SEC工作站指南
H3C SecCenter A1000 开局指导书(V1.00)

H3C SecCenter A1000安全管理中心开局指导书Deployment Instructions for XXX Beta Test(仅供内部使用)(For internal use)拟制: Drafted by: 谢剑平 日期: Date: 2007/04/10 审核:Reviewed by: 吕振峰 日期: Date: 2007/04/10 审核:Reviewed by: 日期: Date: yyyy/mm/dd 批准:Approved by:日期: Date:yyyy/mm/dd华为3Com 技术有限公司Huawei-3Com Technologies Co., Ltd.版权所有 侵权必究 All rights reserved修订记录Revision Records目录 Catalog1. 介绍Introduction (5)1.1.系统介绍Instruction to the System (6)1.2.组网介绍Introduction to Networking (6)1.3.系统结构介绍Introduction to System Architecture (8)硬件规格 (8)SecCenter A1000支持的数据采集方式 (9)SecCenter A1000与其它系统的通讯 (11)2. 业务配置Service Configuration (11)2.1.SecCenter A1000网络接口出厂配置 (11)2.2.SecCenter A1000系统的远程访问方式 (12)2.3.SecCenter A1000系统启动及关机 (13)2.4.SecCenter A1000的部署位置 (14)2.5.SecCenter A1000的网络接口配置 (15)2.6.通过Web方式登录SecCenter A1000 (17)SecCenter A1000 Web客户端的软件需求 (17)2.7.SecCenter A1000 License授权操作指南 (18)2.8.配置设备的syslog主机地址 (20)2.8.1.设备启用license方法 (21)2.9.SecCenter A1000采集端口配置 (22)2.10.SecCenter A1000接收网流报文操作指南 (24)Stream (24)2.10.2.SecPath防火墙二进制流日志 (24)flow/CFlow (24)2.10.4.网流报文正常接收验证 (25)2.11.Windows主机操作指南 (26)2.11.1.手动增加Windows主机方法 (26)2.11.2.主机启用license方法 (27)2.11.3.Windows WMI接口测试 (28)2.11.4.主机采集监视策略设置 (29)2.12.Unix主机操作指南 (31)2.12.1.手动增加Unix主机方法 (31)2.12.2.主机启用license、采集监视及策略配置方法 (32)2.12.3.Unix主机的syslog发送、SSH接口配置方法 (32)2.13.数据库DB Audit操作指南 (32)3. 目前还存在的问题,需要安装维护中注意的事项Current Problems and Matters Deserving Attention in Installation and Maintenance (33)3.1.报告数据滞后问题 (33)3.2.报告无数据输出问题 (33)3.3.Forensics查询数据滞后问题 (33)3.4.手动删除设备后不能再自动发现设备问题 (33)3.5.进程重新启动问题 (34)3.6.License失效问题 (34)3.7.DB Audit功能无操作成功提示问题 (35)3.8.Unix主机使用SSH接口无连接测试问题 (36)4. 扩容及升级Expansion and Upgrade Method (37)4.1.采用外部存储系统保存原始数据配置方法 (37)4.2.SecCenter A1000系统升级方法 (38)4.3.分布式部署SecCenter A1000 (42)4.3.1.分布式部署SecCenter A1000组网方式 (42)4.3.2.分布式部署SecCenter A1000软件定制方法 (43)4.3.3.分布式部署方式下的license授权问题 (48)开局指导书Customer sites Deployment Instructions关键词:Key words:防火墙、IPS、IDS、Windows主机、Unix主机、Syslog、NetStream、NetFlow、数据库、法规遵从报告、Web管理界面、数据库审计。
电化学工作站(简易说明)

________________________________________________________________________Technique CommandUse this command to select an electrochemical technique.This command presents an Electrochemical Techniques dialog box:The following options allow you to select an electrochemical technique:Technique SelectionSelect the electrochemical technique you want to use. This box lists the techniques available in the instrument. Double clicking the technique you want to select is equivalent to selecting the technique and clicking the OK button.Polarographic ModeCheck this box will enable the polarographic mode. In the polarographic mode, the mercury drop will be allowed to grow and be dislodged for every data point.Only a few techniques are allowed to have polarographic mode: Sampling Current (Staircase) Polarography (SCP), Differential Pulse Polarography (DPP), Normal Pulse________________________________________________________________________ Polarography (NPP), Differential Normal Pulse Polarography (DNPP), A.C. Polarography (ACP), and Second Harmonic A.C. Polarography (SHACP).Once polarographic mode is enabled, stripping mode is disabled. In order to set stripping mode by using the Stripping Mode command in Control Menu, you have to uncheck the polarographic mode.This command has a toolbar button:________________________________________________________________________Parameters CommandUse this command to set experimental parameters.This command presents a Parameter dialog box so you can select the parameters you want to use.Depending on the technique, the parameters dialog box will be different. The followings are the parameters for different techniques:Parameters for Cyclic VoltammetryParameters for Linear Sweep VoltammetryParameters for Sampled Current VoltammetryParameters for Tafel PlotParameters for ChronoamperometryParameters for ChronocoulometryParameters for Differential Pulse VoltammetryParameters for Normal Pulse VoltammetryParameters for Differential Normal Pulse VoltammetryParameters for Square Wave VoltammetryParameters for A.C. VoltammetryParameters for 2nd Harmonic A.C. VoltammetryParameters for Amperometric i-t CurveParameters for Differential Pulse AmperometryParameters for Double Differential Pulse AmperometryParameters for Triple Pulse AmperometryParameters for Integrated