link goes down.We call the above relations between network links and probes dependency relations.Dependency relations of a network can be represented by a dependency matrix D of dimension e×n p, where e is the number of links and n p=|P|is the number of probes in the network.D is constructed as follows.Let P s,t be the path followed by probe p i in the normal situation without failures.Then the entry D(i,j)=1if the path P s,t contains the link e j and D(i,j)=0otherwise.A row of D therefore corresponds to a probe(more precisely,to the path that the probe take),whereas a column corresponds to a link.3Probe selection problemGiven a network G=(V,E)with a set of beacons V B,we denote by P max the set of probes generated when each beacon sends probes to all nodes in the network. P max represents an upper bound on the probing capability of the network.It is5the largest set of probes that can be sent to different destinations in the network.Let D max denote the dependency matrix when the set of probes is P max .Let S ⊆E be a set of links.The set of failed probes triggered by the failure of all links in S is made of all the failed probes that would be triggered by the individual failure of each link in S .The failure of links in S can thus be represented by a vector −→d S that is obtained by OR-ing all the column vectors of D max representing individual links in S .Let us define the failure of a set of network links as the failure of all links in that set.A probe p k is said to distinguish the failures of two subsets E 1,E 2⊆E if and only if the corresponding k th entries in −→d E 1and −→d E 2are different,i.e.,d E 1(k )=d E 2(k ).The probe set P is said to distinguish the failures of two subsets E 1,E 2⊆E if and only if there exists a probe p ∈P such that p distinguishes E 1,E 2.We are interested in the following optimization problem.Definition 1.[PS problem]The probe selection problem is the determination of the smallest subset P ∗of P max ,such that any two subsets of E whose failures are distinguished by P max are also distinguished by P ∗.Let D ∗be the dependency matrix for the system with the set of probes P ∗.In terms of dependency matrices,the probe selection problem amounts to removing some rows of D max in order to obtain a new matrix D ∗that verifies the following properties:(i)D max and D ∗have the same number of columns,and (ii)whenever two vectors obtained by OR-ing up to e =|E|columns of D max are different,the two vectors obtained by OR-ing the same columns in D ∗are also different.The set of all binary vectors that represent single and multiple link failures of a network has a special property that the OR-ing of any two vectors is also a vector in the set.Any set of vectors with the above property is called a vector span [10].To solve the probe selection problem,we need to employ some special properties of a vector span.We,therefore,first study in Section 3.1properties of general vector spans,and then show how these properties can be applied to develop an algorithm for the probes selection problem in Section 3.2.3.1Mathematical basisLet D ={−→d i }1≤i ≤h be a set of binary vectors of equal length,and let I ={1,...,h }be the index set of D .A vector span S can be defined on D as follows.Definition 2.[Vector span]The vector span of D isS =<D >={i ∈I αi ·−→d i |αi ∈{0,1},−→d i ∈D}where “∨”denotes the binary max operation,and “·”denotes the usual multi-plication operation.Vectors in D are called the generator vectors of S .On the set D ,we define the following independence property [10].6Definition 3.[IP]The set D ={−→d i }i ∈I is independent if for all i ∈I and I 2⊆I \{i },−→d i /∈<{−→d j }j ∈I 2>.Merging Definition 3and Definition 4,we obtain the following definition.Definition 4.[Basis]A basis B of a span S is a set of independent vectors of S such that <B >=S .Assume we have a span S that is generated by a set of generator vectors D and has a basis B .The following lemmas follow from Definition 4,and are needed to solve the probe selection problem.Lemma 1.If D is finite,then S has a unique basis B that is the subset of D with smallest cardinality such that <B >=S .Proof.Wagneur [10]proved that spans over general vector sets have a unique basis,and hence this conclusion is also true for spans over binary vectors.We prove the second assertion of the Lemma by contradiction.Assume that there is a smaller subset of D ,namely B ,which satisfies <B >=S ,i.e.,that there exists at least one vector −→v of B that does not belong to B .Let us denote by I B the index set of B ,and by I B the index set of B .Let −→d i ,i ∈I B be thevectors of B .Since <B >=S ,there exists a non empty subset I v ⊆I B such that:−→v = i ∈I v−→d i .(1)Furthermore,since B is also a basis of S ,for each −→d i ∈B there is a nonemptysubset I i ⊆I B such that:−→d i = j ∈I i−→d j .