Reproducibility standards for wavelet transform algorithms
小波变换-分段直接校正法用于近红外光谱模型传递研究

928
分析化学
第 34 卷
的
Dif
2 s,un 转换为与源机上测得的光谱一致的光谱数据
Dif
2
( p
s,un
理论上),即:
Dif
2P s,un
=
Dif
2 s,un F
转换矩阵 F 的计算公式为:
红外光谱仪。其中 3 台为总后油料研究所研制的便携式油料质量分析仪,编号为 Zh3-1、Zh3-2 和 Zh33;2 台为北京英贤仪器有限公司生产的 NIR3000 型近红外光谱仪,编号为 Nir8 和 Nir33。其中 Zh3-3 为 源机,其余 4 台为目标机。上述 5 台仪器均为 CCD2048 象元检测器,分辨率优于 1. 5 nm,光谱采集范围 700 ~ 1100 nm,数据间隔 0. 2 nm。 3. 2 光谱测量和基础数据测定方法
第7 期 927 ~ 932
小波变换-分段直接校正法用于近红外光谱模型传递研究
田高友#1 褚小立2 袁洪福2 陆婉珍2
(1 解放军总后勤部油料研究所,北京 102300) (2 石油化工科学研究院,北京 100083)
摘 要 提出了一种新的传递算法( WT-PDS)———小波变换-分段直接校正法,并详细讨论了模型传递参数和 传递结果。首先利用小波变换对光谱进行压缩处理,采用 PDS 算法消除不同仪器之间压缩数据的差异,最后 利用经校正的压缩数据进行分析,实现模型传递。本方法能够扣除不同仪器之间的大部分差异,大幅度改善 分析精度。传递后模型分析精度与源机模型稳健性紧密相关。如果源机模型稳健性强,则能够实现不同仪器 之间的共享。本方法能够实现源机的 0# 轻柴十六烷值、凝点、馏出温度;-10# 轻柴十六烷值、凝点以及-10# 军 柴凝点和馏出温度共 10 个模型在 5 台仪器之间共享,简化了建模的成本。与传统的 PDS 相比,WT-PDS 方法 具有传递和建模变量少、速度快、光谱校正性能高等优点,而其模型分析精度与传统 PDS 基本一致。
BSENISO17638-2016焊缝的无损检验.磁粒子检验

BSENISO17638-2016焊缝的⽆损检验.磁粒⼦检验EUROPEAN STANDARD NORME EUROPéENNE EUROP?ISCHE NORM EN ISO 17638 November 2016ICS 25.160.40 Supersedes EN ISO 17638:2009English VersionNon-destructive testing of welds - Magnetic particletesting (ISO 17638:2016)Contr?le non destructif des assemblages soudés - Magnétoscopie (ISO 17638:2016) Zerst?rungsfreie Prüfung von Schwei?verbindungen - Magnetpulverprüfung (ISO 17638:2016)This European Standard was approved by CEN on 2 October 2016.CEN members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CEN member.This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CEN member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions.CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and United Kingdom.EUROPEAN COMMITTEE FOR STANDARDIZATIONC O M I TéE UR O PéE N DE N O R M A L I SA T I O NE UR O P?I SC HE S KO M I T E E FüR N O R M UN GCEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels2016 CEN All rights of exploitation in any form and by any means reservedworldwide for CEN national Members.Ref. No. EN ISO 17638:2016 EBS EN ISO 17638:2016EN ISO 17638:2016 (E)3European forewordThis document (EN ISO 17638:2016) has been prepared by Technical Committee ISO/TC 44 “Welding and allied processes” in collaboration with Technical Committee CEN/TC 121 “Welding and allied processes” the secretariat of which is held by DIN.This European Standard shall be given the status of a national standard, either by publication of an identical text or by endorsement, at the latest by May 2017, and conflicting national standards shall be withdrawn at the latest by May 2017.Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CEN [and/or CENELEC] shall not be held responsible for identifying any or all such patent rights.This document supersedes EN ISO 17638:2009.According to the CEN-CENELEC Internal Regulations, the national standards organizations of the following countries are bound to implement this European Standard: Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom.Endorsement noticeThe text of ISO 17638:2016 has been approved by CEN as EN ISO 17638:2016 without any modification.BS EN ISO 17638:2016ISO 17638:2016(E) Contents PageForeword (iv)1 Scope (1)2 Normative references (1)3 Terms and definitions (1)4 Safety precautions (1)5 General (1)5.1 Information required prior to testing (1)5.2 Additional pre-test information (2)5.3 Personnel qualification (2)5.4 Surface conditions and preparation (2)5.5 Magnetizing (2)5.5.1 Magnetizing equipment (2)5.5.2 Verification of magnetization (3)5.6 Application techniques (3)5.6.1 Field directions and testing area (3)5.6.2 Typical magnetic testing techniques (6)5.7 Detection media (9)5.7.1 General (9)5.7.2 Verification of detection media performance (9)5.8 Viewing conditions (10)5.9 Application of detection media (10)5.10 Overall performance test (10)5.11 False indications (10)5.12 Recording of indications (10)5.13 Demagnetization (11)5.14 Test report (11)Annex A (informative) Variables affecting the sensitivity of magnetic particle testing (13)Bibliography (15)ISO 2016 – All rights reserved iiiBS EN ISO 17638:2016ISO 17638:2016(E)ForewordISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO member bodies). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be represented on that committee. International organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.The procedures used to develop this document and those intended for its further maintenance are described in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for the different types of ISO documents should be noted. This document was drafted in accordance with the editorial rules of the ISO/IEC Directives, Part 2 (see /doc/b748db97f68a6529647d27284b73f242326c3101.html /directives). Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of any patent rights identified during the development of the document will be in the Introduction and/or on the ISO list of patent declarations received (see/doc/b748db97f68a6529647d27284b73f242326c3101.html /patents).Any trade name used in this document is information given for the convenience of users and does not constitute an endorsement.For an explanation on the meaning of ISO specific terms and expressions related to conformity assessment, as well as information about ISO’s adherence to the World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT) see the following URL:/doc/b748db97f68a6529647d27284b73f242326c3101.html /iso/foreword.html. The committee responsible for this document is ISO/TC 44, Welding and allied processes, Subcommittee 5, Testing and inspection of welds.This second edition cancels and replaces the first edition (ISO 17638:2003), which has been technically revised.Requests for official interpretations of any aspect of this document should be directed to the Secretariat of ISO/TC 44/SC 5 via your national standards body. A complete listing of these bodies can be found at /doc/b748db97f68a6529647d27284b73f242326c3101.html .ISO 2016 – All rights reservedBS EN ISO 17638:2016 INTERNATIONAL STANDARD ISO 17638:2016(E)Non-destructive testing of welds — Magnetic particle testing1 ScopeThis document specifies techniques for detection of surface imperfections in welds in ferromagnetic materials, including the heat affected zones, by means of magnetic particle testing. The techniques are suitable for most welding processes and joint configurations. Variations in the basic techniques that will provide a higher or lower test sensitivity are described in Annex A.This document does not specify acceptance levels of the indications. Further information on acceptance levels for indications may be found in ISO 23278 or in product or application standards.2 Normative referencesThe following documents are referred to in the text in such a way that some or all of their content constitutes requirements of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. ISO 3059, Non-destructive testing —Penetrant testing and magnetic particle testing — Viewing conditions ISO 9934-1:2015, Non-destructive testing — Magnetic particle testing — Part 1: General principles ISO 9934-2, Non-destructive testing — Magnetic particle testing — Part 2: Detection media ISO 9934-3, Non-destructive testing — Magnetic particle testing — Part 3: Equipment3 Terms and definitionsFor the purposes of this document, the terms and definitions given in ISO 12707 and ISO 17635 apply. ISO and IEC maintain terminological databases for use in standardization at the following addresses:— IEC Electropedia: available at /doc/b748db97f68a6529647d27284b73f242326c3101.html /— ISO Online browsing platform: available at /doc/b748db97f68a6529647d27284b73f242326c3101.html /obp4 Safety precautionsSpecial consideration shall be given to toxic, inflammable and/or volatile materials, electrical safety and unfiltered UV radiation.Magnetic particle testing often creates high magnetic fields close to the object under test and the magnetising equipment. Items sensitive to these fields should be excluded from such areas.5 General5.1 Information required prior to testingPrior to testing, the following items shall be specified (where applicable):a)specific test procedure;b)certification requirements for NDT personnel;ISO 2016 – All rights reserved 1BS EN ISO 17638:2016ISO 17638:2016(E)extent of coverage;state of manufacture;testing techniques to be used;overall performance test;any demagnetization;acceptance level;action necessary for unacceptable indications.5.2 Additional pre-test informationPrior to testing, the following additional information can also be required:type and designation of the parent and weld materials;welding process;location and extent of welds to be tested;joint preparation and dimensions;location and extent of any repairs;post-weld treatment (if any);surface conditions.Operators may ask for further information that could be helpful in determining the nature of any indications detected.5.3 Personnel qualificationMagnetic particle testing of welds and the evaluation of results for final acceptance shall be performed by qualified and capable personnel. It is recommended that personnel be qualified in accordance with ISO 9712 or an equivalent standard at an appropriate level in the relevant industry sector.5.4 Surface conditions and preparationAreas to be tested shall be dry unless appropriate products for wet surfaces are used. It may be necessary to improve the surface condition, e.g. by use of abrasive paper or local grinding to permit accurate interpretation of indications.Any cleaning or surface preparation shall not be detrimental to the material, the surface finish or the magnetic testing media. Detection media shall be used within the temperature range limitations set by the manufacturer.5.5 Magnetizing5.5.1 Magnetizing equipmentGeneral magnetization requirements shall be in