CODEV使用手册
CODEV中文使用手册2
CODEV使用手册2容许公差你可能熟悉莫非准则：任何可能出错的事情都会出错。
公差就是试图通过模拟：何种类型的误差会发生、它们在多大程度上影响光学系统的性能以及建造一个可以工作的系统的概率有多大等问题使Murphy定律不适用。
CODE-V 有一些用于进行公差分析的工具，包括一个被称为的强有力的属性。
其它的工具被用来分析用户自定义的公差要求和蒙特卡罗（Monte Carlo）仿真。
目录莫非准则…………公差分配和TOR..………公差类型………用LDM确定公差和TOR..…………的输出…………………………其它的公差分析属性…………莫非准则光学系统对加工精度有一定的要求。
在许多机械装置中不太明显的误差在光学系统中可能会造成严重的成像质量问题。
因为没有任何事情可以做得非常完美，因此，误差必然会产生。
公差分析就是要弄明白在建造一个光学系统中，以及在建成之前预测它们的影响中会出现的误差类型。
你不能够推翻Murphy定律，但是，可以弄懂何处会出错，确定对误差的限制，以及预测它们的影响，从而限制误差。
何种项目会出错？一个共轴光学系统由不多的几个参数就可以确定，主要是每个表面的曲率、厚度、和玻璃材料。
但是，这这几个参数会使许多事情出现错误，包括：●错误的曲率（通常用样板的吻合度来测试，DLF,加上柱面的不规则度,IRR）●错误的厚度（玻璃）或者空气间隔（安装误差），由δ-厚度来测量（DLT）●错误的折射率或者色散（DLN,DLV）●定心误差（前后表面不同轴，被称为光楔，或者成为零件偏心率TIR（Total Indica Runout））●安装误差（单个元件或者一组元件相对于设计位置的倾斜、移动或者偏心）总之，有七种或者更多的与光学表面有关的，很容易出现的加工误差。
有特殊面形的复杂系统会有更多的潜在误差。
每一种潜在误差都必须规定一个可接受的范围或者公差。
例如，表面8玻璃元件的厚度（THI S8 5.5）可能要求被控制在±20微米的公差范围内（如5.500mm±0.020mm，或者DLT S8 0.02）。
codeviser使用手册
codeviser使用手册CodeViser是一款功能强大的代码编辑器，为开发人员提供了一套便捷的开发工具。
本使用手册将介绍CodeViser的安装、基本功能和高级功能，帮助用户快速上手使用CodeViser。
一、安装CodeViser支持Windows、Mac和Linux操作系统，用户可以根据自己的操作系统版本下载对应的安装包，并按照以下步骤进行安装：1. 下载安装包2. 打开安装包并按照向导进行安装3. 完成安装后，即可开始使用CodeViser二、基本功能1. 代码编辑CodeViser提供了友好的代码编辑界面，支持多种编程语言的语法高亮显示。
用户可以使用CodeViser编写、编辑和保存代码文件。
2. 代码导航CodeViser提供了便捷的代码导航功能，让用户可以快速定位到代码中的特定位置。
用户可以通过搜索、书签或文件结构视图来实现代码导航。
3. 代码补全CodeViser的智能代码补全功能可以根据用户的输入提示代码，并提供可选的代码补全建议。
用户可以通过快捷键或自动触发来使用代码补全功能。
4. 代码调试CodeViser支持代码断点调试功能，用户可以设置断点、单步执行代码、查看变量值等。
代码调试功能可以帮助用户定位和修复代码中的错误。
5. 版本控制CodeViser集成了常见的版本控制系统，如Git和SVN，用户可以通过界面操作进行代码的版本管理和提交。
三、高级功能1. 插件扩展CodeViser支持插件扩展，用户可以根据自己的需求安装和启用各种插件，以增强CodeViser的功能。
常见的插件类型包括代码格式化、语法检查、自动化脚本等。
2. 任务管理CodeViser提供了任务管理功能，用户可以创建并管理各种任务，如需求分析、项目计划等。
用户可以设置任务的优先级、状态、截止日期等属性，并在任务列表中进行查看和操作。
3. 项目管理CodeViser支持项目管理功能，用户可以将相关的代码文件组织为项目，并通过界面操作进行项目的管理。
code v参考手册中文版
CODE V 参考手册中文版
文档作者 ：魏葰 标识版本 ：CODE V Manual/1.0 更新日期 ：2008/06/11 文档状态 ：概念
技术要点 RIM—边缘光线像差绘图
何时使用边缘光线像差绘图功能选项 缺省操作 命令清单 定义绘图控制 定义波长/颜色设置 输入与计算讨论 输出描述 CAT—猫眼图 何时使用猫眼图功能选项 缺省操作 命令清单 定义猫眼图设置 输入与计算讨论 输出描述 PMA—光瞳图 何时使用光瞳图功能选项 缺省操作 命令清单 定义显示设置 定义计算控制 定义输出控制 定义绘图控制 定义颜色显示设置 定义 Zernike 系数控制 定义扰动波阵面 输入与计算讨论
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CODE V 参考手册中文版
文档作者 ：魏葰 标识版本 ：CODE V Manual/1.0 更新日期 ：2008/06/11 文档状态 ：概念
定义特殊表面 定义衍射表面 定义线性光栅属性 定义相位函数属性 定义全息光学元件属性 定义阵列元件 使用规则网格定义平行阵列 定义常规元件阵列 定义多项式阵列 使用阵列元件 第五章 定义镜头材料 定义镜头材料 指定表面玻璃 使用预存玻璃目录 使用虚构玻璃 使用反射面 使用私有玻璃目录 定义其他玻璃属性 定义梯度折射率材料（GRIN） 使用梯度折射率材料（GRIN）常用命令 定义 SELFOC 梯度 定义轴向梯度 定义 Rochester 大学梯度 定义 Luneberg 透镜梯度 定义球形梯度 定义 Maxwell 鱼眼梯度 定义用户定义梯度 梯度折射率材料（GRIN）定义与例子
修订要点
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CODEV使用技巧
CODEV使用技巧CODEV（Cooperative Development Environment）是一个供多人协同开发的软件开发环境。
它为开发人员提供了一套工具，可以帮助他们共同创建和维护软件项目。
下面是一些CODEV的使用技巧，有助于提高团队的协作效率和软件开发的质量。
1.定期进行代码审查：代码审查是CODEV中一个重要的环节，可以帮助团队成员相互学习和提高代码质量。
通过定期进行代码审查，团队可以发现潜在的问题和错误，并及时进行修改。
2.使用版本控制工具进行代码管理：版本控制工具是CODEV中不可缺少的一部分。
它可以帮助团队成员协同工作，跟踪代码的变化，解决冲突，并提供一个中央代码库，使得团队成员可以轻松地共享和维护代码。
3.使用任务管理工具进行任务分配和跟踪：任务管理工具可以帮助团队成员分配任务，并及时跟踪任务的进度。
通过使用任务管理工具，团队可以更好地组织工作，提高开发效率。
4.设计良好的软件架构：良好的软件架构是保证软件质量和可维护性的关键。
在CODEV中，团队应该设计一个清晰的软件架构，包括模块划分、接口设计、数据结构等。
这样可以使得项目开发更加有序，减少后期的修改和维护工作。
5.遵循代码规范和最佳实践：团队应该制定一套代码规范，并且所有人都要遵循。
代码规范可以提高代码的可读性和可维护性，减少团队成员之间的差异。
此外，团队也应该学习和使用最佳的开发实践，以提高代码的质量和性能。
6.使用自动化测试工具进行测试：自动化测试工具可以帮助团队快速、准确地对代码进行测试。
通过使用自动化测试工具，可以有效地减少手动测试的工作量，并提高测试的覆盖率和效果。
7.随时更新文档和注释：文档和注释是CODEV中至关重要的一部分。
团队成员应该随时更新文档和注释，以保证团队成员之间的沟通和理解。
文档和注释应该清晰、简洁，并且准确反映代码的逻辑和功能。
8.持续交付和集成：持续交付和集成是现代软件开发的重要实践。
CODEV10.2说明书1
ALI-Alignment OptimizationALI computes the necessary changes in compensators needed to minimize the differences between nominal design wavefronts and wavefronts measured by an interferometer on the system as-built; these adjustments would then be made in the hardware to restore as much of the design performance as possible. The calculation predicts the potential improvement that making such adjustments will generate, pre- and post-alignment. ALI can also convert a null test interferogram into a surface deformation interferogram.When to Use the Alignment Optimization (ALI) OptionThe ALI option can be used for three purposes:•To predict the small changes in specified parameters (compensators designated in the LDM) needed to do final alignment of an assembled optical system•To predict the potential improvement that making such adjustments will generate, pre- and post-alignment•To convert a null test interferogram into an interferogram measured along the surface normal.The first two are part of the output of the option. The conversion of a null test interferogram to a surface normal interferogram is included here because the computation in ALI is the one needed: defining a system wavefront and relating surface errors to system wavefront errors.The use of ALI should be associated