reliable test report(可靠性测试报告)
可靠性实验报告模版
可靠性实验报告Reliability Test Report品质实验室声明THE DECLARATION OF QUALITYLABORATORYNO：SDC-D-PJ-22-B( / ) 1. 为提高产品质量，本实验室遵循科学、公正、准确的原则，为用户提供有效、迅速的服务。
Conducting scientifically, candidly and precisely, test service for improvingproduct quality is provided effectively and timely by this laboratory to our customers. 2. 报告无品质实验室专用图章无效。
The report is void without appropriative stamp of quality test laboratory.3. 报告涂改、部分复制无效。
The report is void if it is, in anyway, altered and/or copied.4. 本次试验结果仅适用于试验样品。
The results only apply to the device under test.5. 带*标记项目为非必要试验项目，若客户需要，可另外安排试验。
Items marked with * are unnecessary test items. If the customer needs, additional tests can be arranged.可靠性实验报告Reliability Test ReportNO：SDC-D-PJ-22-B( / )NO：SDC-D-PJ-22-B( / )附录一：试验/检测设备可焊性实验分项试验报告Solder ability SUB-ITEM TEST REPORT产品&试验信息 Product&Test Information NO：SDC-D-PJ-22-B( / )检验情况 Inspection Description试验/检测设备 Test/Inspection Device结论 Conclusion高低温循环试验分项试验报告TEMP.Cycles Test SUB-ITEM TEST REPORT产品&试验信息 Product&Test Information NO：SDC-D-PJ-22-B( / )检验情况 Inspection Description试验/检测设备 Test/Inspection Device结论 ConclusionPressure Cooker Test SUB-ITEM TEST REPORT产品&试验信息 Product&Test Information NO：SDC-D-PJ-22-B( / )检验情况 Inspection Description试验/检测设备 Test/Inspection Device结论 ConclusionHigh Temperature Storage Test SUB-ITEM TEST REPORT 产品&试验信息 Product&Test Information NO：SDC-D-PJ-22-B( / )检验情况 Inspection Description试验/检测设备 Test/Inspection Device结论 ConclusionLOW Temperature Storage Test SUB-ITEM TEST REPORT 产品&试验信息 Product&Test Information NO：SDC-D-PJ-22-B( / )检验情况 Inspection Description试验/检测设备 Test/Inspection Device结论 Conclusion恒温恒湿试验分项试验报告Temperature&Humidity Test SUB-ITEM TEST REPORT产品&试验信息 Product&Test Information NO：SDC-D-PJ-22-B( / )检验情况 Inspection Description试验/检测设备 Test/Inspection Device结论 Conclusion* 稳态温湿度偏压试验分项试验报告* Temperature Humidity Bias Test SUB-ITEM TEST REPORT 产品&试验信息 Product&Test Information NO：SDC-D-PJ-22-B( / )检验情况 Inspection Description试验/检测设备 Test/Inspection Device结论 Conclusion* 高加速温湿度应力试验分项试验报告* Highly Accelerated Stress Test SUB-ITEM TEST REPORT 产品&试验信息 Product&Test Information NO：SDC-D-PJ-22-B( / )检验情况 Inspection Description试验/检测设备 Test/Inspection Device结论 Conclusion* 高温工作寿命试验分项试验报告* High Temperature Operating Life SUB-ITEM TEST REPORT 产品&试验信息 Product&Test Information NO：SDC-D-PJ-22-B( / )检验情况 Inspection Description试验/检测设备 Test/Inspection Device结论 Conclusion。
可靠性鉴定测试申请表
RELIABILITYQUALIFICATIONTESTREQUESTFORM靠谱性判定测试申请表RequestNumber申请编号:DateRequested申请日期:RequestorName申请人姓名:SAMPLEINFORMATION样品信息Supplier供给商：LotNumber批号：Product/MaterialType产品/资料型号:QuantityofSample样品数目:TYPEOFQUALIFICATION判定种类NewProductQualificat ion新产品判定NewMaterialQualification新资料判定ExistingProductClass ificationExistingMaterialQualification（Existing/New现有产品入级Supplier）CustomerRequest客户要求现有资料判定（原/新供给商）OtherQualification其余判定NewProcessQualification新制程判定TYPEOFTEST测试种类HighTemperatureHighHumidityStora geTestThermalShockStorage