Pulse Amperometric DetectionParameters for Bulk Electrolysis with CoulomteryParameters for Hydrodynamic Modulation VoltammetryParameters for Sweep-Step FunctionsParameters for Multi-Potential StepsParameters for A.C. ImpedanceParameters for Impedance - TimeParameters for Impedance - PotentialParameters for ChronopotentiometryParameters for Chronopotentiometry with Current RampParameters for Multi-Current StepsParameters for Potentiometric Stripping AnalysisParameters for Open Circuit Potential - TimeFor details of the parameters of each technique, see the description of individual dialog box of related techniques.This command has a toolbar button:________________________________________________________________________Parameters for Cyclic VoltammetryIn Cyclic Voltammetry (CV), potential is scanned from Init E toward either High E or Low E depending on the Init P/N. The potential will then scan back. The following diagram shows the potential waveform applied as the function of time. The current is recorded as the function of potential.The following are the experimental parameters, their range and descriptions:Parameters Range Description Init E (V)-10 - +10Initial potential High E (V)-10 - +10High limit of potential scan Low E (V)-10 - +10Low limit of potential scan Init P/NPositive or Negative Initial scan direction Scan Rate (V/s)1e-6 - 20000Potential scan rate Sweep Segments1 - 1000000Sweep segments, each segments is half cycle Sample Interval (V)1e-6 - 0.064Data sampling interval Quiet Time (sec)0 - 100000Quiescent time before potential scan Sensitivity (A/V)1e-12 - 0.1Sensitivity scale Auto SensCheck or Uncheck Automatic sensitivity switching during run Scan Complete CyclesCheck or Uncheck Scan complete cycles Auxiliary SignalRecordingCheck or Uncheck Simultaneously external signal recording when the scan rate is less than 0.25V/sNotes:P o t e n t i a l (V )Init ETime (s)High EScan Rate (V/s)Segment 1Segment 2Segment 3Low E________________________________________________________________________1.High E and Low E should be at least 0.01 V apart.2.If unreasonable High E and Low E are entered, the system will automatically readjust them.3.Depending on the Init E, High E and Low E value, the system will automatically readjust initial scan direction.4.The maximum potential scan range is 13.1V.5.The potential increment is 0.1 mV if the scan rate is below 500 V/s. The potential increment is 1 mV at the scan rate of 5000 V/s, and 4 mV at 20000 V/s.6.The sample interval can be 1 mV When the scan rate is below 1000 V/s. The sample interval is 2 mV at the scan rate of 2000 V/s, 5 mV at 5000 V/s, and 20 mV at 20000 V/s. If the scan rate is high, the data sampling interval will be automatically increased.7.When large number of sweep segments are involved, the data sampling interval will be automatically increased up to 0.02V. If the scan rate is higher than 0.5V/s, the number of sweep segments will be limited by the memory size (64000 points). If the scan rate is below 0.5V/s, the maximum data length set by the System command will take effect. When the scan rate is low, the specified sweep segments will be executed, but only limited number of segments will be stored. Large sweep segments might be useful for conditioning of electrodes.8.When scan rate is below 0.01 V/s, the sensitivity scale during run can be automatically switched according to the current level. When it is activated, the sensitivity selection will have no effect on the measurement. However, the automatic sensitivity switching range will be from 1e-8 - 0.1 A/V, instead of 1e-12 - 0.1 A/V. The Picoamp Booster will not work either. In order to select higher sensitivities, automatic sensitivity switching option needs to be disabled.9.Scan Complete Cycles will only work for Sweep Segments at 3, 5, 7, 9, (odd numbers) and if Initial E is different from High E and Low E. When it works, the last segment will stop at Initial E instead of High E or Low E.10.If the scan rate is lower than 0.25V/s, it is possible to record external voltage signal (such s spectroscopic signal) simultaneously with the voltammogram. Use the 9-pin D-connector on the real panel for signal input. Check the User's Manual for the pin-out and signal level requirements.