with lens systems that require adjustments after initial assembly. Most rotationally symmetric refractive lens systems are designed to be fabricated and assembled with enough precision that no internal adjustments after assembly are needed; only focus and possibly tilt of the image surface are typically used to enhance performance; an effective tolerance analysis can establish the feasibility of such an approach. Additional steps such as fitting to test plates, melt glass data, or even respacing for measured thicknesses can be applied to give wider latitude to the remaining tolerances or achieve a higher level of quality. These systems do not require the use of the ALI option.In non-rotationally symmetric systems (and even in selected centered systems) it is often too much to expect that all parts can be made and assembled without planning to have final adjustments. For example, multi-mirror unobscured systems depend on adjustable parameters (element tilts and/or displacements) for final tuning of the system to produce the design performance; in fact, they often are designed with 6degree-of-freedom mirror mounts and toleranced with adjustment as an essential step. Alignment would be an impossible task without developing the simultaneous solution for adjustments that the ALI option provides.An assembled system may show residual aberrations not present in the design. Note that - without knowing the magnitude or even the source of specific errors within the lens, but just having the system interferograms at several field angles - computational experiments can be run with this option, trying different potential adjustment scenarios until one is found that restores enough of the design performance. The best scenario can then be applied to do final alignment of the lens assembly.Even some rotationally symmetric systems (e.g., microscope objectives, Cassegrain reflecting systems, etc.) may be designed to have an adjustment (e.g., a mirror tilt, lens element decenter, and/or an airspace) aimed at taking out some residual aberration such as axial coma or spherical aberration; the ALI option makes this a single step process giving both the correct magnitude and direction, instead of a trial-and-error process on the hardware itself. For modest field systems, this often can be done with a single axial system interferogram. In all of the applications suited for treatment by the ALI option, the system must have residual wavefronterrors that can be measured interferometrically.ALI - Alignment OptimizationPreparation for Running the Alignment OptionLike the TOR option, the ALI option calculates wavefront differentials which are linear with respect to the parameter changes. Thus, it can only predict small changes in the user-specified alignment parameters. One common alignment problem is that of rotating two mirrors with respect to each other to minimize the effects of surface errors, e.g., astigmatism. This must be done by assigning the interferogram data to the appropriate surfaces and analyzing the system with any of the image quality options (e.g., WAV). By going through a series of rotation angles (e.g., 0, 30, 60, 90), a minimum may be found.Preparation for Running the Alignment Option For alignment purposes, the lens data should be the best achievable design - the design fitted to glass melt data, test plates and measured thicknesses. Only include enough of these steps, forming the “baseline” design, to represent the design performance as you want it to be post-alignment. Details such as interferometric surface errors are immaterial since the predicted adjustment magnitudes and directions will be unaffected by them; they will only affect the pre- and post-alignment predicted performance.As part of the lens data, include the compensators (CMP) you wish to have used as alignment parameters. These are entered in the LDM (see section on Tolerances). Be sure to include compensators that can be effective in correcting the system (focus shift, image plane tilt or independent focus at each field (INC command), element/subsystem spacings and tilts, etc.). Note that this is a crucial step in the process - selection of the right element decenter in a high numerical aperture microscope objective may make an otherwise unfeasible performance level achievable.There is no limit on the number of compensators allowed, however the best solutions are obtained with the fewest compensators which will accomplish the alignment. The parameters are typically motions of optical elements, such as tilt and decenter of the secondary in a Cassegrain, but also would normally include axial displacement and tilt of the image surface.The focusing mode is