Fast bootstrap for least-square support vector machines
spss统计分析及应用教程-第9章 结构方程模型

❖ 模型评价
评价指标
绝对拟合评价
指 标
绝对拟合评价
绝对拟合评价
卡方值
拟合优度指数GFI
标准化均方根残余 SRMR 期望复核效度指标 AGFI 调整后的拟合指数 AGFI 不规范拟合指数 NNFI
增值拟合指数IFI
简效规范拟合指数 PNFI Akaike 信息标准化 AIC 规范卡方Normed Chi-Square
• Move是移动所选定的图形; • Duplicate是复制所选定的图形; • Erase是删除所选定的图形; • Move Parameter是移动所设定的参数位置;
•Edit按钮 在Edit下拉的菜单之中,提供了路径图编辑的相关工具, 如图所示。各选项的功能如下:
• Reflect是将所选定的图形作镜面对称; • Rotate是旋转所选定的图形; • Shape of Object是调整所选定的图形大小; • Space Horizontally是水平调整选定的图形; • Space Vertically是水垂直平调整选定的图形; • Drag Properties用来设定正在编辑的图形的性质; • Fit to page是使绘图区的图形与绘图区域大小相适应; • Touch up是用来使图形相对协调美观。
(3)可以在一个模型中同时处理因素的测量和因素之间的结构 传统的统计方法中,因素自身的测量和因素之间的结构关系往
往是分开处理的——对因素先进行测量,评估概念的信度与效度, 通过评估标准之后,才将测量资料用于进一步的分析。
在结构方程模型中,则允许将因素测量与因素之间的结构关系 纳入同一模型中同时予以拟合,这不仅可以检验因素测量的信度和 效度,还可以将测量信度的概念整合到路经分析等统计推理中。
ls-app

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assuming tk = tl for k = l and m ≥ n, A is full rank: • suppose Aa = 0 • corresponding polynomial p(t) = a0 + · · · + an−1tn−1 vanishes at m points t1, . . . , tm • by fundamental theorem of algebra p can have no more than n − 1 zeros, so p is identically zero, and a = 0 • columns of A are independent, i.e., A full rank
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Least-squares applications 6–7
Growing sets of regressors
consider family of least-squares problems minimize for p = 1, . . . , n (a1, . . . , ap are called regressors ) • approximate y by linear combination of a1, . . . , ap • project y onto span{a1, . . . , ap} • regress y on a1, . . . , ap • as p increases, get better fit, so optimal residual decreases
时频分析在雷达信号识别中的应用分析

南京航空航天大学硕士学位论文图表清单图2.1谱线位置示意图1 (8)图2.2谱线位置示意图2 (10)图3.1对正弦信号的采样 (16)图4.1高阶矩算法的估计均值与真实值的比较 (21)图4.2高阶矩算法的估计值的标准差 (22)图4.3自相关矩阵奇异值分解法 (25)图4.4LFM信噪比估计算例结果图 (26)图4.5NS信噪比估计算例结果图 (27)图4.6W ELCH修正平均周期图法估计功率谱 (29)图4.7W ELCH修正平均周期图法估计功率谱差分 (29)图5.1NS信号的FFT频谱图 (32)图5.2LFM信号的FFT频谱图 (32)图5.3DLFM信号的FFT频谱图 (33)图5.4多项式调频信号的FFT频谱图 (34)图5.52LFM信号的FFT频谱图 (34)图5.6正弦调频连续波信号FFT频谱图 (35)图5.7BPSK信号及其平方后的FFT频谱图 (36)图5.8QPSK信号及其平方后的FFT频谱图 (37)图5.92FSK信号FFT频谱图 (39)图5.104FSK信号FFT频谱图 (39)图5.11常规信号(左)和线性调频(右)信号瞬时频率曲线 (40)图5.12双线性调频(左)和分段线性调频(右)信号瞬时频率曲线 (40)图5.13多项式调频(左)和正弦调频连续波(右)信号瞬时频率曲线 (40)图5.14二相编码信号(左)和四相编码信号(右)信号瞬时频率曲线 (41)图5.152FSK(左)和4FSK(右)信号瞬时频率曲线 (41)图5.16线性调频信号的瞬时频率曲线及其拟合曲线 (42)v时频分析在雷达信号识别中的应用研究vi图5.17 多项式调频信号的瞬时频率曲线及其拟合曲线.....................................................43 图5.18 NS 、LFM 、PFM 、DLFM 、2LFM 信号的识别流程图...........................................45 图5.19 PSK 、FSK 和COSFM 信号瞬时频率曲线的峰度系数...........................................46 图5.20 4FSK 信号的瞬时频率曲线及其多重差分..............................................................48 图5.21 FSK 和COSFM 信号瞬时频率曲线的多重差分峰度系数.......................................48 图5.22 2FSK 和4FSK 信号的()()f t f t −包络方差系数..................................................49 