Test高温高湿储存测试冷热冲击储存测试HighTemperatureStorageTest LowTemperatureStorageTest高温储存测试低温储存测试LifeTest寿命Vibratio振动测测试nTest试UnitDropTest单品跌落测试PackageDropTest包装跌落测试PushPressureTest1推压测试1SaltSprayTest盐雾试验PushPressureTest2推压测试2OtherTest(specify)其余测试（规定）DETAILSANDREASONFORQUALIFICATION 判定细节及原由(pleaseprovidetheevaluationreportand relateddocument 请供给评估报告及有关文件)RequestorSignature 申请人署名: Date 日期:ApprovedBy 申请部门批准： Date日期:ReceivingDept. Recipient Date ApprovedByDate接收部门接收人日期接收部门批准日期QANote:ShadedareaisforReliability SM/Form-QA-16Rev.A/1 Engineeruseonly.。
通用可靠性测试指引(General reliability test instruction)
通用可靠性测试指引(General reliability test instruction)制作人(Prepare By) ：David Tsang批准人(Approve By）：Carrie Chueng发出日期(Issue Date)：Aug. 05, 20101. 目的(Purpose)根据一般行业标准的可靠性测试要求及判定基准, 本文件旨在建立可靠性的一些测试项目、要求和操作说明来规范和指导PDP业务的可靠性。
(Basing on the general reliability test requirements and judgment criteria in industrial standard, this document aims to set up the some test items, requirements and operation instruction forstandardization of reliability test of PDP business).2. 适用范围(Scope)本程序文件适用于与PDP有业务的产品. 如顾客没有提供测试标准或产品本身无特别安全测试要求,PDP及生产商可根据本程序内文的测试标准或指定的文件来进行可靠性测试。
(This document is applicable to the products which related to PDP business. PDP and subcontractor can conduct reliability test referring to this instruction if no specified testing instruction supplied by customer.)3. 参考文件(Reference)3.1 产品规格(Product specification)3.2 电气规格（Available electrical specification）3.3 QP-RTI-002 (NOA Accessory Testing Guideline)4. 操作程序(Operation Procedure)4.1 首先根据产品的物料特性、设计的要求选取下面合适的测试项目进行测试。
可靠性分析Reliability Analysis
六西格玛培训—验证阶段模块可靠性分析Patrick ZhaoI&CIM Deployment Champion可靠性分析介绍执行可靠性分析可靠性分析介绍执行可靠性分析可靠性与质量•狭义的质量，一般指的是符合性质量，即是否满足标准或规范，通常是以产品出厂时的状态为准，此时传统的质量控制人员已经完成任务。
•可靠性更多关注在产品的全生命周期中的质量表现，即产品是否能够始终满足标准，始终满足客户的应用。
在如今全面质量管理的阶段，产品的可靠性也越来越需要企业投入更多的时间。
•企业中的可靠性分析可以分为产品和过程：•产品：分析产品在客户使用中是否满足可靠性目标。
•过程：一般指设备、工装、模具等在长期使用过程中，是否会出现问题。
可靠性工程的益处•在物质匮乏的年代，衣服可能是作为耐用品使用，而如今衣服已经越来越成为快速消费品。
曾经的手机等电子产品，更换周期也同样有越来越短的趋势。
甚至是汽车也开始加速迭代，不停缩短换车的时间。
•在这样的背景下，可靠性似乎成为了一个不是那么重要的关注点，可是为什么我们仍然在关注可靠性工程？•政府、法规的要求。
•不可靠的产品通常有安全或健康风险。
•产品变得复杂，零件变多，更容易发生故障。
•可靠性的优势可以成为销售和市场部门的宣传点。
•处于保护环境，节约资源的考虑。
可靠性分析的常用术语•浴缸曲线（Bathtub Curve）•MTTF: Mean Time To Failure（平均失效前时间）•MTTR: Mean Time To Repair（平均修复时间）•MTBF: Mean Time Between Failure（平均故障发生间隔时间）•威布尔分布（Weibull Distribution）•数据删失（Data Censoring）•HALT: Highly Accelerated Life Testing（高加速寿命试验）•HASS: Highly Accelerated Stress Screening（高加速应力筛选）•HASA: Highly Accelerated Stress Audit（高加速应力稽核/抽检）浴缸曲线•浴缸曲线（Bathtub Curve）在可靠性分析中是一种常用的概念，它把失效分为三个阶段。
锂离子电池可靠性测试报告
4.262
4.177
4.172
4.203
4.203
4.204
跌落前内阻
(mQ )
13.7
13.5
13.4
13.6
13.6
13.9
17.8
12.8
21.1
14.0
跌落后内阻
(mQ)
13.5
13.3
13.4
13.2
13.9
12.8
12.5
13.7
20.8
13.7
(mQ)
13.9
14.8
14.2
12.4
12.6
20.8
12.1
11.9
26.0
14.4
编号—-
项目
31
32
33
34
35
36
37
38
39
40
跌落前电压
(V)
4.185
4.170
4.205
4.265
4.264
4.177
4.175
4.204
4.205
4.207
跌落后电压
(V)
4.183
4.168
4.203
8
150C高温测试
-
9
重物冲击测试
-
10
低温性能测试
-
11
高温性能测试
-
12
循环性能测试
50
13
容量测试
50
4.
