2014-test-02
湖北省黄冈中学2014届高考模拟试卷 英语(一)2

湖北省黄冈中学2014届高考模拟试卷英语(一)2高考英语2014-02-25 2014()Many people will remember the flight of the space shuttle(航天飞机)challenger,in June,1983. The achievement of Sally Ride,America’s first woman astronaut to fly into space,made this flight especially memorable. Students from two Camden, New Jersey, high schools, however, are probably to remember Norma rather than Sally whenever they think about the flight.Norma didn’t travel alone. She brought about 20140 companions along with her. Norma was an ant,a queen ant who,with her subject,made up the first ant colony(群体)to travel into space. The ants were part of a science experiment designed by students to test the effects of weightlessness on insects.The equipment designed by the students for their colony functioned perfectly throughout the long space trip. The young scientists and their teachers were very sad to find that their insect astronauts had all died at some point before the container was returned to the school and opened. The problem didn’t occur in space,but on the ground after challenger had landed. The container remained in the desert for nearly a week before the ant colony was moved. The hot,dry desert air dried out the colony’s container and the ants died from lack of moisture(水分).The project was termed success because it did provide useful information. Students will continue their efforts to pinpoint(精确找到)what went wrong. They will try to prevent the same difficulties from reoccurring on future missions. They don’t want to be discouraged either by the demise of the ants or by the $ 2014,000 shuttle fare they will have to pay to send the next colony of ants into space.51.What does the passage mainly tell us?A.Sally Ride,America’s first woman astronaut.B.How to keep ants alive in space.C.How to make equipment for insects in space.D.An experiment with ants in space.52.According to the passage, we know that the underlined word“demise”is another word for“_____”.A.death B.colonyC.insect D.moisture53.We don’t think the project was a failure. This is because_____.A.everything went as smoothly as expectedB.the students had pinpointed exactly the reasonC.something important had been learnedD.the students had succeeded in the experiment54.We can conclude that ants _____ on the next space trip.A.will have to be kept alive in a container full of waterB.will have to be sent into space with the first woman astronautC.should be put into a container where there is enough foodD.should be put into a container which is not too dryBRussian President Putin named Time magazine’s“Person of the Year”Russian President Vladimir Putin was named Time magazine’s“Person of the Year”on December 19th.2007 for strengthening stability(稳定)that made Russia a world power again.The magazine recognized Putin’s“extraordinary feat(技艺)of leadership in taking a country that was in a mess and bringing it stability,”said Richard Stengel,Time’s managing editor.The magazine noted that“Person of the Year”is not an honor or an endorsement(认可)but a recognition of leadership that shapes the world.Putin,who is 56 years old,is very popular in Russia,making a great effort to cause economy to come to life on revenue(收入)from oil and natural gas.Putin recently supported vice-PM Dmitry Medvedev’s presidential bid,and said he would accept Medvedev’s offer to serve as prime minister if Medvedev is elected on March 2.The Kremlin said Wednesday the Time recognition was seen there as an acknowledgement o f Putin’s role in helping Russia pull out of its social and economic troubles in the 1990s.Others considered for“Person of the Year”included Nobel Prize-winner Al Gore and author J.K. Rowling.This year’s choice was a return to the magazine’s traditio n of picking an individual rather than last year’s choice of“You”,which refers to anyone creating or using content on the World Wide Web.Putin is the fifth Russian(or Soviet)leader to be named Person of the Year:Gorbachev,Andropov,Khrushchev and Stalin,who was named twice.55.How did Putin try to make Russia a world power again?A.By performing arms race.B.By making war.C.By strengthening stability.D.By getting foreign help.56.Which of the following is Not True according to the passage?A.Russia used to be in a mess.B.Time always picks an individual to be the“Person of the Year”.C.Oil and natural gas caused Russia’s economy to come to life.D.Putin will leave office on March 2,2007.57.What does the underlined word“acknowledgement”mean?A.Praise.B.Support.C.Scold.D.Recognition.58.How many times have Russian leaders been named“Person of the Year”so far?A.Five times.B.Six times.C.Seven times.D.Eight times.。
山东省泰安市2014届高三一模考试英语试题2

山东省泰安市2014届高三一模考试英语试题2高考英语2014-04-02 1548need both knowledge and reasoning,we need to explore teaching methods that target both.”‘The current education systems and asessment of China and the US do not emphasize on deep understanding of scientific reasoning in the disciplines of science;technology,engineering andmathematics(STEM),the study concluded.Bao explained that reasoning is good skill for everyone topossess-not just scientists andengineers:The general public also need good reasoning skills in order to correctly interpretscientific findings and think rationally.STEM students need to excael at scientific reasoning in order to handle open-ended real-world tasks in their future careers in science and engineering.How to boost scientific reasoning?The study suggests that educators must go beyond teaching science facts if they hope to boost students’reasoning ability.Bao points to inquiry-basedleaming.where students work in groups,question teachers and design their owu investigations.This teaching technique is growing in popularity worldwide.67.According to the research,we know thatA.Chinese students and their US counterparts did poorly in the first two testsB.Chinese students did beaer than their US counterparts in alI the three testsC.Chinese students did beaer than their US counterparts in the first two tests ‘D.US students did beaer than their Chinese counterparts in the third test68.The conventional wisdom holds that .A.the more facts~tudents are taught,the more reasoning skills they will acquireB.the general public also need reasoning skills to interpret scientific findingsC.to boost students’reasoning ability,educators must explore teaching methodsD.the current education Systems are harmful to improvestudents’reason ing ability69.Based on the study,what will be done to improvestudents’reasoning ability?A.To improve teaching techniques. B.To betterstudents’learning conditions.C.To teach students more science facts. D.To offer students more tests.70.The underlined phrase“excel at”in Paragraph 6 probablymeans .A.be worse at B.be beaer at C.be enthusiastic about D.be inferior to71.Which of the following is correct according to the passage?A.Little needs to be done to develop students’reason ing ability in the US.B.Only scientists and engineers need reasoning abilities.C.Two