Electronystagmographic Findings in a Case of Lermoyez's Syndrome

合集下载

进出口货物名称中英对照(113)

进出口货物名称中英对照(113)

electronic test equipment 电⼦测试设备 electronic test pattern generator 电⼦测试图像发⽣器 electronic tester 电⼦式测试器 electronic therm static heat circulator 电⼦恒温热循环器 electronic thermometer 电⼦体温计 electronic thermostat 电⼦恒温器 electronic thickness gauge 电⼦测厚仪 electronic timer 电⼦定时器 electronic timing machine 电⼦校时机 electronic tonometer 电⼦眼压计 electronic torch generator 电⼦⽕炬发⽣器 electronic torch 电⼦⽕炬 electronic totalizer 电⼦累积器 electronic toy 电⼦玩具 electronic traffic-recording machine 电⼦话务记录机 electronic transducer 电⼦换能器 electronic transfer unit 电⼦转接器 electronic transformer 电⼦变压器 electronic translator 电⼦翻译器 electronic transmission densimeter 电⼦透射密度计 electronic treating device for paralysis 电⼦截瘫治疗仪 electronic tube amplifier 电⼦管放⼤器 electronic tube generator 电⼦管信号发⽣器 electronic tube oscillator 电⼦管振荡器 electronic tube 电⼦管 electronic tube-type amperemeter 电⼦管式电流计 electronic type automatic voltage regulator 电⼦式⾃动电压调整器 electronic type regulator 电⼦式调节器 electronic typewriter 电⼦打字机 electronic universal shaving machine 电⼦通⽤剃须⼑ electronic universal thermometer 电⼦通⽤温度计 electronic unscrambler 电⼦辨⾳器 electronic vacuum dilatometer 电⼦真空膨胀计 electronic valve type power directional relay 电⼦管功率定向继电器 electronic valve 电⼦阀 electronic ventilator 电⼦呼吸机 electronic vertical long-period seismometer 电⼦⽴式长周期⼦地震仪 electronic video recorder 电⼦录像机 electronic viewfinder 电⼦取景器 electronic voltage regulator 电⼦式电压调节器 electronic voltmeter 电⼦电压表 electronic voltohmmeter 电⼦伏欧表 electronic walk helper 电⼦助⾏器 electronic watch 电⼦表 electronic weigher 电⼦秤 electronic width gauge 电⼦测宽仪 electronic wobbulator 电⼦摆频振荡器 electronic yarn clearer 电⼦清纱器 electronic yarn selector 电⼦选纱器 electronical time relay 电⼦式时间继电器 electronically conducting glass 电⼦导电玻璃 electronically conductive glass 电⼦导电玻璃 electronically controllable coupler 电⼦控制耦合器 electronically controlled telephone exchange 电⼦控制电话交换机 electronically operated mill ⾃动控制轧机 electronically tunable filter 电⼦可调滤波器 electronystagmograph 眼球震颤描记器 electrophone 送受话器 electrophonoide apparatus 电助听训练器 electrophonoide 电助听训练器 electrophoresis apparatus 电泳器 electrophoresis scanner 电泳扫描器 electrophoretic image display 电泳成像显⽰器 electrophotographic copier 电⼦照相复印机 electrophotographic copy paper 电⼦照相复印纸 electrophotographic microfilm 电⼦照相缩微胶⽚ electrophotographic paper 电⼦照相感光纸 electrophotographic printer 电⼦照相印刷机 electrophotographic printing paper 电⼦照相印刷纸 electrophotographic projector printer 电⼦照相投影复印机 electrophotographic recording paper 电⼦照相记录纸 electrophotometer 光电光度计 electrophysiology signal processor 电⽣理学信号处理机 electroplane camera 光电透镜摄像机 electroplate liquid 电镀液 electroplate zinclead wire 电镀锌铅丝 electroplating bath 电镀槽 electroplating film machine 电镀膜机 electroplating filter 电镀滤器 electroplating machine 电镀机 electroplating meter 电镀仪 electropneumatic actuator 电动⽓动致动器 electropneumatic brake 电动⽓动制动器 electropneumatic contactor 电动⽓动接触器 electropneumatic controller 电动⽓动控制器 electropneumatic converter 电动⽓动变换器 electropneumatic fire detector 电⽓联动⽕情探测器 electropneumatic positioner 电⽓定位器 electropneumatic pusher 电动⽓动推车器 electropneumatic regulator 电动⽓动调节器 electropneumatic switch machine 电动⽓动转辙机器 electropneumatic switch 电动⽓动开关 electropneumatic transducer 电动⽓动变换器 electropneumatic valve positioner 电⽓阀门定位器 electropneumatotherapy instrument 喉感应电疗仪 electropneumograph 电⼦呼吸记录器 electropolarized relay 极化继电器 electroprobe 电笔 electroptic range finder 光电测距仪 electropulse engine 电脉冲发动机 electropyrometer 电阻⾼温计 electroradiometer 放射测量计 electroretinograph 视膜电流描记器 electroscope 验电器 