Polarizer Process Introdution
阿尔法拉瓦尔药业线_S用户手册说明书
2. Installation .............................................................................................. 8 2.1. Clearance for dismantling ........................................................................ 8 2.2. Foundations ....................................................................................... 8 2.3. Positioning and slope ............................................................................. 8 2.3.1 Horizontal positioning ............................................................................. 8 2.3.2 Vertical positioning ................................................................................ 8 2.4 Levelling .............................................................................................. 9 2.5 Cleanliness provisions .............................................................................. 9 2.6 Connecting the heat exchanger to the piping system ........................................... 9 2.7 Fitting and piping .................................................................................... 10
TFT LCD液晶成盒工艺介绍
b. Sealant break checker:
確認框膠pattern之塗佈情形(斷膠、框膠粗細)
c. Sealant pre cure:
將sealant中之溶劑揮發 使sealant黏度變高，以防止hot-press時sealant path之產生
Stage
APR Plate
• Material : poly-butadiene • filling PI solution with rough surface
Rubbing
回轉方向 延伸張力 配向前 配向中 磨擦熱 配向後
• Use mechanical force to rearrange the orientation of PI film
順序 24 順序 ቤተ መጻሕፍቲ ባይዱ5 順序 19~23 順序 18 順序 17
順序 26 順序 16
順序 15 順序 27 順序 14
順序 8~12 順序 7 順序 28
順序 6 順序 13
順序 5 順序 30~33 順序 1 順序 2 順序 29 順序 4 順序 3
15“之pattern
順序 6 順序 7
順序 8
a. 膠材黏度: 550 Poise
膠材黏度 b. 塗佈壓力: 0.2~0.5 kg/cm
2
c. 塗佈gap值: 25~30 μm d. 針頭孔徑: 0.25mm
塗佈時間 塗佈gap值 針頭孔徑
e. 塗佈速度: 0.15msec
玻璃 塗佈台面
框膠塗佈之圖形(pattern)
圖形之區別:
a.主圖形(main pattern)
順序 5
Performing Fluorescence Polarization Assays on the
Multimode Detection Performing FluorescencePolarization Assays on theVICTOR NivoIntroductionFluorescence Polarization (FP) is a homogeneous assay formatthat is highly suitable for many applications from occasionalusage to high throughput screening, due to rather inexpensive reagents and its signal stability1. In FP assays, polarized light isused to determine the rotation capabilities of smallfluorescently labelled molecules. With this assay principle, onecan indirectly detect whether tracer molecules are bound to amuch larger molecule or are freely rotating in solution. Theseare rather complex interrelationships on the assay as well as on the device side compared to other homogeneous, plate reader compatible assays. Hence, for users, it is often difficult to set up an FP assay correctly.For this reason, we describe in this T echnical Note how to set up a Fluorescence Polarization assay on the VICTOR® Nivo™multimode plate reader and provide guidance for protocoloptimization. The VICTOR Nivo is a compact multimode plate reader that provides all detection modes which are routinelyused in drug discovery: Absorbance, Luminescence,Fluorescence Intensity, as well as options for Alpha, Time-Resolved Fluorescence and Fluorescence Polarization. Due toits intuitive control software and small footprint, the platereader fits easily in any lab.For research use only. Not for use in diagnostic procedures.As an example assay, the Predictor™ hERG Fluorescence Polarization Assay2 was used and its principle is shown in Figure 1, where the fluorescently labelled small moleculesof the Predictor™ hERG Tracer Red can either bind to the hERG channel protein in Predictor™ membrane fraction or can rotate freely.Blocking of the hERG potassium channel is known to be a potential off-target activity of drug candidates2,3, that can lead to life-threatening arrhythmias. For this reason, effects on the hERG channel are investigated early in the drug discovery process using various methodologies, one of them being the Fluorescence Polarization assay.VICTOR Nivo Multimode Plate Reader2Figure 2. Plate layout for the instrument setup run on the VICTOR Nivo.Instrument Setup Run for Predictor ™ hERG FP Assay The instrument setup run is a step used to optimize the FP measurement protocol specifically for the Predictor ™ hERGFluorescence Polarization Assay (Invitrogen, # PV5365) with regard to Z-height and G factor . For this experiment, a set of assay controls is needed: Buffer Blank, Assay Blank, Free tracer control, Negative control and Positive control. The controls were prepared according to the assay manual 5 and were transferred in triplicates to a black 384-well assay plate (PerkinElmer , ProxiPlate # 6008260 or OptiPlate # 6007270) at a volume of 20 ul/well (Figure 2).1. Selection of FiltersIn order to set up a FP measurement protocol on the