________________________________________________________________________Parameters for Linear Sweep VoltammetryIn Linear Sweep Voltammetry (LSV), potential is scanned from Init E toward Final E.The following diagram shows the potential waveform applied as the function of time. The current is recorded as the function of potential.The following are the experimental parameters, their range and descriptions:Parameters Range Description Init E (V)-10 - +10Initial potential Final E (V)-10 - +10Final potential Scan Rate (V/s)1e-6 - 20000Potential scan rate Sample Interval (V)1e-6 - 0.064Data sampling interval Quiet Time (sec)0 - 100000Quiescent time before potential scan Sensitivity (A/V)1e-12 - 0.1Sensitivity scale Auto SensCheck or Uncheck Automatic sensitivity switching during run Auxiliary SignalRecording Check or Uncheck Simultaneously external signal recording when the scan rate is lessthan 0. 25V/sNotes:1.Init E and Final E should be at least 0.01 V apart.2.The maximum potential scan range is 13.1 V.3.When the scan rate is high, the data sampling interval will be automatically increased.P o t e n t i a l (V )Init ETime (s)Final EScan Rate (V/s)4.The potential increment is 0.1 mV if the scan rate is below 500 V/s. The potential increment is 1 mV at the scan rate of 5000 V/s, and 4 mV at 20000 V/s.5.The sample interval can be 1 mV When the scan rate is below 1000 V/s. The sample interval is 2 mV at the scan rate of 2000 V/s, 5 mV at 5000 V/s, and 20 mV at 20000 V/s. If the scan rate is high, the data sampling interval will be automatically increased.6.When scan rate is below 0.01 V/s, the sensitivity scale during run can be automatically switched according to the current level. When it is activated, the sensitivity selection will have no effect on the measurement. However, the automatic sensitivity switching range will be from 1e-8 - 0.1 A/V, instead of 1e-12 - 0.1 A/V. The Picoamp Booster will not work either. In order to select higher sensitivities, automatic sensitivity switching option needs to be disabled.7.If the scan rate is lower than 0.25V/s, it is possible to record external voltage signal (such s spectroscopic signal) simultaneously with the voltammogram. Use the 9-pin D-connector on the real panel for signal input. Check the User's Manual for the pin-out and signal level requirements.8. Linear polarization resistance plot can be obtained by the Special Plots command under the Graphics menu.Parameters for Tafel PlotIn Tafel Plot (TAFEL), potential is scanned from Init E toward Final E. The potential may be scanned back. The following diagram shows the potential waveform applied as the function of time. The logarithm of current is recorded as the function of potential.The following are the experimental parameters, their range and descriptions:Parameters Range Description Init E (V)-10 - +10Initial potential Final E (V)-10 - +10Final potential Sweep Segments1 - 2Sweep segments, each segments is half cycle Hold Time at Final E (s)0 - 100000Potential hold time atfer 1st sweep segent Scan Rate (V/s)1e-6 - 0.1Potential scan rate Quiet Time (sec)0 - 100000Quiescent time before potential scan Sensitivity (A/V)1e-12 - 0.1Sensitivity scale Auto Sens Check orUncheck Automatic sensitivity switching during runNotes:1.Init E and Final E should be at least 0.01 V apart.2.Corrosion rate calculation can be obtained by Special Analysis command under the Analysis menu.P o t e n t i a l (V )Init ETime (s)Final EScan Rate (V/s)Segment 1Segment 2Hold TimeSystem CommandUse this command to set up the serial communication port, current polarity, potential axis and current axis.This command presents a System Setup dialog box:The following options allow you to set up your system:Communication PortSelect the communication port to link the PC to the instrument.Com Port SpeedSelect the communication port speed to link the PC to the instrument. Standard is guaranteed to work with any computer. Fast may or may not work with a particularcomputer. When Fast is chosen, the real time data transfer will be done at higher scan rate or shorter sample interval.Current PolarityYou can either select cathodic current as positive current or anodic current as positive current. You should set this before experiment, otherwise the experimental results (peaks and waves) will not be reported properly.