electrosensitive metallic paper 电敏⾦属纸 electrosensitive paper 电感光纸 electrosensitive printer 电灼式打印机 electroslag welder 电渣焊机 electroslag welding machine 电渣焊机 electrosleep apparatus 电催眠设备 electrosol 电溶胶 electrosparking & machinery tool grinding machine 电⽕花机械复合⼯具磨床 electrosparking machine 电⽕花加⼯机床 electrosparking photo-electric tracking wire-cutting machine 电⽕花光电控线切割机床 electrostatic accelerator 静电加速器 electrostatic actuator 静电激励器 electrostatic air cleaner 静电空⽓净化器 electrostatic altimeter 静电⾼度计 electrostatic analyzer for paper 静电纸张测试仪 electrostatic analyzer 静电分析器 electrostatic beam positioner 静电横臂调位器 electrostatic cathode-ray tube 静电阴极射线管 electrostatic chest 静电柜 electrostatic condenser 静电电容器 electrostatic copying and plate-making machine 静电复印制版机 electrostatic copying machine 静电复印机 electrostatic copying paper 静电复印纸 electrostatic dehydrator 静电脱⽔器 electrostatic detarrer 静电焦油捕集器 electrostatic dust collector 静电除尘器 electrostatic dust precipitator 静电除尘器 electrostatic electron lens 静电型电⼦透镜 electrostatic electron microscope 静电式电⼦显微镜 electrostatic electron mirror microscope 静电电⼦反射镜式显微镜 electrostatic electron spectrometer 静电电⼦谱仪 electrostatic electron-velocity analyzer 静电电⼦速度分析仪 electrostatic energy analyser 静电能量分析仪 electrostatic energy storage spot welder 静电能储存式点焊机 electrostatic filter 静电过滤器 electrostatic fluid depositor 静电式液体沉淀器 electrostatic gas cleaner 静电净⽓器 electrostatic generator 静电发⽣器 electrostatic ground detector 静电式接地检测器 electrostatic hand gun 静电⼿提式喷枪 electrostatic image displaying machine 静电显像机 electrostatic immersion lens 静电浸没透镜 electrostatic instrument 静电式仪表 electrostatic lens 静电透镜 electrostatic loud-speaker 静电扬声器 electrostatic magnetic β-spectrometer 复合式静电β磁谱仪 electrostatic memory tube 静电存储管 electrostatic memory 静电存储器 electrostatic meter 静电计 electrostatic microphone 静电式话筒 electrostatic microscope 静电显微镜 electrostatic motor 静电电动机 electrostatic nebulizer 静电雾化器 electrostatic oiler 静电涂油机 electrostatic ore separator 静电选矿机 electrostatic oscillograph 静电⽰波器 electrostatic oscillometer 静电⽰波仪 electrostatic pickup 静电拾⾳器 electrostatic plotter 静电绘图仪 electrostatic potential dynamic testing instrument 静电电位动态测试仪 electrostatic powder coating gun 静电粉末喷涂枪 electrostatic power generator 静电发电机 electrostatic precipitator for chemical industry 静电化⼯滤尘器 electrostatic precipitator 静电滤尘器 electrostatic printer 静电印刷机 electrostatic receiver 静电式受话器 electrostatic recorder 静电记录仪 electrostatic relay 静电继电器 electrostatic scanner 静电扫描器 electrostatic screen printing machine 静电丝印刷机 electrostatic seismometer 静电地震检波器 electrostatic separator 静电分选机 electrostatic spectrometer 静电谱仪 electrostatic sprayer 静电喷涂机 electrostatic spraying gun 静电喷涂枪 electrostatic spun yarn 静电纺纱 electrostatic storage 静电存储器 electrostatic stored energy welder 静电蓄能焊机 electrostatic strip-oiling apparatus 静电涂油机 electrostatic transducer 静电式换能器 electrostatic transformer 静电式变压器 electrostatic treater 静电处理器 electrostatic voltmeter 静电电压表 electrostatic wattmeter 静电⽡特计 electrostatographic paper 静电记录纸 electrosteel 电炉钢 electrostethograph 电⼼⾳描记器 electrostethophone 电扩⾳听诊器 electrostimulator 电⼦剌激器 electrostriction vibrator 电致伸缩振动器 electrostrictive relay 电致伸缩继电器 electrosurgery unit 电外科设备 electrosurgical switching pencil 电动转换⼿术⼑ electrotherapy apparatus 电疗设备 electrothermal blowing dry box 电热⿎风⼲燥箱 electrothermal constant-temperature dry box 电热恒温⼲燥箱 electrothermal furnace 电热炉 electrothermal generator 电热发⽣器 electrothermal meter 热丝电流计 electrothermal printer 电热打印机 electrothermic instrument 电热式仪表 electrothermic regulator 电热调节器 electrothermostat 电热恒温箱 electrotimer 电⼦定时器 electrotypograph 电⼦排字机 