accordance with ISO 9934-1:2015, Clause 8. Unless otherwise specified, for example, in an application standard, the following types of alternating current-magnetizing equipment shall be used: electromagnetic yokes;ISO 2016 – All rights reservedBS EN ISO 17638:2016ISO 17638:2016(E)b)current flow equipment with prods;c)adjacent or threading conductors or coil techniques.DC electromagnets and permanent magnets may only be used by agreement at the time of enquiry and order.The magnetizing equipment shall conform to ISO 9934-3.Where prods are used, precautions shall be taken to minimize overheating, burning or arcing at the contact tips. Removal of arc burns shall be carried out where necessary. The affected area shall be tested by a suitable method to ensure the integrity of the surface.5.5.2 Verification of magnetizationFor the verification of magnetization, see ISO 9934-1:2015, 8.2.For structural steels in welds, a tangential field between 2 kA/m to 6 kA/m (r.m.s.) is recommended. The adequacy of the surface flux density shall be established by one or more of the following methods: a)by testing a representative component containing fine natural or artificial discontinuities in the least favourable locations;b)measurement of the tangential field strength as close as possible to the surface using a Hall effect probe; the appropriate tangential field strength can be difficult to measure close to abrupt changes in the shape of a component or where flux leaves the surface of a component;c)calculation of the approximate current value in order to achieve the recommended tangential field strength; the calculation can be based on the current values specified in Figure 5 and Figure 6;d)by the use of other methods based on established principles.Flux indicators (i.e. shim-type) placed in contact with the surface under test provide a guide to the magnitude and direction of the tangential field strength, but should not be used to verify that the tangential field strength is acceptable.NOTE Information on b) is given in ISO 9934-3.5.6 Application techniques5.6.1 Field directions and testing areaThe detectability of an imperfection depends on the angle of its major axis with respect to the direction of the magnetic field. This is explained for one direction of magnetization in Figure 1.ISO 2016 – All rights reserved 3BS EN ISO 17638:2016ISO 17638:2016(E)Keymagnetic field direction αangle between the magnetic field and the direction of the imperfection optimum sensitivity αmin minimum angle for imperfection detection reducing sensitivity αi example of imperfection orientationinsufficient sensitivityFigure 1 — Directions of detectable imperfectionsTo ensure detection of imperfections in all orientations, the welds shall be magnetized in two directionsapproximately perpendicular to each other with a maximum deviation of 30°. This can be achieved using one or more magnetization methods.Testing in only one field direction is not recommended but may be carried out if specified, for example, in an application standard.When using yokes or prods, there will be an area of the component in the vicinity of each pole piece or tip that will be impossible to test due to excessive magnetic field strength. This is usually seen as furring of particles.Care shall be taken to ensure adequate overlap of the testing areas as shown in Figure 2 and Figure 3.ISO 2016 – All rights reservedBS EN ISO 17638:2016ISO 17638:2016(E)Dimensions in millimetresKeyd separation between the poles (yoke/prod )Figure 2 — Examples of effective testing area (shaded) for magnetizing with yokes and prods ? ISO 2016 – All rights reserved 5BS EN ISO 17638:2016ISO 17638:2016(E)Keyeffective area overlapFigure 3 — Overlap of effective areas5.6.2 Typical magnetic testing techniquesMagnetic particle testing techniques for common weld joint configurations are shown in Figure 4, Figure 5 and Figure 6. Values are given for guidance purposes only. Where possible, the same directions of magnetization and field overlaps should be used for other weld geometries to be tested. The width of the flux current (in case of flux current technique) or of the magnetic flow (in case of magnetic flow technique) path in the material, d , shall be greater than or equal to the width of the weld and the heat affected zone +50 mm and in all cases, the weld and the heat affected zone shall be included in the effective area. The direction of magnetization with respect to the orientation of the weld shall be specified.ISO 2016 – All rights reservedBS EN ISO 17638:2016 ISO 17638:2016(E)Dimensions in millimetresd ≥ 75b ≤ d/2β≈ 90od1 ≥ 75b1 ≤ d1/2b2 ≤ d2 – 50d2≥ 75d1 ≥ 75d2 ≥ 75b1 ≤ d1/2b2 ≤ d2 ? 50d1 ≥ 75d2 > 75b1 ≤ d1/2b2 ≤ d2 ? 50Key1longitudinal cracks2transverse cracksFigure 4 — Typical magnetizing techniques for yokes ISO 2016 – All rights reserved 7BS EN ISO 17638:2016 ISO 17638:2016(E)Dimensions in millimetresd ≥ 75b ≤ d/2β≈ 90od ≥ 75b ≤ d/2d ≥ 75b ≤ d/2d ≥ 75b ≤ d/2Figure 5 — Typical magnetizing techniques for prods, using a magnetizing current prod spacing ISO 2016 – All rights reservedBS EN ISO 17638:2016ISO 17638:2016(E)Dimensions in millimetres20 ≤ a ≤ 50 N ·I ≥ 8D 20 ≤ a ≤ 50 N ·I ≥ 8D20 ≤ a ≤ 50 N ·I ≥ 8DKeyN number of turns I current (r.m.s)a distance between weld and coil or cableFigure 6 — Typical magnetizing techniques for flexible cables or coils (for longitudinal cracks)5.7 Detection media5.7.1 GeneralDetection media may be either in dry powder form or magnetic inks in accordance with ISO 9934-2.5.7.2 Verification of detection media performanceThe detection media used shall fulfil the requirements of ISO 9934-2.ISO 2016 – All rights reserved9BS EN ISO 17638:2016ISO 17638:2016(E)Indications obtained with the medium to be verified shall be compared against those obtained from a medium having a known and acceptable performance. For this purpose, the reference indications may be real imperfections,photograph(s), andreplica(s).5.8 Viewing conditionsThe viewing conditions shall be in accordance with ISO 3059.5.9 Application of detection mediaAfter the object has been prepared for testing, the detection medium shall be applied by spraying, flooding or dusting immediately prior to and during the magnetization. Following this, time shall be allowed for indications to form before removal of the magnetic field.When magnetic suspensions are used, the magnetic field shall be maintained within the object until the majority of the suspension carrier liquid has drained away from the test surface. This will prevent any indications being washed away.Depending on the material being tested, its surface condition and magnetic permeability, indications will normally remain on the surface even after removal of the magnetic field due to residual magnetism within the part (mainly at the location of the poles). However, the presence of residual magnetism shall not be presumed and post evaluation techniques after removal of the prime magnetic field source are only permitted when a component has been proven by an overall performance test to retain magnetic indications.5.10 Overall performance testWhen specified, an overall performance test of the system sensitivity for each procedure shall be carried out on site. The performance test shall be designed to ensure a proper functioning of the entire chain of parameters including the equipment, the magnetic field strength and direction, surface characteristics, detection media and illumination.The most reliable test is to use representative test pieces containing real imperfections of known type, location, size and size-distribution. Where these are not available, fabricated test pieces with artificial imperfections or flux shunting indicators of the cross or disc or shim-type may be used.The test pieces shall be demagnetized and free from indications resulting from previous tests.NOTE It can be necessary to perform an overall performance test of the system sensitivity for each specific procedure on site.5.11 False indicationsFalse indications which may mask relevant indications can arise for many reasons, such as changes in magnetic permeability, very important geometry variation in, for example, the heat affected zone. Where masking is suspected, the test surface shall be dressed or alternative test methods should be used.5.12 Recording of indicationsIndications can be recorded in one or more of the following ways by using: description in writing;sketches;10 ? ISO 2016 – All rights reservedBS EN ISO 17638:2016ISO 17638:2016(E)c)photography;d)transparent adhesive tape;e)transparent varnish for “freezing” the indication on the surface tested;f)peelable contrast coating;g)video recording;h)magnetic particle dispersion in an epoxy curable resin;i)magnetic tapes;j)electronic scanning.5.13 DemagnetizationAfter testing welds with alternating current, residual magnetization will normally be low and there will generally be no need for demagnetization of the object under test. If demagnetization is required, it shall be carried out using a defined method and to a predefined level. For metal cutting processes, a typical residual field strength value of H < 0,4 kA/m is recommended.5.14 Test reportA test report shall be prepared.The report should contain at least the following:a)name of the company carrying out the test;b)the object tested;c)date of testing;d)parent and weld materials;e)any post weld heat treatment;f)type of joint;g)material thickness;h)welding process(es);i)temperature of the test object and the detection media (when using media in circulation) throughout testing duration;j)identity of the test procedure and description of the parameters used, including the following:— type of magnetization;— type of current;— detection media;— viewing conditions;k)details and results of the