determined by compensator entries such as DLZ SI (defocus) and TIL SI (2components of tilt). If none of these compensators is entered, there is no adjustment of the focal surface. With INC (independent compensation), DLZ SI must also be entered if it is to work correctly, but each field will be focused independently and any focal surface tilt compensators will have no effect.A special feature of the ALIgnment option is the ability to calculate the surface deformations of a surface being tested in a null configuration. In some null tests, the surface is not measured at center of curvature, e.g., a parabola in autocollimation. The resulting interferogram, therefore, does not correctly represent surface errors as measured normal to the surface. This feature predicts the correct surface deformations as a Zernike polynomial. To use it, set up the null test configuration as the lens data in the LDM. Run the ALI option, designating the one surface associated with the null test wavefront; write out the .INT file in polynomial form. Repeat for each null tested surface in the system. Then restore the full system and attach the new files to the corresponding surfaces. Proceed with any desired CODE V operations (optimization, evaluation, alignment, etc.).Default OperationNone; no calculation is possible without at least one measured wavefront supplied (INT command). With one such wavefront (measured at the exit pupil for the assembled system in the reference wavelength) entered for each field point and zoom position, values of the small alignment changes are generated. (Alignmentparameters are selected in the LDM as compensators, such as tilts, decenters, axial spacings, and focal plane shift and tilt). The computed changes are those needed to restore as much performance as possible; they are listed along with the RMS error existing before and after alignment. The RMS error is for the difference between the measured and nominal system wavefronts; thus the goal is restoration of design performance, notenhancement relative to a perfect lens. ALI uses Gaussian apodization if present in the lens data.ALI - Alignment OptimizationCommand MnemonicsCommand Mnemonics (alphabetical)Data Input Overview The ALI option assumes that:•The lens data (entered or restored in the LDM) is a system that represents the desired wavefront performance, and that the desired alignment parameters have been designated as compensators in theLDM. Zoom positions can be used to represent a zoom lens or to extend the number of fields at which measurements have been made beyond the limit of 25 for a non-zoom lens.•Exit pupil interferograms have been measured at one or more field points for the hardware assembled as represented in the lens data, and converted to files according to the CODE V standard described in theLDM (several interferometer manufacturers supply this form of output).•These files are attached to their appropriate field points (INT) and scaled in deformation if needed (ISF).The interferograms they represent are matched to the exit pupil in size (INR) and position (FID or IMI, IRO, INX, INY).•All exit pupil interferograms have been measured with respect to images lying on the desired focal surface, or else adjusted so (FOC).•Appropriate values or defaults are present for ray grid density (NRD) and the desired weighting of the various field points (WTF). The default field weights are the LDM field weights.The option then proceeds with its computation. All calculations are done in the reference wavelength only. If it is a null test conversion see “Null Test Computations” on page 21-18 for details. Also see “Discussion of Input and Computations” on page 21-16 for a thorough explanation.FID FOC IMI INR INT INX INY IRO ISF NRD NUL WIN WTF ZFRZRNALI - Alignment OptimizationDefining the InterferogramDefining the Interferogram To define the interferogram, select the Analysis >Fabrication Support > Alignment Optimization menu. The Alignment Optimization dialog box is displayed, with the Interferogram tab in the mand Syntax Screen ControlExplanation Default INT Fk [ Zn ] int_filenameFile Assign system (exit pupil) interferogram data in the file int_filename.INT to field k, zoom n. When more than twenty-five fields are needed, the system may be zoomedto allow other fields (up to 35) to be defined in the added position(s); this is the most frequent use of Zn, althoughzoom systems can also be aligned.None; at least one interferogram isREQUIRED.ISF Fk scale_factor....zScale Scale the measured wave deformation for field k anddesignated zoom position by the specified scale factor -provides a convenient scale factor separate from the one specified in the interferogram