图5.23 PSK 信号、FSK 信号和COSFM 信号的识别.........................................................50 图5.24 各信号的归类识别结果..........................................................................................51 图5.25 各信号的正确识别结果 (52)表5.1 各种信号的瞬时频率特征 (41)南京航空航天大学硕士学位论文vii注释表符号和函数:arctan 反正切arg 复数辐角cos 余弦cov 协方差dB 分贝,信噪比单位exp 以e 为底的对数运算Im 复数虚部kHz 千赫兹,频率单位,1 kHz 等于310赫兹MHz 兆赫兹,频率单位,1 MHz 等于610赫兹Re 复数实部sin 正弦Var 方差缩写:BPSK Binary Phase-Shift-Keying,DLFM Double Linear Frequency Modulated,FFT Fast Fourier Transform,FSK Frequency-Shift-Keying,LFM Linear Frequency Modulated,NS Normal Signal,PSK Phase-Shift-Keying,QPSK Quarter Phase-Shift-Keying,SNR Signal Noise Ratio 。
统计学专业英语词汇

log-log 对数
log-normal distribution 对数正态分布
longitudinal 经度的,纵的
loss function 损失函数
M
Mahalanobis\' generalized distance Mahalanobis广义距离
drop out 脱落例
Durbin-Watson statistic(ratio) Durbin-Watson统计量(比)
E
efficient, efficiency 有效的、有效性
* Engel\'s coefficient 恩格尔系数
entropy 熵
epidemiology 流行病学
* error 误差
item 项
J
Jacknife 刀切法
K
Kaplan-Meier estimate Kaplan-Meier估计
* Kendall\'s rank correlation coefficients 肯德尔等级相关系数
Kullback-Leibler information number 库尔贝克-莱布勒信息函数
model, -ing 模型(建模)
moment 矩
moving average 移动平均
multicolinear, -ity 多重共线(性)
multidimensional scaling(MDS) 多维换算
multiple answer 重复回答
multiple choice 多重选择
multiple comparison 多重比较
* histogram 直方图
训练集(trainset)验证集(validationset)测试集(testset)。

训练集(trainset)验证集(validationset)测试集(testset)。
训练集(train set) 验证集(validation set) 集(test set)。
⼀般需要将样本分成独⽴的三部分训练集(train set),验证集(validation set)和测试集(test set)。
其中训练集⽤来估计模型,验证集⽤来确定⽹络结构或者控制模型复杂程度的参数,⽽测试集则检验最终选择最优的模型的性能如何。
⼀个典型的划分是训练集占总样本的50%,⽽其它各占25%,三部分都是从样本中随机抽取。
样本少的时候,上⾯的划分就不合适了。
常⽤的是留少部分做测试集。
然后对其余N个样本采⽤K折交叉验证法。
就是将样本打乱,然后均匀分成K份,轮流选择其中K-1份训练,剩余的⼀份做验证,计算预测误差平⽅和,最后把K次的预测误差平⽅和再做平均作为选择最优模型结构的依据。
特别的K取N,就是留⼀法(leave one out)。
这三个名词在机器学习领域的⽂章中极其常见,但很多⼈对他们的概念并不是特别清楚,尤其是后两个经常被⼈混⽤。
Ripley, B.D(1996)在他的经典专著Pattern Recognition and Neural Networks中给出了这三个词的定义。
Training set: A set of examples used for learning, which is to fit the parameters [i.e., weights] of the classifier.Validation set: A set of examples used to tune the parameters [i.e., architecture, not weights] of a classifier, for example to choose the number of hidden units in a neural network.Test set: A set of examples used only to assess the performance [generalization] of a fully specified classifier.显然,training set是⽤来训练模型或确定模型参数的,如ANN中权值等; validation set是⽤来做模型选择(model selection),即做模型的最终优化及确定的,如ANN的结构;⽽ test set则纯粹是为了测试已经训练好的模型的推⼴能⼒。
【课件】偏最小二乘之smartpls使用(90页)

可以互相交換
形成型與反映型指標的差異
“Whereas reflective indicators are essentially interchangeable (and therefore the removal of an item does not change the essential nature of the underlying construct), with formative indicators ‘omitting an indicator is omitting a part of the construct’.”