(2)Substituting (2)in (1)yields −→v = j ∈I v −→d j ,where I v = i ∈I v I i .Since Bis independent,the only case where this can happen is that there exists an index k ∈I v such that:−→v =−→d k and −→d k ∨−→d l =−→d k for all l ∈I v \{k }.From (2),this implies that there exists i ∈I v such that −→d i =−→v ,which in turn indicates that −→v ∈B ;a contradiction to the assumption −→v /∈B .3.2Probe selection algorithmDenote by C (D max )and R (D max )the set of column vectors and row vectors of the matrix D max .Let <C (D max )>be the span generated by column vectors,called column span of D max ,and let <R (D max )>be the span generated by row vectors,called row span of D max .A vector in <C (D max )>represents subsets of E whose failures generate the same set of failed probes.We call the set of all the subsets of E whose failures are represented by the same vector a failure set .Two different vectors in <C (D max )>represent two failure sets that are distinguished by P max .Therefore,its cardinality |<C (D max )>|is the number of failure sets7 that can be distinguished by P max.Similarly,let D∗be the dependency matrix of the system with the set of probes P∗.Let R(D∗)and C(D∗)be respectively the set of column vectors and row vectors of D∗.|<C(D∗)>|is the number of failure sets that can be distinguished by P∗.Since P∗is a subset of P max,the number of failure sets that can be distin-guished by P∗is always less than or equal to the number of failure sets that can be distinguished by P max.Furthermore,any two subsets of E that can be distinguished by P∗can also be distinguished by P max.Thus,P∗distinguishes any two subsets of E that P max distinguishes if and only if the number of failure sets that are distinguishable by P∗is equal to the number of failure sets that are distinguishable by P max.Consequently,the probe selection problem amounts to find P∗such that the number of failure sets that can be distinguished by P∗and by P max are equal.Since each failure set is respectively represented by a column of D∗or D max,the solution of the probe selection problem is the smallest subset R(D∗)of R(D max)such that|<C(D∗)>|=|<C(D max)>|.Theorem1 below gives the solution to the probe selection problem.Theorem1.The solution to the probe selection problem is the set of probes whose corresponding rows in D max form the basis of<R(D max)>.Proof.Let D∗be a matrix whose rows are the basis of the span<R(D max)>, i.e.,such that<R(D∗)>=<R(D max)>.From[11],Theorem1.2.3,the row span and column span of any binary matrix have the same cardinality.Therefore, |<C(D∗)>|=|<R(D∗)>|=|<R(D max)>|=|<C(D max)>|, which yields that R(D∗)is a solution for the probe selection problem.Now, Lemmas1yields that R(D∗)is the smallest subset of<R(D max)>such that |<R(D∗)>|=|<R(D max)>|.Therefore,R(D∗)is the unique solution to the probe selection problem.We now give an algorithm,which we call the the P robe S election(PS)algo-rithm,thatfinds the basis of<R(D max)>.The weight of a vector is defined as the number of1entries in that vector.Let us denote the elements of R(D max)by{−→r1,−→r2,...,−→r nP max },where n Pmax=|P max|.The PS algorithm constructsthe set R(D∗)as follows.The PS algorithm∗to an empty set,and set an integer i to1;Step2:Sort and re-index the vectors in R(D max)in increasing weight order. Step3:Until R(D max)=∅repeat the loop:remove−→r i from R(D max);increase i by1;if−→r i/∈<R(D∗)>,then append−→r i to R(D∗).Step4:return R(D∗).Theorem2.The set of vectors R(D∗)returned by the PS algorithm is the basis of<R(D max)>.Proof.First,we prove that the vectors in R(D∗)are independent.Let us re-index the vectors−→r i in R(D∗)in the order of inclusion to R(D∗)by the PS algorithm.Step3of the PS algorithm prevents any−→r i∈R(D∗)to be obtained8by OR-ing any combination of vectors in{−→r i−1,−→r i−2,...,−→r1}.Furthermore,−→r i is not an OR-ing of any combination of vectors in{−→r i+1,...,−→r|R(D∗)|}.Indeed, if this was true,then the weight of−→r i would be larger than the weight of these vectors,which is impossible because by construction the weight of−→r i is smaller than or equal to the weight of−→r j for all j>i.From the above results,any vector −→ri∈R(D∗)is not an OR-ing of any combination of other vectors in R(D∗), hence the set R(D∗)is independent.Second,we prove that<R(D∗)>=<R(D max)>.Indeed,by construction,any vector in the set{−→r1,...,−→r nP max }either belongs to R(D∗),or is an OR-ingof some combinations of vectors in R(D∗).Note here that for any two nodes s and t,if P t,s and P s,t contain the same links,then the two row vectors that represent the probe from s to t,and the probe from t to s are equal.Furthermore,the vector that represents the path P t,s can only be generated by probes from at most two beacons(at node s and t).4Beacon placement problemWe have shown in Section3that given a set of beacons V B,there is an optimal set of row vectors R(D∗)of the dependency matrix that the beacons need to generate for multiple failure diagnosis.Once the optimal set of row vectors R(D∗)is determined,to generate these vectors we may not need all the available beacons. We are now interested infinding the minimal number of beacons needed to generate the probes corresponding to the vectors in R(D∗);this is the beacon placement problem defined as follows.Definition5.