________________________________________________________________________ Potential AxisYou can set positive potential axis either left or right. This is meaningful only for voltammetric or polarographic modes.Current AxisYou can set positive current axis either up or down.Line FrequencySet line frequency according to what is applied. This helps set default sample interval in certain techniques to reduce the interference from the line frequency.Windowsif you are using English Windows, please choose English. If you are using Chinese, Japanese, or Korean Windows, check Oriental. Oriental Windows shows slightly bigger letters than English Windows. The Technique selection field may be truncated if you select English Windows. Also oriental Windows does not support certain symbols. For instance, symbol "µ" will not be displayed properly. Choose oriental Windows will use "u" instead of "µ".Data LengthThe default data length is 128K. The longer the data length, the more computer resource will be used. It is recommended not to use long data length unless necessary. Using long data length will need large computer memory such as 256M, 512M RAM or more. It will also slow down the system and prohibit other programs to run.After you change the data length setting in the System Setup command, please exit the program and restart the program so that the data length can be set properly. Otherwise the program may crash.If the data is acquired and saved with long data length setting, but read back with shorter data length setting, the program may crash. Therefore once you used long data length setting, you should not set to shorter data length later. Please think carefully before you decide to increase the data length.Save retrieve data during runCheck this option will allow data to be saved on the hard drive during run. In case experiment does not complete due to external interference or interruption, misscommunication, partial data can be recovered. This is useful for very slow experiments.Hours of experimental data can be recovered.This option is not active by default. If you do not run very slow experiments, you can re-run the experiment if the experiment is interrupted by accident.To retrieve experimental data of last run, you should use Retrieve command under the File menu.Present Data Override WarningIf your experimental data is not saved before running a new experiment or opening an existing file on the disk, your unsaved data will be overridden. This option will allow system to issue a warning before the data is lost.Save Text File As WellNormally only binary data files is saved. Binary file contains more information (including experimental control information) but small in size. This option allows you to________________________________________________________________________ save text file as well whenever you save the binary data. This is useful for those who want toexport data to other software, such as spreadsheet software.Erase ADC Calibration CoefficientsThe analog-to-digital converter (ADC) calibration coefficients are stored in the instrument non-volatile memory. ADC calibration is carried out in CH Instruments before the instrument is shipped. You use this command only if you want to recalibrate the ADC. After you erase ADC calibration coefficients, you will see a prompt of ADC calibration when you run next hardware test or experiment.________________________________________________________________________Hardware Test CommandUse this command to test the system hardware. The system will test digital and analog circuitry.After the test, the system will display the Hardware Test Results dialog box:Digital Circuitry TestThe software version and the last revision date for the Flash ROM is shown.Potential and current offset testIf test is failed, the error message will be given.Sensitivity scale testIf test is failed, the error message will be given. Most times the error is related to leakage current.Gain testThere are 3 gain stages. If test is failed, the error message will be given.Analog Test SummaryThe test results of analog circuitry are summarized. A message of “Analog circuitry test OK.” will appear if no error is detected, otherwise an error message will appear. In case there is error and the cause is due to the analog-to-digital converters, it will also be reported.If you see analog test error, please repeat the test several