tests were carried out to evaluate students’scientific reasoning.D.Inquiry-based learning is a good way to boost students’reasoning ability.DMarriages improve after children grow up and move out,according to an academic study,which suggests an“empty nest”is not always a bad thing.Popular wisdom has it that parents’relationships may suffer once their young fly the coop,because they feel they have lost their purpose in life.However,a new study by researchers at theUniversity of California,Berkeley,has found that many couples actually feel happier when theirchildren leave home because they are able to enjoy spending time together.In total,123 American mothers born in the 1930s were tracked for 18 years and asked to ratetheir satisfaction levels shortly after marrying,when they were bringing up babies,once theirchildren reached their teenage years and finally at age 61,when almost all had“empty nests”.Although not all said they were happier in general,most claimedtheir marriages had improved since their children had left home.Researchers believe this is not just because the spouses were spending more time together,but because they were able to enjoy each other’s c ompany more.One of the participants in the study,which is published in the jourmal Psychological Science,said:“Once the kids grow up…there’s some of that stress removed…that responsibility removed,so things are a little more relaxed.’’Psychologist Sara Gorchoff,who carried out the investigation,said:“The take-home messagefor couples with young children is‘hang in there’.”Her co-author Oliver John added:“Don’t wait until your kids leave home to schedule quality time with your partner.”However,Dr Dorothy Rowe,from the British Psychological Society,said the effects of livingin an“empty nest'”will depend on the parents’relationship with their children.“If yod’re justwaiting for them to leave home so you Can get on with your life,then of course you’11 be p leased to see them go,”she said,‘‘But if you’ve built your life around your children you’11 be terribly lonely.”For some parents,their world falls apart when their Children leave.’’72.It is commonly believed thatA.marriages improve after children leave homeB.an“empty nest'’is always a happy thingC.parents’relationships may suffer once their young grow up and move outD.parents will be pleased after their children leave home73.When did many couples feel happier according to the study?A.At age 61.when a lmost all had“empty nests”.B.Shortly after marrying.C.Once their children reached their teenage years.D.Whentheywerebringingupbabies.74.Marriages improve after children fly the coop not becauseA.many couples are able to spend time togetherB.many couples arc able to enjoy each other’s companyC.things are a little more relaxedD.many couples needn’t work at all75.The author ofthe passage tends to agree that .A.parents should build their life around their kidsB.parents should schedule quality time with each other before kids leave homeC.parents’relationship with their kids has no effect on marriages at allD.parents should be pleased to see their kids leave home第Ⅱ卷(共45分)注意事项:1. 用钢笔或圆珠笔直接答在试卷上2. 答卷前将密封线内的项目填写清楚。
2014考研英语阅读真题:考研英语(一)第2篇-毙考题

2014考研英语阅读真题:考研英语(一)第2篇-毙考题2014考研英语阅读真题:考研英语(一)第2篇All around the world, lawyers generate more hostility than the members of any other profession —with the possible exception of journalism.But there are few places where clients have more grounds for complaint than America.During the decade before the economic crisis, spending on legal services in America grew twice as fast as inflation.The best lawyers made skyscrapers-full of money, tempting ever more students to pile into law schools.But most law graduates never get a big-firm job.Many of them instead become the kind of nuisance-lawsuit filer that makes the tort system a costly nightmare.There are many reasons for this. One is the excessive costs of a legal education.There is just one path for a lawyer in most American states:a four-year undergraduate degree in some unrelated subject,then a three-year law degree at one of 200lawOne idea is to allow people to study law as an undergraduate degree.Another is to let students sit for the bar after only two years of law school.If the bar exam is truly a stern enough test for a would-be lawyer, those who can sit it earlier should be allowed to do so.Students who do not need the extra training could cut their debt mountain by a third.The other reason why costs are so high is the restrictive guild-like ownership structure of the business.Except in the District of Columbia, non-lawyers may not own any share of a law firm.This keeps fees high and innovation slow.There is pressure for change from within the profession,but opponents of change among the regulators insist thatkeeping outsiders out of a law firm isolates lawyers from the pressure to make money rather than serve clients ethically.In fact, allowing non-lawyers to own shares in law firms would reduce costs and improve services to customers,by encouraging law firms to use technology and to employ professional managers to focus on imp roving firms’ effi ciency.After all, other countries, such as Australia and Britain, have started liberalizing their legal professions. America should follow.整个世界范围内,律师比起其他任何职业的人员引起更多的敌意--可能除了新闻业人员。
初中毕业生英语能力评价与测试(2)

初中毕业生英语能力评价与测试(2)作者:肖丽颖来源:《校园英语·中旬》2014年第02期卷I(选择题,共85分)注意事项:1.答卷Ⅰ前,考生务必将自己的姓名、准考证号、科目填涂在答题卡上,考试结束,监考人员将试卷和答题卡一并收回。
2.答卷Ⅰ时,每小题选出答案后,用2B铅笔把答题卡上对应题目的答案标号涂黑,答在试卷上无效。
3.听力部分共包括两小节:第一节在卷Ⅰ,第二节在卷Ⅱ。
完成第一节后,请根据录音指令,在卷Ⅱ完成第二节。
听力部分(第一节)Ⅰ. 听句子,选出句子中所包含的信息。
(共5小题,每小题1分,计5分)1. A. repair B. reply C. report2. A. through B. throw C. threw3. A. G8F362 B. J85362 C. J8F3624. A. The camera is missing.B. The camera doesn’t work.C. The camera is old.5. A. My friend likes swimming.B. My friend is the same as me.C. My friend and I both like swimming.Ⅱ. 听句子,选出该句的最佳答语。
(共5小题,每小题1分,计5分)6. A. By air. B. Yes,I do. C. It’s very interesting.7. A. You’re welcome. B. I’m happy, too. C. Very well, thank you.8. A. Yes. Over there. B. Have you found it? C. Yes,I’m going to the office.9. A. That’s a great idea. B. Thanks,I will. C. I don’t think so.10. A. Sure,that’s smith@. UK.B. It’s very nice to get your e-mail.C. I will often send e-mail to you.Ⅲ. 听对话和问题,选择正确答案。
2014年考研英语一真题及答案

2014年考研英语一真题及答案2014年考研英语一真题及答案可以为考生提供有效的备考参考材料和指导。
以下是2014年考研英语一真题及答案。
希望对考生备考有所帮助。