file. Example : use 0.5 for scaling of wavefront data measured in a double-pass test.1.0.ALI - Alignment Optimization Defining the Interferogram INR Fk radius....z Radius Radius of data on the exit pupil at field k and designatedzoom position, in units of the lens. This connects the unit length of the file data to a physical length on the exit pupil. The unit length of file data is defined:Zernike polynomials–In a circle of unit radius Grid –In a square of unitsemi-dimension The entered value of physical length is the radius on the exit pupil, measured in a direction normal to the chief ray.Note : If the given value of radius scaled theinterferogram smaller than needed to cover the exit pupil, the data outside the unit semi-dimension will eitherbe missing (grid) or extrapolated (polynomial) leading to false results; this must be avoided.Semi-diameter of the exit pupil.IMI Fk XC | YC | No....zMirror Mirror image in X or Y at field k and designated zoom position:XC –Move deformation data to theopposite X-coordinateYC –Move deformation data to theopposite Y-coordinateN or No – No mirror image is doneOnly one of IMI XC or IMI YC can be done at a given field position; to do both is equivalent to an IRO of 180°.No.INX Fk x_dec....zX Decenter The X coordinate for the interferogram center in the plane containing the exit pupil point and normal to the chief ray, at field k and designated zoom position.Chief rayintersection.INY Fk y_dec....zY Decenter The Y coordinate for the interferogram center in the plane containing the exit pupil point and normal to the chief ray, at field k and designated zoom position.Chief rayintersection.IRO Fk ang_rot_degr....zRotation Angle of rotation, in degrees, of the deformation data in the interferogram at field k and designated zoom position. Rotation is about the center of the interferogram. Rotation of the positive X axis toward the positive Y axis(counterclockwise) is a positive rotation. If IMI was entered, the IRO action is done after IMI.0.0Command Syntax Screen Control Explanation DefaultALI - Alignment OptimizationFitting the Interferograms to the Exit PupilFitting the Interferograms to the Exit PupilOrienting Interferogram DataFive commands are available for orienting interferogram data on the exit pupil in this option:FID Fk [ Zn ] x_R2 y_R2 x_R3 y_R3 [ x_R4 y_R4 [ x_R5 y_R5 ] ]Fiducials for interferogram data alignment w.r.t. reference ray Fiducials for aligning the interferogram data at field k, zoom n with the CODE V reference rays. Values are points relative to the unit circle (of the interferogram) where the CODE V reference rays (R2, R3, R4 and R5) pass through the interferogram (assuming it is positionedin the real exit pupil, normal to the chief ray). The action is dependent on the number of rays referenced in the X_Rn, Y_Rn values:R2, R3MINIMUM DATA. Generatesvalues for rotation (IRO), scaling(INR), and decenter in X and Y(INX, INY) to match exactly the4 values.R2, R3, R4, orR2, R3, R4, R5Generates values for mirrorimage (IMI,XC),rotation (IRO),scaling (INR), image (IMI, XC),and decenter in X and Y (INX,INY) that minimizes in the least squares sense the departures fromthe 6 (or 8) values.None. Uses IMI, IRO, INR, INX, mand Description LocationIMI Reverse interferogram data “left-for-right” or “up-for-down” (i.e., a mirror image in X or Y, respectively)Interferogram tab (See “Defining the Interferogram” on page 21-8.)IRO Rotate the interferogram about its center Interferogram tab (See “Defining the Interferogram” on page 21-8.)INR Scale the interferogram unit dimension to the specified value Interferogram tab (See “Defining the Interferogram” on page 21-8.)INX, INY Shift center point of interferogram to a designated X, Y point in the exit pupil Interferogram tab (See “Defining the Interferogram” on page 21-8.)Command Syntax Screen Control Explanation DefaultALI - Alignment OptimizationFitting the Interferograms to the Exit PupilIMI and IRO apply to interferogram coordinates only. The interferogram coordinate system is:IMI XC means that data that was on the +X side is now on the -X side and vice versa. IMI YC has a similar meaning in the Y direction. Notice that it is the deformation data that moves; the axes do not move. IRO rotates the data by the specified angle, where counterclockwise is the positive direction (rotating the positive X axis toward the positive Y axis). If both IMI and IRO are entered, the IMI is done first.INX, INY and INR apply to the exit pupil only. INX and INY specify where the center of the interferogram is placed. These are given in units of the lens system. INR is the radius of the data, also in lens units. It equates the unit radius of the interferogram data to a physical distance.Mirror Image, Rotation, and Translation OrderThe transformations IMI, IRO, INX and INY are performed in the order of: mirror image, rotation,translation.Defaults apply:•The interferogram is centered on the intersection of the chief ray with the exit pupil. Overridden by FID, INX and/or INY.