times and see if the error is consistent. Record the error message and contact the factory for servicing._____________________________________________________________________________________Open Circuit Potential CommandUse this command to measure the open circuit potential.The open circuit potential is the potential between the working electrode and reference electrode while no current flows through the cell. This is an important parameter. It tells you what is the initial state before you start experiment. You can then figure out if the compound under study is oxidizable or reducible.After the measurement, the system will display the open circuit potential value through the Open Circuit Potential dialog box. Click OK to close the dialog box after you read it._____________________________________________________________________________________iR Compensation CommandUse this command to test the solution resistance and the cell time constant, as well as to enable or disable automatic or manual iR compensation.This command presents an iR Compensation dialog box:The following options allow you to set iR compensation parameters:iR Comp Test ResultsIf you click the iR Test button, the system will engage solution resistance and cell time constant test. The result will be reported here.After that the system will test the stability by gradually increase the compensation level until the desired compensation level is reached or if the system is no longer stable. The actually allowed compensation level and the uncompensated resistance will be displayed.The uncompensated resistance is calculated from the measured resistance and the allowed compensation level.Please note that the maximum allowed resistance compensation may also be limited to the feedback resistor of the i/E converter.iR Comp TestBefore start iR compensation test, you should check the test parameters.Test E is the test potential where no electrochemical reaction will occur. When the system is doing test, it applies a potential step around the test potential. The test result is good only if the electrochemical cell can be equivalent to a solution resistance in series witha double layer capacitor. The range of Test E is -10V - +10V.You may adjust the potential step amplitude. The larger the amplitude, the higher the signal-to-noise ratio. However, too large amplitude may cause faradaic current to flow. A step amplitude of 0.05V is recommended. The range of Step Amplitude is 0.01 - 0.25 V._____________________________________________________________________________________ The compensation level is the percentage of resistance you want to compensate based on the measured solution resistance. The range of this parameter is 0 - 200%. The default value is 100%.Overshoot level is the criterion of the stability test. As the amount of positive feedback increases, the system might become unstable. Before the potentiostat start to oscillate, the overshoot in current response to the potential pulse will appear. The higher the allowedovershoot level, the higher the possible compensation level, but the worse the systemstability. The range of this parameter is 0 - 100%. The default level is 2%.If you click the iR Test button, the system will engage solution resistance and stability test. The result will be reported in the iR Comp Test Results Box.For more details about the iR compensation, please see “Intelligent, Automatic Compensation of Solution Resistance”, P. He, and L. R. Faulkner, Anal. Chem., 58, 517-523 (1986).iR Compensation for Next RunWhen this box is checked, the iR compensation for next run is enabled. You may not be able to enable iR compensation if the automatic compensation is set and the iR compensation test has not been conducted or the sensitivity scale has been altered. This option can also be turned on or off from Run Status command under Control menu.iR Comp EnableIf the option "Once" is chosen, the iR compensation will only be applied to next run and then disabled. If you want the same compensation conditions to be applied to the consecutive runs, choose "Always" option. Click the proper radio button to select the option.iR Comp ModeYou can choose automatic iR compensation or manual iR compensation. The automatic iR compensation will be based on the iR compensation test results. You can also choose