electrovalve 电⼦阀 electrovibrator 电⼦振荡器 electrowelding machine 电焊机 electrowelding net 电焊 Electrum 埃雷克特鲁⾦银合⾦ electrum 琥珀⾦ elegreen 甲基柑青醛 elektrionised oil ⾼压放电合成油 Elektron alloy 埃雷克特龙镁铝锌合⾦ Elema heating resistor 埃莱马加热电阻器 Elema 硅碳棒 Elemass 电动多尺⼨检查仪 element antenna 振⼦天线 element cloth 防⽔布 element forming machine 元件成形机 element lamp 元素灯 elemental analyzer 元素分析仪 elemental crystal furnace 单晶炉 elemi 榄⾹脂 Elena 依丽娜 eleometer 油度计 elephant bells 喇叭裤 elephant crepe 双绉 elephant paper ⼤画纸 elephant shape jelly 象形软糖 elephant towelling 浮松布 elephant transformer ⽆套管式⾼压屋内变压器 elephant tubing 象⿐管 eletric etcher 电解蚀刻器 eletrician's scissors 电⼯剪 eletro-hydraulic steering gear 电动液压舵机 eletroconductive resin 导电树脂 eletromechanical hammer 电动机械锤 elevated single-track trolley bus ⾼架单轨电车 elevating grader 升运平路机 elevating loader 提升式装载机 elevating motor 升降电动机 elevating piler 升降堆垛机 elevating platform truck 带升降台的载重汽车 elevating platform 升降台 elevating scraper 升降式铲运机 elevating screw 升降螺丝 elevating stripper 提升卸卷机 elevating valve 升杆阀 elevation computer ⾼度计算计 elevation drive motor 仰⾓传动电动机 elevation indicator 射⾓指⽰器 elevation potentiometer 仰⾓分压器 elevation receiver 仰⾓接收机 elevation selsyn transformer 仰⾓⾃动同步机变压器 elevation selsyn 仰⾓⾃动同步机 elevation stop 仰⾓限制器 elevation tracker 仰⾓跟踪器 elevation tracking cursor 仰⾓跟踪指⽰器 elevator digger 升运式挖掘机 elevator dredger 链⽃式挖泥船 elevator gear reducer box 电梯减速箱 elevator ladder dredger 链⽃式挖掘机 elevator loader 升运装载机 elevator machine 升降机 elevator periscope 升降式潜望镜 elevator platform 升降机架 elevator power-off protection device 电梯停电保护装置 elevator travel motor 升降电动机 elevator type furnace 升运式电炉 elevator type loader 升运式装载机 elevator 升降机 ELF 埃勒夫牌汽车 Elgeet lens 美国爱尔吉特镜头 Elgetol 30 ⼆硝甲酚 Elgetol 318 地乐酚 Elgetol ⼆硝甲酚 Elgiloy 埃尔吉洛伊⾮磁性合⾦ Elgin 爱⽽近牌⼿表 Elianite 埃利阿奈特耐蚀⾼硅铁基合⾦ eliminator 排除器 Elimite 氯杀螨 Elinvar 埃勒因⽡恒弹性镍铁合⾦ elixir 酏剂 elk leather 麋⽪⾰ elk side leather 多脂铬铝鞣鞋⾯⾰ elk 麂 elk's horn 麋茸 Elka-Soper 锚牌⼿表 Elkaloy 埃尔卡洛伊铜合⾦焊条 Elkonite 埃尔科奈特钨铜烧结合⾦ Elkonium 埃尔科纽姆接点合⾦ ellagic acid 鞣花酸 ellipse gear flow meter 椭圆齿轮流量计 ellipsograph 椭圆规 ellipsoid resonator 椭圆形谐振器 ellipsoidal cavity resonator 椭圆形空腔谐振器 ellipsoidal shell and tube heat exchanger 椭圆管板换热器 ellipsometer 椭圆计 elliptic function filter 椭圆函数型滤波器 elliptic pulley 椭圆形滑轮 elliptic wheel 椭圆轮 elliptical analyzer 椭圆分析器 elliptical clad fiber 椭圆包层光纤 elliptical cladding single-polarization fiber 椭圆包层单偏振光纤 elliptical compass 椭圆罗径 elliptical core fiber 椭圆芯光纤 elliptical jacket fiber 椭圆被覆层光纤 elliptical mirror 椭圆反射镜 elliptical optical fiber 椭圆形光纤 elliptical-jacket polarization-maintaining optical fiber 椭圆夹层保偏光纤 ellipticity detector 椭圆度检测器 Ellsworth cotton 埃尔斯沃思棉 elm bark 榆树⽪ elm bast 榆树⽪纤维 elm 榆⽊ Elmarit 埃马⾥特硬质合⾦ Elmendorf tearing tester 爱尔门道夫式撕裂度测定仪 elmilimess 电动测微仪 Elmo 爱慕牌照相机 Elocron ⼆氧威 Eloga 依罗格牌⼿表 elongated twill 阶梯斜纹 elongating mill 延伸轧机 elongation hood 延长罩 elongation meter 延伸仪 elongation pad 外延衰减器 Elor 爱乐牌⼿表 Elphal 埃尔法尔电泳涂铝钢带 Elsan 稻丰散 Elsholtzia oil 云⾹薷油 Elsholtzia patrini garcke ⼟⾹薷 Elsholtzia ⼤黄药 elspar vial 注射⽤爱施巴 elucaine 依鲁卡因 Elura 伊鲁拉变性聚丙烯腈纤维 eluting agent 洗提剂 elutriator 洗提器 Elva 依尔法牌⼿表 Elvalan 伊尔⽡纶 Elvaron 抑菌灵 Elverite 埃尔韦莱特耐蚀铸铁 Elwotite 埃尔沃太特硬钨合⾦ elysee work 贴花刺绣品 elysian 伊利西安波纹厚呢 elytra cloth 伊利特拉蝉翼纱 EM specimen autoprocessor 电⼦显微镜标本⾃动处理机 EM specimen penetrator 电⼦显微镜标本渗透器 EM specimen polymerizer 电⼦显微镜标本聚合器 emanameter 射⽓仪 emanation electrometer 放射性静电计 emanation electroscope 射⽓验电器 Emathlite 酸性⽩⼟ Embafume 溴甲烷 Embathion ⼄硫磷 Embauba fibre 恩鲍巴纤维 embedded heterostructure laser 嵌⼊式异质结构激光器 embedded sensor 埋置式传感器 embedded stripe double-hetero-structure laser 嵌⼊式条状双异质结构激光器 embedded switch 嵌⼊式开关。