Part A Text 1Just a few years ago, the news that a Californian fruit-packing company was turning awayjob seekers who had not mastered basic math sparked a national debate. How could a high school diploma,or even a college degree, not ensure a worker’s competence in arithmetic?The answer is simple: American education is in a sorry state of affairs. In 2012, the Organisationfor Economic Cooperation and Development administered basic math and literacy tests to thousands ofadults in 24 countries. The United States ranked second to last in math. More than 20 percent of the USadults scored at the lowest level on the test, compared with only 9 percent of adults in Japan and 5 percentin Finland.The state of American education did not happen by chance, nor is it an isolated problem. Fromhistoric underfunding to today’s emphasis on hard skills over critical thinking, the United States haslong failed to prioritize education. If we want to keep pace with international competitors and prepareour students for 21st-century careers, we must finally start investing in education.In the years following World War II, the United States dominated the world economy. Americanswere well educated and the states and federalgovernment invested heavily in expanding access toeducation. But as the United States began losing its competitive edge, factors including changingdemographics, the economy, and technological advances prompted officials to pull back on governmen\tfunding for education.The implications of that disinvestment are clear. The US high school dropout rate remains high,at around 17 percent, and has shown little improvement in recent years. College is even less accessible.Plus, the cost of going to college has skyrocketed, putting it out of reach for many low-income students,at least without burdening themselves with massive debt. As a result, American workers lag behindtheir global peers in the skills that are increasingly demanded in today’s economy.So how can we fix our education system? The answer is complex, and there is no one-size-fitsall solution. However, there are several key areas that need to be addressed if we want to makeprogress.First and foremost, we must invest more money in education. Money alone will not solve theproblem, but it is certainly a necessary starting point. Adequate funding is needed to attract and retainhigh-quality teachers, provide modern resources and infrastructure, and support innovative programs.High-performing countries, such as Finland and South Korea, understand this and consistently investheavily in education.Secondly, we must shift our focus from standardized testing to a more well-rounded approachto education. Standardized tests have their place, but they should not be the sole measure of a student’sability or a teacher’s effectiveness. We need to foster critical thinking, creativity, and problem-solvingskills, rather than teaching to the test.Additionally, it is crucial that we improve the professional development and support provided toteachers. Teachers are the backbone of our education system, and they need ongoing training and supportto stay effective in the classroom. Investing in teachers means investing in our students.Finally, we must address the disparities in education that exist among different regions and socioeconomic groups. Education should not be a privilege reserved for the wealthy or those lucky enoughto live in well-funded school districts. Every child, no matter their background, deserves access to ahigh-quality education.In conclusion, the state of American education is in dire need of improvement. It is time for usto recognize the significance of education and invest in its future. By putting money towards education,shifting our focus to a more well-rounded approach, supporting and training our teachers, and ensuringequal access to education for all students, we can begin to turn the tide and provide our students withthe skills they need to succeed in the 21st century.Part A Text 1 Source: Adapted from The New York Times, September 13, 2014Part A Text 1 Questions:1. Why were fruit-packing companies turning away job applicants a few years ago?2. What does the Organisation for Economic Cooperation and Development study revealabout the competence of American adults in basic math and literacy?3. What is the main reason for the sorry state of American education according to the text?4. What consequences does the disinvestment in education in the United States bring about?5. What does the author suggest about how to improve the current education system in theUnited States?Part A Text 1 Answers:1. A Californian fruit-packing company was turning away job seekers who had not mastered basicmath because American education is in a sorry state and workers lack competence in arithmetic.2. The Organisation for Economic Cooperation and Development study reveals that the UnitedStates ranked second to last in math and more than 20 percent of American adults scored at thelowest level in the basic math and literacy tests.3. The main reason for the sorry state of American education is a historic underfunding of and the lackof priority given to education in the United States.4. The consequences of disinvestment in education in the United States include a high high schooldropout rate, limited access to college, and American workers lagging behind their global peers inthe skills demanded in today’s economy.5. The author suggests that the education system in the United States can be improved by investingmore money in education, shifting focus fromstandardized testing to a more well-rounded approach,supporting and training teachers, and ensuring equal access to education for all students.。
TL_81000_EN

Group standardTL 81000Issue 2021-09Class. No.:8MD00Descriptors:EMC, ESD, electrostatic discharge, immunity, interference emission, interference emission, interference immunity, pulseElectromagnetic Compatibility of Electronic Components for Motor Vehicles EMC changesPrevious issuesTL 965: 2012-04; TL 82066: 2006-11; TL 82166: 2011-01; TL 82366: 2008-02; TL 82466: 2009-06;TL 82566: 2011-05; TL 81000: 2013-02, 2014-04, 2016-02, 2018-03, 2021-06ChangesThe following changes have been made to TL 81000: 2021-06:a)Section 5.3.6.3 "Requirements": Formula for test no. "B9" adapted in column "QP";b)Section 5.4.2.5 "Test pulse 48a": Figure 33 added;c)Section 5.4.2.6 "Test pulse 48": Figure 34 added.ContentsPageScope .........................................................................................................................3Definitions ..................................................................................................................3Abbreviations .............................................................................................................6General ......................................................................................................................6General conditions and terms ....................................................................................6Temperature ...............................................................................................................6Run-in time .................................................................................................................6Test voltage ................................................................................................................7Test documentation ....................................................................................................7Function performance status classification (FPSC) ...................................................7Component level ........................................................................................................8Electrostatic discharge (ESD) ....................................................................................8General requirements for ESD component testing ....................................................9Tests at assembly level (packaging and handling) ...................................................11Tests at system level ................................................................................................13ESD documentation/test documents ........................................................................18Interference immunity ...............................................................................................18General requirements for the interference immunity tests of components ...............18BCI testing . (19)12344.14.1.14.1.24.1.34.1.44.1.555.15.1.15.1.25.1.35.1.45.25.2.15.2.2Always use the latest version of this standard.This electronically generated standard is authentic and valid without signature. A comma is used as the decimal sign.The English translation is believed to be accurate. In case of discrepancies, the German version controls.Page 1 of 110All rights reserved. No part of this document may be provided to third parties or reproduced without the prior consent of one of the Volkswagen Group’s Standards departments. | internal© Volkswagen AktiengesellschaftVWNORM-2019-10Page 2TL 81000: 2021-09Antenna ....................................................................................................................22Stripline ....................................................................................................................25Mobile radio communications test ............................................................................27Magnetic field test ....................................................................................................29Interference emission ...............................................................................................34Overview of emission tests and frequency ranges ...................................................34Specific interference emission terms, definitions, and abbreviations .......................35General requirements – HF emissions from component measurements .................35Limit classes .............................................................................................................37Artificial network (AN test) ........................................................................................37Antennas (RE test) ...................................................................................................38Stripline (SL test, optional) .......................................................................................43Clamp-on current probe (CP test, optional) .............................................................45Magnetic field coil 12 cm ..........................................................................................47Magnetic field coil 60 cm ..........................................................................................52Isotropic magnetic field coil 100 cm 2 ........................................................................55Pulse ........................................................................................................................60Test equipment .........................................................................................................60Pulse forms ..............................................................................................................62Pulsed interference on power supply cables ............................................................67Pulsed interference on sensor cables ......................................................................74Vehicle level .............................................................................................................81Interference emission ...............................................................................................81Frequency range during vehicle measurement ........................................................81Requirements ...........................................................................................................81Test setup .................................................................................................................81Antennas and related components ..........................................................................83Measurement receiver settings and limits for vehicle measurements ......................83Interference immunity ...............................................................................................88Interference immunity test (far field) .........................................................................88Mobile radio communications test with exterior antenna attached to the vehicle ....92Mobile radio communications test using portable mobile radio communicationsdevices in the vehicle interior ...................................................................................94Additional measurements in the free field ................................................................96Electrostatic discharge – ESD ..................................................................................96General requirements for the ESD vehicle tests ......................................................96Test setup and test conditions for tests at vehicle level ...........................................97Procedure for tests at vehicle level ..........................................................................97Applicable documents ..............................................................................................98Bibliography ...........................................................................................................100ESD ........................................................................................................................101Geometric setup of the ESD coupling structure for indirect discharges atsystem level ...........................................................................................................101Interference immunity .............................................................................................102Test severity levels for BCI testing .........................................................................102Conversion of dB(µA) into mA ................................................................................103Magnetic field – correlation between magnetic field strength H and magneticflux density B ..........................................................................................................103Emission .................................................................................................................105Measurements