[BP problem]Given a network G=(V,E),with V B possible positions where we can place the beacons,the beacon placement(BP)problem is the determination of the smallest subset V∗of V B such that any two sets of links E1and E2that are distinguished by probes of V B are also distinguished by probes of V∗.We solve the beacon placement problem as follows.Wefirst assume that all nodes in V B are used as beacons andfind the optimal set of row vectors R(D∗) for this setting using the PS algorithm described in Section3.We then look for the smallest subset V∗of V B such that the set of vectors corresponding to probes from nodes in V∗contains R(D∗).4.1Hardness of the beacon placement problemTheorem3.The beacon placement problem is NP-hard.Proof.The proof for this theorem is trivial by realizing that in a network that uses shortest path routing with all links have equal weight,and with V B=V, the BP problem reduces to the well-known vertex cover problem[12].9 4.2A greedy algorithm for the beacon placement problemThe following beacon placement(BP)is a greedy algorithm that constructs V∗given R(D∗).Let V approx be the set of beacons returned by the BP algorithm, and let A and C be two subsets of R(D∗).For a beacon u,let us denote by R(u)the set of all vectors representing probes that can be generated from u. The steps of the BP algorithm are as follows.The BP algorithmStep1:Initialize V approx and A to empty sets,C to R(D∗).Step2:Until C=∅repeat the loop:pick a vector−→r∈C and append−→r to A;If for all nodes u in V B,−→r∈R(u),then include u in V approx and remove all the vectors in R(u)from C.Step3:Return V approx.The BP algorithm is said to have an approximation ratioρ(n)if for every≤ρ(n).graph G with n nodes,|V approx||V∗|Theorem4.The BP algorithm has a constant approximation factor of2. Proof.From Step2of the algorithm,for each vector in A,we add one or two nodes(as explained at the end of Section3.2,there is a maximum of two beacons that can send probes taking the same path and hence are represented by the same vector)to V approx,hence|V approx|≤2∗|A|(*).Any solution must include,for every vector in A,at least one beacon that can generate it.Furthermore,by construction,no two vectors in A can be generated by the same beacon.So the optimal beacon selection V∗is of size|V∗|≥|A| (**).Combining(*)and(**),we get|V approx|≤2∗|V∗|. 5Experimental studyWe apply our algorithms on ISP topologies that are inferred by the Rocketfuel tool[2].We investigate the number of beacons and the number of probes required for multiple failures diagnosis by our algorithms to that needed for single failure diagnosis by algorithms in[6]on three backbone ISP topologies with sizes ranging from small(Exodus:80nodes and147links)to medium(Telstra:115nodes and 153links),and large(Tiscali:164nodes and328links).For the sake of simplicity, we assume that all the ISPs use shortest path routing to route traffic.Recall that n is the number of nodes in the network.In our experiments,the number of nodes that be can be used as beacons(beacon candidates)|V B|is varied from n/100to n.We select the beacon candidates randomly by picking a random permutation of the set of nodes in the network.After building the dependency matrix as in Section3,we run the PS algorithm tofind the optimal set of probes and then the BP algorithm tofind the set of beacons that are required to generate these probes.We also run the algorithms described in[6] tofind the set of beacons and the set of probes for single fault diagnosis.Due to space constraint,we only present in this paper the results for the Tiscali10 0 1020 30 40 50 60 70 80 90 100 0 10 20 30 40 50 60 70 80 90 100P e r c e n t a g e o f n o d e s t h a t a r e u s e d a s b e a c o n s Percentage of nodes that can be used as beacons Tiscali-single Tiscali-multiple Fig.1.The number of beacons for single and multiple failure(s)diagnosis. 