所有测试结果符合IEC标准、国家标准及迈科可靠性检验规范(MNA—TDD—016)的品质要求，085065A型锂离子电池能够大批量生产。
跌落实验测试报告
可靠性测试2
Ensuring Reliable Performance
The Role of Reliability Testing
Reliability Life Testing
Some of the other important engineering considerations are : • Purposes of the Test • Test Plans This includes the stress levels, sample sizes for each level and the levels of other factors which may affect the life of the product. • Specimen Specimens used in a test may be different from the actual product and their life may be different from that of the products. • Test conditions Vs Use condition Ideally, test conditions should reproduce use conditions but this is often not possible. It is thus important to distinguish between test reliability and field reliability.
Total time on test 501.3 = = 55.7 days θˆ = Number of failures 9
x
x
Sample average
© 2007 LC Tang. All rights reserved
通用可靠性测试指引(General-reliability-test-instruction)
通用可靠性测试指引(General reliability test instruction)制作人(Prepare By) ：David Tsang批准人(Approve By）：Carrie Chueng发出日期(Issue Date)：Aug. 05, 20101. 目的(Purpose)根据一般行业标准的可靠性测试要求及判定基准, 本文件旨在建立可靠性的一些测试项目、要求和操作说明来规范和指导PDP业务的可靠性。
(Basing on the general reliability test requirements and judgment criteria in industrial standard, this document aims to set up the some test items, requirements and operation instruction forstandardization of reliability test of PDP business).2. 适用范围(Scope)本程序文件适用于与PDP有业务的产品. 如顾客没有提供测试标准或产品本身无特别安全测试要求,PDP及生产商可根据本程序内文的测试标准或指定的文件来进行可靠性测试。
(This document is applicable to the products which related to PDP business. PDP and subcontractor can conduct reliability test referring to this instruction if no specified testing instruction supplied by customer.)3. 参考文件(Reference)3.1 产品规格(Product specification)3.2 电气规格（Available electrical specification）3.3 QP-RTI-002 (NOA Accessory Testing Guideline)4. 操作程序(Operation Procedure)4.1 首先根据产品的物料特性、设计的要求选取下面合适的测试项目进行测试。
可靠性测试参考
CRT/VGA, Serial, Paraபைடு நூலகம்lel, DVI
Insert the connector. Fully tighten the screws. Wiggle the connector up and down two or three times. Loosen the screws and pull at a 30-degree angle to remove.
Reliability Test for Electronic Product
Thermal Shock
1. Purpose The objective of this test is to precondition or age systems, subassemblies, or components by subjecting them to the stresses of rapid thermal expansion and compression. This test can also precipitate some gross failure modes associated with differing coefficients of thermal expansion (CTEs) 2. Scope Provide detailed instructions for conducting a system-level, subassembly, or component test. It also contains criteria for determining whether a failure has occurred. 3. Test procedure -Place units or subassemblies in the chamber. -Based on test units, choose one of the following profiles: System level or hinge-up assembly: 65C to -40C. 20-minute dwell. Motherboard or component level: 80C to -40C. 15-minute dwell. -If running systems, ensure they are powered off and execute 50 cycles of the chosen profile. -Perform the cold portion of the cycle first, so that the test ends with the samples in the hot condition. This will reduce the likelihood of moisture damage to the samples. -After completing 50 cycles, return to the high temperature for a minimum of 4 hours to evaporate any accumulated moisture. -Return to room temperature (25C) prior to removal of test units from the chamber.