•No mirror image. Overridden by FID and/or IMI.•No rotation. Overridden by FID and/or IRO.•The radius of the data is the semi-diameter of the exit pupil. Overridden by FID and/or INR.Interferograms which are entered in ALI, are associated with the exit pupil. The coordinates of the exit pupil are always measured perpendicular to the chief ray. This is because an interferogram represents the image of the exit pupil of the system and the axis of the interferometric setup is approximately along the chief ray. The coordinates of the interferogram are mapped onto the plane which is tangent to the reference sphere at the position where the chief ray intersects the reference sphere.An alternate method of orienting the interferogram to the exit pupil is by matching fiducial points on the interferogram to the intersection of the CODE V reference rays with the tilted exit pupil. The CODE V reference rays are used to define the bundles of light. These rays are:Ray Label DescriptionR1Chief rayR2Upper (+) Y rayR3Lower (-) Y rayR4“Upper” (+) X rayR5“Lower” (-) X rayALI - Alignment OptimizationNull Test Analysis: Converting Non-normal Null Test Interferograms to Normal InterferogramsThe FID input defines between two and four points on the interferogram which are associated with the reference rays, R2, R3, R4 and R5. If only two points (R2, R3) are used, an exact fit can be obtained; for more than two points, a least squares fit is done between the fiducial points and the intersection of the CODE V reference rays with the tilted exit pupil. The solution gives the values of IMI, IRO, INR, INX and INY.If a set of fiducial points (FID) is entered, it will be used for the referencing. Otherwise, the specific coordinate transformations (IMI, IRO, INR, INX, INY) or their defaults will be used. Null Test Analysis: Converting Non-normal Null Test Interferograms to Normal Interferograms In some null tests, the lens surface is not measured at its center of curvature; for example, a parabola could be tested at its focus with a flat mirror. The resulting interferogram, therefore, does not directly represent surface errors as measured normal to the surface. Since surface errors, as specified in .INT files, are assumed to be measured along the surface normal, a way is needed to convert the results of a non-normal null test to surface deformations along the surface normal. This is done, on one interferogram at a time, as follows:•Set up the single field null test configuration as your lens, in the LDM, then enter this option (ALI) •Use INT to place the null test interferogram in the exit pupil•Use ISF, FID or IMI, IRO, INR, INX, INY as necessary•Use NUL to bypass regular alignment operations and to convert the exit pupil interferogram into a surface interferogram for the designated surface•Use ZRN or ZFR to designate form of Zernike polynomial to be generated•Use NRD if necessary to provide enough grid points for the single field fit to polynomials of the designated order•Use WIN (writes the information on a file in a format compatible with the INT command in the LDM) •Do the same for any other surfaces measured by null test interferogramsSet up your actual optical system in the LDM, attaching these new surface interferograms to the assigned surfaces plus any other surface interferograms. Proceed with any desired CODE V operations (optimization,evaluation, etc.).ALI - Alignment Optimization Defining a Null Test Analysis Defining a Null Test Analysis To define a null test analysis, select the Analysis >Fabrication Support > Alignment Optimization menu. The Alignment Optimization dialog box is displayed. Select the Null Test tab to bring it to the foreground. Command SyntaxScreen Control Explanation DefaultNUL Sk [ radius ]Surface number for null test /Radius of surface (lensunits)Bypass the normal alignment calculation and convert the one exit pupil interferogram from a null test into a surface interferogram for surface Sk. The lens must bethe optical system representing the null test; one, and only one, exit pupil interferogram (INT) must beentered. The ray traced wavefront is compared to themeasured exit pupil interferogram; any differences are assumed to be due to errors on the specified surface. A Zernike polynomial fit is done to the surfacedeformations, specified by the ZRN or ZRF command;if neither is given, ZRN 