overall performance test, where applicable;l)acceptance levels;ISO 2016 – All rights reserved 11BS EN ISO 17638:2016ISO 17638:2016(E)m)description and location of all recordable indications;test results with reference to acceptance levels;names, relevant qualification and signatures of personnel who carried out the test.12 ? ISO 2016 – All rights reservedBS EN ISO 17638:2016ISO 17638:2016(E)Annex A(informative)Variables affecting the sensitivity of magnetic particle testingA.1 Surface conditions and preparationThe maximum test sensitivity that can be achieved by any magnetic testing method is dependent on many variables but can be seriously affected by the surface roughness of the object and any irregularities present. In some cases, it can be necessary to— dress undercut and surface irregularities by grinding, and— remove or reduce the weld reinforcement.Surfaces covered with a thin non-ferromagnetic coatings up to 50 µm thickness may be tested provided the colour is contrasting with the colour of the detection medium used. Above this thickness, the sensitivity of the method decreases and may be demonstrated to be sufficiently sensitive before proceeding with the test.A.2 Magnetizing equipment characteristicsThe use of alternating current gives the best sensitivity for detecting surface imperfections. Yokes produce an adequate magnetic field in simple butt-welds but where the flux is reduced by gaps or the path is excessive through the object, as in T-joints a reduction of sensitivity can occur.For complex joint configurations, i.e. branch connections with an inclined angle of less than 90°, testing using yokes might be inadequate. Prods or cable wrapping with current flow will, in these cases, prove more suitable.A.3 Magnetic field strength and permeabilityThe field strength required to produce an indication strong enough to be detected during magnetic particle testing is dependent mainly on the magnetic permeability of the object. Generally, magnetic permeability is high in softer magnetic materials, for example, low alloy steels and low in harder magnetic materials, i.e. martensitic steels. Because permeability is a function of the magnetizing current, low permeability materials usually require application of a higher magnetization value than do softer alloys to produce the same flux density. It is essential, therefore, to establish that flux density values are adequate before beginning the magnetic particle testing.A.4 Detection mediaMagnetic particle suspensions will usually give a higher sensitivity for detecting surface imperfections than dry powders.Fluorescent magnetic detection media usually give a higher test sensitivity than colour contrast media, because of the higher contrast between the darkened background and the fluorescent indication. The sensitivity of the fluorescent method will, nevertheless, decrease in proportion to any increase in the roughness of the surface to which magnetic particles adhere and can cause a disturbing background fluorescence.ISO 2016 – All rights reserved 13BS EN ISO 17638:2016ISO 17638:2016(E)Where the background illumination cannot be adequately lowered or where background fluorescence is disturbing, coloured detection media in conjunction with the smoothing effect of a contrast aid will usually give better sensitivity.14 ? ISO 2016 – All rights reservedBS EN ISO 17638:2016ISO 17638:2016(E)Bibliography[1] ISO 9712, Non-destructive testing — Qualification and certification of NDT personnel[2] ISO 12707, Non-destructive testing — Magnetic particle testing — Vocabulary[3] ISO 17635, Non-destructive testing of welds — General rules for metallic materials[4] ISO 23278, Non-destructive testing of welds — Magnetic particle testing — Acceptance levels ? ISO 2016 – All rights reserved 15。
AS1429.1-2006---电缆-聚合绝缘第一部分:工作电压为1.93.3(3.6)kV时,电力供应小于等于1933(36)kV解读

Australian/New Zealand Standard TM澳大利亚/新西兰标准TMElectric cables—Polymeric insulatedPart 1: For working voltages 1.9/3.3 (3.6) kV up to and including小于等于 19/33 (36) kV电缆-聚合绝缘第一部分:工作电压为1.9/3.3 (3.6) kV时,电力供应小于等于19/33 (36) kVThis Joint Australian/New Zealand Standard was prepared by Joint Technical Committee EL-003, Electric Wires and Cables. It was approved on behalf of the Council of Standards Australia on 3 April 2006 and on behalf of the Council of Standards New Zealand on 31 March 2006.本澳/新联合标准由电线和电缆联合技术委员会EL-003编制,并以澳大利亚标准委员会的名义于2006年4月3日获得审批通过,以新西兰标准委员会的名义于2006年3月31日获得审批通过。
This Standard was published on 21 April 2006.本标准于2006年4月21日出版。
The following are represented on Committee EL-003:EL-003委员会由以下单位参加:Australasian Railway Association大洋洲铁路协会Australian Electrical and Electronic Manufacturers Association澳大利亚电气和电子制造商协会Australian Industry Group澳大利亚工业集团Canterbury Manufacturers Association New Zealand新西兰坎特伯雷制造商协会Department of Primary Industries, Mine Safety (NSW)第一产业部,矿山安全(新南威尔士)Electrical Contractors Association of New Zealand新西兰电气承包商协会Electrical Regulatory Authorities Council电气管理机构委员会Energy Networks Association能源网络协会Engineers Australia澳大利亚工程师协会Ministry of Economic Development (New Zealand)经济发展部(新西兰)Keeping Standards up-to-date关于标准的更新Standards are living documents which reflect progress in science, technology and systems. To maintain their currency, all Standards are periodically reviewed, and new editions are published. Between editions, amendments may be issued. Standards may also be withdrawn. It is important that readers assure themselves they are using a current Standard, which should include any amendments which may have been published since the Standard was purchased.标准是应适时更新的文件体系,反映人们在科学、技术及系统方面取得的进步。
ITTC船模试验导则

(m/s) VA (m) C0.7R (m) D (m) R 3 (kg/m ) ρ (m2/s) υ
ITTC – Recommended Procedures and Guidelines
Testing and Extrapolation Methods Propulsion, Propulsor Open Water Test
2.2
Thrust Coefficient Torque Coefficient
Ducted Propeller TD ρ .n 2 D 4 TP Thrust Coefficient KTP = ρ .n 2 D 4 Total thrust coefficient for a ducted propeller unit KTT = KTP+KTD Duct Thrust Coefficient KTD =
η0 =
JKT 2π K Q
J=
VA nD
Reynolds Number of propeller Based on chord length 0.7 R
C0.7 R V + ( 0.7π nD
2 A
Re =
(
2
))
1 2
ν
Definition of Variables (N) (N) (N) (N) (Nm) (rps) T TD TP TT Q n
3.1.2.1 Conventional Propellers The propeller model is to be mounted on a drive shaft. A streamlined nose cap of sufficient length to ensure that the inflow over the propeller hub is parallel to the shaft should be mounted upstream of the propeller model, Fig.1. In the case of a pulling propeller, the
ISO 14389-2014 纺织品 邻苯二甲酸酯类含量的测定 四氢呋喃法

Reference number ISO 14389:2014(E)
© ISO 2014
ISO 14389:2014(E)
COPYRIGHT PROTECTED DOCUMENT
© ISO 2014 All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below or ISO’s member body in the country of the requester. ISO copyright office Case postale 56 • CH-1211 Geneva 20 Tel. + 41 22 749 01 11 Fax + 41 22 749 09 47 E-mail copyright@ Web Published in Switzerland
INTERNATIONAL STANDARD
ISO 14389
First edition 2014-05-01
Textiles — Determination of the phthalate content — Tetrahydrofuran method
ASTM D1545_98 Standard Test Method for Viscosity of Transparent Liquids by Bubble Time Method

NOTE 3—Adequate control of the temperature bath is essential. A variation of 0.1°C in the temperature of the bath will cause a 1 % variation in the timed bubble travel.
NOTE 2—For convenience, the reference standards can be divided in three series: light series, 15 tubes marked 0.22 to 8.0; heavy series, 14 tubes marked 10 to 200; and very heavy series, 7 tubes, marked 250 to 1000.
2. Terminology
2.1 Definitions: 2.1.1 viscosity—the resistance experienced by one portion of a liquid moving over another portion of the liquid. The absolute unit of viscosity in the cgs system is the poise which is expressed as dyne-seconds per square centimetre. Stokes are equal to poises divided by density. The absolute SI viscosity unit is the pascal-second.
BS 5996-1993 超声波探伤规范
steel plate, strip and wide flats
5
Annex B (normative) Technique for establishing a distance
amplitude correction (DAC) curve
7
Annex C (normative) Determination of the size of internal
Licensed Copy: Institute Of Technology Tallaght, Institute of Technology, Sat Sep 22 04:54:16 GMT+00:00 2007, Uncontrolled Copy, (c) BSI
BRITISH STANDARD
Committees responsible Foreword
Page Inside front cover
ii
1 Scope
1
2 Normative references
1
3 Definitions
1
4 Acceptance levels
1
Annex A (normative) Method for ultrasonic testing of
www.bzfxw.com
© BSI 12-1998
i
Licensed Copy: Institute Of Technology Tallaght, Institute of Technology, Sat Sep 22 04:54:16 GMT+00:00 2007, Uncontrolled Copy, (c) BSI
1 Scope
A WAVELET FILTER CRITERION FOR AN A-PRZORZ EVALUATION OF WAVELET CODING AND DENOISING PERFO
The interest of the wavelet transform analysis is the deal between frequency and spatial analysis. When a FWT is used to compute the coefficients, the performances of the transform are the performances of the filter bank. A "good" filter set must be efficient both in the frequency and in the spatial domains. In the spatial domain, the quality of a filter set can be estimated from the support of the coefficients of the impulse response of the filter bank. In the frequency domain, the quality of the filter set can be estimated from the aliasing of the filter bank. Two indexes can thus been deduced from these considerations.
Section 2 presents the definition of the spatial and frequency indexes. Section 3 details the data used to estimate compression and denoising quality. Section 4 links the indexes to the data. A formula is given to estimate the coding quality from the spatial and frequency indexes. Another formula is givne to estimate the denoising quality from the same these indexes. The proposed works are preliminary and some improvements, tests and questions remains. They are presented in the conclusion.