0 5 10 15 20 25 30 35 40 45 50 0 10 20 30 40 50 60 70 80 90 100P e r c e n t a g e o f u s e f u l p r o b e s Percentage of nodes that can be used as beaconsTiscali-single Tiscali-multiple Fig.2.The number of probes for single and multiple failure(s)diagnosis.topology.In the other topologies,the same results are obtained.In Fig.1,we plot the percentage of nodes that are actually used as beacons for multiple failures diagnosis and percentage of nodes that are actually used as beacons for the single failure diagnosis.We also plot the percentage of useful probes returned by the PS algorithm and the percentage of useful probes returned by the single fault algorithm in Fig.2.The number of useful beacons for multiple failures diagnosis is notably smaller than the number of beacon candidates for all sizes of the set of beacon candi-dates.This is especially true when the number of beacon candidates is large.We also observe a fast increase in the number of beacons required for multiple failure diagnosis when the number of beacon candidates increases.This can be explained by the increase in number of multiple failures that can be distinguished by the beacons.However,for single fault diagnosis,the number of beacons increases very slowly.This phenomenon can be explained by the fact that probes from even a small set of beacons are enough to detect and locate all single failures.We observe that for all sizes of the set of beacon candidates,the number of useful probes is less than a half of the total number of probes that can be sent in the network.The percentage of useful probes also decreases rapidly as the number of beacons increases for both multiple and single failure(s)cases.This phenomenon can be explained for both the single failure case and the multiple failure case as follows.In the single failure case,the number of useful probes remains relatively unchanged (approximately equal to the number of links)for various number of beacon candidates.Hence,when the total number of probes that can be sent in the network increases with the number of beacon candidates ,the percentage of useful probes decreases.In the multiple fault case,the number of useful probes decreases as the number of beacon candidates increases.This situation is explained by the availability of good “probes”(probes that help distinguish many failure scenarios).We also observe a large difference in the number of probes for multiple failures and the number of probes for single failure diagnosis in Fig.2.11 6ConclusionsIn this paper,we have investigated the use of active probing for link failure diag-nosis in ISP networks.We show that for multiple failures diagnosis the optimal set of probes can be found in polynomial time.On the contrary,the problem of optimizing the number of beacons for multiple failures diagnosis is NP-hard.We study the performance of our algorithms on existing ISP topologies.Our studies show that there is a great reduction in the number of probes and beacons that are available and the number of probes and beacons that are actually useful for multiple failures diagnosis.However,there are also remarkable differences in the number of probe and the number of beacons for single and multiple fault diag-nosis in all analyzed ISP topologies.Thesefigures can be used by ISP operators to trade offaccuracy of diagnosis for probing costs.We are working on various extensions of the present work.We obtained in this paper the optimal set of useful ing this optimal set of probes, we can study how many double,triple,etc.failures can be detected and located by an active probing system.We are also investigating how an active probing system can cope with missing and false probes.The challenge is to improve the robustness of the probing system to probe errors without much increasing in the probing costs.References1. A.Markopoulou,Iannaccone,G.,S.Bhattacharyya,Chuah,C.N.,C.Diot:Charac-terization of Failures in an IP Backbone.To appear in proceedings of the IEEE INFOCOM’04(2004)2.Spring,N.,Mahajan,R.,D.Wetherall:Measuring ISP topologies with Rocketfuel.Proceedings of ACM SIGCOMM(2002)indan,G.,H.Tangmunarunkit:Heuristics for internet map discovery.In pro-ceedings of the IEEE INFOCOM’00(2000)4.S.Jamin,C.Jin,Y.Jin,D.Raz,L.Zhang:On the placement of internet instrumen-tation.In proceedings of the IEEE INFOCOM’00(2000)5.Adler,M.,Bu,T.,Sitaraman,R.K.,Towsley,D.:Tree layout for internal networkcharacterizations in multicast networks.Lecture Notes in Computer Science2233 (2001)189–??6.Bejerano,Y.,Rastogi,R.:Robust monitoring of link delays and faults in IP net-works.In proceedings of the IEEE INFOCOM’03(2003)7.Horton,J.,A.Lopez-Ortiz:On the number of distributed measurement points fornetwork tomography.IMC’03(2003)8.S.W.Richard:TCP/IP illustrated.Addision-Wesley Publishing Company(1994)9.CAIDA:Cooperative Association for Internet Data Analysis.(/Tools/Skitter)10. E.Wagneur:Moduloids and pseudomodules:1dimension theory.Discrete Mathe-matics98(1991)57–7311.Kim,J.:Boolean Matrix theory and applications.Marcel Dekker(1982)12.Garey,M.R.,Johnson,D.S.:Computers and Intractibility:A guide to the theoryof NP-completeness.W.H.Freeman(1979)。

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