尝试新方式创新的英语作文

尝试新方式创新的英语作文

Innovation is the key to progress,and in the realm of English composition,trying new methods can lead to fresh perspectives and engaging narratives.Here are some innovative approaches to writing an English essay that can help you stand out:1.Narrative Techniques:Instead of the traditional expository or argumentative essay,try writing a e a narrative style to engage the reader with a compelling plot, interesting characters,and a setting that brings the topic to life.2.Creative Formatting:Break away from the standard paragraph structure.Experiment with different formats such as lists,dialogues,diary entries,or even a series of letters to present your ideas.3.Multimedia Integration:If your platform allows,incorporate visual elements like graphs,charts,or images that complement your written content.This can make your essay more interactive and visually appealing.4.Personal Anecdotes:Sharing personal experiences can make your essay more relatable and e anecdotes to illustrate your points and connect with the reader on a deeper level.5.Historical or Cultural References:Enrich your essay by drawing parallels with historical events or cultural practices.This can provide a broader context and add depth to your argument.e of Metaphors and Similes:Enhance your writing by using figurative language. Metaphors and similes can help paint a vivid picture and make abstract concepts more tangible.7.Incorporate Research:Support your arguments with credible research.Cite studies, surveys,or expert opinions to lend authority to your claims.8.Interactive Elements:If possible,create an interactive essay where readers can click on links to explore further information or view related content.This can be particularly effective in digital formats.9.Voice and Tone:Experiment with the voice and tone of your writing.A conversational tone can make your essay more approachable,while a formal tone can convey seriousness and professionalism.10.Peer Review and Feedback:Before finalizing your essay,seek feedback from peers ormentors.They can provide valuable insights and suggest improvements that you might not have considered.11.Innovative Conclusions:End your essay with a twist or a thoughtprovoking question that leaves the reader contemplating the topic long after theyve finished reading.12.CrossDisciplinary Approaches:Combine insights from different fields of study to analyze your topic.This can provide a unique angle and demonstrate a wellrounded understanding.Remember,the goal of innovation in writing is not just to be different,but to enhance the clarity,interest,and impact of your message.Always consider your audience and the purpose of your essay when experimenting with new methods.。

关于electron error invoking remote method的文章

关于electron error invoking remote method的文章

关于electron error invoking remote method的文章Electron Error Invoking Remote Method: Troubleshooting GuideIntroduction:\nElectron is a popular framework for building cross-platform desktop applications using web technologies such as HTML, CSS, and JavaScript. However, like any software development framework, Electron is not immune to errors and bugs. One common error that developers may encounter is the \"Error invoking remote method\" in Electron. In this article, we will explore the causes of this error and provide troubleshooting steps to resolve it.Understanding the Error:\nThe \"Error invoking remote method\" typically occurs when there is a problem with the communication between the main process and the renderer process in Electron. The main process is responsible for managing the application's lifecycle and interacting with the operating system, while the renderer process handles rendering web pages and executing JavaScript code.Causes of the Error:\n1. Synchronous Remote Method Calls: Electron allows developers to invoke remote methods between processes using IPC (Inter-Process Communication). However, if a synchronous remote method call takes too long to complete orencounters an error, it can result in this error message.2. Missing or Incorrect Method Definition: If a remote method is not properly defined or if there are discrepancies between the main and renderer processes regarding method names or arguments, it can lead to this error.3. Asynchronous Code Execution: If there are asynchronous operations within a remote method that are not handled correctly, such as missing callbacks or unhandled promises, it can cause this error.Troubleshooting Steps:\n1. Check Method Definitions: Ensure that all remote methods are correctly defined in both the main and renderer processes. Verify that method names and arguments match exactly between processes.2. Use Asynchronous Remote Methods: Whenever possible, use asynchronous remote methods instead of synchronous ones to avoid potential blocking issues. Asynchronous methods allow for better handling of long-running operations without impacting other parts of your application.3. Handle Errors Properly: Make sure to handle errors appropriately within your remote methods. Use try-catch blocks or promise rejections to catch and handle any errors that may occur during method execution.4. Debugging: Electron provides powerfuldebugging tools that can help identify the root cause of the error. Use the DevTools to inspect and debug both the main and renderer processes, enabling you to step through your code and identify any potential issues.5. Update Electron: Ensure that you are using the latest version of Electron. Developers often release updates to address known issues and improve overall stability. Updating to the latest version may resolve the error.Conclusion:\nThe \"Error invoking remotemethod\" in Electron can be frustrating for developers, but with proper troubleshooting techniques, it can be resolved effectively. By understanding the causes of this error andfollowing the troubleshooting steps outlined inthis article, developers can overcome this issue and continue building robust and reliable Electron applications. Remember to always keep your software up-to-date and leverage debugging tools provided by Electron for a smoother development experience.。