以相近的lv作為代理計算仍然是用phaseiii的因此稱為偏最小平方法plssemcriteriasempls只能用反映型指標反映型或形成型指標均可參數估計最佳化預測能力最大化semplscriteriasempls模型複雜度小或中度複雜通常不超過100個mvs可以很複雜如100lvs1000mvs樣本需求最小要求為100以上建議300500個樣本最小要求為30100最大概似插補法nipals演算模型辨識一般lv需3個以上的mvs只要是遞迴路徑就可以三星統計服務有限公司semplscriteriasempls所有估計參數均有jackknife形成型指標沒有理論需求支持驗證式研究探索及解釋性研究無需充份測量模型二階測量模型多階測量模型分析功能semplscriteriasempls模型配適度很多25種gof最佳化形式整體模型迭代局部模型迭代模型變數一致性有一致性一致性因素分數不特別估計軟體工具成熟不成熟應用情形逐步加温plssem形成型指標
1. 申請論壇帳號,一般1-2天便可取得 SmartPLS軟體的序號
2. 到SmartPLS論壇下載軟體(JRE 6 included) 3. 安裝smartpls軟體,輸入序號,此序號每90天
least_squares用法

least_squares用法least_squares用法什么是least_squares?least_squares是一个用于最小二乘法求解问题的函数,它可以找到一个参数向量,使得给定的模型函数的预测值与观测值之间的残差平方和最小化。
它在科学计算和数据拟合中被广泛应用。
用法列表以下是least_squares的一些常用用法:1.线性回归2.非线性回归3.参数估计4.数据拟合5.正则化问题1. 线性回归线性回归是一种常见的数据拟合问题,用于将一个因变量与一个或多个自变量之间的线性关系进行建模。
least_squares可以通过最小二乘法寻找最佳的线性参数。
import numpy as npfrom import least_squares# 数据准备x = ([1, 2, 3, 4, 5])y = ([3, 5, 7, 9, 11])# 模型函数def linear_func(params, x):return params[0] * x + params[1]# 残差函数def residuals(params, x, y):return linear_func(params, x) - y# 初始参数猜测params_guess = [2, 1]# 通过最小二乘法求解result = least_squares(residuals, params_guess, args=(x, y))# 最佳参数best_params =2. 非线性回归当模型函数不是线性的时候,可以使用least_squares进行非线性回归。
在拟合非线性模型时,需要提供适当的初始参数猜测。
import numpy as npfrom import least_squares# 数据准备x = ([1, 2, 3, 4, 5])y = ([, , , , ])# 模型函数def nonlinear_func(params, x):return params[0] * (params[1] * x)# 残差函数def residuals(params, x, y):return nonlinear_func(params, x) - y# 初始参数猜测params_guess = [1, 1]# 通过最小二乘法求解result = least_squares(residuals, params_guess, args=(x, y))# 最佳参数best_params =3. 参数估计least_squares可以用来估计模型参数的置信区间和标准误差。
Silicon Laboratories Si826x-EVB LED EMULATOR INPUT

Rev. 0.1 2/13Copyright © 2013 by Silicon LaboratoriesSi826x-EVBSi826x-EVBSi826X LED E MULATOR I NPUT I SODRIVER E VALUATION B OARD U SER ’S G UIDE1. IntroductionThe Si826x evaluation board allows designers to evaluate Silicon Lab's Si826x family of CMOS based LED Emulator Input ISOdrivers. The Si826x ISOdrivers are pin-compatible, drop-in upgrades for popular opto-coupled gate drivers, such as 0.6 A ACPL-0302/3020, 2.5 A HCPL-3120/ACPL-3130, HCNW3120/3130, and similar opto-drivers. The devices are ideal for driving power MOSFETs and IGBTs used in a wide variety of inverter and motor control applications. The Si826x isolated gate drivers utilize Silicon Laboratories' proprietary silicon isolation technology, supporting up to 5.0kV RMS withstand voltage per UL1577. This technology enables higher-performance,reduced variation with temperature and age, tighter part-to-part matching, and superior common-mode rejection compared to opto-coupled gate drivers. While the input circuit mimics the characteristics of an LED, less drive current is required, resulting in higher efficiency. Propagation delay time is independent of input drive current,resulting in consistently short propagation times, tighter unit-to-unit variation, and greater input circuit design flexibility. As a result, the Si826x series offers longer service life and dramatically higher reliability compared to opto-coupled gate drivers. The evaluation kit consists of four separately orderable boards with each board featuring either the DIP8, SOIC8, SDIP6, or LGA8 package. For more information on configuring the ISOdriver itself, see the Si826x product data sheet and application note “AN677: Using the Si826x Family of Isolated Gate Drivers”.1.1. Kit ContentsEach Si826x Evaluation Kit contains the following items:⏹ Si826x based evaluation board as shown in Figures 1 through 4.⏹ Si826x LED Emulator Input ISOdriver (installed on the evaluation board)● Si8261 (DIP8, SOIC8, SDIP6, LGA8)Figure1.Si826x DIP8 Evaluation Board OverviewFigure2.Si826x SOIC8 Evaluation Board OverviewSi826x-EVB2Rev. 0.1Figure3.Si826x SDIP6 Evaluation Board Overview Figure4.Si826x LGA8 Evaluation Board OverviewSi826x-EVBRev. 0.132. Required EquipmentThe following equipment is required to demonstrate the evaluation board:⏹ 1 digital multimeter⏹ 2 multimeter test leads (red and black)⏹ 1 oscilloscope (Tektronix TDS 2024B or equivalent) ⏹ 1 function generator (Agilent 33220A, 20MHz or equivalent)⏹ 1 dc power supply (HP6024A, 30 V dc, 0–100mA or equivalent)⏹ 1 BNC splitter ⏹ 3 coaxial cables⏹ 2 BNC to clip converters (red and black)⏹ 2 Banana to clip wires (red and black)⏹ Si826x Evaluation Board (board under test)⏹ Si826x LED Emulator Input Evaluation Board User's Guide (this document)Si826x-EVB4Rev. 0.13. Hardware Overview and DemoFigure 5 illustrates the connection diagram to demonstrate the Si826x-DIP8 EVB. The other footprint boards demonstrate in a similar fashion. This demo transmits a 500kHz (5V peak, 50 percent duty cycle) square wave through the ISOdriver to its output (Vo). In this example, VDD is powered by a 15V supply. Figure 6 shows a scope shot of CH1 (input) and CH2 (output). Note that if a user wants to evaluate an LED Emulator Input ISOdriver other than the ones pre-populated, this can be accomplished by removing the installed device and replacing it with the desired footprint-compatible ISOdriver device.Figure 5.Summary Diagram and Test SetupFigure 6.Oscilloscope Display of Input and OutputOutput to ScopeCH2Signal Input (500 kHz, 5 Vpk)Square WavePower Supply (15 V, 100 mA)Input to Scope CH1+-+-+-Si826x-EVBRev. 