纹理物体缺陷的视觉检测算法研究--优秀毕业论文
摘 要
在竞争激烈的工业自动化生产过程中,机器视觉对产品质量的把关起着举足 轻重的作用,机器视觉在缺陷检测技术方面的应用也逐渐普遍起来。与常规的检 测技术相比,自动化的视觉检测系统更加经济、快捷、高效与 安全。纹理物体在 工业生产中广泛存在,像用于半导体装配和封装底板和发光二极管,现代 化电子 系统中的印制电路板,以及纺织行业中的布匹和织物等都可认为是含有纹理特征 的物体。本论文主要致力于纹理物体的缺陷检测技术研究,为纹理物体的自动化 检测提供高效而可靠的检测算法。 纹理是描述图像内容的重要特征,纹理分析也已经被成功的应用与纹理分割 和纹理分类当中。本研究提出了一种基于纹理分析技术和参考比较方式的缺陷检 测算法。这种算法能容忍物体变形引起的图像配准误差,对纹理的影响也具有鲁 棒性。本算法旨在为检测出的缺陷区域提供丰富而重要的物理意义,如缺陷区域 的大小、形状、亮度对比度及空间分布等。同时,在参考图像可行的情况下,本 算法可用于同质纹理物体和非同质纹理物体的检测,对非纹理物体 的检测也可取 得不错的效果。 在整个检测过程中,我们采用了可调控金字塔的纹理分析和重构技术。与传 统的小波纹理分析技术不同,我们在小波域中加入处理物体变形和纹理影响的容 忍度控制算法,来实现容忍物体变形和对纹理影响鲁棒的目的。最后可调控金字 塔的重构保证了缺陷区域物理意义恢复的准确性。实验阶段,我们检测了一系列 具有实际应用价值的图像。实验结果表明 本文提出的纹理物体缺陷检测算法具有 高效性和易于实现性。 关键字: 缺陷检测;纹理;物体变形;可调控金字塔;重构
Keywords: defect detection, texture, object distortion, steerable pyramid, reconstruction
II
俄罗斯分光光度计PHOTON RT说明书
PHOTON RTUniversal Scanning SpectrophotometerOperation ManualPKTH.033.000.0001IMPORTANT NOTICECopyright InformationThis document contains proprietary information that is protected by copyright. All rights are reserved. Neither the whole document nor any part of this document may be reproduced in any form or by any means or translated into any language without the prior and written permission of EssentOptics Ltd. Copyright © 2012-2016 EssentOptics Ltd.TrademarksAll brand names, trademarks, etc. used in this document, even when not specifically marked as such, are protected by law. EssentOptics and PHOTON RT are trademarks of EssentOptics Ltd.Contents1 SAFETY MEASURES (4)2 DESCRIPTION AND OPERATION OF PHOTON RT SPECTROPHOTOMETER (5)2.1 P URPOSE (5)2.2 P RODUCT S PECIFICATIONS (6)2.3 C OMPLETE SET OF SPECTROPHOTOMETER (6)2.4 C ONFIGURATION OF SPECTROPHOTOMETER (7)2.5 M ARKING AND SEALING (9)2.6 P ACKING (9)3 INSTALLATION (10)3.1 P REPARING FOR OPERATION (10)3.2 P HOTON S OFT I NSTALLATION (11)3.2.1 PC REQUIREMENTS (11)3.2.2 S OFTWARE INSTALLATION (11)3.3 O PERATION OF THE SPECTROPHOTOMETER (12)3.3.1 M EASUREMENT OF TRANSMITTANCE. (13)3.3.2 M EASUREMENT OF ABSOLUTE SPECULAR REFLECTANCE. (14)3.3.3 M EASUREMENT OF ABSORPTANCE SPECTRA (15)3.3.4 P OLARIZATION-DEPENDENT MEASUREMENTS AT VARIABLE ANGLES IN PS MODE. (16)3.3.5 T RANSMITTANCE MEASUREMENT OF THICK SAMPLES AT HIGH ANGLES OF INCIDENCE. (18)3.3.6 M EASUREMENT OF COMPLEX REFRACTIVE INDEX AND LAYER THICKNESS (19)3.3.7 B ATCH MEASUREMENTS (21)3.3.8 V ERIFICATION OF WAVELENGTH CALIBRATION OF THE SPECTROPHOTOMETER (22)3.4 P HOTON S OFT S OFTWARE (24)3.4.1 C ONTROL COMMANDS (24)3.4.2 S ETTINGS OF MEASURING PARAMETERS (26)3.4.3 S PECTRAL GRAPHS (27)3.4.4 S AVING OF SPECTRA (28)3.4.5 O PTICAL DENSITY (29)3.4.6 K INETIC MEASUREMENT (29)3.4.7 P RINTING OF REPORT (32)3.4.8 B EAM DISPLACEMENT CALCULATOR (36)3.4.9 M EASUREMENT OF COMPLEX REFRACTIVE INDEX AND LAYER THICKNESS. (37)3.4.10 M ETHODS (39)3.4.11 B ATCH MEASUREMENTS (40)3.4.12 I NTERFACE SETTINGS (44)4 MAINTENANCE AND REPAIRS (46)4.1 R EPLACEMENT OF LIGHT SOURCES (46)4.1.1 R EPLACEMENT OF HALOGEN LAMP (46)4.1.2 R EPLACEMENT OF DEUTERIUM LAMP (48)5 STORAGE (50)6 TRANSPORTATION (50)7 UTILIZATION (50)8 ACCEPTANCE CERTIFICATE (51)9 PACKING CERTIFICATE (52)10 WARRANTY (53)11 APPENDIX 1. PRODUCT SPECIFICATION (54)12 APPENDIX 2. COMPLETE SET OF SPECTROPHOTOMETER (56)13 APPENDIX 3. WAVELENGTH CALIBRATION TABLE (57)1Safety measuresThe spectrophotometer complies with the safety standard IР STB 14254-96 standard.Prior to the operation, read the safety rules and regulations for electric equipment carefully and follow the necessary instructions for operation of the spectrophotometer. One should be clearly aware of danger of hazardous internal and external voltages.CAUTION!It is PROHIBITED to operate the spectrophotometer with the removed housing.It is PROHIBITED to operate the spectrophotometer after ingress of water.It is PROHIBITED to operate the spectrophotometer without proper grounding.2Description and operation of Photon RT spectrophotometer2.1PurposeThe Photon RT universal scanning spectrophotometer (further referred to as spectrophotometer) is designed to measure optical characteristics of absolute specular reflectance, transmittance, absorptance, and optical density of planar optical samples with thin film coatings at variable angles and in the polarized light.The spectrophotometer is developed on the basis of the Czerny-Turner monochromator. The spectrophotometer is intended for operation in laboratory conditions in accordance with the following requirements:∙ambient temperature – from +10 0С to +28 0С;∙relative humidity – below 80 % at the temperature + 25 оС;∙atmospheric pressure – from 84 kPa to 106.7 kPa∙proper grounding at the connection point of spectrophotometer and computer2.2Product SpecificationsSee Appendix 1for specifications of your individual spectrophotometer.2.3Complete set of spectrophotometerSee Appendix 2 for complete set of your individual spectrophotometer.2.4Configuration of spectrophotometerFigure 2.4.1 shows the spectrophotometer (front view) with an open lid.The lid of the measuring compartment 1 ensures protection against ambient illumination. In the process of measurement a sample is placed on the sample holder 3 of the sample stage 2 and is fastened with clamps 4. When the spectrophotometer is switched on, red-color flickering of indicator light-emitting diode (LED) 7 continues until the end of the spectrophotometer initialization and self-check procedure. When the spectrophotometer is in the off-measuring mode (“ready” mode), flickering of the indicator LED is green. The indicator LED 7 flickers red during the measurement process, and red-yellow during the change of diffraction gratings. The spectrophotometer is switched on and off by switch 6.Photodetector unit 5 is positioned at a supporting holder of the photodetector drive. The drive provides for positioning of photodetectors along the optical axis for the angles from 16˚ to 183˚: in the case of reflectance measuring -synchronously or non-synchronously with the stage rotation, in the case of transmittance measuring - photodetectors are positioned at normal angle of incidence or any angle within 0˚ - 75˚ range selected by the user.Rotation of stage 2 in the horizontal plane around the optical axis is realized from 0˚ to 75˚. Both rotations are executed with 0,10 step.The value of the incidence angle on the measured surface is set in the field «Measuring parameters» (see Subsection 2.4.2). The position of photodetector is adjusted automatically with the measuring mode («TRANSMITTANCE» or «REFLECTANCE») and depending on the rotation angle of sample stage 2. Rotation angles of sample stage 2 and photodetector unit 5 can be also realized independently in the manual mode for measurement of complex prismatic units. The motorized displacement of photodetector unit perpendicular to the axis of the light beam allows measuring the transmittance of thick samples at high angles up to 75˚. Operation of the beam displacement calculator is described in section 2.4.For the adequate measurement of reflectance, the sample’s surface must be pressed to the stage surface. The measuring area is at the opening center of stage 2.1. Lid of measuring compartment;2. Sample stage;3. Holder;4. Clamps;5. Photodetector unit;6. Power switch;7. Indicator LED;Figure 2.4.1 Photon RT spectrophotometer, front view, with open lid.Figure 2 shows a rear view of the spectrophotometer. The rear panel has USB connector 1 for connection of PC, power supply connector 2, and fuse 3 (including the spare fuse inside). Cover 4 of the compartment with light sources is fastened to the side surface of the instrument by screws 5. The procedure for replacement of the light sources is described in Subsection 4.11. USB connector;2. Power supply connector;3. Fuse (including spare fuse inside);4. Cover;5. Screws.Figure 2.4.2 Photon RT spectrophotometer, rear view.2.5Marking and sealingMarking of the spectrophotometer includes:∙brand name (description) of the device;∙manufacturer’s trademark;∙legends for the elements of connection to external devices are given on the rear panel of the spectrophotometer;∙serial number of the tool is provided on the rear panel;∙marking on the shipment package2.6PackingThe spectrophotometer is packed in accordance with the manufacturer’s requirements and specifications.3Installation3.1Preparing for operation1)Open the packing container, take out the operation manual (OM), take out the spectrophotometer. Whentransportation of the spectrophotometer is handled at temperature below 5оС, leave it unpacked for no less than 24 hours.2)Install the spectrophotometer on the solid horizontal surface.3)Check for the set completeness (see Subsection 2.3).4)Inspect the instrument to make sure that there is no mechanical damage.5)Install «PhotonSoft» Software using PC in accordance with Subsection 3.2.6)Provide effective grounding of the spectrophotometer and PC.7)Connect the spectrophotometer to power mains using the power cable.8)Connect the spectrophotometer to PC with the help of USB cable (see Figure 2.4.2).9)Switch-on the spectrophotometer.10)Start «PhotonSoft» Software.IMPORTANT NOTE:After “PhotonSoft” software starts, the instrument runs self-check and initialization procedure of all controlled elements. This may take about 1 minute.It is PROHIBITED to switch off / switch on the instrument, close / open the software or activate any elements of the software during the self-check and initialization procedure. Otherwise this may damage the instrument.3.2PhotonSoft Installation3.2.1PC requirements∙Microsoft Windows XP/ Windows7/Windows 8operating system;∙SVGA monitor with the resolution no less than 1024x768 (optimum 1280х1024) dots;∙Video adapter memory capacity no less than 32Мb (optimum 64Мb) and color depth no less than 16 bit; ∙No less than 128 Мb of memory (RAM);∙Keyboard, mouse-type manipulator;∙Hard disk (HDD) with free capacity no less than 10 Gb.3.2.2 Software installationTo install the Software, perform the following operations:∙make sure the spectrophotometer is NOT connected to PC∙insert the Software CD-disk (or USB-flash) into CD-ROM (or USB port) of PC ;∙start the installation software setup.exe and follow its instructions;∙press the «Next» button in the installation window ;∙press «Next» in the installation window;∙after successful installation of the software, press the «Finish» button in the window;∙find quick start tag of «PhotonSoft» on the desktop of your PC;∙connect the spectrophotometer to PC;The spectrophotometer is ready for operation.3.3Operation of the spectrophotometer3.3.1Measurement of transmittance.∙Switch on the spectrophotometer.∙Start «PhotonSoft» from your desktop.IMPORTANT NOTE:After “PhotonSoft” software starts, the instrument runs self-check and initialization procedure of all controlled elements. This may take about 1 minute.It is PROHIBITED to switch off / switch on the instrument, close / open the software or activate any elements of the software during the self-check and initialization procedure. Otherwise this may damage the instrument.∙The warm-up time of the spectrophotometer shall be no less than 30 minutes.∙Select «TRANSMITTANCE» from the drop-down menu.