Backscatter Electron Imaging

Backscatter Electron Imaging

Backscatter ImagingWhat is Backscatter Electron Imaging?Backscatter Electron (BSE) Imaging is a scanning electron microscopy technique that detects differences in atomic number on and below the surface of the sample. In failure analysis, BSE imaging is primarily used to detect sharp atomic number gradients, such as impurities and metal conductor voiding, under IC passivation layers.Backscattered electron imaging can locate regions of differing atomic number, such as metal voiding (see Figure 1) and high atomic number impurities, but it normally cannot diagnose the root cause of failure. Numerous mechanisms can cause metal voiding, and high atomic number impurities must be identified by other techniques before their source can be located. Backscattered electron imaging can be an important tool in assisting root cause analysis, but it is rarely used alone.One should also keep in mind that the primary electron beam energy can be varied to examine the z distribution of backscattered electron anomalies.Why Perform Backscatter Electron Imaging?Backscatter Electron (BSE) imaging should be performed to examine for metal voiding or high atomic number impurities. The BSE signal is proportional to the atomic number of the sample volume examined; therefore, BSE examination should not be used to identify impurities that have an atomic number similar to the pure sample. Metal voiding in Al conductors produces good BSE image contrast because of the large atomic number difference (0 for the void versus 13 for Al). If a high Z barrier metal, such as TiW, is below the conductor under examination, metal voiding can be difficult to examine using BSE imaging. The large BSE signal from the high Z material can mask and BSE contrast differences caused by the metal void. BSE imaging can still be used to examine metal conductors with barrier metals, but the primary electron beam energy must be controlled so that the BSE signal originates primarily from the top level Al metal and as little BSE signal as possible originates from the barrier metal level.How is Backscatter Electron Imaging Performed?Backscatter electron imaging requires a scanning electron microscope and a backscattered electron detector. The detector is normally a large area semiconductor positioned directly over the sample. The secondary electron detector can also be used to detect backscattered electrons if the normally positively biased Faraday cage in front of the secondary electron detector's photomultiplier is grounded. This enables the backscatter electrons scattered in the direction of the secondary electron detector to be collected and differentiated from secondary electrons. Since the number of backscattered electrons is far less than the number of secondary electrons generated under the same primary electron beam conditions, beam currents 5 to 10 times greater than those used for secondary electron imaging are normally needed for adequate signal-to-noise ratios.Backscattered electrons are electrons with energies E such that 50 eV < E < E*, where E* is the primary beam energy. Unlike secondary electrons, the backscattered electrons escape from much deeper in the surface, most originating from about 1/3 or less the maximum depth of the electron beam/device interaction volume.This greatly reduces the surface effects that hamper secondary electron imaging. The major factor determining backscatter electron image contrast is the atomic number of the sample material within the interaction volume, indicating that nuclear scattering is the principle electron interaction. Because of the complex elastic and inelastic scattering processes that create backscatter electrons, no exact theory is possible, but some general comments about image expectations can be made. First, the spatial resolution is limited by the size of the interaction volume at the backscattered electron source; therefore, the spatial resolution will always be less than or equal to the secondary electron image resolution. Second, experimentation with different primary electron beam energies can improve spatial resolution depending upon the backscattered electron source and its depth below the sample surface. Finally, backscattered electron imaging is used primarily to identify metal conductor voiding and verify subsurface composition, and by definition is not a high resolution technique.Figure 1 and Figure 3 (see Photographs section) are examples of backscattered electron imaging results. Figure 1 shows metal voiding in a power bus caused by electromigration. The passivation was intact for this image. Figure 3 shows the bright contrast signal that comes from a TiW buried diffusion barrier layer under metal-1 in this two level metal IC. The metal-2 does not have a barrier layer and displays darker image contrast than the metal-1 conductors, even though more of the interaction volume intersects the metal-2 level.When is Backscatter Electron Imaging Performed?For ICs, backscattered electron imaging should be performed after more benign failure analysis techniques have been applied. The high primary electron beam energies required to generate backscattered electrons from below the IC surface will almost immediately alter the threshold voltage of exposed MOS transistors. This threshold shift results from fixed oxide change and interface trap occupancy in the oxide after exposure to primary electrons and x-rays. If MOS structures are not exposed directly to the high energy primary electron beam, the damage is minimized. Backscattered electron imaging does have the advantage of being able to probe through passivation and, to some extent, metal layers. If backscattered electron examination is indicated by other test methods, it should be applied before layer removal.For IC test structures such as electromigration serpentines, backscattered electron imaging can be applied after an open conductor or large increase in resistance is indicated. Without a MOS structure to be altered by primary beam irradiation, high energies can be used to ensure that the interaction volume reaches the structures of interest. While surface layer removal can make it easier to reach a buried conductor pattern at lower primary electron beam energies, the possibility of altering the failing conductor state during deprocessing remains a reality. Backscattered electron imaging can eliminate or reduce the need for surface layer removal during failure site localization.FiguresFigure 1 shows metal voiding in a power bus caused by electromigration. The passivation was intact for this image. Figure 2 shows the electron beam physics interaction volume (after Cole).Figure 3 shows the voding in the metal 1 layer in this two level metal IC (Photo courtesy Analytical Solutions).References on Backscatter Electron Imaging1."Advanced Scanning Electron Microscopy Methods and Applications to Integrated Circuit Failure Analysis", Scanning Microscopy (1988).2.Scanning Electron Microscopy, Spinger-Verlag, Berlin (1985).。