VICTOR Nivo, three filters and a dichroic mirror are needed: a 530/30 nm excitation filter, two 580/20 nm emission filters and a 565 nm dichroic mirror. Alternatively, a 50/50 beam splitter can be used, but assay performance may be impaired. Dedicated polarization filters are not needed as the necessary polarizing components are already located inside the plate reader, if the instrument is equipped with FP technology.2. Z-focus Height OptimizationUsing a free tracer control well (reference polarization control), the Z-focus height optimization was demonstrated for a 384-well ProxiPlate and 384-well OptiPlate. A FP Z-focus scan protocol was set up (excitation at 530 nm, emission at 580 nm) with 20 scan points between 0 and 20 mm (Figure 3). The emission values (either S or P) were plotted in the VICTOR Nivo control software (Figure 4). The plate specific optimal Z-focus height was determined at the emissionintensity maximum. For future FP measurements, this Z-focus height was transferred to the FP endpoint protocol ofthe control software.Figure 1. Assay Principle. If polarized light excites Tracer Red bound to the hERG channel protein, the emission light remains polarized, because the tracer-channel-complex rotates slowly during fluorescent lifetime. In contrast, inhibiting compounds in the ion channel block Tracer Red from binding. In case Tracer Red is replaced in the ion channel by a compound, it rotates quickly during fluorescent lifetime due to its small size. This is leading to highly depolarized emission light, which is detected by the instrument not only in S, but also in P orientation.3Figure 3. Z-focus scan protocol for the plate specific optimization of the Z-focus height.3. G Factor CalculationThe G factor is a correction factor used to compensate for differences in parallel and perpendicular optical components of the measurement device. Calculating the G factor isrecommended, if the true polarization should be determined. Here, it was calculated using the free tracer control wells. In the Predictor ™ hERG FP Assay, this reference control has a known value of 50 mP 5. As a first step, the assay plate was measured once with the FP endpoint protocol including a G factor of 1. The S and P channel results were then used to calculate the G factor using Microsoft Excel according to the following formula:G =S*(1 – )mP (T racer )1000P*(1 + )mP (T racer )1000If the literature polarization value is not known for the used fluorophore, the relative change of polarization values (ΔmP) upon treatment can be plotted to create dose-responsecurves. For this, the G factor does not need to be adjusted and can be kept at 1. T o calculate ΔmP , all resulting mP values of the curve are normalized to an assay relevant sample showing low polarization values such as the free tracer control, positive control or even the lowest compound concentration in this example.As a rule of thumb, G is usually 0.8 < G < 1.2. The assayspecific calculated G factor was inserted in the FP endpoint protocol of the control software and the measurement of the assay plate repeated. The G factor was determined correctly, if the known mP value of the reference control (here 50 mP , see above) is obtained as a result.4Figure 5. Final VICTOR Nivo measurement protocol for the Predictor™ hERG FP assay shown here for 384-well ProxiPlates.Compound Testing in the Predictor ™ hERG FP AssayThe known hERG channel inhibitors Astemizole (Cayman chemical, #16967) and T erfenadine (Cayman chemical, #20305) were tested in 16-point dose response curves in a concentration range of 3.3 µM - 0.2 pM in the FP assay. T o allow data correction in case of unspecific compound effects, both compounds were also tested in the presence of a saturating concentration of the inhibitor E-4031 (30 µM). The plate layout is shown in Figure 6.First, the test compounds were dissolved in DMSO and a 3-fold dilution series was prepared. Afterwards, all samples were diluted 1:25 in assay buffer. Compounds were transferred to the assay plate at a volume of 5 µl/well. The tracer was diluted to 4 nM and 5 µl/well were transferred into the assay. Finally, 10 µl/well of the Predictor™ hERG Membrane were dispensed into a ProxiPlate (PerkinElmer, # 6008260). After 2 hours ofincubation at room temperature, the assay plate was placed in the VICTOR Nivo to run the FP protocol with the measurementsettings shown in Figure 5.Figure 4. Z-focus height optimization was demonstrated in PerkinElmer OptiPlate and ProxiPlate using a FP Z-focus scan protocol (excitation at 530 nm, emission at 580 nm) with 20 scan points between 0 and 20 mm. The emission intensity maximum (red intersecting lines) was determined directly in the