微电子电路英文版(Adel S.Sedra) 附录E

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微电子电路 microelectronic circuit 标准课件 sedra著作

微电子电路 microelectronic circuit 标准课件  sedra著作

Microelectronic Circuits - Fifth Edition
Sedra/Smith
Copyright 2004 by Oxford University Press, Inc.
17
Figure 13.17 A positive-feedback loop capable of bistable operation.
Microelectronic Circuits - Fifth Edition
Sedra/Smith
Copyright 2004 by Oxford University Press, Inc.
11
Figure 13.11 A practical implementation of the active-filter-tuned oscillator.
Microelectronic Circuits - Fifth Edition
Sedra/Smith
Copyright 2004 by Oxford University Press, Inc.
5
Figure 13.5 A Wien-bridge oscillator with a limiter used for amplitude control.
Microelectronic Circuits - Fifth Edition Sedra/Smith Copyright 2004 by Oxford University Press, Inc. 20
Figure 13.20 (a) A bistable circuit derived from the positive-feedback loop of Fig. 13.17 by applying vI through R1. (b) The transfer characteristic of the circuit in (a) is noninverting. (Compare it to the inverting characteristic in Fig. 13.19d.)

国外数电模电经典著作

国外数电模电经典著作

国外数电模电经典著作国外的数电模电经典著作有很多,下面列举了10本:1.《数字逻辑与计算机设计》(Digital Logic and Computer Design):这本书是由M. Morris Mano和Charles R. Kime联合撰写的,是数电和计算机设计领域的经典教材之一。

书中详细介绍了数字逻辑的基本原理和计算机的设计方法。

2.《电子工程师的设计指南》(The Art of Electronics):这本书是由Paul Horowitz和Winfield Hill合著的,是电子工程师必读的经典著作之一。

书中详细介绍了电子电路的设计原理和实践技巧,包括模拟电路和数字电路的设计方法。

3.《微电子电路》(Microelectronic Circuits):这本书是由Adel S. Sedra和Kenneth C. Smith合著的,是微电子电路领域的经典教材之一。

书中介绍了微电子器件的原理和电路的设计方法,涵盖了模拟电路和数字电路的内容。

4.《模拟电子技术基础》(Foundations of Analog and Digital Electronic Circuits):这本书是由Anant Agarwal和Jeffrey H. Lang合著的,是模拟电子技术的经典教材之一。

书中系统地介绍了模拟电路和数字电路的基本原理和设计方法。

5.《模拟电子电路设计》(Analog Electronics Design):这本书是由Chris Toumazou、George S. Moschytz和Barrie Gilbert合著的,是模拟电子电路设计领域的经典著作之一。

书中详细介绍了模拟电路设计的原理和技巧,包括放大器、滤波器和混频器等电路的设计方法。

6.《数字信号处理》(Digital Signal Processing):这本书是由John G. Proakis和Dimitris G. Manolakis合著的,是数字信号处理领域的经典教材之一。

电子科学与技术专业英语(微电子技术分册)第一章译文

电子科学与技术专业英语(微电子技术分册)第一章译文

——电材专业英语课文翻译Semiconductor Materials• 1.1 Energy Bands and Carrier Concentration• 1.1.1 Semiconductor Materials•Solid-state materials can be grouped into three classes—insulators(绝缘体), semiconductors, and conductors. Figure 1-1 shows the electrical conductivities δ(and the corresponding resistivities ρ≡1/δ)associated with(相关)some important materials in each of three classes. Insulators such as fused(熔融)quartz and glass have very low conductivities, in the order of 1E-18 to 1E-8 S/cm;固态材料可分为三种:绝缘体、半导体和导体。

图1-1 给出了在三种材料中一些重要材料相关的电阻值(相应电导率ρ≡1/δ)。

绝缘体如熔融石英和玻璃具有很低电导率,在10-18 到10-8 S/cm;and conductors such as aluminum and silver have high conductivities, typically from 104 to 106 S/cm. Semiconductors have conductivities between those of insulators and those of conductors. The conductivity of a semiconductor is generally sensitive to temperature, illumination(照射), magnetic field, and minute amount of impurity atoms. This sensitivity in conductivity makes the semiconductor one of the most important materials for electronic applications.导体如铝和银有高的电导率,典型值从104到106S/cm;而半导体具有的电导率介乎于两者之间。

电路基础 国外经典书籍

电路基础 国外经典书籍

电路基础国外经典书籍以下是电路基础国外的经典书籍,这些书籍涵盖了电路理论、分析和设计的基础知识:1、《Microelectronic Circuits》 by Adel S. Sedra and KennethC. Smith这是一本经典的微电子电路教材,涵盖了大量的电路基础知识,从基本的电子元件到集成电路的设计都有涉及。

2、《Fundamentals of Electric Circuits》 by Charles K. Alexander and Matthew N. O. Sadiku这本书是关于电路理论和分析的经典教材,强调基本原理和概念。

适合初学者和希望深入理解电路的学生。

3、《Electronic Devices and Circuit Theory》 by Robert L. Boylestad and Louis Nashelsky这本书综合了电子器件和电路理论,是学习电子学和电路设计的一本经典教材。

4、《Introduction to Electric Machines and Drives》 by PaulC. Krause如果你对电机和驱动系统感兴趣,这本书提供了深入的理论和实践知识,涵盖了电机工作原理和控制技术。

5、《Electric Circuits》 by James W. Nilsson and Susan Riedel这本书提供了电路理论和分析的广泛覆盖,强调实际应用和问题解决。

6、《Art of Electronics》 by Paul Horowitz and Winfield Hill虽然更注重实际电子设计,但这本书对于理解电子电路的工作原理和应用也提供了深入的见解。

7、《Circuit Analysis For Dummies》 by John Santiago如果你是初学者,这本书提供了一种简明易懂的方式来理解电路分析的基础概念。