∙Set the necessary measuring parameters (see Subsection 3.4.1).1) scanning range;2) sampling pitch;3) averaging count;4) smoothing mode;5) sample stage angle setting;6) polarization.∙Open the lid and make sure that the optical channel in the measuring compartment has no objects.∙Close the lid.∙Press the button «Apply».∙Press the button «Calibration» for baseline calibration. When scanning of a spectrum is finished, the screen displays the horizontal spectral graph serving as 100% transmittance level.∙Open the lid. Place a sample to be measured on the sample stage. Close the lid.∙Start the measuring process by pressing the button «MEASUREMENT». When the process is finished, the screen displays the graph for a transmittance spectrum of the sample.IMPORTANT NOTES:1)When starting the instrument on the new day, it is recommended to repeat baseline calibration beforeactual measurements for breaking-in after 30 minutes warm-up time. This ensures small bit adjustments of the moving parts after idle time.Recommended parameters:∙Staring wavelength: 400 nm;∙Ending wavelength: 1600 nm;∙Sampling pitch: 10 nm;∙Averaging count: 10;∙Smoothing mode: 0;2)Select the wavelength scanning range applicable to the measured sample.3)For more precise measurements in UV-VIS or VIS range, set scanning range and run baselinecalibration up to 990 nm. (For example, 180-990 nm or 380-990 nm respectfully.)4)For more precise measurements in IR range, set scanning range and run baseline calibration starting1000 nm. (For example, or 1000-1600 nm or 1000-3000 nm etc).5)When measurements are conducted over the complete effective wavelength range of thespectrophotometer, it is recommended to perform the baseline calibration directly before measuring the spectrum of the sample.Figure 3.3.1 Transmittance and optical density spectrum.Figure 3 illustrates transmittance and optical density spectrum. The transmittance scale is on the left and the optical density scale is on the right. The optical density graph may be displayed or hidden (see Subsection2.4.4).3.3.2Measurement of absolute specular reflectance.∙Switch on the spectrophotometer.∙Start «PhotonSoft».IMPORTANT NOTE:After “PhotonSoft” software starts, the instrument runs self-check and initialization procedure of all controlled elements. This may take about 1 minute.It is PROHIBITED to switch off / switch on the instrument, close / open the software or activate any elements of the software during the self-check and initialization procedure. Otherwise this may damage the instrument.∙The warm-up time of the spectrophotometer shall be no less than 30 minutes.∙Select «TRANSMITTANCE» from the drop-down menu.∙Set the required measuring parameters (see Subsection 3.4.1)1) scanning range;2) sampling pitch;3) averaging count;4) smoothing mode;5) polarization.∙Make sure that the optical channel in the measuring compartment has no objects.∙Press the button«Apply».∙Press the button «Calibration» for baseline calibration. When scanning of a spectrum is finished, the screen displays the horizontal spectral graph serving as 100% transmittance level.∙Select «REFLECTANCE» from the drop-down menu to change for measurement of absolute specular reflectance.∙Open the lid. Place a sample to be measured on the sample stage. The coated surface shall be facing the sample stage for measurement of absolute specular reflectance. Close the lid.∙Set the angle for sample stage.∙Press the button«Apply».∙Start the measuring process by pressing the button «MEASUREMENT». When the process is finished, the screen displays the graph for the absolute reflectance spectrum of the sample.IMPORTANT NOTES:1)When starting the instrument on the new day, it is recommended to repeat baseline calibration beforeactual measurements for breaking-in after 30 minutes warm-up time. This ensures small bit adjustments of the moving parts after idle time.Recommended parameters:∙Staring wavelength: 400 nm;∙Ending wavelength: 1600 nm;∙Sampling pitch: 10 nm;∙Averaging count: 10;∙Smoothing mode: 0;2)Select the wavelength scanning range applicable to the measured sample.3)For more precise measurements in UV-VIS or VIS range, set scanning range and run baselinecalibration up to 990 nm. (For example, 180-990 nm or 380-990 nm respectfully.4)For more precise measurements in IR range, set scanning range and run baseline calibration starting1000 nm. (For example, 1000-3000 nm, 1000-1650 nm etc.)5)When measurements are conducted over the complete effective wavelength range of thespectrophotometer, perform baseline calibration directly before measuring the spectrum of the sample.3.3.3Measurement of absorptance spectraThe Photon RT spectrophotometer provides the possibility to measure absorptance spectra of the unknown transparent substrate. The measurement of the absorptance spectra is realized by sequential measurements of transmittance and reflectance, and subsequent processing of the measurement results.∙Switch on the spectrophotometer.∙Start «PhotonSoft».IMPORTANT NOTE:After “PhotonSoft” software starts, the instrument runs self-check and initialization procedure of all controlled elements. This may take about 1 minute.It is PROHIBITED to switch off / switch on the instrument, close / open the software or activate any elements of the software during the self-check and initialization procedure. Otherwise this may damage the instrument.∙The warm-up time of the spectrophotometer shall be no less than 30 minutes.∙Select «TRANSMITTANCE» from the drop-down menu.∙Set the required measuring parameters (see Subsection 3.4.1)1) scanning range;2) sampling pitch;3) averaging count;4) smoothing mode;5) polarization.∙Make sure that the optical channel in the measuring compartment has no objects.∙Press the button«Apply».∙Press the button «Calibration» for baseline calibration. When scanning of a spectrum is finished, the screen displays the horizontal spectral graph serving as 100% transmittance level.∙Select «ABSORPTANCE» from the drop-down menu to change for measurement of absorptance.∙Place a sample to be measured on the sample stage.NOTE: One can use the same sample to measure both transmittance and reflectance, if the sample has thickness of 40 mm and above. Otherwise, for reflectance measurementone should prepare and use a 50 wedge sample made of the same material.∙Input the value of the sample thickness in the line “Sample thickness, mm” (See Fig. 3.4.4).∙Press the button«Apply».∙Start the measuring process by pressing the button «MEASUREMENT». When the process is finished, the screen displays the graph for the transmittance spectrum of the sample. After that, thedetectors unit and sample stage will synchronously rotate for reflectance measurement at 80.∙Start the measuring process by pressing the button «MEASUREMENT». When the process is finished, the screen displays the graph for the internal attenuation DA which represents the value of total internal losses for absorptance and scattering of the signal in the measured sample.3.3.4Polarization-dependent measurements at variable angles in PS mode.The spectrophotometer has built-in high-contrast polarizers that operate unattended. This configuration provides for polarization-dependent measurement of transmittance, absolute specular reflectance at variable angles of incidence, and measurement/calculation of optical constants (refractive index, layer thickness and extinction coefficient).During the PS mode of measurement, the spectrum is measured subsequently for S polarization and for P polarization without any involvement of operator. Next, the (S+P)/2 value of random polarization is calculated and displayed instantly for transmittance or absolute specular reflectance.∙Switch on the spectrophotometer.∙Start the «PhotonSoft».IMPORTANT NOTE:After “PhotonSoft” software starts, the instrument runs self-check and initialization procedure of all controlled elements. This may take about 1 minute.It is PROHIBITED to switch off / switch on the instrument, close / open the software or activate any elements of the software during the self-check and initialization procedure. Otherwise this may damage the instrument.∙The warm-up time of the spectrophotometer shall be no less than 30 minutes.∙Set the required measuring parameters (see Subsection 3.4.1)(1) scanning range;(2) sampling pitch;(3) averaging count;(4) smoothing mode;(5) polarization - PS.(6) slid width∙Open the lid, make sure that the optical channel in the measuring compartment has no objects. Close the lid.∙Press the button«Apply».∙Press the button «CALIBRATION».∙Open the lid. Place a sample to be measured on the sample stage. The coated surface shall be facing the sample table for measurement of reflectance. Close the lid.∙Select «TRANSMITTANCE» or “REFLECTANCE” measurement mode from the drop-down menu. ∙Set the angel for the sample stage.∙Press the button«Apply».∙To start the measuring process, press the button «MEASUREMENT».In the «PS» polarization mode the baseline calibration is performed twice: in «S» position of the polarizer and in «P» position of the polarizer. The displayed spectrum for «S» polarization is dark blue and that for «P» polarization is dark green in color. The calculation of average polarization «(S+P)/2» is performed after completion of subsequent measurements for the spectra associated with «S» and «P» polarizations. The resultant spectrum is displayed in white color on the screen immediately.∙When the process is finished, the screen displays a transmittance or reflectance spectrum at the specified angle of incidence at (S+P)/2 average polarization.IMPORTANT NOTES:1)When starting the instrument on the new day, it is recommended to repeat baseline calibration beforeactual measurements for breaking-in after 30 minutes warm-up time. This ensures small bit adjustments of the moving parts after idle time.Recommended parameters:2)Staring wavelength: 400 nm;3)Ending wavelength: 1600 nm;4)Sampling pitch: 10 nm;5)Averaging count: 10;6)Smoothing mode: 0;7)Select the wavelength scanning range applicable to the measured sample.8)For more precise measurements in UV-VIS or VIS range, set scanning range and run baselinecalibration up to 990 nm. (For example, 180-990 nm or 380-990 nm respectfully.)9)For more precise measurements in IR range, set scanning range and run baseline calibration starting1000 nm. (For example, 1000-3000 nm, 1000-1650 nm etc.)10)W hen measurements are conducted over the complete effective wavelength range of thespectrophotometer, perform calibration directly before measuring the spectrum for a sample.11)S elect the slit width approximately 1.5 times bigger compared to regular (not PS) measurementprocedure. Make sure the maximum signal value does not exceed 65 000 units after baseline calibration (refer to the Signal window of the main interface).Figure 3.3.2 Transmittance spectrum in «PS» mode.Figure 3.3.2 shows a transmittance spectrum of the optical coating at the 45˚ angle of incidence in «PS» mode. The spectra for «S» and «P» polarizations are displayed in darkened colors.3.3.5Transmittance measurement of thick samples at high angles of incidence.When measuring transmittance of thick optical samples at high angles of incidence, the parallel displacement of transmitted beam occurs. The value of beam displacement depends on three factors: angle of incidence, physical thickness of the sample and refractive index of the sample material.The PHOTON RT spectrophotometer offers a possibility for correct transmittance measurement of thick sample at high angles using the built-in “Beam displacement calculator” option (See also Section 3.4.8). The actual value of beam displacement can be within 0-10 mm range.