英文版计算机试题及答案

英文版计算机试题及答案

英文版计算机试题及答案一、选择题(每题2分,共20分)1. Which of the following is not a function of an operating system?A. Process managementB. Memory managementC. Data storageD. File management2. In a computer network, what does the term "bandwidth" refer to?A. The width of the network cableB. The maximum rate of data transferC. The number of users connectedD. The speed of the network processor3. What is the primary purpose of a firewall?A. To prevent unauthorized access to a networkB. To encrypt dataC. To manage network trafficD. To store user passwords4. Which of the following is a type of software used for creating and editing documents?A. Spreadsheet softwareB. Database softwareC. Word processing softwareD. Graphics software5. What is the term used to describe the process of converting data from one format to another?A. Data migrationB. Data transformationC. Data conversionD. Data translation6. What does the acronym "CPU" stand for in computing?A. Central Processing UnitB. Central Processing UnitC. Computer Processing UnitD. Computing Processing Unit7. What is the function of a router in a network?A. To connect multiple networksB. To store dataC. To provide power to devicesD. To print documents8. What is the process of finding and fixing errors in software called?A. DebuggingB. PatchingC. UpdatingD. Patching9. Which of the following is a type of computer virus that replicates itself by attaching to other programs?A. TrojanB. WormC. RansomwareD. Spyware10. What is the term for the graphical representation of data on a computer screen?A. Data visualizationB. Data representationC. Data graphingD. Data mapping二、填空题(每题2分,共20分)1. The _________ is the primary memory used by a computer to store data and instructions that are currently being processed.2. A _________ is a type of software that allows users to create and edit images.3. The process of converting analog signals to digital signals is known as _________.4. A _________ is a collection of data stored in a structured format.5. The _________ is a hardware component that connects a computer to a network.6. In computer programming, a _________ is a sequence of statements that perform a specific task.7. The _________ is a type of malware that hides its presence and waits for a trigger to activate.8. A _________ is a type of software that is designed to protect a computer from unauthorized access.9. The _________ is the process of organizing and managing data in a database.10. A _________ is a type of software that allows users tocreate and edit spreadsheets.三、简答题(每题10分,共30分)1. Describe the role of a server in a computer network.2. Explain the difference between a compiler and an interpreter in programming.3. Discuss the importance of data backup and recovery in a computing environment.四、编程题(每题15分,共30分)1. Write a simple program in Python that calculates the factorial of a given number.2. Create a function in Java that takes an array of integers and returns the largest number in the array.答案:一、选择题1. C2. B3. A4. C5. C6. A7. A8. A9. B10. A二、填空题1. RAM (Random Access Memory)2. Graphics software3. Analog-to-digital conversion4. Database5. Network interface card (NIC)6. Function or procedure7. Trojan8. Antivirus software9. Database management10. Spreadsheet software三、简答题1. A server in a computer network is a powerful computer or system that manages network resources, including hardware and software, and provides services to other computers on the network, such as file storage, web hosting, and print services.2. A compiler is a program that translates source codewritten in a programming language into machine code that a computer can execute. An interpreter, on the other hand, reads and executes the source code line by line without the need for a separate compilation step.3. Data backup and recovery are crucial in a computing environment to prevent data loss due to hardware failure, software bugs, or malicious attacks. Regular backups ensure that data can be restored to a previous state in case of corruption or deletion.四、编程题1. Python Program for Factorial Calculation:```pythondef factorial(n):if n == 0:return 1 else:。

Electronholography

Electronholography

materialsElectron holographyWhat direction? Single or multidomains? Coupling between nanoparticles?Bulk samples: optical microscopy + colloidal suspension of ferro µPnanometric samples:Electron holography : sensitive to the phase changes of the electronic wave –resolution: 5 nm Electron holography—basics and applicationsHannes Lichte and Michael Lehmann Rep. Prog. Phys.71 (2008) 016102Electron Holography for the Study of Magnetic Nanomaterials John Meurig Thomas, Edward T. Simpson, Takeshi Kasama, and Rafal E. Dunin-BorkowskiAcc. Chem. Res.41, 665 (2008)Electrons = particles:F = –eE –e v ⊗BRelativistic effects:Electrons = wave:Relativistic effects:In vacuum: V=0 and A =0Ψ(r,t)= a exp (i (k 0.r –ωt)); E = h ωPossible thanks to field emission guns (spatial and energetic coherence)samplehologrambiprism wiresampleHologram writing Coherent beamSeparated in 2 beamsDeviation of beams for interferenceContrastField emission electron gunSample over half of the beamWire at + potential (biprism)Holographie électroniquevacuumHolographieélectronique reference hologramDiffractionby the wireElectron holographyWhat direction? Single or multidomains? Coupling between nanoparticles?Bulk samples: optical microscopy + colloidal suspension of ferro µPnanometric samples:Electron holography : sensitive to the phase changes of the electronic wave –resolution: 5 nm Electron holography—basics and applicationsHannes Lichte and Michael Lehmann Rep. Prog. Phys.71 (2008) 016102Electron Holography for the Study of Magnetic Nanomaterials John Meurig Thomas, Edward T. Simpson, Takeshi Kasama, and Rafal E. Dunin-BorkowskiAcc. Chem. Res.41, 665 (2008)Electrons = particles: Relativistic effects:Electrons = waveRelativistic effects:In vacuum: V=0 and A =0Ψ(r,t)= a exp (i (k 0.r –ωt)); E = h ωIn sample: V ≠0 and A ≠0p = kk = k e/ v : the electron velocityprincipe de l’holographie optiqueécriture :faisceau très cohérentréférenceéchantillonlecture : faisceau très cohérenthologrammeHolographieélectronique Optical holographyOptical holographyWriting ReadingE= (O+ R)(O+ R)*=OO* + RR* + OR* + RO*transmittancet= 1-A EU= t R= A[(C+D)R+ OD+ R2O*O+ RO*R]materialsmagnetic phase image of FeNi particles and scheme of corresponding magnetic configuration deduced fromcomparison with simulationscProfile of electric potential phaseMICROSCOPY RESEARCH AND TECHNIQUE 64:390 (2004)Electron Holography for the Study of MagneticNanomaterialsJohn Meurig Thomas, Edward T. Simpson, TakeshiKasama, and Rafal E. Dunin-Borkowski Electron holography+ +16.5 nm30.2 nma) TEM micrograph and b) size distribution (histogram) and dynamic light scattering(DLS)measurements (line) of iron oxide nanoparticles NC30with cubic-shaped morphology.a) TEM micrograph and b) size distribution (histogram) and dynamic light scattering(DLS)measurements (line) of iron oxide nanoparticles NC16with cubic-shaped morphology.Ferrite nanocubesHigh resolution TEM micrographs of cubic-shaped NC16nanoparticles Fourier transform related to the observed isolated nanoparticles.Electron Tomography in classical TEM longitudinal one, taken alongthe plane marked in red in b).global view 8kX wire @ 150V (out of interference zone )100 nm100 nmface1face2 : hol1 f2 c23hologrammes40kX fil 150V face 2face 1c u b e 2c u b e 3face 1face 2MIP= mean internal potential = ½+MAG= magnetic phase=½-magnetic cubes made of platelets on a non magnetic coreOFeO(AFM) coreFe3O4(FM) shellplain cubes2D STEM-HAADF image reconstruct the volume ofdirection indicated by the averaging the line profiles computed projection of c).side viewa bFlorea, Lucian Roiban, Ovidiu Ersenfor the Study of Magnetic NanomaterialsThomas, Edward T. Simpson, Takeshi Kasama, and41, 665 (2008)Possible thanks to field emission guns (spatial and energetic coherence)1 2。