- 1、下载文档前请自行甄别文档内容的完整性，平台不提供额外的编辑、内容补充、找答案等附加服务。
- 2、"仅部分预览"的文档,不可在线预览部分如存在完整性等问题,可反馈申请退款(可完整预览的文档不适用该条件!)。
- 3、如文档侵犯您的权益，请联系客服反馈,我们会尽快为您处理(人工客服工作时间：9:00-18:30)。
Conclusion
Baking test heat up to 320°C , keep 5 minutes , do not change color . The maximum leak rate is 1.6*10-9 atm·cc·s-1. For insulation resistance , minimum is 384,200 MΩ . Nickel thickness is between 1.69 μm and 1.92 μm . Gold thickness is between 0.129 μm and 0.168 μm. Conclusion : TO46(4+1)AP0156A header quality is good enough for
Resistance test result
Spec. is more than 1000 MΩ，minimum is 384,200 MΩ , judge OK. sample
Unit Ω MΩ 1 7.091 T 686.5G 2 744.2G 3 2.436T 4 384.2G 5 442.8G 6 826.7G 7 903.1G 8
Leak test result
Spec. is no more than 1.0*10-8 atm·cc·s-1 (means 1.0*10-9 Pa·m3·s-1），maximum is 1.6*10-9 atm·cc·s-1,judge OK.
Unit Pa·m ·s
3 -1
1 1.2*10
-10
Bake test result
All samples plating did not change color.
Reliability Test Report for TO46(4+1) AP0156A header
test result: 0.6*10-10Pa·m3·s-1
Leak test
Method
1. 2. 3. 4. Open He-leak detector and wait is stable. Fix TO46 fixture on He-leak detector. Put test sample into the fixture. Press “detect ” button wait pressure on detect valve stable . 5. Spray He gas to sample and read the result on the screen.
By Chris(Mr.) , Quality Department of Co., Ltd . Apr. 27th ,2016
Reliability Test Report TO46(4+1) AP0156A header
Test items 1. Baking test by Thermostat furnace. 2. Helium leak test by KYKY ZQJ-530 He-leak detector. 3. Resistance test by TH2683A insulation Resistance Meter. 4.Nickel thickness and Gold thickness by Oxford CMI900 X-ray film thickness detector.
2*10-10
6*10-10
4*10-10
6*10-10
Reliability Test Report for TO46(4+1) AP0156A header
Voltage set valve:100V
test result: 7.091 TΩ
Resistance test
Method
1. 2. 3. 4. Turn on the Resistance Meter. Set voltage as 100V. Use detect head clamp test samples. Press “ Test ” button , then read result on the screen.
Tested Location Co.,Ltd ,Shandong province ,China.
Reliability Test Report for TO46(4+1) AP0156A header
Baking test
Method
1. Set oven temperature to 320°C,and wait it stable 320°C. 2. Put samples in plate , put the plate in furnace , Bake 5minutes. 3. Cooling down in atmosphere.
2 1.4*10
-10
3 1.6*10
-10
4 4*10
-11
5 2*10
-11
6 6*10
-11
7 4*10
-11
8 6*10
-11
pressure on detect valve
“detect ” button
atm ·cc·s-1 1.2*10-9 1.4*10-9 1.6*10-9 4*10-10
Plating thickness result
Plating Nickel Gold
USL 2
LSL 1 0.1
MAX 1.92 0.168
MIN 1.69 0.129
JUDGE OK OK
Reliability Test Report for TO46(4+1) AP0156A header
“ Test ” button detect head
7.1E+06 6.9E+05 7.4E+05 2.4E+06 3.8E+05 4.4E+05 8.3E+05 9.0E+05
Reliability Test Report for TO46(4+1) AP0156A header
Plating thickness
Method
1. Turn on the film thickness detector and adjust to stable( lab manage person do this every morning , when we use , it is already stable ). 2. Put samples in test chamber . 3. Adjust X-ray signal point on test position . 4. Click “start ” button on the computer. 5. Read test result on computer screen . 6. Print test report .