∙Switch on the spectrophotometer.∙Start the «PhotonSoft».IMPORTANT NOTE:After “PhotonSoft” software starts, the instrument runs self-check and initialization procedure of all controlled elements. This may take about 1 minute.It is PROHIBITED to switch off / switch on the instrument, close / open the software or activate any elements of the software during the self-check and initialization procedure. Otherwise this may damage the instrument.∙The warm-up time of the spectrophotometer shall be no less than 30 minutes.∙Set the required measuring parameters (see Subsection 3.4.1)(1) scanning range;(2) sampling pitch;(3) averaging count;(4) smoothing mode;(5) sample table angle setting(6) polarization - PS.∙Open the lid. Make sure that the optical channel in the measuring compartment has no objects. Close the lid.∙Press the button«Apply».∙Press the button «Calibration» for baseline calibration. When scanning of a spectrum is finished, the screen displays the horizontal spectral graph serving as 100% transmittance level.∙Open the lid. Place a sample to be measured on the sample stage.∙Select desired angle of incidence. Close the lid.∙Select «BEAM DISPLACEMENT CALCULATOR» from the drop-down menu «Tools”. The “Beam displacement calculator” window opens (see Figure 3.4.21).∙In the “Beam displacement calculator” window, fill in appropriate fields “Thickness” (in mm) and “Refractive index” for the measured sample. The angle of sample table is uploaded from the “Sample table angle setting” field (see Figure 3.4.4).∙The value of beam displacement (in mm) is calculated immediately.∙Press the button«APPLY» in the “Beam displacement calculator” window. The value of beam displacement (in mm) will be immediately displayed in the “Detector displacement, mm” field of the “Display options” menu (see Figure 3.4.4).∙Press the button«APPLY» in the “Display options” menu (see Figure 3.4.4).∙Start the measuring process by pressing the button «MEASUREMENT». When the process is finished, the screen displays the graph for transmittance spectra of the sample at a user-selected angle of incidence.∙Change the beam displacement value for “0” in the “Detector displacement, mm” field of the “Display options” menu (see Figure 3.4.4) if no further transmittance measurements of thick samples at highangles of incidence are required.∙Press the button«APPLY» in the “Display options” menu (see Figure 3.4.4).The beam displacement of the detectors can also be realized by setting the check box in the field "Detector autodisplacement" (see. Figure 3.4.3). The following lines become active: "Sample thickness, mm" and "Refractive index n”. The value of the sample thickness and the average refractive index of the sample material for the selected wavelength range shall be indicated in the appropriate fields. After clicking the "Apply" button, the value of detector displacement will be displayed in the "Detector displacement, mm" field. The detectors will immediately move at the calculated value of displacement.3.3.6Measurement of complex refractive index and layer thicknessOptical constants of the material layers are characterized with a number of parameters. Several of them are important for experts involved in optical design of the multilayer coatings – refractive index (n), layer thickness (d) and extinction coefficient (k).The NKD calculation software is designed to calculate the refractive index (n), extinction coefficient (k) and layer thickness (d) of the single homogenous layers on the known substrate using the photometric reverse engineering method. Calculations of optical parameters of the thin film layers is based on measuring the reflectance of the coated substrate in a polarized light (Rp and Rs values) for several angles of incidence. Typically, 3 to 8 angles of incidence are sufficient for correct measurement and calculation. Recommended sampling pitch is from 5 to 20 nm. The wedged substrate (with not less than 5 deg wedge angle) must be used for correct measurement to exclude reflectance from the back surface. BK7 and SiO2 substrates are recommended as test substrates for described measurement. It is necessary to increase the slid with 1,5 times to compensate for decreased signal in the PS measurement mode.∙Switch on the spectrophotometer.∙Start the «PhotonSoft».。
- 1、下载文档前请自行甄别文档内容的完整性,平台不提供额外的编辑、内容补充、找答案等附加服务。
- 2、"仅部分预览"的文档,不可在线预览部分如存在完整性等问题,可反馈申请退款(可完整预览的文档不适用该条件!)。
- 3、如文档侵犯您的权益,请联系客服反馈,我们会尽快为您处理(人工客服工作时间:9:00-18:30)。
1Reproducibility Standards forWavelet Transform AlgorithmsCarl TaswellC.Taswell is with UCSD School of Medicine,La Jolla,CA92093-0603,(ctaswell@),and with Com-putational Toolsmiths,POB9925,Stanford,CA94309-9925,(taswell@).Manuscript submitted 12/15/96to IEEE TCAS-II;revision resubmitted3/12/98.2TASWELL:REPRODUCIBILITY STANDARDS FOR WAVELET TRANSFORM ALGORITHMSAbstractSpecifications for reproducibility standards are developed for wavelet transform algorithms.Repro-ducibility of an algorithm is defined as the requirement that the specified algorithm yield the same trans-form coefficients for the same signal data regardless of implementation in any programming language or on any computing machine.The specification is built with three heirarchical stages consisting of1)filter bank coefficients,2)single-level convolutions,and3)multi-level transforms.Each stage is specified with all the necessary choices, parameters,and operators required to insure reproducibility.Each stage can be further characterized by additional properties that provide relevant information.The specification has been designed to be a sufficiently general andflexible framework which encompasses many different convolution types addressing the issues of both the phase shift and the boundary treatment.New convolution phase shift variants are introduced.In particular,a peak near-aligned phase variant is demonstrated on test signals and applied to fast wavelet based matrix multiplication.Finally,in the context of computational science and engineering,the concept of scientific reproducibility of an algorithm is discussed and contrasted with two other concepts introduced as repetitive executability and input-output repeatability.KeywordsWavelet transforms,multiratefilter banks,algorithms,repetitive executability,input-output repeata-bility,scientific reproducibility,standards.I.IntroductionGrowth in the number of variations and applications of wavelet transforms has progressed rapidly over the past decade[1].Indeed,this growth has been so expansive that there are now many different classes and subclasses of wavelets and wavelet transforms.Certainly,opinions and definitions of what constitutes a wavelet and wavelet transform vary with different authors [2].Nevertheless,this report focuses on those wavelet transforms that are currently the most prevalent and that can be implemented as iteratedfilter banks.Although particular attention is addressed to non-redundant transforms,the general principles of the methods described here can also be applied to redundant transforms.Most of the literature on wavelet transforms has discussed the theory of analysis and methods rather than the implementation of algorithms.There have been a few important and notable exceptions such as the papers by Shensa[3]and Rioul and Duhamel[4].However,these articles discussed algorithmic schemes at a more general level in order to describe them and compareSUBMITTED12/15/96TO IEEE TCAS-II;REVISION RESUBMITTED3/12/98.3their relative efficiency,rather than algorithmic implementations at a sufficiently detailed level to specify them and insure their reproducibility.The use of the terms describe and description when associated here with the discussion of an algorithm will refer to a general scheme or diagram for the algorithm,whereas the terms specify and specification will refer to a complete listing of all implementation details for the algorithm. With this usage then,a description of an algorithm is sufficient for a discussion of its efficiency, but a specification is necessary for a discussion of its reproducibility.A complete specification of an algorithm may be provided with a detailed pseudo-code template as exemplified in the wavelet transform algorithm published by Taswell and McGill[5]or with a sufficiently detailed listing of all mathematical equations and parameters as exemplified by the work of Bradley and Brislawn[6]for the FBIfingerprint image compression standard.However, these published examples remain more the exception than the rule.Systematic development of a standard for the specification and reproducibility of wavelet transform algorithms has not yet been promoted in the wavelet community.Thus,this report presents thefirst attempt in thefield of wavelets to develop a systematic methodology to specify mathematically,and then to evaluate numerically waveletfilter banks, convolutions,and transform algorithms in a heirarchical framework with empirical testing and validation of each stage.Any such methodology fulfilling this objective will constitute an impor-tant and necessary aspect of reporting computational experiments involving wavelet transforms. These algorithm verification methodologies can then be used to insure reproducibility of results, especially for those experimental studies purporting to compare alternative algorithms.The evaluation methodology presented here comprises a systematic listing of the principal parameters,choices,and tests that can be specified and performed for waveletfilter coefficients, single-level convolutions,and multi-level transforms when the investigator wishes to guarantee reproducibility and verifiability regardless of computing platform and programming language. The specification of thefilter convolutions,the phase delays and advances of thefilters in the filter bank,and the treatment of the ends of the signal remains a central issue relevant to algorithms forfinite-length signals.In the introduction to his paper[7],Brislawn provides a comprehensive historical review of the various convolution types available.However,reporting of such details is often neglected.To emphasize the importance of specifying these convolution details,this article presents a4TASWELL:REPRODUCIBILITY STANDARDS FOR WAVELET TRANSFORM ALGORITHMSunifying framework for reporting them and demonstrates the use of this framework with a sim-ple yet novel solution to the phase alignment problem.As an example application,this solution is then applied to fast wavelet based matrix multiplication.Beylkin et al[8]introduced fast al-gorithms for the efficient multiplication of sparse wavelet based representations for integral and pseudodifferential matrix operators of a certain class.Keinert[9]continued