VICTOR Nivo software.5Figure 6. Plate layout for Compound Profiling in the Predictor ™ hERG assay. The compounds Astemizole and T erfenadine were tested in 16-point dose response (3.3 µM - 0.2 pM, triplicates per concentration) in the presence and absence of the inhibitor E-4031.ResultsAfter optimizing the FP protocol on the VICTOR Nivo, it was used to measure the assay plate containing controls. As shown in Figure 7, the free tracer control results in 50 mP on average, showing that the G factor has been optimized correctly using the literature value 5. Nevertheless, the actual assay window is the span between the negative (tracer and membrane) and positive control (tracer, membrane and 30 µM E-4031) in these experiments ~100 mP . Comparable results were obtained in the OptiPlate and ProxiPlate at a volume of 20 µl (data not shown). In addition, it can be helpful to look not only at the mP results but also to calculate the total intensity with the formula 2*P+S. For example, background signal (assay blank and buffer blank) is often highly polarized, but the intensities are actually very low. T aking the total intensity into account during data analysis can therefore helpavoid misinterpretation of results.Figure 7. Resulting mP values (left) and total intensity (right) of assay controls in ProxiPlate after protocol optimization on the VICTOR Nivo. For each sample, the mean and standard deviation of three wells are shown.In a subsequent experiment, the known inhibitors T erfenadine and Astemizole were tested in dose response in the FP assay, results are shown in Figure 8. The FP signal was detected 2 hours after incubation. Assay statistics for the two independent experiments are summarized in T able 1. For the calculations,16 positive control wells and 16 negative control wells were used. The Z prime values of 0.73 and 0.87 indicate a robust assayperformance for both experiments.Figure 8. The compounds Astemizole and Terfenadine were tested in dose response experiments. The following IC 50 values were determined: IC 50 (Astemizole)= 0.97 nM and IC 50 (Terfenadine)= 2.8 nM. For comparison, the assay manual 5 reports an IC 50 value of 1.9 nM for Astemizole. For each data point, the mean and standard deviation of three wells are shown.For a complete listing of our global offices, visit /ContactUsCopyright ©2021, PerkinElmer, Inc. All rights reserved. PerkinElmer ® is a registered trademark of PerkinElmer, Inc. All other trademarks are the property of their respective owners.211120 (145315) PKIPerkinElmer, Inc. 940 Winter StreetWaltham, MA 02451 USA P: (800) 762-4000 or (+1) 203-925-4602ConclusionWe demonstrated the steps for FP protocol setup and optimization on the VICTOR Nivo and used the established measurement protocol for testing hERG inhibitors in dose response in two independent experiments. Using the protocol optimization steps described in this technical note, VICTOR Nivo’s simple and flexible software enables users to quickly optimize FP assays. Software features such as the graph view for Z-focus scans and the applied G factor make it easy for users to determine the correctmeasurement height and to directly export the polarization values. Also, the innovative filter wheel with its built-in polarizingcomponents makes it possible to use any Fluorescence Intensity filter combination for FP assays. No dedicated polarization filters are needed, only a second identical emission filter is required. In summary, this demonstrates that its ease of use of FP assays is a valuable addition to the VICTOR Nivo, along with its standard detection technologies.References1. Lea WA, Simeonov A. Fluorescence Polarization assays in small molecule screening. Expert Opin Drug Discov. 2011;6(1):17-32. doi:10.1517/17460441.2011.5373222. Piper DR, Duff SR, Eliason HC, et al. Development of the predictor hERG Fluorescence Polarization assay using a membrane protein enrichment approach. Assay Drug Dev T echnol. 2008;6(2):213-223. doi:10.1089/adt.2008.1373. Birgit Priest, Ian M. Bell & Maria Garcia (2008) Role of hERG potassium channel assays in drug development, Channels, 2:2, 87-93, DOI: 10.4161/chan.2.2.60044. Dierk Thomas, Christoph Karle & Johann Kiehn (2004) Modulation of hERG potassium channel function by drug action, Annals of Medicine, 36:sup1, 41-46, DOI: 10.1080/174313804100325805. Predictor hERG Assay Manual (Rev. date: 28 October 2009, https:///order/catalog/product/PV5365#/PV5365)。
Cell工艺介绍
PI聚合体和液晶分子之间的亲和力，使液晶能沿着摩擦沟槽有 秩序地粘在取向层上。
Company Confidential
BOE Copyright ⓒ 2010
质量组织
PI Cleaner
Loader
Robot
Conveyer
Detergent Brush Chamber
DIW+ Clean Dry Air
DOCTOR ROLL ( BLADE)
版胴
用于安装APR Plate
ANILOX ROLL 基板
APR PLATE
取向层
印刷时托放Glass，要 求平坦度在20㎛以内.