0.153.1. Board Jumper SettingsTo run the demo, follow the instructions below. Review Figure 5 and Figures 11 through 14 if necessary.1. Ensure that JP1 and JP6 are installed as shown in Figure 1, 2, 3, or 4.3.2. DC Supply Configuration1. Turn OFF the dc power supply and ensure that the output voltage is set to its lowest output voltage.2. Connect the banana ends of the black and red banana to clip terminated wires to the outputs of the dc supply.3. Then, connect the clip end of the red and black banana to clip wires to P2. The red wire goes to Pin1. The black wire goes to Pin3.4. Turn ON the dc power supply.5. Adjust the dc power supply to provide 15V on its output.6. Ensure that the current draw is less than 25mA. If it is larger, this indicates that either the board or Si826x has been damaged or the supply is connected backwards.3.3. Wave Form Generator1. Turn ON the arbitrary waveform generator with the output disengaged.2. Adjust its output to provide a 500kHz, 0 to 5V peak square wave (50 percent duty cycle) to its output.3. Split the output of the generator with a BNC splitter.4. From the BNC splitter, connect a coaxial cable to CH1 of the scope. This will be the input.5. Connect a second coaxial cable to the BNC splitter, and connect a BNC-to-clip converter to the end of the coaxial cable.6. From here, connect the clip ends of the BNC-to-clip converter to P1, Pin1 (red wire here) and Pin3 (black wire here). The positive terminal is Pin1 on P1.7. Connect one end of a third coaxial cable to a BNC-to-clip converter (note that a scope probe can be used here instead).8. From here, connect the clip end of the BNC-to-clip converter to P2, Pin2 (red wire here) and Pin3 (black wire here). Vo is on P2 Pin2.9. Connect the other end of the coaxial cable to CH2 of the oscilloscope. This will be the output.10. Engage the output of the waveform generator.3.4. Oscilloscope Setup1. Turn ON the oscilloscope.2. Set the scope to Trigger on CH1 and adjust the trigger level to 1V minimum.3. Set CH1 to 2V per division. Set CH2 to 5V per division.4. Adjust the seconds/division setting to 250ns/division.5. Adjust the level indicator for all channels to properly view each channel as shown in Figure6.A 500kHz square wave should display on Channel 1 of the scope for the input and a slightly delayed 5V version of this square wave should display the output on Channel 2, as shown in Figure 6. This concludes the basic demo.For more advanced demos, see the following section.Si826x-EVB6Rev. 0.13.5. Adjusting Input Signal Frequency and VDDNow is a good time to explore some additional functionality of the board. From here the user can do the following:1. Slowly adjust VDD down to 13V and up to 30V. Then, take the VDD voltage below 12V. Once below 12V,it can be seen that the Si826x’s UVLO turns on. In this condition, the output should turn off in which case the square wave disappears.2. Next, adjust the supply back to 15V.3. Another dial the user can adjust is the frequency dial on the square wave generator. Turn this dial from tensof Hz up to several MHz and observe the scope output.Si826x-EVBRev. 0.174. Open Loop POL Evaluation BoardThe power and jumper connections descriptions are summarized here:⏹ P1External input signal connections to drive the LED Emulator.⏹ P2External output signal and VDD connections.⏹ JP1Jumper when installed bypasses the external bootstrap circuitry.⏹ JP2Jumper when installed used to accommodate common-anode drive.⏹ JP3Jumper when installed can be used to enable the fast reverse recovery diode.⏹ JP4Jumper when installed can be used to add additional load to output.⏹ JP5Jumper when installed can be used to bypass the output gate resistor.⏹ JP6Jumper when installed used to accommodate common-cathode drive.4.1. Voltage and Current Sense Test PointsThe Si826x evaluation board has several test points. These test points correspond to the respective pins on the Si826x integrated circuits as well as other useful inspection points. See Figures 7 through 10 for a silkscreen overview. See schematics in Figures 11 through 14 for more details as well.Figure 7.Si826x DIP8 Evaluation Board SilkscreenFigure 8.Si826x SOIC8 Evaluation Board SilkscreenSi826x-EVB8Rev. 0.1Figure9.Si826x SDIP6 Evaluation Board Silkscreen Figure10.Si826x LGA8 Evaluation Board SilkscreenSi826x-EVBRev. 