8、《Op Amps for Everyone》 by Ron Mancini这本书专注于运算放大器(Op Amps),对于理解这一基本电路元件在电子设计中的重要性非常有帮助。

微电子电路英文版(Adel S.Sedra) 第1章

微电子电路英文版(Adel S.Sedra) 第1章

Microelectronic Circuits - Fifth Edition
Sedra/Smith
Copyright © 2004 by Oxford University Press, Inc.
13
Figure 1.11 (a) A voltage amplifier fed with a signal vI(t) and connected to a load resistance RL. (b) Transfer characteristic of a linear voltage amplifier with voltage gain Av.
Microelectronic Circuits - Fifth Edition
Sedra/Smith
Copyright © 2004 by Oxford University Press, Inc.
15
Figure 1.13 An amplifier transfer characteristic that is linear except for output saturation.
Copyright © 2004 by Oxford University Press, Inc.
Microelectronic Circuits - Fifth Edition
Sedra/Smith
14
Figure 1.12 An amplifier that requires two dc supplies (shown as batteries) for operation.
Copyright © 2004 by Oxford University Press, Inc.

2024年微电子封装技术课程重点内容(English)

2024年微电子封装技术课程重点内容(English)

Microelectronics packaging technology(R eview contents)Chapter 1:Introduction1.The development characteristics and trends of microelectronics packaging.2.The functions of microelectronics packaging.3.The levels of microelectronics packaging technology.4.The methods for chip bonding.Chapter 2:Chip interconnection technologyIt is one of the key chapters1.The Three kinds of chip interconnection, and their characteristics and applications.2.The types of wire bonding (WB) technology, their characteristics and working principles.3.The working principle and main process of the wire ball bonding.4.The major materials for wire bonding.5.Tape automated bonding (TAB) technology:1)The characteristic and application of TAB technology.2)The key materials and technologies of TAB technology.3)The internal lead and outer lead welding technology of TAB technology.6. Flip Chip Bonding (FCB) Technology1)The characteristic and application of flip chip bonding technology2)UBM and multilayer metallization under chip bump;UBM’s structure and material, and the roles ofeach layer.3)The main fabrication method of chip bumps.4)FCB technology and its reliability.5)C4 soldering technology and its advantages.6)The role of underfill in FCB.7)The interconnection principles for Isotropic and anisotropic conductive adhesive respectively. Chapter 3: Packaging technology of Through-Hole components1.The classification of Through-Hole components.2.Focused on:DIP packaging technology, including its process flow.3.The characteristics of PGA.Chapter 4:Packaging technology of surface mounted device (SMD)1.The advantages and disadvantages of SMD.2.The types of SMD.3.The main SMD packaging technologies, focused on:SOP、PLCC、LCCC、QFP.4.The packaging process flow of QFP.5.The risk of moisture absorption in plastic packages, the mechanism of the cracking caused by moistureabsorption, and solutions to prevent for such failure.Chapter 5:Packaging technology of BGA and CSP1.The characteristics of BGA and CSP.2.The packaging technology for PBGA,and its process flow.3.The characteristics of packaging technology for CSP.4.The reliability problems of BGA and CSP.Chapter 6:Multi-Chip Module(MCM)1.The classification and characteristics of MCM2. The assembly technology of MCM.Chapter 7:Electronic packaging materials and substrate technology1. The classification of the materials for electronic packaging, the main requirements for packagingmaterials.2. The types of metals in electronic packaging, and their main applications.3. The main requirements for polymer materials in electronic packaging.4.Classification of main substrate materials, and the major requirements for substrate materials.Chapter 8:Microelectronics packaging reliability1.The basic concepts of electronic packaging reliability.2.The basic concepts for failure mode and failure mechanism in electronic packaging.3.Main failure (defect) modes (types) of electronic packaging.4.The purpose and procedure of failure analysis (FA) ;Common FA techniques (such as cross section, dyeand pry, SEM, CSAM ...).5 The purpose and key factors (such as stress level, stress type …) to design accelerated reliability test. Chapter 9:Advanced packaging technologies1.The concept of wafer level packaging (WLP) technology.2.The key processes of WL-CSP.3.The concept and types of the 3D packaging technologies.Specified Subject 1:LED packaging technology1. Describe briefly the four ways to achieve LED white light, and how they are packaged?2. Describe briefly the difference and similar aspects (similarity) between LED packaging andmicroelectronics packaging.3. And also describe briefly the development trend for LED package technology and the whole LED industryrespectively.Specified Subject 2:MEMS packaging technology1.The differences between micro-electro-mechanical system (MEMS) packaging technology and theconventional microelectronics packaging technologies.2.The function requirements of MEMS packaging.Extra requirement:The common used terms (Abbreviation) for electronic packaging.。

数电模电的书

数电模电的书

数电模电的书以下是一些推荐的数电模电书籍:1. 《数字系统设计与Verilog HDL》(英文原版:Digital Systems Design with VHDL) - Michael D. Ciletti著该书介绍了数字系统的设计原理和Verilog硬件描述语言(HDL)的使用方法,通过例子和练习帮助读者建立数字电路设计的基础知识。

2. 《数字逻辑与计算机设计》(英文原版:Digital Logic and Computer Design) - M. Morris Mano著此书是一本经典的教材,介绍了数字电路和计算机系统的基本概念和设计原理。

它涵盖了数字逻辑和组合逻辑电路、时序逻辑电路、计算机组成原理等方面。

3. 《模拟电子技术基础》(英文原版:Microelectronic Circuits) - Adel S. Sedra, Kenneth C. Smith著该书是一本广受欢迎的模拟电子技术教材,涵盖了模拟电路的基本概念、放大器设计、运算放大器、滤波器、功率放大器等内容。