Company Confidential
BOE Copyright ⓒ 2010
质量组织
Coater Machine
Table
Anilox Roll
IPA Load Convey Clean
Detergent Brush Clean
DIW Clean
Hypermixing Rinse
Company Confidential
BOE Copyright ⓒ 2010
质量组织
AirProcess knife of Cleaner PI Clean
更好的干燥效果; 风速的均一性: Chamber的稳定性 搬送方向
目的及清洗原理：小尺寸的玻璃基板是使其 本身高速的旋转来进行脱水，但由于基板的大型 化，这种方式渐渐被AK所取缔。AK是一种专门 针对大型玻璃基板的干燥方式，其主要干燥过程 是用slit 型的Nozzle喷出高压空气以形成一段 空气刀，对流过的玻璃基板进行干燥。主要的工 艺参数有：slit nozzle的角度，空气的流量和压 力，玻璃基板的传送速度。
POLARIZER, PROCESS FOR PRODUCING POLARIZER-PROTEC
专利名称：POLARIZER, PROCESS FOR PRODUCING POLARIZER-PROTECTING FILM, ANDLIQUID-CRYSTAL DISPLAY发明人：IRIE, Yasushi申请号：JP2009050029申请日：20090106公开号：WO09/119122P1公开日：20091001专利内容由知识产权出版社提供摘要：A polarizer is provided which is inhibited from suffering hardness unevenness and flatness unevenness in a high-temperature high-humidity environment and is highly reduced in light leakage and color unevenness. Also provided is a liquid-crystal display employing the polarizer. The polarizer comprises a polarizing element and two polarizer-protecting films (1, 2) between which the polarizing element is sandwiched. The polarizer is characterized in that the polarizer-protecting film (1) is a cellulose ester film satisfying both of the following expressions (A1) and (A2), having a solvent content of 0.01 mass% or lower, and having a sound velocity at 100°C in at least one of the machine direction and the transverse direction of 1.6-2.2 km/s, and that the polarizer-protecting film (2) is an optically anisotropic film having fluctuations in thickness-direction retardation (Rt) of 10 nm or less. Expression (A1) 2.0≤X+Y≤3.0 Expression (A2) 1.0≤Y≤2.5 (In the expressions, X indicates the degree of acetyl substitution of the cellulose ester; and Y indicates the degree of propionyl or butyryl substitution of the ester.)申请人：IRIE, Yasushi地址：2970, Ishikawa-machi, Hachioji-shi, Tokyo 1928505 JP,c/o Konica Minolta Opto,Inc. 2970, Ishikawa-machi, Hachioji-shi, Tokyo 1928505 JP 国籍：JP,JP更多信息请下载全文后查看。
液晶的mura介绍及资料
Updated：12/18/2010 Printed Date：12/18/2010 Rev.1.0
Page: 5
Prepared by : CS Daniel
Mura的成因
為何會有Mura產生— TFT製程而言 為何會有Mura產生—就TFT製程而言
Over-lap—TFT的主要構成為層與層之間的 關關相連，若某一層當中有shift的情況產生 就會產生異常，可能影響TFT的特性而造成 Mura。
Updated：12/18/2010 Printed Date：12/18/2010 Rev.1.0
Page: 7
Prepared by : CS Daniel
Mura的成因
為何會有Mura產生— LCM製程而 為何會有Mura產生—就LCM製程而 言