0.195. Si826x Evaluation Board SchematicsF i g u r e 11.S i 826x D I P 8 E v a l u a t i o n B o a r d S c h e m a t i cSi826x-EVB10Rev. 0.16. Bill of MaterialsTable 1. Si826x DIP8 Evaluation Board Bill of MaterialsItem Qty Ref Part #Supplier Description Value11C1GRM32DF51H106ZA01L MurataElectronicsNorth AmericaCAP, 10µF, 50V,–20% to +80%, Y5V, 121010µF21C2C1210X7R101-105K Venkel CAP, 1µF, 100V, ±10%, X7R,12101µF31C3C0603X7R101-104M Venkel CAP, 0.1µF, 100V, ±20%,X7R, 06030.1µF43C4, C5, C6C0805C0G500-201K Venkel CAP, 200pF, 50V, ±10%,COG, 0805200pF51CR1BAS16XV2T1G On Semi DIO, SWITCH, 200mA, 75V,SOD523BAS16X61D1US1K-13-F Diodes Inc.DIO, SWITCH, ULT FAST 1A800V, SMAUS1K75JP1, JP2,JP3, JP4,JP5TSW-102-07-T-S Samtec Header, 2x1, 0.1in pitch,Tin PlatedJumper81JP6TSW-102-07-T-D Samtec Header, 2x2, 0.1in pitch,Tin Plated Header 2x292JS1, JS2SNT-100-BK-T Samtec Shunt, 1x2, 0.1in pitch,Tin Plated Jumper Shunt102P1, P2TSW-103-07-T-S Samtec Header, 3x1, 0.1in pitch,Tin Plated Header 1x3112R1, R4CR0805-10W-2670F Venkel Res, 267Ω, 1/10W, ±1%,ThickFilm, 0805267121R2CR0805-10W-000Venkel Res, 0Ω, 2A, ThickFilm,0805131R3CR0805-10W-4R7J Venkel Res, 4.7Ω, 1/10W, ±5%,ThickFilm, 08054.7144SF1, SF2,SF3, SF4SJ61A63M HDW, Bumpon Cylindrical.312X.215 BLKBumper158TP1, TP2,TP3, TP4,TP5, TP6,TP7, TP8151-201-RC Kobiconn Testpoint, White, PTH White161U1Si8261BCC-C-IP Silicon Labs ISOdriver 3.75kV emulatorinput, DIP8, RoHS Si826X DIP8Item Qty Ref Part #Supplier Description Value11C1GRM32DF51H106ZA01L MurataElectronicsNorth AmericaCAP, 10µF, 50V,–20% to +80%, Y5V, 121010µF21C2C1210X7R101-105K Venkel CAP, 1µF, 100V, ±10%, X7R,12101µF31C3C0603X7R101-104M Venkel CAP, 0.1µF, 100V, ±20%,X7R, 06030.1µF43C4, C5, C6C0805C0G500-201K Venkel CAP, 200pF, 50V, ±10%,COG, 0805200pF51CR1BAS16XV2T1G On Semi DIO, SWITCH, 200mA, 75V,SOD523BAS16X61D1US1K-13-F Diodes Inc.DIO, SWITCH, ULT FAST 1A800V, SMAUS1K75JP1, JP2,JP3, JP4,JP5TSW-102-07-T-S Samtec Header, 2x1, 0.1in pitch,Tin PlatedJumper81JP6TSW-102-07-T-D Samtec Header, 2x2, 0.1in pitch,Tin Plated Header 2x292JS1, JS2SNT-100-BK-T Samtec Shunt, 1x2, 0.1in pitch,Tin Plated Jumper Shunt102P1, P2TSW-103-07-T-S Samtec Header, 3x1, 0.1in pitch,Tin Plated Header 1x3112R1, R4CR0805-10W-2670F Venkel Res, 267Ω, 1/10W, ±1%,ThickFilm, 0805267121R2CR0805-10W-000Venkel Res, 0Ω, 2A, ThickFilm,0805131R3CR0805-10W-4R7J Venkel Res, 4.7Ω, 1/10W, ±5%,ThickFilm, 08054.7144SF1, SF2,SF3, SF4SJ61A63M HDW, Bumpon Cylindrical.312X.215 BLKBumper158TP1, TP2,TP3, TP4,TP5, TP6,TP7, TP8151-201-RC Kobiconn Testpoint, White, PTH White161U1Si8261BCC-C-IS Silicon Labs ISOdriver 3.75kV emulatorinput, SOIC8, RoHS Si826X SOIC8Item Qty Ref Part #Supplier Description Value11C1GRM32DF51H106ZA01L MurataElectronicsNorth AmericaCAP, 10µF, 50V,–20% to +80%, Y5V, 121010µF21C2C1210X7R101-105K Venkel CAP, 1µF, 100V, ±10%, X7R,12101µF31C3C0603X7R101-104M Venkel CAP, 0.1µF, 100V, ±20%,X7R, 06030.1µF43C4, C5, C6C0805C0G500-201K Venkel CAP, 200pF, 50V, ±10%,COG, 0805200pF51CR1BAS16XV2T1G On Semi DIO, SWITCH, 200mA, 75V,SOD523BAS16X61D1US1K-13-F Diodes Inc.DIO, SWITCH, ULT FAST 1A800V, SMAUS1K75JP1, JP2,JP3, JP4,JP5TSW-102-07-T-S Samtec Header, 2x1, 0.1in pitch,Tin PlatedJumper81JP6TSW-102-07-T-D Samtec Header, 2x2, 0.1in pitch,Tin Plated Header 2x292JS1, JS2SNT-100-BK-T Samtec Shunt, 1x2, 0.1in pitch,Tin Plated Jumper Shunt102P1, P2TSW-103-07-T-S Samtec Header, 3x1, 0.1in pitch,Tin Plated Header 1x3112R1, R4CR0805-10W-2670F Venkel Res, 267Ω, 1/10W, ±1%,ThickFilm, 0805267121R2CR0805-10W-000Venkel Res, 0Ω, 2A, ThickFilm,0805131R3CR0805-10W-4R7J Venkel Res, 4.7Ω, 1/10W, ±5%,ThickFilm, 08054.7144SF1, SF2,SF3, SF4SJ61A63M HDW, Bumpon Cylindrical.312X.215 BLKBumper158TP1, TP2,TP3, TP4,TP5, TP6,TP7, TP8151-201-RC Kobiconn Testpoint, White, PTH White161U1Si8261BCD-C-IS Silicon Labs ISOdriver 5kV emulator input,SDIP6, RoHS Si826X SDIP6Item Qty Ref Part #Supplier Description Value11C1GRM32DF51H106ZA01L MurataElectronicsNorth AmericaCAP, 10µF, 50V,–20% to +80%, Y5V, 121010µF21C2C1210X7R101-105K Venkel CAP, 1µF, 100V, ±10%, X7R,12101µF31C3C0603X7R101-104M Venkel CAP, 0.1µF, 100V, ±20%,X7R, 06030.1µF43C4, C5, C6C0805C0G500-201K Venkel CAP, 200pF, 50V, ±10%,COG, 0805200pF51CR1BAS16XV2T1G On Semi DIO, SWITCH, 200mA, 75V,SOD523BAS16X61D1US1K-13-F Diodes Inc.DIO, SWITCH, ULT FAST 1A800V, SMAUS1K75JP1, JP2,JP3, JP4,JP5TSW-102-07-T-S Samtec Header, 2x1, 0.1in pitch,Tin PlatedJumper81JP6TSW-102-07-T-D Samtec Header, 2x2, 0.1in pitch,Tin Plated Header 2x292JS1, JS2SNT-100-BK-T Samtec Shunt, 1x2, 0.1in pitch,Tin Plated Jumper