manual iR compensation by entering the resistance value you want to compensate. Click the proper radio button to select the option.Manual Compensation ResistanceIf you select manual iR compensation, you should enter the resistance value that you want system to compensate. Be careful about the compensation level. If the compensation level is close or exceeds the actual solution resistance, the potentiostat will oscillate. Please also notice that the maximum allowed resistance compensation may be limited to thefeedback resistor of the i/E converter.This parameter has no effect if automatic iR compensation is selected.This command has a toolbar button:。
TAC vista工作站手册(内容详细)

1 Introduction
9
1.1
Structure ..................................................................................................................... 9
1.2
TAC AB, Nov 2006 04-00023-01-en
5 (96)
TAC Vista Workstation, Administering Manual
2.13 Editing a User Profile................................................................................................. 29
2.14 Activating Auto-Login in Windows........................................................................... 30
3.3
Changing the Authority for Objects ........................................................................... 45
4 Backup
47
4.1
Changing the Backup Folder...................................................................................... 47
Symantec Endpoint Protection 12.1.6 快速入门指南

Symantec™ Endpoint Protection 12.1.6 ection 快速入门指南
产品版本:12.1.6
文档版本:1
文档上次更新日期: 六月 17, 2015
法律声明
Copyright © 2015 Symantec Corporation. © 2015 年 Symantec Corporation 版权所有。 All rights reserved. 保留所有权利。
险性。 请参见第 13 页的“Symantec Endpoint Protection 的组件”。
Symantec Endpoint Protection 12.1.6 中的新增功能
此版本的 Symantec Endpoint Protection 包含的新功能如以下部分所示: ■ 系统要求 ■ Windows Embedded 平台支持 ■ 防护功能 ■ 报告 ■ 已删除或不支持的功能 ■ 文档
安装 Symantec Endpoint Protection for Mac 客户端 ....................... 27 安装 Symantec Endpoint Protection for Linux 客户端 ..................... 28 使用远程推送安装客户端 ................................................................ 29 测试 Symantec Endpoint Protection Manager 策略 .............................. 31 从何处获取更多信息 ...................................................................... 32
网神SecFox安全管理系统快速指南5.9.4.X(软件)[V16.5.1]
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网神SecFox安全管理系统快速指南声明服务修订:●本公司保留不预先通知客户而修改本文档所含内容的权利。
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网神信息技术(北京)股份有限公司北京市海淀区上地开发区开拓路7号先锋大厦目录第1章系统概述 (5)1.1系统功能 (5)1.2系统功能 (6)1.3产品形态 (6)1.4相关参考手册 (7)1.5公司地址 (7)第2章安装与卸载 (8)2.1安装光盘内容 (8)2.2安装服务器 (8)2.3卸载服务器 (8)第3章如何开始 (10)3.1启动服务器 (10)3.2登录系统 (10)第4章设备配置 (12)4.1设备监控协议配置 (12)4.1.1网络设备 (12)4.1.2安全设备 (13)4.1.3 SecGate安全网关 (13)4.1.4 Windows主机设备 (13)4.1.5 Unix主机设备 (14)4.1.6 Weblogic (15)4.1.7 Websphere (16)4.1.8 Tomcat (17)4.1.9 WebsphereMQ (18)4.1.10 Lotus Domino (18)4.1.11 IIS (20)4.1.12 Oracle数据库 (20)4.1.13 MSSQL数据库 (21)4.1.14 MYSQL数据库 (21)4.1.15 DB2数据库 (22)4.1.16 Sybase数据库 (22)4.2事件源配置 (23)4.2.1有发送功能的设备 (23)4.2.2没有发送功能的设备 (25)4.3开放端口 (26)第5章系统配置 (27)5.1服务器配置 (27)5.2采集参数配置 (28)5.3数据的备份归档设置 (29)5.4安装W INDOWS事件传感器 (29)5.5资源定义 (29)5.5.1时间资源 (29)5.5.2地址资源 (30)5.5.3端口资源 (30)5.6过滤器 (30)第6章开始使用 (32)6.1如何查看整体网络状况 (32)6.1.1网络拓扑发现 (32)6.1.2网络监控与管理 (32)6.1.3物理拓扑-机架视图 (33)6.2如何监控设备和应用的运行情况 (33)6.2.1建立监控任务 (33)6.2.2配置告警规则 (33)6.3如何监控业务的运行状态 (34)6.3.1建立业务 (34)6.3.2查看业务运行状态 (34)6.4如何进行日志审计 (34)6.4.1如何实时监视日志 (34)6.4.2如何实时分析日志 (35)6.4.3如何查询历史日志 (36)6.4.4如何对日志进行趋势分析 (36)6.5如何配置关联告警规则 (36)6.6如何创建适合自己的视图 (37)6.7如何生成报表 (37)6.7.1系统内置报表 (37)6.7.2用户自定义报表 (38)6.7.3综合审计报告 (38)系统概述系统功能SecFox安全管理系统能够统一管理企业和组织的各类基础设施节点,包括网络、安全、存储、主机等设备,以及机房供电、环境和安防等系统。
网神SecAV 3600防毒墙系统-快速使用指南V3.0概要

网御神州科技(北京有限公司
第一章产品简介.................................................................................. 4 1.1简介........................................................................................ 4 1.2确认您的防毒墙产品.......................................................................... 4 1.3网神S EC AV 3600-FS硬件特性:.................................................................4 1.3.1指示灯含义.............................................................................. 5 1.3.2固定接口属性............................................................................ 5 1.4网神S EC AV 3600-F硬件特性:..................................................................6 1.4.1指示灯含义.............................................................................. 