in the AM range .............................................................................105Subjective evaluation of interference suppression .................................................105Analog radio and TV ranges and radio applications . (105)5.2.35.2.45.2.55.2.65.35.3.15.3.25.3.35.3.45.3.55.3.65.3.75.3.85.3.95.3.105.3.115.45.4.15.4.25.4.35.4.466.16.1.16.1.26.1.36.1.46.1.56.26.2.16.2.26.2.36.2.46.36.3.16.3.26.3.378Appendix A A.1Appendix B B.1B.2B.3Appendix C C.1C.2C.2.1Page 3TL 81000: 2021-09Digital radio and TV ranges (DAB, DVB-T, etc.) .....................................................108Long-distance interference suppression ................................................................110C.2.2C.2.3ScopeThis standard covers and defines requirements and tests at the component level and vehicle level that are used to ensure the electromagnetic compatibility (EMC) of electronic assemblies and sys-tems with respect to:–Electrostatic discharges that can directly or indirectly couple into an assembly or into supplyand signal cables (during the installation process, during vehicle servicing, or during vehicle operation)–Radiated interference that can couple into a vehicle's supply and signal cables or into elec-tronic assemblies or systems–Pulse interference on power supply cables caused by electrical and electronic componentson power supply cables or on signal cables and sensor cables that are directly or indirectly (e.g., via switch contacts, relay contacts, or valves/actuators/sensors) galvanically connected to power supply cables–Pulse interference on sensor cables ; with the exception of cables that belong to the powersupply and therefore fall under "pulse interference on power supply cables"–Radio interference suppression and the associated limitation of the interference emission ofelectrical and electronic vehicle components –Magnetic fields that are generated DefinitionsTest method in which the charged test generator electrode is quickly brought close to the DUT; discharge takes place by means of a sparkover to the DUTCorresponds to the simple peak value or maximum value An assembly is an individual component or a combination of components,as delivered by the contractorGeneral term for an electronic component, assembly, or system (e.g., elec-tronic control unit [ECU], sensor, actuator).Test method in which the test generator electrode is brought intocontact with the DUT; discharge is then initiated by the discharge switch in-side the generatorCoupling is interference on cables caused by the transfer of power from one cable to another.A device with defined dimensions and characteristics used for the common mode coupling of a disturbance to the test circuit without a galvanic con-nectionA current transformer for coupling a disturbance into the test circuit with-out a galvanic connection to itOne or more functions of the device do not perform as designed during and after exposure to the disturbance and the device has to be repaired or re-placed or, if there is still functional capability, some parameters do not lie within the specified tolerances.12Air discharge (for ESD)Amplitude Assembly ComponentContact discharge (for ESD)CouplingCoupling clampCurrent injection probe DamagePage 4TL 81000: 2021-09When a device's operation is impaired in such a way that is not negligible but still accepted as permissible. Degradation ends when the disturbance subsides.Electronic component, assembly, or system under testA discharge that is discharged directly ontothe device under test (DUT).Electromagnetic quantity that can cause undesirable interference in electri-cal equipment. Disturbance serves as a generic term for such terms as in-terference voltage, interference current, interfering signal, and interferenceenergy.Time interval between the pulse's rise to over 10% of the amplitudeand its subsequent fall below this value.The ability of electrical equipment to function satisfactorily inan electromagnetic environment without unduly influencing its environment (including other equipment).Electromagnetic effects (e.g., fields) on circuits, assemblies,and systems (e.g., vehicle).The time required to fall from 90% to 10% of the amplitude Impairment of a device's function to a degree that is no longer permissibleand where the function can only be restored by technical intervention.This standard uses FPSC as per definition inISO 11452-1, ISO 7637-1, and ISO 10605. A detailed description can be found in section 4.1.5.Maximum height beyond the ripple amplitude.The discharge occurs onto a coupling structure in the vicinity of theDUT and simulates a discharge onto objects in the vicinity of the DUT, or discharges that flow in cables adjacent to DUT cables in the wiring harness.Disturbance emitted by an interference sourceThe ability of an electrical device to withstand specific disturbances withoutmalfunctionNon-periodic, brief positive or negative disturbance (voltage or current) be-tween two steady statesElectrical or electronic device whose function can be influenced by distur-bancesElectrical device of the vehicle from which disturbances are emitted, or ori-gin of disturbancesMinimum value of a disturbance that causes a malfunction in an interfer-ence sinkVoltage drop below the normal level, caused by the switch-ing on and turning of the starter. In engaging alternators, this interference usually includes an initial single pulse when the starter is switched on and a state while it is turning.A circuit that emits interference.Disturbance of the device's function to a degree that is no longer permissi-ble. The malfunction ends after the disturbance subsides.Undesirable impairment of a device's operation.The nominal voltage of the power supply system isspecified in order to be independent from the used battery technology.In this document, parallel routing describes cables following the same path within a wiring harness.DegradationDevice under test (DUT)Direct discharge (for electrostatic discharge (ESD))Disturbance Duration of single pulse (t d )Electromagnetic compatibility (EMC)Electromagnetic interference (EMI)Fall time (t f )Function failure Function performance status classification (FPSC)Height of single pulse (V, I)Indirect discharge (for ESD)Interference emission Interference immunity Interference pulse Interference sinkInterference source Interference threshold Interference when starting the engine Interfering circuitMalfunctionMalfunctionNominal voltage of the power supply system Parallel routingPage 5TL 81000: 2021-09Transitional process, during which the height of the ripple amplitude is ex-ceeded for a duration less than 150 µs. Peaks are generally oscillating and arise from high-frequency currents caused by sudden load changes. The duration of a decreasing oscillation is defined as less than 1/20 of the inter-val between two sequential peaks. Thus, decreasing oscillation after this time must regarded as ripple. Frequent causes of decreasing oscillations include ignition systems and rectifiers at the output of alternators.Energy per unit of time for subsiding peaks Time interval between the end of one pulse and the start of the followingpulse.Number of pulses per unit of time.A number of repeated pulses during a defined time interval.Interval between the instant in which the voltage increases above its normal value due to a transitional process and the point in time at which the volt-age drops back to its original value and remains there.The maximum change in voltage caused by ripple above or below the aver-age level is referred to as upper amplitude or lower amplitude. The ripple from amplitude to amplitude is defined by the maximum distance between the upper and lower amplitude.More or less periodic changes in voltage around the voltage level that oc-curs in the system in its steady state. Transitional processes and frequen-cies below 10 Hz are excluded (apart from the process of starting the en-gine).The time required to rise from 10% to 90% of the amplitude Cables that are not directly or indirectly (via switch contacts, relay con-tacts, or valves/actuators/sensors) galvanically connected to the power supply cablesA non-oscillating transitional process, usually occurring sporadically and in-frequently, which has a long duration in comparison to 150 µs and which exceeds the ripple amplitude.A condition that sets in after the activation operation and in which the val-ues of electrical variables remain essentially constant.The voltage measured at any arbitrarily chosen pair of terminals of the pow-er supply system, whereby one terminal may also be a ground connection.Within this context, "surfaces" refers not only to closed surfaces, but also to all gaps and openings (switches, tip switches, transition points, ventilation slots, loudspeaker openings, etc.).A system is defined as an assembly in conjunction with all components necessary for complete functioning (buttons, switches, antennas, displays,sensors, actuators, etc.).In the context of this standard, "test step" refers to the specified number of discharges that occur at a discharge point and that have a specific polarity and voltage.Temporary increase or decrease of the supply voltagecaused by rapid load changes.Terrestrial Trunked Radio (TETRA) frequency bands The vehicle electrical system in a motor vehicle that is used to pro-vide electrical power, including the connected battery and the alternator with regulator.PeakPeak power Pulse interval Pulse repetition frequency Pulse sequence Return timeRipple magnitudeRipplesRise time (t r )Signal or sensor cable Single pulseSteady state Supply voltageSurface (for ESD)SystemTest step (for ESD)Transitional process of supply voltage Trunked radioVehicle power supply systemPage 6TL 81000: 2021-09AbbreviationsAmplitude modulation Artificial networkAverage detector as per DIN EN 55016-1-1. Use of the linear average de-tector without consideration of the time constant of the display apparatus is also permissible.Bulk current injectionPublic safety organizations in GermanyIntermediate frequency (IF) measurement bandwidth of the test receiver Current probe Continuous waveDigital Audio BroadcastingDedicated short-range communication Device under testElectrostatic discharge Fast Fourier transformGlobal navigation satellite system (GPS, GLONASS, Beidou, Galileo, Qua-si-Zenith Satellite System [QZSS])Global Positioning SystemMetal-oxide-semiconductor field-effect-transistor Moving Picture Experts GroupPeak detector as per DIN EN 55016-1-1Pulse-width modulationQuasi-peak detector as per DIN EN 55016-1-1Quadrature phase-shift keying Radiated emissionSatellite Digital Audio Radio Service StriplineShort range devicesTerrestrial Trunked RadioUniversal Mobile Telecommunications SystemGeneralGeneral conditions and termsDeviations from the following test conditions must always be documented in the test record.TemperatureTest temperature range:(23 ±5) °C; in agreement with the purchaser, at operat-ing temperatureRun-in timeThe electrical components must be subjected to a 15 min run-in time under the specified load (as per drawing or Performance Specification) and with the test voltage.3 AM AN AVBCI BOS BW CP CW DAB DSRC DUT ESD FFT GNSS GPSMOSFET MPEG PK PWM QP QPSK RESDARS SL SRD TETRA UMTS 4 4.14.1.14.1.2Page 7TL 81000: 2021-09Test voltageOperating voltagesAs per drawing, Performance Specification, or table 1;unless otherwise specified, the following voltage values must be used:Table 1 – Operating voltages and test voltagesTest documentationThe following documents must be submitted when the development process starts:–System designation and description with a representation of the system functions –Circuit diagram, component location drawing, and bill of materials–Operating states with sequence descriptions (e.g., switch-on/off procedures, static/dynamic states)–Description of circuit parts (sub-systems, sensors, actuators)–System variants and codings–Interfaces to other vehicle components–Error handling and diagnostic functions of the system itself–Description of EMC measures (e.g., filter and protective circuitry of inputs/outputs as well as power supply cables, shielding measures)Before the samples to be tested are delivered, the following documents must be presented in addi-tion:–Exact schedule for the planned EMC component tests and the planned test location (laborato-ry)–Deviations from requirements of this standard that were made in agreement with the purchas-er and the contractor–Informative, complete EMC qualification report for the pertinent sample version –Hardware/software version with description of the EMC measuresFunction performance status classification (FPSC)For interference immunity tests and ESD, this standard uses the function performance status clas-sification (FPSC) as defined in ISO 11452-1, ISO 7637-1, and ISO 10605. The following status def-initions as specified in ISO 11452-1 are used:–Status I The function behaves as specified before, during, and after the test–Status IIThe function does not behave as specified during the test, but automatically returns to normal operation after the testThe following definitions from ISO 11452-1 are used to determine the status (I or II) that must be met and the disturbance (level) up to which this status must be met:4.1.3 4.1.4 4.1.5Page 8TL 81000: 2021-09–L1Disturbance level up to which status I must be met–L2Disturbance level up to which at least status II must be met (status I is per-missible as well)Deviating from the examples in ISO 11452-1, it is not the different functions of a DUT that are cate-gorized, but rather the effects or functional deviations of a DUT occurring during an interference immunity test. Based on how customers are affected, there are three categories of effects:–Category 1Minor effects or negligible malfunctions of the DUT–Category 2Effects or malfunctions of the DUT with an impact on comfort–Category 