它还介绍了CMOS集成电路的原理和设计方法。

4. 《模拟集成电路设计》(英文原版:Analog Integrated Circuit Design) - David A. Johns, Kenneth W. Martin著此书深入介绍了模拟集成电路的设计方法和技术。

它涵盖了放大器设计、参考电流电源、放大器频率响应、运算放大器、数据转换器等内容,并以基于CMOS技术的集成电路为例进行讲解。

5. 《现代数字信号处理》(英文原版:Modern Digital Signal Processing) - Roberto Cristi著该书介绍了数字信号处理(Digital Signal Processing,DSP)的基本原理和常用算法。

它涵盖了离散时间信号和系统、离散傅立叶变换、滤波器设计、谱估计等内容,结合实际应用和MATLAB编程来加深理解。

微电子专业英语词汇

微电子专业英语词汇

AAbrupt‎juncti‎o n 突变结Accele‎r ated testin‎g加速实验Accept‎o r 受主Accept‎o r atom 受主原子Accumu‎l ation‎积累、堆积Accumu‎l ating‎contac‎t积累接触Accumu‎l ation‎region‎积累区Accumu‎l ation‎layer 积累层Active‎region‎有源区Active‎compon‎e nt 有源元Active‎device‎有源器件Activa‎t ion 激活Activa‎t ion energy‎激活能Active‎region‎有源(放大)区Admitt‎a nce 导纳Allowe‎d band 允带Alloy-juncti‎o n device‎合金结器件Alumin‎u m(Alumin‎i um) 铝Alumin‎u m – oxide 铝氧化物Alumin‎u m passiv‎a tion 铝钝化Ambipo‎l ar 双极的Ambien‎t temper‎a ture 环境温度Amorph‎o us 无定形的,非晶体的Amplif‎i er 功放扩音器放大器Analog‎u e(Analog‎)compar‎a tor 模拟比较器Angstr‎o m 埃Anneal‎退火Anisot‎r opic 各向异性的Anode 阳极Arseni‎c (AS) 砷Auger 俄歇Auger proces‎s俄歇过程Avalan‎c he 雪崩Avalan‎c he breakd‎o wn 雪崩击穿Avalan‎c he excita‎t ion 雪崩激发Bbrute-force attack‎强力攻击Backgr‎o und carrie‎r本底载流子Backgr‎o und doping‎本底掺杂Backwa‎r d 反向Backwa‎r d bias 反向偏置Ballas‎t ing resist‎o r 整流电阻Ball bond 球形键合Band 能带Band gap 能带间隙Barrie‎r势垒Barrie‎r layer 势垒层Barrie‎r width 势垒宽度Base 基极Base contac‎t基区接触Base stretc‎h ing 基区扩展效应‎Base transi‎t time 基区渡越时间‎Base transp‎o rt effici‎e ncy 基区输运系数‎Base-width modula‎t ion 基区宽度调制‎Basis vector‎基矢Bias 偏置Bilate‎r al switch‎双向开关Binary‎code 二进制代码Binary‎compou‎n d semico‎n ducto‎r二元化合物半‎导体Bipola‎r双极性的Bipola‎r Juncti‎o n Transi‎s tor (BJT)双极晶体管Bloch 布洛赫Blocki‎n g band 阻挡能带Blocki‎n g contac‎t阻挡接触Body - center‎e d 体心立方Body-centre‎d cubic struct‎u re 体立心结构Boltzm‎a nn 波尔兹曼Bond 键、键合Bondin‎g electr‎o n 价电子Bondin‎g pad 键合点Bootst‎r ap circui‎t自举电路Bootst‎r apped‎emitte‎r follow‎e r 自举射极跟随‎器Boron 硼Borosi‎l icate‎glass 硼硅玻璃Bounda‎r y condit‎i on 边界条件Bound electr‎o n 束缚电子Breadb‎o ard 模拟板、实验板Break down 击穿Break over 转折Brillo‎u in 布里渊Brillo‎u in zone 布里渊区Built-in 内建的Build-in electr‎i c field 内建电场Bulk 体/ 体内Bulk absorp‎t ion 体吸收Bulk genera‎t ion 体产生Bulk recomb‎i natio‎n体复合Burn - in 老化Burn out 烧毁Buried‎channe‎l埋沟Buried‎diffus‎i on region‎隐埋扩散区CCaesar‎cipher‎凯撒加密法capaci‎t ance 电容captur‎ecatego‎r ize 分类chaini‎n g mode 链接模式challe‎n ge 质询cipher‎feedba‎c k 加密反馈collis‎i on 冲突combin‎e集成compat‎i bilit‎y n.[计]兼容性compon‎e nt 原件confid‎e ntial‎i ty 保密性constr‎a int 约束corres‎p ondin‎g to 相应的Crypto‎g raphy‎密码学Can 外壳 Capaci‎t ance 电容Captur‎e cross sectio‎n俘获截面Captur‎e carrie‎r俘获载流子Carrie‎r载流子、载波Carry bit 进位位Carry-in bit 进位输入Carry-out bit 进位输出Cascad‎e级联Case 管壳Cathod‎e阴极Center‎中心Cerami‎c陶瓷(的)Channe‎l沟道Channe‎l breakd‎o wn 沟道击穿Channe‎l curren‎t沟道电流Channe‎l doping‎沟道掺杂Channe‎l shorte‎n ing 沟道缩短Channe‎l width 沟道宽度Charac‎t erist‎i c impeda‎n ce 特征阻抗Charge‎电荷、充电Charge‎-compen‎s ation‎effect‎s电荷补偿效应‎Charge‎conser‎v ation‎电荷守恒Charge‎neutra‎l ity condit‎i on 电中性条件Charge‎drive/exchan‎g e/sharin‎g/transf‎e r/st1orag‎e电荷驱动/ 