this work by imple-menting the Beylkin algorithm for biorthogonal instead of orthogonal wavelets,and observing the relative advantages and disadvantages of the various wavelets investigated.In the exam-ple application demonstrated in Section III-D,their work is extended further by experimentally comparing different convolution phase variants instead of different wavelets.Finally,Section IV discusses how the specification and evaluation methodology reported here promotes scientific reproducibility in contrast with repetitive executability,which is a term coined here to refer to the notions advocated by several other authors[10],[11],[12].Earlier versions of material reported in this article have appeared elsewhere[13],[14].II.MethodsAlgorithms are specified here by building heirarchical systems with modular components con-sisting of structures and functions forfilter banks,single-level convolutions,and multi-level trans-forms.Each component,whether a structure containing data or a function processing data,is represented as a data matrix or an operator matrix.Each stage of the heirarchy is detailed with all necessary choices to insure reproducibility and verifiability.The specification outlined here assumes that the multi-level wavelet transform can be implemented as an iteration of a multi-rate single-level convolution of thefilters in an M-bandfilter plete algorithmic details for all of the methods presented here have been and/or will be available in a sequence of papers including[15],[16],a forthcoming book[17],and a software function library[18],[19].A.Filter BanksConsider an M-band analysis and synthesisfilter bank system with uniform downsampling and upsampling rate R.This system has M analysisfilters with impulse responses f m≡f m(n), M downsamplers and upsamplers operating at rate R,and M synthesisfilters g m≡g m(n)where m=0,1,...,M−1is the band index and n=0,1,...,N−1is the time index.Here N=QR is an integer multiple Q= (max m N m)/R of R determined with the maximum of the minimumSUBMITTED12/15/96TO IEEE TCAS-II;REVISION RESUBMITTED3/12/98.5support lengths N m of f m.1Thefirst nonzero coefficient of each f m is indexed at time step n=0 and anyfilter with length N m<N is padded with trailing zeros.Thefirst nonzero coefficient of each g m is indexed at a time step n≥0and padded with either leading or trailing zeros or both as long as the total length with padding is constrained to N.Thefilter coefficients can then be structured as the matrices F=[f nm]and G=[g nm]with time index n increasing down the rows and band index m increasing across the columns.This convention permits columnwise tabulation of the coefficients and facilitates convenient colum-nwise analysis for the bandfilters in each of the columns.Thus,individualfilters in thefilter banks can be readily characterized by computing various measures of each column of coefficients in the matrices.A minimal specification of thefilter bank coefficients requires either a)actual tabulation of the coefficient matrices F and G,or b)specific definition of the computational algorithm that generates the coefficient matrices with sufficient detail to clarify choices of signs,phases,and normalization constants.Assuming that F and G have been unequivocally specified,additional informative characterization of thefilter banks may also include a)the accuracy and precision of the numerical coefficients relative to their theoretical values,b)various norms and statistical moments,the number v of vanishing moments,the Holder estimate h for time-domain regularity, estimates of the frequency-domain selectivity,and other measures of the individualfilters in the filter banks,c)the system delay∆and reconstruction error for an impulse processed through thefilter bank system,and d)other properties of thefilter bank system rather than the individual filters.The delay∆and error can be computed most readily with a simple modification of the method devised by Nayebi et al.[20].The Holder regularity h can be estimated by the method of Rioul[21]or Taswell[15].The number v of vanishing moments can be numerically tested by straightforward calculations subject to a prescribed error tolerance.Such a definition interprets “vanishing”to mean that the required“zero”is any absolute numerical value less than the prescribed error tolerance.Finally,thefilters may also be tested numerically for other properties such as orthogonality and biorthogonality.All of these methods and tests are detailed in[15], [16].1The minimum support length of afilter is its length without any leading or trailing zeros.6TASWELL:REPRODUCIBILITY STANDARDS FOR WAVELET TRANSFORM ALGORITHMSB.Single-Level ConvolutionsUnder the assumptions validating the noble identities,the order of analysis filters and down-samplers can be exchanged,and similarly the order of upsamplers and synthesis filters can be exchanged [22].Moreover,for computational efficiency,each pair of operations can be integrated into a single convolution operation called downscaling for the composition of analysis filtering and downsampling,and upscaling for the composition of upsampling and synthesis filtering [21].Thus,for the purposes of this exposition,the operations will be denoted with the matrices T (f m )for filtering with the m th analysis filter f m ,D for downsampling,D m ≡D ·T (f m )for down-scaling with f m ,U for upsampling,T (g m )for filtering with the m th synthesis filter g m ,and U m ≡T (g m )·U for upscaling with g m .Since the matrix operators T are assumed here to implement standard linear or circular convolution (denoted respectively T lin or T cir ),they are banded Toeplitz matrices and thus the matrices D m and U m are block Toeplitz matrices.Using this matrix notation,the single-level convolutions can be implemented and studied as multiplications of the finite-length signal data X with the finite-size downscaling matrices D m to obtain the decomposition bands Y m =D m X ,and then with the upscaling matrices U mto obtain the reconstruction bands ˆXm =U m Y m .Summing these outputs yields the final reconstruction ˆX = m ˆX m .In this representation,the matrices X and Y could be replacedby the vectors x and y .These alternatives correspond to single-and multi-channel signal data with single and multiple columns for the vectors and matrices,mon examples of multi-channel data are two-channel (left and right stereo)audio recordings and twelve-channel electrocardiograms.Discussion of the matrix representation of the single-level convolutions suffices to fix issues re-lated to reproducibility without concern for efficiency.Again,this objective is defined here prin-cipally as the requirement that a given sequence of output coefficients be computed reproducibly for a given sequence of input coefficients.Thus,issues related to efficiency (such as matrix-filter versus vector-filter implementations [5],standard filter versus lattice filter implementations [22],and time-domain versus frequency-domain implementations [4])are not considered here other than as already mentioned at the beginning of this section.It is,however,the finite size of the downscaling,upscaling,and data matrices that does di-rectly impact reproducibility of the single-level convolutions,and consequently,the multi-level transforms.This finiteness imposes the necessity to consider the treatment of the ends of theSUBMITTED12/15/96TO IEEE TCAS-II;REVISION RESUBMITTED3/12/98.7signal,not only with regard to the choice of the type of convolution such as zero-extended[5], circularly-periodized[5],linearly-extended[23],[24],symmetrically-reflected[7],or boundary-adjusted[25],but also with regard to the choice of phase shifts for the convolutions.To specify the single-level convolutions reproducibly,it is thus necessary to clarify unambiguously the con-volution types and phase delays and advances imposed on thefilter bands in thefilter banks. Clarifying in terms of the heirarchy offilter banks,single-level convolutions,and multi-level transforms,the matrices F and G determine a standardized M-bandfilter bank system with allfilters in the causal time-aligned zero-indexed format as explained in Section II-A,while the matrices{D m,U m|m=0,...,M−1}determine an unrestricted,possibly anti-causal,M-band single-level convolution system for a decomposition and reconstruction allowing for many possible variations of signal-end treatment.All of the different types of convolutions can be incorporated in the following general framework described here with analysis phase delaysαim,synthesis phase delaysβim,and several additional matrix operators:the pre-processing or extension matrix E,the shift matrix S,and the post-processing or restriction matrix R.Then the m th analysis downscaling and synthesis upscaling matrices can be redefined asD m≡R·D·T(f m,α2m)·E(α1m)U m≡R·S(β3m)·T(g m,β2m)·U·E(β1m)for a scheme intended to impose a perfect reconstruction result I=mU m·D m on a single-leveldecomposition and reconstruction whenever possible.Note that S(β3m)is afinal shift necessary to account for the combined delays resulting from the operators E and T as well as from the delay ∆for thefilter banks F and G in their standardized format.This scheme assumes zero delays on the D,U,and R operators but still allows for as many as5M different delay parameters for the E,T,and S operators used here in the M-band single-level convolution system.Phase alignment of peaks of polyphase components of bands in the transform domain relative to the signal domain can be accomplished by the simple introduction of two more circular shift operators and delay parameters in the schemeD m≡S(α3m)RDT(f m,α2m)E(α1m)U m≡RS(β4m)T(g m,β3m)UE(β2m)S(β1m)which ideally should require that thefinal downscaling rotation S(α3m)and the initial upscaling8TASWELL:REPRODUCIBILITY STANDARDS FOR WAVELET TRANSFORM ALGORITHMSinverse rotation S(β1m)yield the identityI=S(β1m)·S(α3m).Thus,imposingβ1m=−α3m eliminates M of the additional parameters,and absorbing S(β1m) into E(β2m)eliminates another M of the additional operators.Relabeling indices such that the main Toeplitz operators T(f)and T(g)are assigned delay index i=1,the inner operators S and E are assigned i=2,and the outer operators E and S are assigned i=3yields the schemeD m≡S(α2m)RDT(h m,α1m)E(α3m)U m≡RS(β3m)T(g m,β1m)UE(β2m)as a general framework sufficient to account for the various convolution types.This particular indexing convention was adopted for W A V B3X4.4Software[18]used to produce the results reported in Section III.Detailed algorithms including pseudo-code templates for these phase aligned convolution types will be available elsewhere[17].A brief explanation,however,is provided here.Letµrm(for r=0,...,R−1and m= 0,...,M−1)be the indices of the center peaks of the r th polyphase components of the m th bandfilters of the analysisfilter bank F.LetµRm be the indices of the center peaks of the entire m th bandfilters of the analysisfilter bank F.Then one possible phase near-aligned solution involves:1)choosingµ =µrm for a particular r and m,2)setting allα1m to the delayζcomputed as a function of R andµ ,3)setting allα3m to the delayηcomputed as a