6 1.4.2固定接口属性............................................................................ 7 1.5网神S EC AV 3600-G硬件特性:..................................................................7 1.5.1指示灯含义.............................................................................. 8 1.5.2固定接口属性............................................................................ 8 1.6网神S EC AV 3600-G2硬件特性:................................................................. 9 1.6.1指示灯含义............................................................................. 10 1.6.2固定接口属性........................................................................... 10第二章产品激活................................................................................. 12 2.1防毒墙未激活状态.......................................................................... 12 2.2激活您的防毒墙........................................................................... 12 2.2.1试用序列号............................................................................ 12 2.2.2正式序列号............................................................................. 13 2.3如何获得病毒库手动升级包................................................................... 14第三章防毒墙的网络配置......................................................................... 15 2.1确定网络配置............................................................................... 15 2.1.1网神SecAV 3600-FS默认接口配置......................................................... 15 2.1.2网神SecAV 3600-F默认接口配置.......................................................... 15 2.1.3网神SecAV 3600-G默认接口配置.......................................................... 15 2.1.4网神SecAV 3600-G2默认接口配置......................................................... 16 2.2登录防毒墙W EB控制台........................................................................ 16 2.2.1准备一台管理PC ........................................................................ 16 2.2.2登录网神SecAV 3600防毒墙.............................................................. 18网神SecAV 36源自0防毒墙-快速使用指南第一章产品简介
赛门铁克产品中文知识库文档列表

1. 赛门铁克产品中文知识库文档列表 (1)2. Symantec Endpoint Protection (SEP) 简体中文文档汇总(持续更新) (2)3. Symantec Endpoint Protection 11.0 主要文章 (8)4. NetBackup (NBU) 简体中文文档汇总(持续更新) (12)5. Backup Exec for Windows Servers (BEWS) 简体中文文档汇总(持续更新) (20)6. Backup Exec System Recovery (BESR) 简体中文文档汇总(持续更新) (30)7. Symantec Brightmail Gateway (SBG) 简体中文文档汇总(增加中) (34)8. Symantec Information Foundation 产品简体中文文档归总(持续更新) (35)9. Cluster Server (VCS) 简体中文文档汇总(持续更新) (38)10. Enterprise Vault (EV) 简体中文文档汇总(持续更新) (39)11. Storage Foundation (SF) 简体中文文档汇总(持续更新) (41)12. Volume Manager(VxVM)简体中文文档汇总(持续更新) (44)13. Volume Replicator (VVR) 简体中文文档汇总(持续更新) (45)1.赛门铁克产品中文知识库文档列表service1.symantec./SUPPORT/INTER/ent-securitysimplifiedchinesekb.nsf/cn_docid/本文档翻译自英文文档。
原英文文档可能在本翻译版发布后进行过修改更新。
赛门铁克对本翻译文档的准确度不做保证。
情形按照产品分类,将现有中文知识库文档汇总,以方便各位查阅。
解释Security (安全产品)•Symantec Endpoint Protection (SEP)•Symantec Brightmail Gateway (SBG)•Symantec Mail Security for SMTP (SMS)Availability (存储产品)•Symantec Backup Exec (BEWS)•Symantec Backup Exec System Recovery (BESR)•Symantec Cluster Server (VCS)•Symantec Enterprise Vault (EV)•Symantec NetBackup (NBU)•Storage Foundation (SF)•Symantec Volume Manager (VxVM)•Symantec Volume Replicator (VVR)•文档号:最近更新: 2009-12-02Date Created: 2009-10-15产品: All Products2.Symantec Endpoint Protection (SEP) 简体中文文档汇总(持续更新)本文档翻译自英文文档。
信息安全基础知识

– 过分繁杂的安全政策将导致比没有安全政策还要低效的安 全。需要考虑一下安全政策给合法用户带来的影响,在很 多情况下如果用户所感受到的不方便大于所产生的安全上 的提高,则执行的安全策略是实际降低了企业的安全有效 性。
——《大英百科全书》
信息安全的定义
• 安全的定义
– 基本含义:客观上不受威胁;主观上不存在恐惧。
– 一种能够识别和消除不安全因素的能力,是一个持续的过程。
• 信息安全的定义
– 狭义:具体的信息技术体系或某一特定信息系统的安全。
– 广义:一个国家的社会信息化状态不受外来的威胁和伤害,一个 国家的信息技术体系不受外来的威胁和侵害。
操作系统安全级别
级别
描述
D 最低的级别。如MS-DOS,没有安全性可言
C1 灵活的安全保护。系统不需要区分用户。可提供基本的访问控 制。如目前常用的各种通用操作系统。
C2 灵活的访问安全性。系统不仅要识别用户还要考虑唯一性。系 统级的保护主要存在于资源、数据、文件和操作上。如 Windows NT 3.5/4.0、Digital UNIX、OpenVMS。
第二阶段:计算机安全
•上世纪70-80年代 – 重点是确保计算机系统中硬件、软件及正在处理、存 储、传输信息的机密性、完整性
– 主要安全威胁扩展到非法访问、恶意代码、脆弱口令 等
– 主要保护措施是安全操作系统设计技术(TCB) – 主要标志是1985年美国国防部(DoD)公布的可信计
算机系统评估准则(TCSEC,橘皮书)将操作系统的 安全级别分为四类七个级别(D、C1、C2、B1、B2、 B3、A1),后补充红皮书TNI(1987)和紫皮书TDI (1991)等,构成彩虹(Rainbow)系列。
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SEC操作指南一、SEC概述体积排阻色谱(SEC)是被用来测定大分子和聚合物类分子量分布的一门色谱科技。
运行SEC(也可以叫做GPC)可以通过进入一个样品到由已知孔径的刚性聚合物凝胶构成的柱子里,小分子渗入到孔里并且比大分子保留时间长,在SEC里不包含柱吸附,是典型的分离色谱。
因为分子的大小与它们的分子量有关,洗脱时间因此能被用来估计分子的分子量。