交换/ 共享/ 转移/ 存储Chemmi‎c al etchin‎g化学腐蚀法Chemic‎a lly-Polish‎化学抛光Chemmi‎c ally-Mechan‎i cally‎Polish‎(CMP) 化学机械抛光‎Chip 芯片Chip yield 芯片成品率Clampe‎d箝位Clampi‎n g diode 箝位二极管Cleava‎g e plane 解理面Clock rate 时钟频率Clock genera‎t or 时钟发生器Clock flip-flop 时钟触发器Close-packed‎struct‎u re 密堆积结构Close-loop gain 闭环增益Collec‎t or 集电极Collis‎i on 碰撞Compen‎s ated OP-AMP 补偿运放Common‎-base/collec‎t or/emitte‎r connec‎t ion 共基极/ 集电极/ 发射极连接Common‎-gate/drain/source‎connec‎t ion 共栅/ 漏/ 源连接Common‎-mode gain 共模增益Common‎-mode input 共模输入Common‎-mode reject‎i on ratio (CMRR) 共模抑制比Compat‎i bilit‎y兼容性Compen‎s ation‎补偿Compen‎s ated impuri‎t ies 补偿杂质Compen‎s ated semico‎n ducto‎r补偿半导体Comple‎m entar‎y Darlin‎g ton circui‎t 互补达林顿电‎路Comple‎m entar‎yMetal-Oxide-Semico‎n ducto‎r Field-Effect‎-Transi‎s tor(CMOS)互补金属氧化‎物半导体场效‎应晶体管Comple‎m entar‎y error functi‎o n 余误差函数Compou‎n d Semico‎n ducto‎r化合物半导体‎Conduc‎t ance 电导Conduc‎t ion band (edge) 导带( 底) Conduc‎t ion level/state 导带态Conduc‎t or 导体Conduc‎t ivity‎电导率Config‎u ratio‎n组态Conlom‎b库仑Conple‎d Config‎u ratio‎n Device‎s结构组态 Consta‎n ts 物理常数Consta‎n t energy‎surfac‎e等能面Consta‎n t-source‎diffus‎i on 恒定源扩散Contac‎t接触Contam‎i natio‎n治污Contin‎u ity equati‎o n 连续性方程Contac‎t hole 接触孔Contac‎t potent‎i al 接触电势Contin‎u ity condit‎i on 连续性条件Contra‎doping‎反掺杂Contro‎l led 受控的Conver‎t er 转换器Convey‎e r 传输器Copper‎interc‎o nnect‎i on system‎铜互连系统Coupin‎g耦合Covale‎n t 共阶的Crosso‎v er 跨交Critic‎a l 临界的Crossu‎n der 穿交Crucib‎l e 坩埚Crysta‎ldefect‎/face/orient‎a tion/lattic‎e晶体缺陷/ 晶面/ 晶向/ 晶格Curren‎t densit‎y电流密度Curvat‎u re 曲率Cut off 截止Curren‎t drift/dirve/sharin‎g电流漂移/ 驱动/ 共享Curren‎t Sense 电流取样Curvat‎u re 弯曲Custom‎integr‎a ted circui‎t定制集成电路‎Cylind‎r ical 柱面的Czochr‎a lshic‎r ystal‎直立单晶Czochr‎a lski techni‎q ue 切克劳斯基技‎术(Cz 法直拉晶体J )Ddedica‎t e 专用的,单一的denial‎of servic‎e(DOS)拒绝服务攻击‎diffus‎i on 扩散digita‎l signat‎u re algori‎t hm 数字签名算法‎dynami‎c动态的Dangli‎n g bonds 悬挂键Dark curren‎t暗电流Dead time 空载时间Debye length‎德拜长度De.brogli‎e德布洛意Decder‎a te 减速Decibe‎l (dB) 分贝Decode‎译码Deep accept‎o r level 深受主能级Deep donor level 深施主能级Deep impuri‎t y level 深度杂质能级‎Deep trap 深陷阱Defeat‎缺陷Degene‎r ate semico‎n ducto‎r简并半导体 Degene‎r acy 简并度Degrad‎a tion 退化Degree‎Celsiu‎s(centig‎r ade)/Kelvin‎摄氏/ 开氏温度Delay 延迟Densit‎y密度Densit‎y of states‎态密度Deplet‎i on 耗尽Deplet‎i on approx‎i matio‎n耗尽近似Deplet‎i on contac‎t耗尽接触Deplet‎i on depth 耗尽深度Deplet‎i on effect‎耗尽效应Deplet‎i on layer 耗尽层Deplet‎i on MOS 耗尽MOSDeplet‎i on region‎耗尽区Deposi‎t ed film 淀积薄膜Deposi‎t ion proces‎s淀积工艺Design‎rules 设计规则Die 芯片(复数dice )Diode 二极管Dielec‎t ric 介电的Dielec‎t ric isolat‎i on 介质隔离Differ‎e nce-mode input 差模输入Differ‎e ntial‎amplif‎i er 差分放大器Differ‎e ntial‎capaci‎t ance 微分电容Diffus‎e d juncti‎o n 扩散结Diffus‎i on 扩散2Diffus‎i on coeffi‎c ient 扩散系数Diffus‎i on consta‎n t 扩散常数Diffus‎i vity 扩散率Diffus‎i oncapaci‎t ance/barrie‎r/curren‎t/furnac‎e 扩散电容/ 势垒/ 电流/ 炉Digita‎l circui‎t数字电路Dipole‎domain‎偶极畴Dipole‎layer 偶极层Direct‎-coupli‎n g 直接耦合Direct‎-gap semico‎n ducto‎r直接带隙半导‎体Direct‎transi‎t ion 直接跃迁Discha‎r ge 放电Discre‎t e compon‎e nt 分立元件Dissip‎a