36 is used. The unit circle for the polynomial corresponds to the radius entered on theNUL command. If a radius is not entered, the clear aperture of surface Sk is used.Do the normal alignment process.ALI - Alignment OptimizationDefining a Null Test AnalysisZRN num_terms Select Interferogram Format: StandardZernike Use with NUL. Fit the residual system wavefront, from the null test configuration, to a standard Zernike polynomial to be used as a surface deformation. The fit is done with respect to normalized exit pupilcoordinates, but centered on and measured in a direction normal to the chief ray. Either ZFR or ZRN may be entered but not both. 36, if NUL is used.ZFR num_termsSelect Interferogram Format: Fringe Zernike /Number of terms Use with NUL. Fit the residual system wavefront, from the null test configuration, to a FRINGE Zernike polynomial to be used as a surface deformation. The fit is done with respect to normalized exit pupilcoordinates, but centered on and measured in a direction normal to the chief ray. Either ZFR or ZRN may be entered but not both.None. Use ZRN.WIN int_filenameEnter interferogram file name for saving Zernike coefficients Use with NUL. For the residual system wavefront, from the null test configuration, write Zernike coefficients on an interferogram file namedint_filename.INT, for use as a surface deformation.No file mand Syntax Screen Control Explanation DefaultDefining Computation ControlsDefining Computation ControlsTo define computation controls, select the Analysis >Fabrication Support > Alignment Optimization menu. The Alignment Optimization dialog box is displayed. Select the Computation tab to bring it to the foreground.Command SyntaxScreen ControlExplanationDefaultNRDnum_rays_across_diameter Number of rays across diameterNumber of rays traced across the pupil diameter at each wavelength. Recommendation: There should be enough rays to give a reasonable representation of theaberrations for the RMS calculation. The default is sufficient in most cases. For significant vignetting and/or central obscuration, increase NRD. For the NUL analysis, the smoothness of fit to Zernikepolynomials is dependent on having significantly more (at least twice as much) information than the number of terms in the polynomial. Increase NRD if number of terms is high, especially with significant vignetting and/or central obscuration.16.Discussion of Input and ComputationsDiscussion of Input and ComputationsWhat to Include in the LDM Lens DataFor alignment purposes, the lens data should be the best achievable design – the design fitted to glass melt data, test plates and measured thicknesses. Only include enough of these steps, forming the “baseline” design, to represent the design performance as you want it to be post-alignment. On the other hand, don't expect the option to overcome the effects of severe, unadjustable errors; the process only aims to minimize the difference between the baseline design and the post-alignment system; if the baseline design is too far away from what is achievable with the adjustment parameters given, the balance may not be optimum. Details such asinterferometric surface errors are immaterial since the predicted adjustment magnitudes and directions will be unaffected by them; they will only affect the pre- and post-alignment predicted performance.As part of the lens data, include the compensators (CMP) you wish to have used as alignment parameters. Values entered with the compensators (or their defaults) act as limits to the allowed changes. Be sure to include compensators that can be effective in correcting the system (focus shift, image plane tilt orindependent focus at each field (INC command), element/subsystem spacings and tilts, etc.). Note that this is a crucial step in the process - selection of the right element decenter in a high numerical aperture microscope objective may make an otherwise unfeasible performance level achievable.Specific tolerancing controls allow ALI to select the most effective set of compensators for your system. The Singular Value Decomposition (SVD) Threshold and Used Compensators controls in the System Data window (SVT and MCP commands, respectively) regulate the compensators used to align the system. See “Defining Tolerance Controls” on page 3-60 for details about these commands. In addition, you can specify which compensators must be used, and which can be dropped from the system. This is done using the Compensator Use Control field in the Surface Properties window, on the Tolerances page. From the command line, use the CMP command. For details, see the CMP command description under “Other Tolerance Controls” on page 8-23.WTF