function of R and N,4)setting eachα2m to a delay computed as a function of R and the sumµrm+ζ+η, 5)settingβ2m=−α2m,and6)settingβ3m=−∆−ζ−η.Numerous other solutions are possible depending on a)the definitions assumed for the center peaks of polyphase components or entirefilters,b)the definitions assumed for phase alignment or near-alignment,and c)any other constraints imposed on the problem.Thus,a minimal specification for reproducibility of the single-level convolutions requires a)the convolution type including the composition sequence of the various operators as in the general framework above,b)the algorithms for generating the operators with particular attention to the extension operator E for a given extension or boundary treatment type,c)any auxiliary parameters or boundaryfilters necessary for E,d)restriction length parameters necessary for the restriction operator R,and e)the phase shifts necessary for any of the E,T,and S oper-ators used by the convolution type(or the algorithms for setting the phase shifts).AdditionalSUBMITTED12/15/96TO IEEE TCAS-II;REVISION RESUBMITTED3/12/98.9characterization for verifiability of the single-level convolutions may also include:a)compari-son of results with known sequences of transform-domain decomposition coefficients for given sequences of signal-domain test data,b)the reconstruction errorεfor the test signals resulting from use of the convolutions as a single-level decomposition and reconstruction,and c)various other measures designed to reveal properties of the convolution type such as energy conservation, distribution,and shift.Simple definitions are possible for the latter measures as ratios.Let the energy conservation ratioρc be the ratio of the energy of{Y m|m=0,...,M−1}to the energy of X.Let the energy distribution ratioρd be the ratio of the energy of{Y m|m=1,...,M−1}to the energy of Y0. In order to define the energy shift ratioρs and also enable visualization of various aspects of the convolution including the behavior of the polyphase components in response to the M-band filters and the boundary treatment,a simple test signal called a“multiple M-spike”has been designed.This test signal has M-channels in which each channel has impulses near the beginning, distributed through the middle,and at the end of the signal,but the impulses for each channel are shifted relative to each other by one time index.Thus,each channel is intended to test a different polyphase component.In conjunction with this test signal,the energy shift ratioρs has been defined to track the energy displaced by the phase shifts of the convolution.This measure, computed by tracking energy in blocks of length R for all M channels of the M-spike test signal, has values in the range0≤ρs≤1with a value ofρs=0indicating that no energy has been displaced by more than R time units.Note however that the impulses in each channel of the M-spike test signal must be spaced more than R time units apart in order for this measure to be meaningful.C.Multi-Level TransformsGiven analysis and synthesisfilter bank coefficients specified by F and G(Section II-A)used to construct downscaling and upscaling single-level convolution operators specified by D m and U m (Section II-B),then a multi-level transform algorithm can be specified as the procedure by which D m and U m(sized appropriately for each level l)are used iteratively to process the input signal and compute the output transform.For an L-level M-band wavelet transform which iterates on the lowpassfilter band indexed m=0,a pseudo-code template for the forward transform algorithm can be written as10TASWELL:REPRODUCIBILITY STANDARDS FOR WAVELET TRANSFORM ALGORITHMSY00=Xfor l=0:L−1for m=0:M−1Y l+1m=D l m Y l0endendand for the inverse wavelet transform algorithm asˆX L=Y L0for l=L:−1:1ˆX l−1 0=U l0ˆX l0+M−11U l m Y l mendˆX=ˆX0with specific algorithms requiring definition of the object structures used for storage of the coefficients(or alternatively,the sequence of coefficients in an outputfile)in a manner analogous to the example published in ACM TOMS Algorithm735[5].Thus,a minimal specification for reproducibility of a multi-level transform algorithm requires a)thefilter bank coefficients F and G,b)the single-level convolution operators D l m and U l m, c)the algorithmic scheme by which the convolution operators are iterated,d)the parameter L for the number of levels of iteration,and e)the transform coefficient object structures with locations of coefficients in the object structures orfile output sequences.Additional characterization for verifiability of the multi-level transform algorithm may also include:a)known sequences of transform coefficients for given sequences of test signal coefficients,and b)the reconstruction error E for the test signals under various norms and conditions.For example,degradation of the signal can be tracked through multiple cycles of decomposition and reconstruction:ˆX=Xfor k=1:KY=fwt(ˆX)ˆX=iwt(Y)E(k)=wtre(X,ˆX)endwhere the function fwt is the forward wavelet transform,iwt the inverse wavelet transform,and wtre the wavelet transform reconstruction error.Plots of E(k)versus k can be used to obtain empirical estimates of the error growth rates as a function of the cycle k.D.Error TypesReporting any error value also requires that the type of error be specifimon error types include those defined by the p vector norms.In addition,let the following elementwise error types be defined for an arbitrary matrix X and its estimateˆX with respect to the matrix elements x ij andˆx ij:the maximum absolute value error|x ij−ˆx ij|,mav(X,ˆX)=maxi,jthe maximum relative value errormrv(X,ˆX)=max|(x ij−ˆx ij)/x ij|,i,jand the maximum mixed value errormmv(X,ˆX)=max|x ij−ˆx ij|/(1+|x ij|).i,jAll errors reported in Section III-A are maximum absolute value errors.Errors reported in Sections III-B,III-C,and III-D are maximum mixed value errors unless noted otherwise.E.Software and HardwareNumerical and graphical results reported here were computed with Version4.4a3(29-Dec-96) of W A V B3X Software[18],[19],[17]running under Version4.2c.1(3-Oct-94)of the MATLAB technical computing environment[26]on a Toshiba Tecra720CDT with a133MHz Pentium and the Windows95operating system.III.ResultsAll computations were performed for a critically sampled wavelet transform multiratefilter bank system with R=M=2.In analogy with the use of the term wavelet to refer tofilters and functions corresponding to the highpass band,the term scalet will be used to refer tofilters and functions corresponding to the lowpass band.A.Filter BanksThe Daubechies’compact orthogonal least-asymmetricfilters[27]of length N=8were gener-ated with the algorithm described by Taswell[28],[29],[15].Sign,phase,and norm were chosen such that the coefficient f00=−7.577×10−2.Coefficients of allfilters in thefilter bank were normalized in the 2-norm to one.Tests of the scalets(lowpassfilters f0and g0)yielded results of v=0vanishing moments and h=1.403Holder regularity estimates.The wavelets(highpass filters f1and g1)were also tested and confirmed to have v=4vanishing moments with an error of8.49×10−12.All of thefilters were confirmed to be orthogonal with an error of4.22×10−13. Values of∆=7and =4.22×10−13for thefilter banks F and G were obtained with the modified Nayebi-Barnwell-Smith perfect reconstruction test[20],[16].B.Single-Level ConvolutionsA circularly-periodized convolution type was chosen for the single-level decomposition and reconstruction steps and was tested with a quadruple M-spike M-channel test signal with M=2. Figure1displays two different phase variants of this convolution type:a causal analysis variant called peak non-aligned with phase delaysα=[0,0;0,0;0,0]andβ=[0,0;0,0;−7,−7],and an anti-causal analysis variant called peak near-aligned with phase delaysα=[1,1;−2,−3;0,0]and β=[0,0;2,3;−8,−8].The reconstruction error wasε=2.96×10−13for both phase variants. The energy conservation and distribution ratios wereρc=1.000andρd=1.000for both phase variants.The energy shift ratio wasρs=0.954andρs=0.084for the peak non-aligned and near-aligned variants,respectively.C.Multi-Level TransformsUsing the configurations as described in Sections III-A and III-B,the single-level steps were iterated to L=5levels on a single-channel test signal called“peaks&chasms”with length512 samples.Figure2displays the approximations output by the scalets and details output by the wavelets for each of the levels and each of the phase variants.In the usual“discrete wavelet transform”or“fast wavelet transform”,only the wavelet details from levels l=1,...,5and the scalet approximation from level l=5would be retained for storage or further processing as the non-redundant transform.The single-level steps were also iterated to L=5levels,and tested for K=100cycles of forward and inverse transforms on a single-channel test signal called“random normal”withlength512samples.Figure3displays log-log plots of the reconstruction error E(k)as a function of k.Linear regression estimates of the slopes of the error curves for each of the 1, 2,and ∞error norms resulted in values of1.00yielding the empirical observationlog10E(k)=E(1)+log10k.Values of E1(1)=1.34×10−10,E2(1)=7.36×10−12,and E∞(1)=9.56×10−13were obtained for the 1, 2,and ∞error norms,respectively.D.Application to Fast Matrix MultiplicationAgain using the configurations as described in Sections III-A and III-B,the single-level steps were iterated to L=4levels in a separable2-D wavelet transform for an application to fast-wavelet-based matrix multiplication as described by Beylkin et al.[8].Using their examples#1 and#2called here“BCR1”and“BCR2”,test matrices of size128×128were multiplied in their natural domain,the wavelet domain using the standard forms of the matrices(SFM),and the wavelet domain using the non-standard forms of the matrices(NFM),both with thresholding (t=1×10−4)and without thresholding(t=0).Table I summarizes the errors computed relative to multiplication in the natural domain assumed to be the correct product.Causal peak non-aligned and anti-causal peak near-aligned phase variants are abbreviated with the labels“Null”and“Peak”respectively.Tables II and III list the data compression numbers N2f for a range of values of the fraction f(see[30]for the definition of N2f)as well as the relative fractional change (RFC)in N2f for the Peak variant in comparison with the Null variant.The test matrix BCR1 in both standard and non-standard forms provides an example for which the Null and Peak convolution phase variants do not impact the compression of the matrix operator.However,the test matrix BCR2in both standard and non-standard forms provides an example for which the different phase variants do affect the compression of the matrix operator with the Peak variant improving the compression relative to the Null variant.IV.DiscussionA.Wavelet Transform AlgorithmsAs the number of applications and use of wavelet transforms continue to grow,so does the number of classes and variations of wavelet transform algorithms.All of these algorithms incor-porate a convolution with a kernel in some implementation,typically,as part of an iteratedfilter。