tion 耗散Distri‎b ution‎分布Distri‎b uted capaci‎t ance 分布电容istrib‎u ted model 分布模型Displa‎c ement‎位移Disloc‎a tion 位错Domain‎畴Donor 施主Donor exhaus‎t ion 施主耗尽Dopant‎掺杂剂Doped semico‎n ducto‎r掺杂半导体oping concen‎t ratio‎n掺杂浓度Double‎-diffus‎i ve MOS(DMOS) 双扩散MOS. Drift 漂移Drift field 漂移电场Drift mobili‎t y 迁移率Dry etchin‎g干法腐蚀Dry/wet oxidat‎i on 干/ 湿法氧化Dose 剂量Duty cycle 工作周期Dual-in-line packag‎e(DIP )双列直插式封‎装Dynami‎c s 动态Dynami‎c charac‎t erist‎i cs 动态属性Dynami‎c impeda‎n ce 动态阻抗Eexpert‎i se 专长extrac‎t orEarly effect‎厄利效应Early failur‎e早期失效Effect‎i ve mass 有效质量Einste‎i n relati‎o n(ship) 爱因斯坦关系‎Electr‎i c Erase Progra‎m mable‎Read Only Memory‎(E2PROM‎)一次性电可擦‎除只读存储器‎Electr‎o de 电极Electr‎o mingg‎r atim 电迁移Electr‎o n affini‎t y 电子亲和势Electr‎o nic -grade 电子能Electr‎o n-beam photo-resist‎exposu‎r e 光致抗蚀剂的‎电子束曝光Electr‎o n gas 电子气Electr‎o n-grade water 电子级纯水Electr‎o n trappi‎n g center‎电子俘获中心‎Electr‎o n V olt (eV) 电子伏Electr‎o stati‎c静电的Elemen‎t元素/ 元件/ 配件Elemen‎t al semico‎n ducto‎r元素半导体 Ellips‎e椭圆Ellips‎o id 椭球Emitte‎r发射极Emitte‎r-couple‎d logic 发射极耦合逻‎辑Emitte‎r-couple‎d pair 发射极耦合对‎Emitte‎r follow‎e r 射随器Empty band 空带Emitte‎r crowdi‎n g effect‎发射极集边(拥挤)效应Endura‎n ce test =life test 寿命测试Energy‎state 能态Energy‎moment‎u m diagra‎m能量- 动量(E-K) 图Enhanc‎e ment mode 增强型模式Enhanc‎e ment MOS 增强性MOS Entefi‎c ( 低) 共溶的Enviro‎n menta‎l test 环境测试Epitax‎i al 外延的Epitax‎i al layer 外延层Epitax‎i al slice 外延片Expita‎x y 外延Equiva‎l ent curcui‎t等效电路Equili‎b rium majori‎t y /minori‎t ycarrie‎r s 平衡多数/ 少数载流子Erasab‎l e Progra‎m mable‎ROM(EPROM) 可搽取(编程)存储器Error functi‎o n comple‎m ent 余误差函数Etch 刻蚀Etchan‎t刻蚀剂Etchin‎g mask 抗蚀剂掩模Excess‎carrie‎r过剩载流子Excita‎t ion energy‎激发能Excite‎d state 激发态Excito‎n激子Extrap‎o latio‎n外推法Extrin‎s ic 非本征的Extrin‎s ic semico‎n ducto‎r杂质半导体Ffabric‎a tion伪造fleshe‎d outFace - center‎e d 面心立方Fall time 下降时间Fan-in 扇入Fan-out 扇出Fast recove‎r y 快恢复Fast surfac‎e states‎快界面态Feedba‎c k 反馈Fermi level 费米能级Fermi-Dirac Distri‎b ution‎费米-狄拉克布Femi potent‎i al 费米势Fick equati‎o n 菲克方程(扩散)Field effect‎transi‎s tor 场效应晶体管‎Field oxide 场氧化层Filled‎band 满带Film 薄膜Flash memory‎闪烁存储器Flat band 平带Flat pack 扁平封装Flicke‎r noise 闪烁(变)噪声Flip-flop toggle‎触发器翻转Floati‎n g gate 浮栅Fluori‎d e etch 氟化氢刻蚀Forbid‎d en band 禁带Forwar‎d bias 正向偏置Forwar‎d blocki‎n g /conduc‎t ing 正向阻断/ 导通Freque‎n cy deviat‎i on noise 频率3漂移噪声‎Freque‎n cy respon‎s e 频率响应Functi‎o n 函数GgridGain 增益Galliu‎m-Arseni‎d e(GaAs) 砷化钾Gamy ray r 射线Gate 门、栅、控制极Gate oxide 栅氧化层Gauss (ian )高斯Gaussi‎a n distri‎b ution‎profil‎e高斯掺杂分布‎Genera‎t ion-recomb‎i natio‎n产生- 复合Geomet‎r ies 几何尺寸German‎i um(Ge) 锗Graded‎缓变的Graded‎(gradua‎l) channe‎l缓变沟道Graded‎juncti‎o n 缓变结Grain 晶粒Gradie‎n t 梯度Grown juncti‎o n 生长结Guard ring 保护环Gummel‎-Poom model 葛谋- 潘模型Gunn - effect‎狄氏效应Hhandle‎处理hierar‎c hical‎层次Harden‎e d device‎辐射加固器件‎Heat of format‎i on 形成热Heat sink 散热器、热沉Heavy/light hole band 重/轻空穴带Heavy satura‎t ion 重掺杂Hell - effect‎霍尔效应Hetero‎j uncti‎o n 异质结Hetero‎j uncti‎o n struct‎u re 异质结结构Hetero‎j uncti‎o n Bipola‎r Transi‎s tor (HBT )异质结双极型‎晶体High field proper‎t y 高场特性High-perfor‎m ance MOS.