field-zoom_weight....f, zField Weights forBalancing Alignment SolutionField weights to balance for solution of alignment parameters. If field_zoom_weight value is 0, computations for that field will be skipped.Lens system weightsfrom WTF in the LDM.FOC focal_shift....f, z Wavefront Focal ShiftFocal shift added to the lens at the specified field/zoom position. Use to compensate for focal shifts known to be present in the measured system interferograms, and to bring them, as needed, into acommon reference with respect to the focal surface as defined in the lens data. Note : Needed so that the focus compensation arrangement defined in the LDM is applied correctly; otherwise, focus compensator values will apply to the unrelated (and possibly unknown) foci represented in the system interferograms.0.0Command SyntaxScreen ControlExplanationDefaultDiscussion of Input and ComputationsUsageThe ALI option predicts small changes in specified alignment parameters based on measured wavefront data at one or more fields:•It uses the baseline design as the performance standard, and compensators (CMP) to designate the alignment parameters, entered in the LDM•It uses measured system wavefront data entered in the option itself•Predicted changes in the alignment parameters are used for adjusting the hardware.Figure 2.Schematic of the ALI optionMore specifically, the ALI option assumes that:•The lens system (entered in the LDM or restored) has been optimized to represent the quality standard to be used, and that the desired alignment parameters have been designated as compensators in the LDM. Zoom positions can be used to represent a zoom lens or to extend the number of fields at whichmeasurements have been made beyond the limit of 25 for a non-zoom lens.•Exit pupil interferograms have been measured at one or more field points for the hardware assembled as represented in the lens data, and converted to files according to the CODE V standard described in theLDM (several interferometer manufacturers supply this form of output).•These files are attached to their appropriate field points (INT) and scaled in deformation if needed (ISF ). The interferograms they represent are matched to the exit pupil in size (INR ) and position (FID or IMI , IRO , INX , INY ).•All exit pupil interferograms have been measured with respect to images lying on the desired focal surface, or else adjusted so (FOC ).•Appropriate values or defaults are present for ray grid density (NRD ) and the desired weighting of the various field points (WTF ). The default field weights are the LDM field weights.。
code v参考手册中文版
CODE V 参考手册中文版
文档作者 ：魏葰 标识版本 ：CODE V Manual/1.0 更新日期 ：2008/06/11 文档状态 ：概念
技术要点 RIM—边缘光线像差绘图
何时使用边缘光线像差绘图功能选项 缺省操作 命令清单 定义绘图控制 定义波长/颜色设置 输入与计算讨论 输出描述 CAT—猫眼图 何时使用猫眼图功能选项 缺省操作 命令清单 定义猫眼图设置 输入与计算讨论 输出描述 PMA—光瞳图 何时使用光瞳图功能选项 缺省操作 命令清单 定义显示设置 定义计算控制 定义输出控制 定义绘图控制 定义颜色显示设置 定义 Zernike 系数控制 定义扰动波阵面 输入与计算讨论
未经 FLOMS 许可，不得擅自复制 第 12 页 共 28 页
CODE V 参考手册中文版
文档作者 ：魏葰 标识版本 ：CODE V Manual/1.0 更新日期 ：2008/06/11 文档状态 ：概念
定义颜色显示设置 定义输出控制 输入与计算讨论 输出描述 技术要点 FOO—足点分析 何时使用足点分析功能选项 缺省操作 命令清单 定义计算控制 定义绘图控制 定义图形设置 定义绘图符号 定义特殊控制 输入与计算讨论 输出描述 第十九章 像质评价 SPO—点列图 何时使用点列图功能选项 缺省操作 命令清单 定义显示设置 定义绘图符号设置 输入与计算讨论 输出描述 技术要点 QUA—象限探测器分析 何时使用象限探测器分析功能选项
文件标识：CODE V Manual/1.0 创建日期: 2008/06/11 文件名称：CODE V 参考手册中文 更新日期: 2008/06/11
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文档版本: 1.0
文档类型：PIR
CODEV中文使用手册1
CODEV 使用手册1CODEV是进行光学系统设计和分析的工具。
这一章向您介绍CODEV，帮助您学习和使用它，并且简单介绍用户使用界面和结构。
目录CODEV功能...简单介绍.......关于命令和宏............ CODEV的结构...............开始，退出，技术支持.............. CODEV功能光学系统设计和分析工具CODEV是为解决光学问题的一件有力和灵活的工具软件。
他的发展已经经历了30年，CODEV是不断随着光学和计算机技术的提高而改进。
他基于与一个可定制Windows用户界面，有广泛的帮助，和优秀的技术支持，便于通过手册CODEV学习和使用。
CODEV的典型应用CODEV有许多方面的应用。
下面一些典型的应用。
为了个新的光学设计而利用一个现有的设计进行评估和改善，可以减少制作花费。
塑料的，非球面，衍射光栅面，或现有的部件都可以如此进行设计。
基于一个新的产品要求要求而创造一个新设计。
对光学设计进行生产公差分析，产生制图甚至输出IGES (CAD)文件应用是什么主要有三个方面：成象系统，光电子或光通信信系统，照明和其他的系统过去，主要应用在图象系统中。
比如包括数码相机，变焦系统和增透镜，光盘系统，医学系统，望远镜，分光镜，复印机，投影机，扫描仪，缩微镜头系统，还包括许多太空应用，军用或者民间等。
尽管这些应用已经存在许多年，但是随着技术的进展，使一些新的工作产生如———照相机到数码相机，CD 到DVD，等等。
近年光电子的应用一直在成长，在照明和其他系统的应用显示了CODEV灵活适应性。
不需要从草稿开始现在说最后一项，CODEV已广泛使用多年。
它的一个优点是不必需从草稿开始进行光学设计。
从一个现有设计做修改是是它典型的应用，并且下面我们将教你怎么做，使用CODEV的New Lens Wizard。
利用专利首先，New Lens Wizard.允许你从CODEV 的一个透镜设计样品开始，从2,400个专利的数据库，或者从你的自己的收集的“favorites”或从一个空白的透镜开始。
CODE V 入门用户指南
第一章概述CODE V是设计和分析光学系统的一种工具。
本章的内容主要是向你介绍CODE V，描述可以帮助您学习和使用它的内容，并且简要地描述其用户界面和程序的结构。
目录第一章概述 (1)1.1 何谓CODE V？ (2)1.2 手册与用户 (3)1.3 假设和术语 (4)1.4 CODE V的界面 (5)1.5 CODE V的结构 (6)1.6 启动、退出程序和技术支持 (7)1.7 手册中的一些设置 (7)1.1 何谓CODE V？1.1.1 光学设计的得力工具CODE V是解决光学问题一种强大、灵活的软件工具。
虽然CODE V的发展始于30多年前，但是它紧跟光学和计算机的发展步伐，得到不断地改进。
由于CODE V采用了可定制的窗口用户界面，有着丰富的帮助功能和优越的技术支持，所以它是十分容易学习和使用的，本手册将展示的这些特点。
1.1.2 CODE V典型的使用任务CODE V可应用于许多种场合。