electron idea 调式

electron idea 调式

电子(electron)是一种用于构建跨评台桌面应用程序的框架,它结合了JavaScript、HTML和CSS等技术,使开发者可以用熟悉的Web技术来构建原生的桌面应用程序。

它的设计初衷是为了简化桌面应用程序的开发过程,实现一次编写,多评台运行的目标。

调试(debug)是开发过程中非常重要的一环,它可以帮助开发者找到并解决应用程序中的错误和问题,提高应用程序的质量和稳定性。

electron idea (electron开发工具)的调试功能尤为重要。

在进行electron应用程序的调试时,开发者常常会遇到各种各样的问题和挑战。

如何在开发过程中实时查看应用程序的运行状态?如何定位和修复代码中的错误?如何进行性能优化,使应用程序更加流畅?这些问题都需要electron idea 提供强大的调试工具来支持。

electron idea 提供了实时预览功能,开发者可以在编写代码的实时查看应用程序的运行效果。

这可以大大提高开发效率,同时帮助开发者更快地发现问题并进行调整。

electron idea 提供了强大的调试器,开发者可以在其中设置断点、单步调试和查看变量值,帮助开发者定位和解决代码中的错误。

另外,electron idea 还提供了性能分析工具,开发者可以通过分析应用程序的运行性能,找到性能瓶颈并进行优化,使应用程序更加流畅。

个人观点上,我认为electron idea 的调试功能非常强大,它为开发者提供了全方位的支持,帮助开发者更好地进行electron应用程序的开发和调试。

通过对调试工具的灵活运用,开发者可以更快地发现问题、解决问题,提高应用程序的质量和用户体验。

希望本文的内容对你有所帮助,也欢迎你共享更多关于electron idea 的调试经验和心得。

电子(electron)是一个非常流行的桌面应用程序开发工具,它可以让开发者用熟悉的Web技术来构建原生的桌面应用程序。

不过,开发一个复杂的桌面应用程序还是需要经过一系列的调试和优化的过程。

electron debug 日志

electron debug 日志

electron debug 日志
在 Electron 中进行调试时,可以使用各种工具和技术来记录和分析日志。

以下是一些常用的方法:
1. 使用 `()`: 这是最简单的方法,可以在 Electron 的主进程和渲染进程中打
印日志。

然而,这种方法可能不是最有效或最易于管理的,特别是对于大规模应用。

2. 使用第三方日志库: 例如 Winston、Bunyan 或 Pino。

这些库提供了更高级的日志功能,如日志轮换、不同级别的日志记录等。

3. 使用自定义的日志系统: 你可以创建自己的日志系统,以便更好地满足你
的需求。

例如,你可以创建一个系统,将日志信息发送到数据库或远程日志管理服务。

4. 使用 Electron 的内置 `ipc` 模块: 主进程和渲染进程可以通过 `ipc` 模块
进行通信,从而在两者之间传递日志信息。

5. 使用远程调试工具: 对于更复杂的应用,你可能需要使用远程调试工具,
如Chrome DevTools。

这些工具允许你在开发过程中实时检查和调试应用。

6. 使用自定义的 DevTools 扩展: 如果你对 Electron 的 DevTools 框架熟悉,你可以创建一个自定义的 DevTools 扩展来添加你自己的日志功能。