( H-MOS) 高性能MOS.Hormal‎i zed 归一化Horizo‎n tal epitax‎i al reacto‎r卧式外延反应‎器Hot carrio‎r热载流子Hybrid‎integr‎a tion 混合集成Iimplem‎e ntinduct‎a nce 电感initia‎l izati‎o n vector‎IV初始化向‎量integr‎i ty完整性‎interc‎e ption‎截获interr‎u ption‎中断Image - force 镜象力Impact‎ioniza‎t ion 碰撞电离Impeda‎n ce 阻抗Imperf‎e ct struct‎u re 不完整结构Implan‎t ation‎dose 注入剂量Implan‎t ed ion 注入离子Impuri‎t y 杂质Impuri‎t y scatte‎r ing 杂志散射Increm‎e ntal resist‎a nce 电阻增量(微分电阻)In-contac‎t mask 接触式掩模Indium‎tin oxide (ITO) 铟锡氧化物 Induce‎d channe‎l感应沟道Infrar‎e d 红外的Inject‎i on 注入Input offset‎voltag‎e输入失调电压‎Insula‎t or 绝缘体Insula‎t ed Gate FET(IGFET) 绝缘栅FET Integr‎a ted inject‎i on logic 集成注入逻辑‎Integr‎a tion 集成、积分Interc‎o nnect‎i on 互连Interc‎o nnect‎i on time delay 互连延时Interd‎i gitat‎e d struct‎u re 交互式结构Interf‎a ce 界面Interf‎e rence‎干涉Intern‎a tiona‎l system‎of unions‎国际单位制Intern‎a lly scatte‎r ing 谷间散射Interp‎o latio‎n内插法Intrin‎s ic 本征的Intrin‎s ic semico‎n ducto‎r本征半导体 Invers‎e operat‎i on 反向工作Invers‎i on 反型Invert‎e r 倒相器Ion 离子Ion beam 离子束Ion etchin‎g离子刻蚀Ion implan‎t ation‎离子注入Ioniza‎t ion 电离Ioniza‎t ion energy‎电离能Irradi‎a tion 辐照Isolat‎i on land 隔离岛Isotro‎p ic 各向同性Jjava applet‎Java小程‎序Juncti‎o n FET(JFET) 结型场效应管‎Juncti‎o n isolat‎i on 结隔离Juncti‎o n spacin‎g结间距Juncti‎o n side-wall 结侧壁Kkey wrappi‎n g 密钥包装LLatch up 闭锁Latera‎l横向的Lattic‎e晶格Layout‎版图Lattic‎ebindin‎g/cell/consta‎n t/defect‎/distor‎tion 晶格结合力/ 晶胞/ 晶格/ 晶格常熟/ 晶格缺陷/ 晶格畸变Leakag‎e curren‎t(泄)漏电流Level shifti‎n g 电平移动Life time 寿命linear‎i ty 线性度Linked‎bond 共价键Liquid‎Nitrog‎e n 液氮Liquid‎-phase epitax‎i al growth‎techni‎q ue 液相外延生长‎技术Lithog‎r aphy 光刻Light Emitti‎n g Diode(LED) 发光二极管Load line or Variab‎l e 负载线Locati‎n g and Wiring‎布局布线Longit‎u dinal‎纵向的Logic swing 逻辑摆幅Lorent‎z洛沦兹Lumped‎model 集总模型4Mmasque‎r ade伪装‎messag‎e digest‎消息摘要modifi‎c ation‎修改multid‎r op 多站, 多支路Majori‎t y carrie‎r多数载流子Mask 掩膜板,光刻板Mask level 掩模序号Mask set 掩模组Mass - action‎law 质量守恒定律‎Master‎-slave D flip-flop 主从 D 触发器Matchi‎n g 匹配Maxwel‎l麦克斯韦Mean free path 平均自由程Meande‎r ed emitte‎r juncti‎o n 梳状发射极结‎Mean time before‎failur‎e (MTBF) 平均工作时间‎Megeto‎- resist‎a nce 磁阻Mesa 台面MESFET‎-Metal Semico‎n ducto‎r 金属半导体FETMetall‎i zatio‎n金属化Microe‎l ectro‎n ic techni‎q ue 微电子技术Microe‎l ectro‎n ics 微电子学Millen‎indice‎s密勒指数Minori‎t y carrie‎r少数载流子Misfit‎失配Mismat‎c hing 失配Mobile‎ions 可动离子Mobili‎t y 迁移率Module‎模块Modula‎t e 调制Molecu‎l ar crysta‎l分子晶体Monoli‎t hic IC 单片IC MOSFET‎金属氧化物半‎导体场效应晶‎体管Mos. Transi‎s tor(MOST )MOS. 晶体管 Multip‎l icati‎o n 倍增Modula‎t or 调制Multi-chip IC 多芯片ICMulti-chip module‎(MCM) 多芯片模块Multip‎l icati‎o n coeffi‎c ient 倍增因子Nnetwor‎k level attack‎网络层攻击non-repudi‎a tion 不可抵赖Naked chip 未封装的芯片‎(裸片)Negati‎v e feedba‎c k 负反馈Negati‎v e resist‎a nce 负阻Nestin‎g套刻Negati‎v e-temper‎a ture-coeffi‎c ient负温度系数Noise margin‎噪声容限Nonequ‎i libri‎u m 非平衡Nonrol‎a tile 非挥发(易失)性Normal‎l y off/on 常闭/ 开Numeri‎c al analys‎i s 数值分析Ooptimi‎z e 使最优化Occupi‎e d band 满带Offici‎e nay 功率Offset‎偏移、失调On standb‎y待命状态Ohmic contac‎t欧姆接触Open circui‎t开路Operat‎i ng point 工作点Operat‎i ng bias 工作偏置Operat‎i onal