Roller—因機台roller的壓力過大或是roller上沾附異物， 造成panel經過roller後而產生丸狀或條狀mura。 Vacuum—因機台stage吸力過大而造成吸附後形成 stage mura。 Black-light—B/L本身Film材不良或其他來料造成異常 亦會形成mura現象，通常以交叉驗證等方式確認B/L是 否有異常現象。 Polarizer—偏光板本身來料不良，造成偏貼後形成 Mura，通常更換偏光板後即OK。
Page: 12
Prepared by : CS Daniel
各種 Mura
Symptom：Arch Mura Description：50%灰階畫面在Panel上方 可見。 Defect photo： Symptom：Around Strip Mura Description：位置於邊框四周或任一側色 差。 Defect photo：
POLARIZER原理介绍与应用
染料
較高
4. Iodine Polarizing Film
4.2 Structure of Polarizing Film
Protective Film (PE/PET)
Triacetyl Cellulose (TAC)
4. Iodine Polarizing Film
Polarizer 偏光膜(偏光板) : Polarizer、 Polarizing + film filter sheet plate
4.1 Main categories
種類
Iodine polarizer
偏光材 I2
優點
缺點
價格
應用產品
高透過性, 高溫高溼情形 手錶,計算 較低 高對比 下偏光率降低 機,PC等
3.2 A Set of Polarizers : Parallel
After passing through the parallel polarizers, the residual light is no more than 50%.
3. Function of Polarizer
3.2 A Set of Polarizers : Crossed
4.2 Structure of Polarizing Film
層別
1 2 3 4 5 6
構成
表面保護膜 保護層 偏光基體 保護層 黏著劑 分離膜
材料
PE,PET TAC PVA TAC 壓克力系 等 PET
功能
偏光膜的保護 偏光膜的支撐保護 偏光機制 偏光膜的支撐保護 LCD基板的黏貼 黏著劑的保護
1. Polarizer in Daily Life
偏光片讲义
熟
成
裁
切
矢
印
目檢/FQC
清
潔
DTS流程
包
裝
二次清潔
磨
邊
P. 27
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©2004, Daxon Technology Inc.
DTS Process
• Cutting process
Pickup Area
Input
Cutting
Wait for transfer
Accumulation
Introduction of process
製造程序 一，TAC膜表面蝕刻處理(F-line) 製造程序 二，染色延伸PVA並與處理後TAC膜面貼合成偏光子(A、Bline) 製造程序 三，偏光子與保護膜貼合為四層結構(B-line) 製造程序 四，離型膜上塗佈PSA膠(G-line) 製造程序 五，四層偏光子與離型膜貼合(G-line)後進入熟成 製造程序 六 ，裁切成適當尺寸並包裝
P. 28
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©2004, Daxon Technology Inc.
• Stamping process
–区分上\下片,上片矢印为红色,下片为兰色
A
收轴 吸
上片
E
收轴 吸
下片
P. 29
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©2004, Daxon Technology Inc.
• Inspection/cleaning
P. 31 2007/8/28
©2004, Daxon Technology Inc.
• Packing
– 真空包装,确保环境因素对偏光片影响最小
真空
P. 32
2007/8/28
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5
偏光板色板
Sumika Technology Co., Ltd.
【一般色板】
【偏光色板】
6
偏光板的特性及產品簡介
Polarizing Film（ Film（PL）： PL）：
1) 、PL即偏光膜之縮寫。
Sumika Technology Co., Ltd.
2) 、目前以三類染色法為主流，即：a)、碘系染色法 b)、染料系染色法 c)、膽固醇染色法三種。 3) 、以產品而言，碘系染色法效果（透光度）較好，而染料系染色法其耐久 度（耐溫度）較好。 4) 、雖亦有其他技術偏光板，但量產不易。
入射光
18
Anti-reflection Anti
抗反射塗佈原理為在原膜表面coating一層低折射率 膜， 利用光之破壞性干涉原理造成反射率下降。
Incident Light Reflective Light
Sumika Technology Co., Ltd.