Shunt102P1, P2TSW-103-07-T-S Samtec Header, 3x1, 0.1in pitch,Tin Plated Header 1x3112R1, R4CR0805-10W-2670F Venkel Res, 267Ω, 1/10W, ±1%,ThickFilm, 0805267121R2CR0805-10W-000Venkel Res, 0Ω, 2A, ThickFilm,0805131R3CR0805-10W-4R7J Venkel Res, 4.7Ω, 1/10W, ±5%,ThickFilm, 08054.7144SF1, SF2,SF3, SF4SJ61A63M HDW, Bumpon Cylindrical.312X.215 BLKBumper158TP1, TP2,TP3, TP4,TP5, TP6,TP7, TP8151-201-RC Kobiconn Testpoint, White, PTH White161U1Si8261BCD-C-IM Silicon Labs ISOdriver 5kV emulator input,LGA8, RoHS Si826X LGA87. Ordering GuideTable 5. Si826x Evaluation Board Ordering Guide Ordering Part Number (OPN)DescriptionSi826xDIP8-KIT Si826x ISOdriver Evaluation Board Kit featuring DIP8 PackageSi826xSOIC8-KIT Si826x ISOdriver Evaluation Board Kit featuring SOIC8 PackageSi826xSDIP6-KIT Si826x ISOdriver Evaluation Board Kit featuring SDIP6 PackageSi826xLGA8-KIT Si826x ISOdriver Evaluation Board Kit featuring LGA8 PackageC ONTACT I NFORMATIONSilicon Laboratories Inc.400 West Cesar ChavezAustin, TX 78701Tel: 1+(512) 416-8500Fax: 1+(512) 416-9669Toll Free: 1+(877) 444-3032Please visit the Silicon Labs Technical Support web page:https:///support/pages/contacttechnicalsupport.aspxand register to submit a technical support request.Patent NoticeSilicon Labs invests in research and development to help our customers differentiate in the market with innovative low-power, small size, analog-intensive mixed-signal solutions. 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Fast Bootstrap forLeast-square Support Vector MachinesA. Lendasse1, G. Simon2, V. Wertz3, M. Verleysen21Helsinki University of TechnologyLaboratory of Computer and Information ScienceOtaniemi 02014, Finland, lendasse@cis.hut.fi.2Université catholique de Louvain, Electricity Dept., 3 pl. du Levant,B-1348 Louvain-la-Neuve, Belgium, {simon, verleysen}@dice.ucl.ac.be.3Université catholique de Louvain, CESAME, 4 av. G. LemaîtreB-1348 Louvain-la-Neuve, Belgium, wertz@auto.ucl.ac.be.Abstract. The Bootstrap resampling method may be efficiently used toestimate the generalization error of nonlinear regression models, as artificialneural networks and especially Least-square Support Vector Machines.Nevertheless, the use of the Bootstrap implies a high computational load. In thispaper we present a simple procedure to obtain a fast approximation of thisgeneralization error with a reduced computation time. This proposal is based onempirical evidence and included in a simulation procedure.1.IntroductionModel design has raised a considerable research effort since decades, on linear models, nonlinear ones, artificial neural networks, and many others. Model design includes the necessity to compare models (for example of different complexities) in order to select the “best” model among several ones. For this purpose, it is necessary to obtain a good approximation of the generalization error of each model (the generalization error being the average error that the model would make on an infinite-size and unknown test set independent from the learning one). Nowadays there exist some well-known and widely used methods able to fulfill this task [1-6] and the Bootstrap is one of the more performing methods. The main problem when using the Bootstrap is the computation of the results that is really time consuming. In this paper we will show that, under reasonable and simple hypotheses usually fulfilled in real world applications, it is possible to provide a good estimate of the Bootstrap results with a considerably reduced number of modeling stages, thus saving a considerable amount of computation time. Previously, the Fast Bootstrap has been developed for the Radial Basis Functions Networks (RBFN). In this paper, the Fast Bootstrap is extended to Least-square Support Vector Machines (LS-SVM) [7-9]. The LS-SVM is presented in section 2. Then, the Bootstrap is presented in section 3 and finally, the Fast Bootstrap is introduced in section 4 using a toy example.2. Least-Square Support Vector Machines (LS-SVM)Consider a given training set of N data points {x k , y k } with x k a n -dimensional input and y t a 1-dimensional output. In feature space SVM models take the form:()()T y x x b =ωϕ+, (1) where the nonlinear mapping ϕ(.) maps the input data into a higher dimensional feature space. In least squares support vector machines for function estimation, the following optimization problem is formulated: 2,111min (,)22N T k e k J e ω=ω=ωω+γe ∑, (2) subject to the equality constraints, (3) ()(), 1,...,.T k y x x b e k N =ωϕ++=This corresponds to a form of ridge regression. The Lagrangian is given by, (4){1(,,;)(,)()NT k k k k L b e J e x b e y =ωα=ω−αωϕ++−∑}k with Lagrange multipliers αk . The conditions for optimality are k k k T