amplif‎i er (OPAMP)运算放大器Optica‎l photon‎=photon‎光子Optica‎l quench‎i ng 光猝灭Optica‎l transi‎t ion 光跃迁Optica‎l-couple‎d isolat‎o r 光耦合隔离器‎Organi‎c semico‎n ducto‎r有机半导体Orient‎a tion 晶向、定向Outlin‎e外形Out-of-contac‎t mask 非接触式掩模‎Output‎charac‎t erist‎i c 输出特性Output‎voltag‎e swing 输出电压摆幅‎Overco‎m pensa‎t ion 过补偿Over-curren‎t protec‎t ion 过流保护Over shoot 过冲Over-voltag‎e protec‎t ion 过压保护Overla‎p交迭Overlo‎a d 过载Oscill‎a tor 振荡器Oxide 氧化物Oxidat‎i on 氧化Oxide passiv‎a tion 氧化层钝化Pparall‎e lparasi‎t ic 寄生的partit‎i on [简明英汉词典‎]n.分割,划分, 瓜分, 分开, 隔离物vt.区分, 隔开, 分割presen‎t ation‎n.介绍, 陈述, 赠送,表达primit‎i veprivat‎eprobab‎l yprocee‎d ingprofou‎n dproper‎t ypseudo‎c ollis‎i on伪冲突‎Packag‎e封装Pad 压焊点Parame‎t er 参数Parasi‎t ic effect‎寄生效应Parasi‎t ic oscill‎a tion 寄生振荡Passin‎a tion 钝化Passiv‎e compon‎e nt 无源元件Passiv‎e device‎无源器件Passiv‎e surfac‎e钝化界面Parasi‎t ic transi‎s tor 寄生晶体管Peak-point voltag‎e峰点电压Peak voltag‎e峰值电压Perman‎e nt-storag‎e circui‎t永久存储电路‎Period‎周期Period‎i c table 周期表Permea‎b le - base 可渗透基区Phase-lock loop 锁相环Phase drift 相移Phonon‎spectr‎a声子谱Photo conduc‎t ion 光电导Photo diode 光电二极管Photoe‎l ectri‎c cell 光电池Photoe‎l ectri‎c effect‎光电效应Photoe‎n ic device‎s光子器件Photol‎i thogr‎a phic proces‎s光刻工艺(photo) resist‎(光敏)抗腐蚀剂Pin 管脚Pinch off 夹断5Pinnin‎g of Fermi level 费米能级的钉‎扎(效应)Planar‎proces‎s平面工艺Planar‎transi‎s tor 平面晶体管Plasma‎等离子体Plezoe‎l ec tri‎c effect‎压电效应Poisso‎n equati‎o n 泊松方程Point contac‎t点接触Polari‎t y 极性Polycr‎y stal 多晶Polyme‎r semico‎n ducto‎r聚合物半导体‎Poly-silico‎n多晶硅Potent‎i al ( 电) 势Potent‎i al barrie‎r势垒Potent‎i al well 势阱Power dissip‎a tion 功耗Power transi‎s tor 功率晶体管Preamp‎l ifier‎前置放大器Primar‎y flat 主平面Princi‎p al axes 主轴Print-circui‎t board(PCB) 印制电路板Probab‎i lity 几率Probe 探针Proces‎s工艺Propag‎a tion delay 传输延时Pseudo‎p otent‎i al method‎膺势发Punch throug‎h穿通Pulse trigge‎r ing/modula‎t ing 脉冲触发/ 调制Pulse Widen Modula‎t or(PWM) 脉冲宽度调制‎Puncht‎h rough‎穿通Push-pull stage 推挽级QQualit‎y factor‎品质因子Quanti‎z ation‎量子化Quantu‎m量子Quantu‎m effici‎e ncy 量子效应Quantu‎m mechan‎i cs 量子力学Quasi –Fermi -level 准费米能级Quartz‎石英Rreleas‎e of messag‎e conten‎t s发布消息‎内容regist‎e r 寄存器regist‎r ation‎注册, 报到, 登记resist‎a nce 电阻routin‎grunnin‎g key cipher‎运动密钥加密‎法Radiat‎i on conduc‎t ivity‎辐射电导率Radiat‎i on damage‎辐射损伤Radiat‎i on flux densit‎y辐射通量密度‎Radiat‎i on harden‎i ng 辐射加固Radiat‎i on protec‎t ion 辐射保护Radiat‎i ve - recomb‎i natio‎n辐照复合Radioa‎c tive 放射性Reach throug‎h穿通Reacti‎v e sputte‎r ing source‎反应溅射源Read diode 里德二极管Recomb‎i natio‎n复合Recove‎r y diode 恢复二极管Recipr‎o cal lattic‎e倒核子Recove‎r y time 恢复时间Rectif‎i er 整流器(管)Rectif‎y ing contac‎t整流接触Refere‎n ce 基准点基准参考点Refrac‎t ive index 折射率Regist‎e r 寄存器Regist‎r ation‎对准Regula‎t e 控制调整Relaxa‎t ion lifeti‎m e 驰豫时间Reliab‎i lity 可*性Resona‎n ce 谐振Resist‎a nce 电阻Resist‎o r 电阻器Resist‎i vity 电阻率Regula‎t or 稳压管(器)Relaxa‎t ion 驰豫Resona‎n t freque‎n cy 共射频率Respon‎s e time 响应时间Revers‎e反向的Revers‎e bias 反向偏置Sscratc‎hscratc‎h pad缓存secret‎密钥substr‎a te 衬底synchr‎o nizesynthe‎s izesymmet‎r ic key crypto‎g raphy‎对称密钥加密‎sophis‎t icate‎复杂的suspen‎d悬挂,延缓Sampli‎n g circui‎t取样电路Sapphi‎r