3All significant effects or other effects and malfunctions of the DUT that do not fall into category 1 or category 2The purchaser is solely responsible for categorizing the effects that occurred during testing. If a malfunction has not been assigned a category, it must always be assigned to category 3. Figure 1shows a diagram of the FPSC.Legend A Category 1B Category 2CCategory 31Status I 2Status IIyV/m, dB(μA), VFigure 1 – Diagram of the FPSCComponent levelThe contractor must perform all component tests as agreed in the test strategy.To obtain a release for the component from the purchaser, the component tests as per section 5and the full vehicle testing as per section 6 must be completed with positive results.Electrostatic discharge (ESD)ESD component tests are based on the following standards: DIN EN 61000-4-2 and ISO 10605.55.1Page 9TL 81000: 2021-09General requirements for ESD component testing Protection targetsThere must not be any permanent damage to an assembly caused by ESD during installation, ve-hicle servicing, or vehicle operation. In addition, discharges from persons in or at the vehicle must not cause malfunctions or function failures.Design measures must prevent components from becoming charged due to air flows or motion.The semiconductor subcomponents connected to the DUT terminals must pass this test without additional protective circuitry at the pertinent pins. If the semiconductor subcomponents in use do not meet these requirements, the assembly developer must justify how sufficient ESD interference immunity is achieved using other suitable protective measures.Test scope and test severitiesESD tests must be performed at the assembly, system, and vehicle levels.All test scopes in table 2 must be performed.5.1.1 5.1.1.15.1.1.2Page 10TL 81000: 2021-09Table 2 – Test scope overview5.1.1.3Test equipment and requirementsApart from the following exceptions, the test generator requirements as per DIN EN 61000-4-2 ap-ply:–It must be possible to select an energy storage capacitance between 150 pF and 330 pF.–The discharge resistance must be 330 Ω.–It must be possible to select an output voltage of up to ±15 kV for contact and air discharges.–The test generator's characteristics must be verified as per ISO 10605.–The relative humidity during the test must be between 20% and 60%.Before a test is performed, a test plan containing all items, operating states, and test severity levels to be tested must be prepared.A test starts with the lowest absolute test voltage and ends with the highest absolute test voltage.Either alternating polarities (e.g., +4 kV → -4 kV → … → +15 kV → -15 kV) or separate test runs with positive and negative test voltage (e.g., +4 kV → … → +15 kV → -4 kV → … → -15 kV) can be used.Unless otherwise agreed upon with the purchaser, the function must be checked and the event memory must be read out after each discharge voltage.Discharges cause charges to build up on conductive surfaces or connector pins. These charges must be dissipated before each new discharge.During discharge, the electrode must be kept as perpendicular to the DUT as possible. If this is not possible, an angle of at least 45° must be maintained.Tests at assembly level (packaging and handling)Test setup and test conditionsThe test setup for testing at assembly level is shown in figure 2. The requirements as persection 5.1.1.3 must be used. The test setup corresponds to the one described in ISO 10605. The DUT must be tested individually, i.e., as delivered by the contractor and without peripherals con-nected to it.The DUT must always be placed directly on the ground plate. An insulating base must not be used.In the case of metallic housings, the contact between the DUT and base must be established in such a way that good conductivity is ensured between them.The return conductor leading from the ESD generator to the ground connection must be fully rout-ed (no shortening) at the greatest possible distance to the ground plate.5.1.2 5.1.2.1Legend1Ground bus2Ground plate3DUT4Ground point5Wooden table6ESD generatorFigure 2 – Example of a test setup for testing at assembly levelProcedure5.1.2.2The contractor must perform the test at assembly level as per ISO 10605 with the specified addi-tions and changes.The test scope can be found in table 2.The tests must always be performed on three samples.For each discharge voltage and each polarity, at least 3 or 5 discharges must be performed for contact discharge, and at least 10 discharges for air discharge. Details can be found in table 2. The contact discharges onto pins must be performed in a defined manner on each individual pin (also for coaxial systems). If necessary, the pins must be extended using a piece of cable.In order to detect premature damage, the DUTs must be included in service life tests after the ESD tests are completed.Testing at the assembly level (packaging and handling) is considered passed if all of the following items are fulfilled:。
催眠功效的芳香中草药植物在园艺疗法中的应用研究_马瑞君

物影响筛选出的有效指标的数量,对其催眠功效作
出评价.
表 1 受 测 试 的 芳 香 植 物 及 其 组 合
Tab 1 The component of tested fragrant herbs
植物名 Species G1 G2 G3 G4 G5 G6 G7 G8
香蜂草
Melissa officinalis Linn √
用 AZN-E 心肺功 能 检 测 仪. 该 仪 器 能 够 自 动 测定人体血管状 况 (15 项)、 心 脏 功 能 (12 项)、 血 液状况(3项)和微循 环 功 能 (3 项)共 计 33 项 指 标. 测试过程共 设 两 个 测 试 室: 测 试 室 1 为 普 通 办 公 室,其内 无 芳 香 植 物, 用 于 安 静 状 态 及 睡 眠 时 用 AZN-E 心肺功 能 检 测 仪 测 定 各 项 指 标; 测 试 室 2 放单种或不同组合的芳香植物.两个测试室除芳香 植 物 外 , 其 它 条 件 相 同 . 试 验 于 2008 年 7~9 月 间 进行.① 每位志愿者首先来到测试室1,正常交谈 放松30min后,开始 测 试 60 min, 用 仪 器 记 录 无 任何植物时清醒状态下的33 项指标; ② 然后进入 测 试 室 2, 放 松 30 min, 同 样 用 仪 器 记 录 有 不 同 芳 香植物(表1)时 安 静 状 态 下 的 各 项 指 标 (表 2); ③ 在 测 试 室 1 分 别 测 定 睡 眠 状 态 时 的 33 项 指 标 . 1.3 数 据 处 理
√√
香艾草 Artemisia argyi L
√√
香水百合 Lilium casa Kitag
√√
蟛蜞菊 Wedelia chinensis Merr
2014级免师教育硕士学科(英语)教育测量与评价答案-精选.pdf

西南大学研究生课程考试答卷纸考试科目教育测量与评价院、所、中心外国语学院专业或专业领域研究方向级别学年2013-2014学年学期2014年秋季学期姓名学号类别③(①全日制博士②全日制硕士③教育硕士④高师硕士⑤工程硕士⑥农推硕士⑦兽医硕士⑧进修)2014年7 月18 日研究生院(筹)制课程类别课程考试方式题号得分教师评价一二三四五六七八九十总分任课教师签名:备注:成绩评定以百分制或等级制评分,每份试卷均应标明课程类别(①必修课②选修课③同等学力补修课)与考核方式(①闭卷笔试②口试③开卷笔试④课程论文)。
课程论文应给出评语。
西南大学外国语学院免师教育硕士2014级“学科(英语)教育测量与评价”课程作业要求:保留原题题干及数据,然后在其下面插入空白来呈现答案。
不得篡改问题或者数据。
在编辑将要提交的作业的Word文件时,需确保欲呈现的内容能被打印出来。
一、简答题(50分)1.测量的基本要素有哪些?(1分)答:测量的量具、测量的单位和测量的参照点是测量的三个基本要素。
2.什么是教育测量?(1分)答:教育测量就是针对学校教育影响下学生各方面的发展,侧重从量的规定性上予以确定和描述的过程。
3.教育测量有哪些量表类型?(1分)答:有称名量表、顺序量表、等距量表和比率量表。
4.什么是教育评价?(1分)答:教育评价是指根据一定的标准,对教育事物或现象进行系统的调查,在获取足够多的资料事实(定性与定量资料)基础上,做出价值分析和价值判断。
5.教育测量与教育评价有什么不同?(1分)答:教育测量时一种以量化为主要特征的事实判断,而教育评价是指根据一定的标准,对教育事物或现象进行系统的调查,在获取足够多的资料事实(定性与定量资料)基础上,做出价值分析和价值判断。
所以教育评价最根本的特征是做出价值判断;而教育测量过程的完结,在给出数量事实的描述与判断之后,不一定都要做出价值判断。
6.教育评价与教育评估有什么异同?(1分)答:教育评估和教育评价是两个近义词,他们在内容上有交叉,也有区别。
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Name:Student ID:Major:
Answer all the questions(20marks each).Write your answer on A4papers provided, with your ID and name.Hand in this Question Paper with your answer. Second Mid-Term of Matb210Engineering Mathematics I(A)
8:00-9:30p.m.17/12/2014E22-1016and E22-1013)
12345
Ans.