k k k k N k k N k k k y e b x L L e L e L L b L x L L −++ϕω→=α∂∂γ=α→=∂∂=α→=∂∂ϕα=ω→=ω∂∂∑∑==)(0000)(011, (5)for k = 1..N . After elimination of e k and ω, the solution is given by the following set of linear equations 10101T b y I −⎡⎤⎡⎤⎡⎤=⎢⎥⎢⎥⎢⎥αΩ+γ⎣⎦⎣⎦⎢⎥⎣⎦r r , (6) where y = [y 1; …; y N ], = [1; …; 1], α = [α1r 1; ...;αΝ] and the Mercer condition, (7) N l k x x x x l k l T k kl ,...,1,),()()(=ψ=ϕϕ=Ωhas been applied. This finally results into the following LS-SVM model for function estimation()()T y x x b =ωϕ+, (8) where α and b are the solution to (6). For the choice of the kernel function ψ(.,.) one has several possibilities [7-9]. In this paper, Gaussian kernels are used: ψ(x , x k ) = exp {-||x -x k ||2/σ2} and the remaining unknowns are σ and γ. These model hyperparameters will be selected according to a model selection procedure detailed in the following of this paper.3. Bootstrap for Model Structure SelectionThe bootstrap [4] is a resampling method that has been developed in order to estimate some statistical parameters (like the mean, the variance, etc). In the case of model structure selection, the parameter to be estimated is the generalization error (i.e. the average error that the model would make on an infinite-size and unknown test set). When using the bootstrap, this error is not computed directly. Rather the bootstrap estimates the difference between the generalization error and the training error calculated on the initial data set. This difference is called the optimism. The estimated generalization error will thus be the sum of the training error and of the estimated optimism. The training error is computed using all data from the training set. The optimism is estimated using a resampling technique based on drawing within the training set with replacement. Using notation where the first exponent A j denotes the training set while the second exponent A j indicates the set used to estimate the model error, the Bootstrap method can be decomposed in the following stages:1. From the initial set I , one randomly draws N points with replacement. The new set A j has thus the same size that the initial set and constitutes a new training set. This stage is called the resampling.2. The training of the various model structures q is done on the same training set A j . One can compute the training error on this single set:()2*,*1(,())(,())j j j j j N A A q i j i A A i j h x q y E q q N =θ−θ=∑, (9)with θj ∗ the model parameters after learning, h q the q th model that is used, x i Aj the i th input vector from set A j , y i Aj the i th output and N the number of elements in this set. Index j means that the error is evaluated on the j th new sample.3. One can also compute the validation error on the initial sample which now plays the role of the validation set V=I :()2*,*1(,())(,())j j N q V V i j i A V i j h x q y E q q N=θ−θ=∑. (10)Here again index j means that the error is evaluated on the j th new sample. 4. The difference between these two errors (9) and (10) is calculated and defined as the optimism by Efron [6]:. (11)5. Steps 1 to 4 are repeated J times. The estimate of the optimism is then calculated as the average of the J values from (11):))(,())(,())(,(*,*,*q q E q q E q q optmism j A A j j V A j j j j j j θ−θ=θ Jq q optmism q ism m opt Jj j j ∑=θ=1*))(,()(ˆ. (12)6. The training of the q model structures is done on the initial data set I and the training error is calculated on the same set. Two exponents I are used to indicate that the initial data set is used for both training and error estimation: ()2*,*1(,())(,())N q I I i i I I i h x q y E q q N =θ−θ=∑. (13)7. An approximation of the generalization error is finally obtained by:),()(ˆ)(ˆ*,θ+=q E q ism m opti q E I I gen. (14) Êgen (q ) is an approximation of the generalization error for each model structure q . The best structure that will be selected is the one that minimizes this estimate of the generalization error.4. Fast Bootstrap and Toy ExampleIn this section, an improvement of the Bootstrap methods is presented. This method is called Fast Bootstrap and allows reducing the computational time of the traditional Bootstraps [10-11]. This method is based on experimental observations and is presented on a function approximation example (represented in Figure 1). In this example, 200 inputs x has been drawn using a uniform random law between 0 and 1. The output y has been generated by the function:, (9) sin(5)sin(15)sin(25)y x x x =+++εwith ε a uniform random law between [-0.5 -0.5].x yFigure 1: Example of function (dots) and its approximation (solid line).A LS-SVM is used to approximate this function. Two parameters still have to be determined, namely σ and γ. For a fixed σ = 0.1, the optimal γ is determined using the Bootstrap method. The set of γ that is tested ranges from 0 to 100 with a 0.1 step. The number of resamplings in (12) is equal to 100.The apparent error defined in (13) is computed and represented in Fig.2A. The optimism is computed using (12) and represented in Fig.2B. The generalization error is computed using (15) and represented in Fig.3. The value of γ that minimizes the generalization error is equal to 11.In Fig.2B, the optimism is very close from an exponential function of γ. This fact has been observed on other examples and benchmarks. Then, using this information, the number of values of γ to be tested can be considerably reduced. In this example, this set is indeed reduced to 5 to 100 with an incremental step of 5. An exponential approximation of the optimism is used. Thanks to the approximation, the number of Bootstraps is also reduced by a factor 10 in (12). The new optimism and generalization error are represented as dotted lines in Fig.2B and Fig.3 respectively. The optimum is close to the one that has been selected by the Bootstrap method. This new method, denoted Fast Bootstrap, is in this toy example 500 times quicker than the traditional Bootstrap. In other examples, the Fast Bootstrap is at least 100 times quicker than traditional Bootstrap for the selection of the γ parameter for a LS-SVM, without loss of precision.gamma A p p a r e n t E r r or gamma O p t i m i s m Figure 2A: Apparent Error with respect to γ. Figure 2B: Optimism with respect to γ using Bootstrap (solid line) and Fast Bootstrap (dashed line).gamma G e n e r a l i s a t i o n E r r o rFigure 3: Generalization Error with respect to γ using Bootstrap (solid line) and Fast Bootstrap (dashed line).5.ConclusionsIn this paper we have shown that the optimism term of the Bootstrap estimator of the prediction error is approximatively an exponential with respect to the γ parameter of a LS-SVM. According to the results shown here and to other ones not illustrated in this paper,we recommend a conservative value of 10 for the number of Bootstrap replications before stopping the approximation computation. We would like to emphasize on the fact that the very limited loss of accuracy is balanced by a considerable saving in computation load, this last fact being the main disadvantage of the Bootstrap resampling procedure in practical situations. This saving is due to the reduced number of tested models and to the limited number of Bootstrap replications. AcknowledgementsMichel Verleysen is Senior Research Associate of the Belgian National Fund for Scientific Research (FNRS). G. Simon is funded by the Belgian F.R.I.A. Part the work of V. Wertz is supported by the Interuniversity Attraction Poles (IAP), initiated by the Belgian Federal State, Ministry of Sciences, Technologies and Culture. The scientific responsibility rests with the authors.References[1]H. Akaike, Information theory and an extension of the maximum likelihood principle,2nd Int. Symp. on information Theory, 267-81, Budapest, 1973.[2]G. Schwarz, “Estimating the dimension of a model”, Ann. Stat. 6, 461-464, 1978.[3]L. Ljung, System Identification - Theory for the user, 2nd Ed, Prentice Hall, 1999.[4] B. Efron, R. J. Tibshirani, An introduction to the Bootstrap, Chapman & Hall, 1993.[5]M. Stone, An asymptotic equivalence of choice of model by cross-validation andAkaike’s criterion, J. Royal. Statist. Soc., B39, 44-7, 1977.[6]R. Kohavi, A study of Cross-Validation and Bootstrap for Accuracy Estimation andModel Selection, Proc. of the 14th Int. Joint Conf. on A.I., Vol. 2, Canada, 1995. [7]J.A.K. Suykens, T. Van Gestel, J. De Brabanter, B. De Moor, J. Vandewalle, LeastSquares Support Vector Machines, World Scientific, Singapore, 2002.[8]J.A.K. Suykens, J. Vandewalle, “Least squares support vector machine classifiers”,Neural Processing Letters, vol. 9, no. 3, Jun. 1999, pp. 293-300.98-86.[9]J.A.K. Suykens, J. De Brabanter, L. Lukas, J. Vandewalle, “Weighted least squaressupport vector machines: robustness and sparse approximation'”, Neurocomputing,vol. 48, no. 1-4, Oct. 2002, pp. 85-105.[10]G. Simon, A. Lendasse, V. Wertz, M. Verleysen, Fast Approximation of theBootstrap for Model Selection, ESANN 2003, European Symposium on ArtificialNeural Networks, Bruges (Belgium), 23-25 April 2003, pp. 99-106.[11]G. Simon, A. Lendasse, M. Verleysen, Bootstrap for Model Selection: LinearApproximation of the Optimism, IWANN 2003, International Work-Conference onArtificial and Natural Neural Networks, Mao, Menorca (Spain), June 3-6, 2003.Computational Methods in Neural Modeling, J. Mira, J.R. Alvarez eds, Springer-Verlag, Lecture Notes in Computer Science 2686, 2003, pp. I182-I189.。