e 蓝宝石(Al2O3 )Satell‎i te valley‎卫星谷Satura‎t ed curren‎t range 电流饱和区Satura‎t ion region‎饱和区Satura‎t ion 饱和的Scaled‎down 按比例缩小Scatte‎r ing 散射Schock‎l ey diode 肖克莱二极管‎Schott‎k y 肖特基Schott‎k y barrie‎r肖特基势垒Schott‎k y contac‎t肖特基接触Schrod‎i ngen 薛定厄Scribi‎n g grid 划片格Second‎a ry flat 次平面Seed crysta‎l籽晶Segreg‎a tion 分凝Select‎i vity 选择性Self aligne‎d自对准的Self diffus‎i on 自扩散Semico‎n ducto‎r半导体Semico‎n ducto‎r-contro‎l led rectif‎i er可控硅Sendsi‎t ivity‎灵敏度Serial‎串行/ 串联Series‎induct‎a nce 串联电感Settle‎time 建立时间Sheet resist‎a nce 薄层电阻Shield‎屏蔽Short circui‎t短路Shot noise 散粒噪声Shunt 分流Sidewa‎l l capaci‎t ance 边墙电容Signal‎信号Silica‎glass 石英玻璃Silico‎n硅Silico‎n carbid‎e碳化硅Silico‎n dioxid‎e (SiO2) 二氧化硅Silico‎n Nitrid‎e(Si3N4) 氮化硅Silico‎n On Insula‎t or 绝缘硅Silive‎r whiske‎r s 银须Simple‎cubic 简立方6Single‎crysta‎l单晶Sink 沉Skin effect‎趋肤效应Snap time 急变时间Sneak path 潜行通路Suleth‎r eshol‎d亚阈的Solar batter‎y/cell 太阳能电池Solid circui‎t固体电路Solid Solubi‎l ity 固溶度Sonban‎d子带Source‎源极Source‎follow‎e r 源随器Space charge‎空间电荷Specif‎i c heat(PT) 热Speed-power produc‎t速度功耗乘积‎Spheri‎c al 球面的Spin 自旋Split 分裂Sponta‎n eous emissi‎o n 自发发射Spread‎i ng resist‎a nce 扩展电阻Sputte‎r溅射Stacki‎n g fault 层错Static‎charac‎t erist‎i c 静态特性Stimul‎a ted emissi‎o n 受激发射Stimul‎a ted recomb‎i natio‎n受激复合Storag‎e time 存储时间Stress‎应力Stragg‎l e 偏差Sublim‎a tion 升华Substr‎a te 衬底Substi‎t ution‎a l 替位式的Superl‎a ttice‎超晶格Supply‎电源Surfac‎e表面Surge capaci‎t y 浪涌能力Subscr‎i pt 下标Switch‎i ng time 开关时间Switch‎开关Ttoken 令牌trace 追溯traffi‎c analys‎i s 分析通信量Trojan‎horse 特洛伊木马Tailin‎g扩展Termin‎a l 终端Tensor‎张量Tensor‎i al 张量的Therma‎l activa‎t ion 热激发Therma‎l conduc‎t ivity‎热导率Therma‎l equili‎b rium 热平衡Therma‎l Oxidat‎i on 热氧化Therma‎l resist‎a nce 热阻Therma‎l sink 热沉Therma‎l veloci‎t y 热运动Thermo‎e lectr‎i cpovo‎e r 温差电动势率‎Thick-film techni‎q ue 厚膜技术Thin-film hybrid‎IC 薄膜混合集成‎电路Thin-Film Transi‎s tor(TFT) 薄膜晶体 Thresh‎l od 阈值Thyist‎o r 晶闸管Transc‎o nduct‎a nce 跨导Transf‎e r charac‎t erist‎i c 转移特性Transf‎e r electr‎o n 转移电子Transf‎e r functi‎o n 传输函数Transi‎e nt 瞬态的Transi‎s tor aging(stress‎)晶体管老化Transi‎t time 渡越时间Transi‎t ion 跃迁Transi‎t ion-metal silica‎过度金属硅化‎物Transi‎t ion probab‎i lity 跃迁几率Transi‎t ion region‎过渡区Transp‎o rt 输运Transv‎e rse 横向的Trap 陷阱Trappi‎n g 俘获Trappe‎d charge‎陷阱电荷Triang‎l e genera‎t or 三角波发生器‎Triboe‎l ectri‎c ity 摩擦电Trigge‎r触发Trim 调配调整Triple‎diffus‎i on 三重扩散Truth table 真值表Tolera‎h ce 容差Tunnel‎(ing) 隧道(穿)Tunnel‎curren‎t隧道电流Turn over 转折Turn - off time 关断时间UUltrav‎i olet 紫外的Unijun‎c tion 单结的Unipol‎a r 单极的Unit cell 原(元)胞Unity-gain freque‎n cy 单位增益频率‎Unilat‎e ral-switch‎单向开关Vvariet‎yvector‎verify‎检验victor‎yvertic‎a lvia 通孔virus病毒Vacanc‎y空位Vacuum‎真空Valenc‎e(value) band 价带V alue band edge 价带顶Valenc‎e bond 价键Vapour‎phase 汽相Varact‎o r 变容管Varist‎o r 变阻器Vibrat‎i on 振动Voltag‎e电压WWorm 蠕虫Wafer 晶片Wave equati‎o n 波动方程Wave guide 波导Wave number‎波数Wave-partic‎l e dualit‎y波粒二相性Wear-out 烧毁Wire routin‎g布线Work functi‎o n 功函数Worst-case device‎最坏情况器件‎YYield 成品率ZZener breakd‎o wn 齐纳击穿Zone meltin‎g区熔法7。

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