屈折率の違 Different 屈折率の違 Different refractive う複数の refractive う複数の index layer コート層で index コート層で layer composite 構成 composite 構成
TAC
鹼化
水洗
水洗
水洗
乾燥
TAC乾燥
TAC水洗
TAC PVA染色工程 染色工程
貼合工程
No.8 No.7 No.6 No.5 No.4 No.3 No.2 No.1
貼合 乾燥 乾燥 水洗 洗淨 硼酸架橋 洗淨 染色 膨潤 水洗 PVA
各槽均有延伸功能 PF貼合 PF
TAC乾 燥 TAC水 洗
TAC
8
21
Anti-Glare Anti
AG :Anti-Glare 功能:抗眩光偏光板
Sumika Technology Co., Ltd.
為了避免光線被過度集中，將偏光膜的表面加工做成凹凸狀，將光線均勻地 分散，可達到防眩的效果。
PF TAC PAV TAC PSA SP
抗眩功能是在偏光板表面加上許 多細小粒子來造成光線的發散， 避免光線被過度集中
3 day
1 Day
※ 若有DBEF 若有DBEF 製程, 製程,則需再加 2-3 days (DBEF裁切 (DBEF裁切, 裁切,檢品 & 貼合工程) 貼合工程)
13
Sumika Technology Co., Ltd.
表面處理光學膜的特性
14
Sumika Technology Co., Ltd.
如上圖所示、 平行放置的話、可看見對面。 平行放置 如上圖所示、 將２張偏光板平行放置 將２張偏光板平行放置 平行放置的話、可看見對面。 平行放置 那是因為如上圖之光射入後、會將單面成分通過2張偏光板的關係。 那是因為如上圖之光射入後、會將單面成分通過2張偏光板的關係。
4
偏光板的機能---直交重疊狀態 偏光板的機能 --直交重疊狀態
水洗-2 D-1404
水洗-3 D-1405
9
偏光板半成品: :延伸 延伸/ /染色工程 染色工程＋ 偏光板半成品 ＋貼合工程
貼合工程: 貼合工程: 主要進行 TAC與 PVA貼合之作業，使延伸 染色過的PVA與經過鹼化的TAC貼合，完成 PL層(原反)。
Sumika Technology Co., Ltd.
微觀
23
DBEF增亮膜使用規範 3M DBEF 增亮膜使用規範
3M recommended peel off method
Sumika Technology Co., Ltd.
3M recommended handling guideline
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WV film 廣視角
提升液晶Panel 提升液晶Panel視野角的膜材 Panel視野角的膜材
Sumika Technology Co., Ltd.
光的干涉
在光線下的反射會造成人眼接受的光線過於強烈 ，經由AR/LR處理可降低反射進人眼的光線強度。 ＊減少外界反射以增加元件之光穿透度 ＊提高影像明晰度、增加對比、色彩飽和度
反射防止膜 AR/LR TAC
PF TAC PAV TAC PSA SP
Sumika Technology Co., Ltd.
材料缺陷: 材料缺陷: WV 煇點，製程瓶頸無法完 全遏止。
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WV film 廣視角
於接近於PSA膠層TAC使用WV TAC增加視角。
Sumika Technology Co., Ltd.
目前TN-LCD加廣視角膜仍是最普遍的廣視技術，當你從某個角度觀看TFT-LCD時， 發現顯示器的亮度急遽的損失(變暗)及變色。 較舊型的平面顯示器通常只有90度的視角，也就是左/右兩邊各45度。但只要只有 一位觀看者的話，這個問題就不存在。而只要超過一位以上的觀看者，就需要使 用廣視角產品使得多人一起觀看時不會有因角度變異產生的畫面變暗或變色。
TAC前處理製程示意圖 TAC前處理製程示意圖
Sumika Technology Co., Ltd.