1.Evaluate the triple integral ∫∫∫
D
2yzdV,where D is the solid tetrahedron P ABC
with vertices A(0,0,0),B(0,1,0),C(2,1,0)and P(0,1,2).
2.Evaluate the triple integral ∫∫∫
D
zdV,where
D={(x,y,z)|x2+y2+z2≤a2,z≥0}is the upper-hemisphere.
3.Find the average value of the function f(x,y)=4xye x2y over the rectangle
R={(x,y)|0≤x≤2,0≤y≤3}.
4.Find the area of the region R that is enclosed by one loop of polar curve
r=2sin(4θ).Hint:sin2θ=1−cos2θ
2
.
5.(a)Draw a picture of the region of integration of
∫1
0∫2x
x
dydx.
(b)Exchange the order of integration to express the integral in part(a)in terms
of integration in the order :Student ID:Major:
Answer all the questions(20marks each).Write your answer on A4papers provided, with your ID and name.Hand in this Question Paper with your answer. Second Mid-Term of Matb210Engineering Mathematics I(D)
8:00-9:30p.m.17/12/2014E22-1016and E22-1013)
12345
Ans.
1.(a)Draw a picture of the region of integration of
∫1
∫2x
x
dydx.
(b)Exchange the order of integration to express the integral in part(a)in terms
of integration in the order dxdy.
2.Evaluate the triple integral
∫∫∫
D
2yzdV,where D is the solid tetrahedron P ABC with vertices A(0,0,0),B(0,1,0),C(2,1,0)and P(0,1,2).
3.Find the area of the region R that is enclosed by one loop of polar curve
r=2sin(4θ).Hint:sin2θ=1−cos2θ
2
.
4.Evaluate the triple integral
∫∫∫
D
zdV,where
D={(x,y,z)|x2+y2+z2≤a2,z≥0}is the upper-hemisphere.
5.Find the average value of the function f(x,y)=4xye xy2over the rectangle
R={(x,y)|0≤x≤3,0≤y≤2}.
Name:Student ID:Major:
Answer all the questions (20marks each).Write your answer on A4papers provided,with your ID and name.Hand in this Question Paper with your answer.Second Mid-Term of Matb 210Engineering Mathematics I (A)8:00-9:30p.m.17/12/2014E22-1016and E22-1013)
1.Evaluate the triple integral ∫∫∫
D
2yzdV,where D is the solid tetrahedron P ABC with vertices A (0,0,0),B (0,1,0),C (2,1,0)and P (0,1,2).
Solution .∫∫∫D 2yzdV =∫10∫2y 0∫2y −x
02yz dz dy,dx =8
15.
2.Evaluate the triple integral ∫∫∫
D
zdV,where D ={(x,y,z )|x 2+y 2+z 2≤a 2,z ≥0}is the upper-hemisphere.Solution .Rewrite the solid region D as D ={(x,y,z )|−a ≤x ≤a,−√a −x 2≤y ≤√
a 2−x 2,0≤z ≤√
a 2−x 2−y 2}.Then ∫∫∫
D zdV =∫a −a ∫√a −x 2−√
a −x 2∫√a 2−x 2−y 20z dz dy dx =∫a −a ∫√a −x 2−√a −x 2
[z
22]√
a 2220dy dx =12∫a −a ∫√a −x 2
−√a −x 2(a 2−x 2−y 2)dy dx =12∫a −a [(a 2−x 2)y +y 33]√
a −x 2−√a −x 2dx =43∫
a −a (a 2−x 2)3/2dx ∗=4
3∫0π(a 2−(a cos θ)2)3/2d (a cos θ)=−43∫0πa 4sin 4θdθ=4a 43∫π
sin 4θdθ=4a 43∫π0(1−sin 2θ2)2dθ=4a 43∫π
01−2sin 2θ+sin 2(2θ)
4dθ
=a 43∫π01+1−sin(4θ)2dθ=,3.Find the average value of the function f (x,y )=4xye x 2
y over the rectangle R ={(x,y )|0≤x ≤2,0≤y ≤3}.Hint:Average of f over region R is ∫∫
R
f (x,y )dA ∫∫R
1dA .Solution .We first evaluate the double integral of f (x,y )over the region R as follows:∫∫R f (x,y )dA =
∫3
0∫2
04xye x 2y
dxdy =∫3
∫2
02e x 2
y d (x 2y )dy =∫30[2e x 2y ]x =2x =0dy =2∫30(e 4y −1)dy =2[e
4y 4−y
]30=2[e 12
−1
4−3]=e 12
−132
,and
the area of the region R is
∫∫
R
1dA =2×3=6.
The average value of f (x,y )over R is 16∫∫
R
f (x,y )dA =e 12−13
12.
4.Find the area of the region R that is enclosed by one loop of polar curve r =
2sin(4θ).Hint:sin 2θ=1−cos 2θ
2
.Solution .Area of R =∫π/40∫r =r max (θ)r =r min (θ)1·r drdθ=∫π/40∫2sin(4θ)
r drdθ=12∫π/40(2sin 4θ))2dθ==2∫π/40sin 24θdθ=2∫π/40
1−cos 8θ2dθ=∫π/4
0(1−cos 8θ)dθ=π4.
5.(a)Draw a picture of the region of integration of ∫10
∫2x
x
dydx.(b)Exchange the order of integration to express the integral in part (a)in terms
of integration in the order dxdy.
Solution .(a)
(b)∫10
∫2x x
dydx =
∫1
∫
x max (y )=y
x min (y )=y/2
dxdy +
∫
2
1
∫
x max (y )=1
x min (y )=y/2
dxdy.。