7. 使用环境变量: 你可以设置环境变量来控制日志的输出级别。

例如,你可
以设置一个环境变量来只打印错误日志,而不打印其他级别的日志。

在调试 Electron 应用时,了解如何有效地记录和分析日志非常重要。

通过仔细分析日志信息,你可以更好地理解应用的行为,以及在出现问题时如何进行调试。

  1. 1、下载文档前请自行甄别文档内容的完整性,平台不提供额外的编辑、内容补充、找答案等附加服务。
  2. 2、"仅部分预览"的文档,不可在线预览部分如存在完整性等问题,可反馈申请退款(可完整预览的文档不适用该条件!)。
  3. 3、如文档侵犯您的权益,请联系客服反馈,我们会尽快为您处理(人工客服工作时间:9:00-18:30)。
Case eport
Auris·Nasus·Larynx (Tokyo) 21, 118-121 (1994)
Electronystagmographic Findings in a Case of Lermoyez's Syndrome
Yi-Ho YOUNG, M.D. and Chih-Hsiu Wu, M.D.
Liang. F .40
IIIII
I IIIIIIIIIIIIIIIII
I IIII
I IIIIIII
1992.8.26.
110"
12oY,ec
-10 0 10 ,.. 20 III ~ 30 40 ~ CD 50 ...J 1:11 60 70 "E to CD 80 J: 90 100 110
(PO--
Department of Otolaryngology, National Taiwan University, Taipei, Taiwan
A 40-year-old female patient with Lermoyez's syndrome is presented. Prior to the vertiginous attack, right low-tone hearing loss and tinnitus were noted. During the vertiginous attack, spontaneous nystagmus was directed to the right (iesioned) side, with improvement of cochlear symptoms. After the vertiginous attack, nystagmus was positional rather than spontaneous, and was directed to the left (opposite) side, with the subsidence of cochlear symptoms. One week later, follow-up audiometry revealed bilateral normal hearing. Lermoyez's syndrome is considered to be a variant of Meniere's disease. 1,2 Many studies of Lermoyez's syndrome have been from an audiological perspective, emphasizing the occurrence of endolymphatic hydrops by means of electrocochleography/,4 with little attention towards vestibular function. In patients with an acute attack of Meniere's disease, change of direction of spontaneous nystagmus is observed5; however, there is no report of whether it also occurs in cases of Lermoyez's syndrome. Recently, we encountered a patient with Lermoyez's syndrome, and recorded the evolution of nystagmus before, during, and after the vertiginous attack. This paper discusses this syndrome from the vestibular perspective.
Liang, F,40
m
~
..J
I: .;::
1i > GI
CI
J:
tV GI
-10 0 10 20 30 40 50 60 70 80 90 100 110
-
V"--( H
lr
1992. 9.4.
125 250 500 1000200040008000
Frequency (Hz)
Fig. 4. Audiogram, 10 days after vertIgmous attack, reveals bilateral normal hearing.
......,.(p
L, V
~lf
........ V
...(1)-
.
1992 .8.27.
125 250 500 1000 2000 4000 8000
Frequency (Hz)
Fig. 3. Audiogram and ENG findings after vertiginous attack. There is bilateral hearing improvement with positional nystagmus beating to the left side.
~
V
.JD----'i-
1992. 8.26.
125 250 500 1000 2000 4000 8000
Frequency (Hz)
Fig. 2. Audiogram and ENG findings during vertiginous attack. Improving hearing of both ears with spontaneous nystagmus beating to the right side are observed.
/J
~
V
......-. t -
~~
L V
.1.
~LY
1992. 8.24.
125
250 500 1000200040008000
Frequency (Hz)
Fig. 1. Audiogram and ENG findings before vertiginous attack. Bilateral low-tone hearing loss ( especially in the right ear) and direction preponderance to the left side of optokinetic after-nystagmus ( arrow) are seen.
Auris·Nasus·Larynx (Tokyo) Vol. 21 (1994)
119
Liang, F, 40
I I I
I I I I
I I I I
I I II I
I I I I I I I I I I I I I I I I I I
I I
1992.8.27.
12oi'sec
-10 0 10 ,.... 20 !XI 30 ~ 40 Qj > III 50 ..J 60 CI 'E 70 III 80 :I: 90 100 110
CASE REPORT
The patient was a 40-year-old female, a physician at our hospital. She had been previously diagnosed as having Meniere's disease of the right ear, and had suffered three vertiginous attacks in the past three years. On August 24, 1992, she noted a sensation of fullness, tinnitus, and hearing loss in both ears on waking in the morning. The right ear was much more severely affected than the left. Audiometry showed right low-tone hearing loss, and examination of eye movement revealed directional preponderance of optokinetic after-nystagmus beating to the left side (Fig. 1). The tentative diagnosis was acute low-tone hearing loss of the right ear and she was admitted for further investigation and management. She experienced two further attacks of vertigo on the night of August 25 and the early morning of August 26, with spontaneous nystagmus directed to the right (lesioned) side. Audiometry and electronystagmography (ENG) were performed on the morning of August 26, and showed bilateral improvement of hearing, and spontaneous nystagmus beating to the right (lesioned) side (Fig. 2). However, the bothersome tinnitus and sensation of fullness in the ear subsided, and she felt much improvement of her hearing although she still experienced vertigo and remained in her bed. On the morning of August 27, she could walk about the ward with no imbalance. Repeated audiometry showed further improvement of hearing bilaterally. No spontaneous nystagmus was visible. However, positional nystagmus was present in the right lateral and left lateral position with the direction beating to the left (opposite) side (Fig. 3). There was no
相关文档
最新文档