下面列举一些典型的使用任务：●对现有光学系统进行评估和调整，以便决定是否适用于新场合或能否降低生产成本。
在重新设计过程中，对使用塑料、非球面、衍射元件或者现在元件进行评估。
●基于具体的产生或应用场合的要求创建新的设计形式。
●对光学系统进行公关分析，以合适制造，绘制生产图纸，甚至导出CAD用的IGES格式文件。
有哪里应用场合？从广义上来说，有三种应用领域：⏹成像系统⏹光电或通讯系统⏹照明和其它系统从历史上来看，CODE V在约80%或更多的应用大概是在成像系统方面。
例如照相镜头、变焦物镜、光盘系统、医用仪器、望远镜、分光镜、复印设备、投影仪、扫描仪、微光刻系统和许多包括军用和民用的航天领域。
虽然用于这些场合已经延续了多年，但是随着技术的发展，例如照相机的数码化、DVD取代CD等等，出现新的工作内容。
在近些年，光子学领域得到快速增长。
同时，由于CODE V有极大的灵活性，照明和其他系统也成为其重要的应用部分。
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当你开始一个新设计时， 你应该考虑包括本质是什么，然后考虑更多的细节。 偏振可以是最后一个重要的因素， 但是你可能不需要打开所以现在不用担心它。 下面是其他一些保持设计简单的方面：
在转到非球面设计或衍射前试着使用全球面设计。
如果非球面或衍射是必需的， 首先考虑降低级别。
不要使用x轴视场，倾斜，和偏心除非系统实际如此和非对称系统。
CODEV功能
光学系统设计和分析工具
CODEV是为解决光学问题的一件有力和灵活的工具软件。他的发展已经经历了30年， CODEV是不断随着光学和计算机技术的提高而改进。他基于与一个可定制Windows用户界面， 有广泛的帮助，和优秀的技术支持，便于通过手册CODEV学习和使用。
CODEV的典型应用
CODEV有许多方面的应用。 下面一些典型的应用。
CODEV使用手册1
CODEV是进行光学系统设计和分析的工具。 这一章向您介绍CODEV， 帮助您学习和使用它， 并且简单介绍用户使用界面和结构。
CODEV功能...简单介绍.......关于命令和宏............ CODEV的结构...............开始，退出， 技术支持..............
First-order or paraxial optics—觅迹的光线被假设为简单的直线方程(例如，角度很小便认为SINθ=θ， 光线高度很小等)，这些被称做一阶或近轴对定义光系统的基本特性使用更方便。
FOCAL LENGTH—是成像系统最基本的定义。薄透镜的焦距的定义是光从无限远所成的像的位置到透镜的距离。有效焦距(EFL) 说明一个真实的厚度不可忽略的光学系统的焦距。假定你已经理解有更多的概念和术语，但是这些是基本。如果大部分是陌生的话，可以从附录B被列出了的书中读一些有关章节，就能够理解他的含义了。
过去，主要应用在图象系统中。比如包括数码相机，变焦系统和增透镜， 光盘系统， 医学系统， 望远镜， 分光镜， 复印机， 投影机， 扫描仪， 缩微镜头系统， 还包括许多太空应用， 军用或者民间等。
尽管这些应用已经存在许多年，但是随着技术的进展，使一些新的工作产生如———照相机到数码相机， CD到DVD， 等等。 近年光电子的应用一直在成长，在照明和其他系统的应用显示了CODEV灵活适应性。
关于手册
手册功能齐全，但是并不尝试完整的阐述光学理论和光学工程， 至少没有形成任何体系。 也不要求阐述CODEV的每一个的特征。只是通过一系列解决实际问题的例子来讲述软件的使用。
更多的介绍
如果在用户界面的你更需要详细的信息和使用技巧， 请使用CODEV的CODE V Test Drive。 更详细的功能信息或其他的例子，请参看on program features, the online Help or Reference Manua He（请参看“Online Help and Documentation”， 下面是更多的细节)。
选择Help > Online Reference Manual(Adobe Acrobat) 是完整的CODEV参考书手册， 包括所有的文本， 图形和例子。 参考书手册是可以查找的并且已经安装好的。
选择Help > Tip of the Day每日提示(也可以关掉提示)。
假设和术语
阅读手册不需要太多必备条件，尽管它需要对光学系统的方法和术语有一些基本的了解。我们将使用一些不太多概念和术语。 如果你已经了解物理学知识，那么那包括基本的光学，你将发现术语的大多数熟悉，虽然一些已经随着工程和设计已经更新。
LENS—在CODEV中把LENS作为光学系统的代称，就象把变焦透镜作为摄像机的代称。在平常，透镜经常指把单一的按照一定方法制作的单片玻璃。 在光学设计中称为透镜单元，或一个光学元件。
Object and Image surfaces—物面是假定光开始的地方，象表面是光线汇集和分析的位置(象是经常在那里形成了， 然而有时候不是)。 物和像的说法在经典光学中有特殊的意义。在这一节将讲述更多基本的光学知识。 许多在CODEV中被模拟的系统是成象系统，因此这些关系是重要的， 知道概念和含义比知道方程是更重要，因为CODEV为你计算这些数据。
但是不要考虑事情太简单：
即使系统仅仅是近轴使用(例如.，一些激光系统) ，至少在轴外使用另一个很小的Y视场， 如果考虑偏心的时候。仅仅使用一个视场有时会引起与太小的缺省孔径。
圆锥曲线比非球面看起来更简单，但是如果一个面为很小的曲率，当一个四阶非球面有有效的优化变数的时候一个圆锥曲线没有。
这些例子你虽然感觉很专业， 但是当你使用CODEV后将能够认识他们。更确切的说，你应该轻松使用CODEV的功能，利用撤消功能(EDIT>UNDO菜单) 进行简单的使用和且估计。 如果它没有改变， 使用恢复并且增加一些更多的变数， 然后再运行你的优化。 这可能仅需要点击和少量时间再运行， 改变试验和误差是实际使用中有效的设计策略。
不需要从草稿开始
现在说最后一项， CODEV已广泛使用多年。 它的一个优点是不必需从草稿开始进行光学设计。 从一个现有设计做修改是是它典型的应用， 并且下面我们将教你怎么做， 使用CODEV的New Lens Wizard。
利用专利
首先，New Lens Wizard.允许你从CODEV 的一个透镜设计样品开始， 从2,400个专利的数据库，或者从你的自己的收集的“favorites” 或从一个空白的透镜开始。 虽然从样品透镜和专利库做为起始点， 但你应该也知道并且在设计中尊敬知识产权。 在CODEV专利数据库包括过期专利， 还有一些期限未满的专利。 从它们作为起始学习， 但只是作为工作的起始点，使用任何期限未满的专利不能侵害专利所有人的权利。“favorites” 特征能是作为典型例子—扩展应用， 或作为输入和你的同事的进行学习， 建立透镜设计的数据库是将来容易的理解和将来更好的应用。 当你完成一个设计和作为一份透镜文件保存它时， 你能快速把它加到你的favorites中，使用tools> favorites> 增加到favorites菜单中，为以后的使用增加方便。
阅读和按照TEST DRIVE中的例子操作然后回到这里继续学习使用技巧。如果对其他的视窗应用程序比较熟悉，不不需要涉及太多的用户知识的结构。
总之你不必担心使用界面，Test Drive将详细阐述从而更有效的学习CODEV的使用。
提示: 注意当使用CODEV的数据表时， 你能选择任何单个表格或整行或列。表格对应于特别的数据例如厚度，当行通常对应于全部表面时。右键菜单选择位置不同所显示的菜单也不一样。 选择行， 在最左面的表格点击直到行变亮。也可以通过拖拽选择多行， 然后对他们整体进行操作(象删除一个表面一样)。 所有这些说到的，后面都有程序图片说明，并且包含简短的定义，如果在使用的时候找不到状态栏在哪里，可以回到这页参考。
CODEV界面
简短浏览
学习一些东西的最好的方法是使用他，我们将推荐你使用CODE V Test Drive作为CODEV的使用界面。虽然他包含许多许多命令除了视窗应用外。这里介绍一些关于CODEV的界面概念和使用方法。Test Drive是包含用户界面最基本特征的简短手册，和一些相关的说明材料。
这手册将在讲述界面的所有特征，但是他们包含在例子和说明文件中，手册的目标是阐述CODEV的各项功能的实际应用。
toolsbar—为许多普通功能单个按钮。把鼠标放在按钮前可以看到按钮的描述信息。 通过鼠标可以拖动工具栏。也可以改变工具栏的内容(tools>custorms菜单)
Lens Data Manager (LDM) Window—用数字来显示镜头数据数据的表格。你能存取其它和修改数据表中利用用右击选择的表格、行或列的数据。仅仅包含弹出式菜单中选择的条目命令。
Ray tracing—通过一系列Optical surface决定光路径的数学方法。 光线通常于几何光学联系， 但是在各种各样的光线觅迹方法被扩展到波甚至偏振所以允许物理光学计算(也被叫做基于波或基于衍射的计算)。
Optical system—包含光面和和一些特性（系统数据) 定义与光面相交特征。在CODEV中光学系统是都是能被制造的真实光学系统模型。 它包含折射面，反射面， 或都包含。
关于手册说明
读者
手册的使用对象是利用CODEV的功能进行模拟，分析，和优化光学系统的任何技术人员。尽管在光学或光学工程的有一些知识背景是有帮助的，CODEV的许多用户已经学习了必需的技能和知识，或通过职业的研习班(SPIE和其他人) 或通过有各种各样的方式自学。 CODEV并不是那没有光学理论而进行透镜设计的暗箱， 但是必要的背景知识在设计的时候经常用到。
提示: 第10章，“Tech Talk: Useful Background,” 包含许多有价值的材料附录并详细的讲述了光建模问题。它包括坐标系统， 系统数据， 瞳孔和渐晕， 并且还有其他重要的内容。 你可能在做第2章和3做例子前读过。
如果你需要更多的知识背景去理解光学技术要点，我们建议您读参考书的一些相关的节(附录B)。有Fischer (2000) and Shannon (1997)着作的书是很有很现代和实际应用意义的倾向于例子和讨论的参考书。
联机帮助和文档
CODEV包括广泛的联机的帮助和文档(它是“online”在PC屏幕上显示的而非打印的)，（不是在网上的，而是与软件一起安装的)。 下面是得到帮助的方式，在CODEV中有很多得到帮助方法。 请看帮助菜单:
选择Help > CODE V Help(或按F1) 为了打开的帮助系统的窗口或对话框。
选择Help > Contents and Index打开帮助内容的索引; 在目录上双击扩展可以看到许多副标题。 从这里能寻找帮助内容。
选择Help > What's This? Help (or press SHIFT+F1)把光标改变成一“help pointer”点击那些分类的能够看到一个相关的帮助话题(在界面的大多数按钮有帮助， 但有部分没有)。