TAC 前處理主要生產作業為進行TAC鹼化與水洗之作業，目的是增加TAC的親水 性，使與PVA黏合順利。
TAC 原反
鹼化
水洗
水洗
水洗
乾燥
鹼化後 TAC
檢品
鹼化(KOH) D-1401
水洗-1 D-1403
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Hard Coating TAC
HC TAC: Hard Coating TAC 功 能:高硬度、防磨損偏光板
Sumika Technology Co., Ltd.
將偏光板做表面硬度處理，可加強偏光板硬度以防止日常生活無意的刮傷。 一般保證>3H
PF TAC PAV TAC PSA SP
HC TAC 於TAC表面塗佈一層防刮傷
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偏光板構成
Sumika Technology Co., Ltd.
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Sumika Technology Co., Ltd.
Defect Introduction
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缺陷判定
※ 偏光板單體Defect檢驗手法: a) 未撕膜反射檢 b) 未撕膜透過檢
Sumika Technology Co., Ltd.
7
住華科技PL< PL<前段 前段> >製程示意圖 住華科技 PL<前段
TAC鹼化工程
Sumika Technology Co., Ltd.
※ 材料入料檢, 鹼化 延伸染色 ※ 材料入料檢 材料入料檢, ,鹼化, 鹼化, ,延伸染色, 延伸染色, , 材料入料檢, 鹼化, 延伸染色, 貼合工程L/T 貼合工程 L/T 貼合工程L/T L/T約 約5 5天 天. . 貼合工程L/T約 L/T約 ※ 塗膠 (PSA) 膠熟成 ※ 塗膠(PSA) 塗膠(PSA) (PSA)工程 工程 & & 膠熟成L/T 膠熟成L/T L/T 塗膠(PSA)工程 (PSA)工程 膠熟成L/T 約 約 10 10 天 天
Reflective Reflective Light Light Interference Interference AR & LR Layer Anti-reflection layer(1/4λ ) Polarizer
AR處理
LR & AR anti-reflection
＊減少外界反射以增加元件之光穿透度 ＊提高影像明晰度、增加對比、色彩飽和度
偏光板要使用時（ 偏光板要使用時（顧客工廠） 顧客工廠）需將PF 需將PF、 PF、SP撕下 SP撕下。 撕下。
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偏光板的機能---平行重疊狀態 偏光板的機能 --平行重疊狀態
【 偏光板機能 】 偏光板 偏光板
吸收軸 光射入
Sumika Technology Co., Ltd.
吸收軸
光可透過 光可透過
【 偏光板機能 】
吸收軸 光射入
Sumika Technology Co., Ltd.
偏光板 偏光板
吸收軸
幾乎不透光 幾乎不透光
如上圖所示、 垂直放置的話、幾乎看不見對面。 垂直放置 如上圖所示、 將２張偏光板垂直放置 將２張偏光板垂直放置 垂直放置的話、幾乎看不見對面。 垂直放置 那是因為如上圖之光射入後、偏光板會將光線吸收的關係。 那是因為如上圖之光射入後、偏光板會將光線吸收的關係。
PF TAC PAV WVTAC PSA SP
WV TAC廣視角
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Polarizer翹曲 Polarizer 翹曲
Sumika Technology Co., Ltd.
Pf 正翹曲
Sp 負翹曲
偏光板單體易受到外界環境『溫溼度』影響 偏光板單體易受到外界環境『溫溼度』影響 其收縮特性，力量由外往內，故當偏光板拆 其收縮特性，力量由外往內，故當偏光板拆 包使用過程中，請務必拆包後立即偏貼避免 包使用過程中，請務必拆包後立即偏貼避免 造成偏光板吸濕造成翹曲異常。 造成偏光板吸濕造成翹曲異常。
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Anti-Static Electricity Anti
AS : Anti-Static Electricity 功能:抗靜電
Sumika Technology Co., Ltd.
抗靜電薄膜可防止靜電的產生，保護電子產品及避免灰塵的產生。
PF TAC PAV TAC PSA SP
AS TAC 於TAC表面塗佈一層抗靜電層
透過檢 反射檢 SP SP Polarizer PF Polarizer PF
Polarizer manufacturing process (PL & OF)
【2011/02/25】
Sumika Quality Assurance Dept./CS Team