大分子首先洗脱出来,小分子最后被洗脱。
在使用SEC分析天然组分时(通常是高分量聚合物),能碰到一个清楚的色谱图是比较少见的,在分离色谱里能出现基线分离的峰。
因此在计算时,通常被设置成产生分子量分布(MWD)或平均分子量,而不去估计分子量的值。
因为对分子量的分布感兴趣,所以结果通常不仅只是包含平均分子量的值,同时也列出了这个样品的面积片断值,连同与它相对应的平均分子量值。
这种类型的报告叫做“Slice Report”。
二、SEC校正EZChrom Elite SEC单元提供了三种SEC校正方法:标准窄分布校正(Narrow Standard s Calibration),宽范围分布校正(Broad Range Calibration,有两种类型)和通用校正(Universal Calibration)。
注意:为校正和分子量计算,时间单位被转换成秒。
三、标准窄分布校正(Narrow Standard s Calibration)通过运行一个由已知分子量组分组成的标准品来建立校正曲线。
这种校正的标准曲线是通过与保留时间相对应的分子量的对数来绘制的(Log M)。
四、宽范围分布校正(Broad Range Calibration)将要使用的Hamielec方法:他为宽范围分布校正提供了两种可用的计算方法。
Broad Range 1是一个线性校正方法并且需要一支SEC柱来提供一条线性的校正曲线。
它仅仅使用标准聚合物的平均MW值,但是却接近GPC校正曲线的线性(标准聚合物的Mn和Mw值必须是已知的并且能通过光散射和渗透压技术检测到)。
这个方法需要一个与未知样品有相同结构的宽分子量分布(Broad-MWD)的标准品。
它也应该尽可能地在任意组合的Mn和Mw里去使用两个不同的标准分子量与两个已知的MW值。
Broad Range 2是使用一个宽范围的标准品而没有线性校正的方法。
五、通用校正(Universal Calibration)通用校正允许用一个窄范围的聚苯乙烯标准校正曲线来校正一个宽范围的聚合物。
利用流体体积之间的关系(物质的分子量M与聚合物固有的粘度[ŋ]和它的洗脱体积),窄分布校正曲线能被调整倒最精密地应用于被分析的样品。
聚合物固有的粘度[ŋ]是通过直接测量聚合物溶液粘度的试验方法测定的。
通过的聚合物分子量与Mark-Houwink等式有关。
[η]=K m aK和a是一个随聚合物种类、溶剂和温度改变的常数。
表格里包含公共的K和a常数,使用于一般的聚合物种类。
因此,使用公共的K和a值,或者是已测定的聚合物的粘度,一样都能检测出样品的分子量信息。
六、SEC的应用SEC通常被用在高分子聚合物的质量控制上。
分子量分布表示的是聚合物的物理性质。
像这种性质包含有强度、柔韧性和粘性,等等其它。
因为宽范围SEC峰的图形是可以改变的,在大多数情况下,只是检测平均分子量是不能充分说明聚合物的特征的,如两种聚合物可能有相同的平均分子量但分子量分布却非常不相同。
因此它对计算不同范围的分子量非常重要,像检测一个有效的尖峰一样(在这里可以用重叠比较辅助)来得到一个正确的聚合物分子量信息。
各种不同的分子量数值被用来表示聚合物的不同特征,如下所示:M n 数均分子量,被用来测定样品的粘性和柔韧性,是一种低分子量物质均衡性的函数。
M w 重均分子量,表示为聚合物的强度,它给出了在样品里高分子量物质的比例。
M z Z均分子量,被用来检测易脆性,并且指示样品里非常高的分子量物质的均衡性。
M v粘均分子量,被用来说明样品的平均粘度与分子量之间的关系。
M w/M n聚合度,是一个用来表示样品是如何单一的。
一个小的数值表示的是最大的单一性,或者是窄分子量分布。
较高的数值表示的是大的合成聚合物。
七、使用EZChrom Elite SEC软件EZChrom Elite SEC软件是一个可选的附件包,可以在EZChrom Elite色谱数据系统里执行SEC计算。
一旦SEC可用,它能够让用户去为已与系统连接的任意一个(或多个)仪器配置一个SEC仪器。
当在另外一个仪器上执行SEC计算时,也可以在其它的仪器上执行正常的色谱分离计算。
(注意SEC和色谱分离是明显不同的技术,因此它们不能在一个仪器里同时执行)通常,执行一个SEC计算包含以下步骤:1、运行SEC标准校正并且利用它去为SEC样品设置校正信息(方法/SEC设置,Method/SEC Setup);2、为您的分析创建一个包含您想要的图谱和SEC报告的自定义报告;3、创建一个批处理(如果需要的话)并且运行您的SEC样品。
八、运行SEC标准校正为了所有数据是正确地取样,在运行您的SEC标准校正之前,您首先必须设置采集参数并保存到您的磁盘。
您可以使用方法下的仪器设置进行操作(Method/Instrument Setup)或点击仪器设置按钮(Instrument Setup)。
九、仪器设置在方法的采集设置部分将告诉您如何从您的色谱仪上采集数据。
注意:默认1H z的数据采集频率已充分满足SEC的运行。
您可以在方法的SEC设置部分为独立的切片报告调整切片宽度(Slice Width)。
Detector 1 (x)为配置仪器上的每一个检测器通道,需要定义以下采集信息:采集通道ON(Acquisition Channel ON)选择这个单选框可以使这个通道的数据采集可用,如果这个复选框没有选择,那么这个通将不能采集数据。
采样(Sampling)这个是通过系统采集数据的频率。
您可以选择您想要的取样频率,当您选择一个取样频率时,一个说明在这个取样频率下可满足的最小峰宽的提示将会显示。
建议您为您的色谱图采用图形事件程序来测定最佳的取样频率。
频率(Frequency)这个选项的单位为H z(每秒采样数),它可以满足大多数的色谱应用。
点击下拉键头,从列表里选择可用的频率来配置您的系统。
周期(Period)当您选择这种采样方式时,您必须选择每个数据点之间的间隔秒(或毫秒)数。
确定一个数值,然后选择周期是在秒或毫秒(mSec)。
运行时间(Run time)运行时间用来确定将要取样的数据时间的长度。
采集延时(Acquisition Delay)采集延时是为这个通道在开始运行(触发器)和数据正式采集之间设置一个时间间隔。
触发(Trigger)为这个仪器从触发表单里选择一个触发类型。
触发类型(Trigger Type)确定数据采集如何开始。
没有(None):在点击Start之后数据采集立即开始,在批处理运行期间没有暂停;手动(Manual):操作者在按Enter键后开始采集数据,批处理运行期间会暂停等待确认;外部(External):如果是从一个外部的触发器开始数据采集,选择这个触发类型。
这个触发器的类型在仪器配置时已经设定好。
当您完成了采集参数设置后,点击对话框右上角的X按钮关闭对话框,然后选择File/Method/Save命令保存设置。
十、单次运行采集(Single Run Acquisition)在EZChrom Elite Client/Server里有两种方法可以采集数据。
第一种是使用批处理(为重复多样品运行),而另外一种就是使用一个单次运行。
为了使用单次运行数据采集,您必须定义被用来分析的方法名和用来保存数据的文件名。
注意:确定用来采集数据的方法,在仪器设置时采集通道已打开,采样频率和运行时间以设置好。
为了使用单次运行,您可以点击Single Run按钮或者从主菜单上点击Control/Single Run命令,以下对话框将会显示。
运行信息(Run Information)在这一段允许您为运行指定文件。
样品ID(Sample ID)为运行输入一个样品ID,这里可以包含字符和数字,并且它将会被保存在数据文件里。
方法(Method)输入一个用来采集数据和将来处理数据的方法名。
如果方法不在默认的方法目录里必须包含输入路径。
您也可以点击输入框右边的文件按钮从您磁盘的可用方法列表里选择一个方法。
数据路径(Data Path)输入一个路径名指定这次运行采集的数据将被保存在哪。
也可以点击文件按钮从您的磁盘列表里选择一个路径。
数据文件(Data File)输入一个文件名用来将数据保存到磁盘上。
不能使用一个已存在的文件名,除非这个文件存在的目录路径里包含有“Public”。
例如,如果您保存数据文件的路径命名为“C:\Public\Data”,那么保存在个目录里的数据文件可以被覆盖。
打印方法报告(Print Method Report)当这个但选框被选中,在结束运行后,这个方法报告(或它的报告)将会被打印。
总量数值(Amount Values)在这一部分,您可以输入一些值对怎样计算浓度起作用。
如果您是在准备校正方法以前做单次数据采集,那么这些值可以保持默认的值。
样品量(Sample Amount)这个样品量的数值在计算浓度期间被当作一个除数。
它是被用来做不同样品之间的称量与当已经计算的样品总量的百分数值并非这次进样所检测到的值之间的补偿。
内标量(Internal Standard Amount)为校正运行,内标量的值取自于方法的峰组份表里。
为一个未知运行,在您的未知样品里输入内标量。
倍乘因子(Multiplication Factor)为这次运行输入一个倍乘因子,所有被测量的峰将与这个因子相乘。
校正(Calibrate)这个选项仅仅用在分离色谱样品的校正上,不能用在SEC运行。
当您完成了对单次运行采集对话框的设置后,点击Start按钮开始数据采集。
当前的数据将显示在谱图窗口上,随着采集并被保存在磁盘上。
在运行结束后,谱图将根据方法参数被分析,并且会产生一个报告(如果您已经设定好)。
如果在结束采集运行后,谱图没有被分析,如果您想查看结果,可以点击Analyze 按钮对谱图进行分析。
样品描述(Sample Description)当您点击Description按钮,您可以为这个样品输入一些描述文本,它会与数据文件一起保存。
从打开文件对话框里可以查看这个描述,或者当这个文件被打开并成为当前数据时,可以通过使用Data/Properties 命令查看。
提交(Submit)当正在使用一个批处理或单运行采集当前数据时,点击Run Single按钮,这个按钮将会显示。