数字集成电路(中文)电路设计题
数字集成电路测试题
A 衬底 B 扩散区 C 有源区 D 接触孔和通孔
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Inverter
单选题 1分 最符合阈值电压定义的说法是 。
A 漏端电流为1μA时的栅源电压
B 漏端电流10倍于泄露电流时的栅源电压
衬底载流子浓度和有源区载流子浓度相 C 等时的栅源电压
芯片中的金属线和PCB中的金属线一样， A 可以是多层的。
B
CMOS集成电路是在一块正方形的硅片 上制造的。
光刻机的作用是通过激光在硅片上刻画 C 集成电路版图。
光刻胶的作用是将集成电路所需的不同 D 材料层胶合在一起。
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Inverter
D MOgrated Circuits2nd
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Inverter
单选题 1分 电路互连线上的延时td 与长度L的关系是 。
A
td L
B
td L2
C
td L3/2
D
td L3
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数字集成电路 ch1-ch4习题集
Jan M. Rabaey Anantha Chandrakasan Borivoje Nikolic
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Inverter
单选题 1分
在集成电路0.25μm工艺中，晶体管的最小沟 道长度由 决定。
A 光刻精度 B 消费者和代工厂 C 电路工程师 D 电源电压
C 无穷大的“断开”电阻和有限的“导通”电阻。
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集成电路设计原理考核试卷
4.描述模拟集成电路与数字集成电路在设计原则和实现技术上的主要区别，并给出一个实际应用中模拟集成电路的例子。
标准答案
一、单项选择题
1. B
2. B
3. D
4. D
5. B
6. D
7. C
8. C
9. B
10. D
17.在集成电路设计中，以下哪些方法可以提高电路的抗干扰能力？( )
A.采用差分信号传输
B.使用屏蔽技术
C.增加电源滤波器
D.提高工作频率
18.以下哪些类型的触发器在数字电路中常见？( )
A. D触发器
B. JK触发器
C. T触发器
D. SR触发器
19.以下哪些技术可以用于提高集成电路的数据处理速度？( )
3.以下哪些是数字集成电路的基本组成部分？( )
A.逻辑门
B.触发器
C.寄生电容
D.晶体管
4.以下哪些技术可以用于提高集成电路的频率？( )
A.减小晶体管尺寸
B.采用高介电常数材料
C.增加电源电压
D.优化互连线设计
5.在CMOS工艺中，以下哪些结构可以用来实现反相器？( )
A. PMOS晶体管
B. NMOS晶体管
11. C
12A
16. B
17. A
18. A
19. C
20. B
二、多选题
1. ABD
2. AB
3. AD
4. AB
5. AB
6. AB
7. ABCD
8. AB
9. ABCD
10. AC
11. ABC
数字集成电路--电路、系统与设计（第二版）课后练习题第六.
数字集成电路--电路、系统与设计（第⼆版）课后练习题第六.Digital Integrated Circuits - 2nd Ed 11 DESIGN PROJECT Design, lay out, and simulate a CMOS four-input XOR gate in the standard 0.25 micron CMOS process. You can choose any logic circuit style, and you are free to choose how many stages of logic to use: you could use one large logic gate or a combination of smaller logic gates. The supply voltage is set at 2.5 V! Your circuit must drive an external 20 fF load in addition to whatever internal parasitics are present in your circuit. The primary design objective is to minimize the propagation delay of the worst-case transition for your circuit. The secondary objective is to minimize the area of the layout. At the very worst, your design must have a propagation delay of no more than 0.5 ns and occupy an area of no more than 500 square microns, but the faster and smaller your circuit, the better. Be aware that, when using dynamic logic, the precharge time should be made part of the delay. The design will be graded on themagnitude of A × tp2, the product of the area of your design and the square of the delay for the worst-case transition.。
【精品】数字集成电路电路、系统与设计第二版课后练习题第六章CMOS组合逻辑门的设计
【精品】数字集成电路--电路、系统与设计(第二版)课后练习题第六章CMOS组合逻辑门的设计第六章 CMOS组合逻辑门的设计1.为什么CMOS电路逻辑门的输入端和输出端都要连接到电源电压？CMOS电路采用了MOSFET（金属氧化物半导体场效应管）作为开关元件，其中N沟道MOSFET（NMOS）和P沟道MOSFET（PMOS）分别用于实现逻辑门的输入和输出。
NMOS和PMOS都需要连接到电源电压，以使其能够正常工作。
输入端连接到电源电压可以确保信号在逻辑门中正常传递，输出端连接到电源电压可以确保输出信号的正确性和稳定性。
2.为什么在CMOS逻辑门中要使用两个互补的MOSFET？CMOS逻辑门中使用两个互补的MOSFET是为了实现高度抗干扰的逻辑功能。
其中，NMOS和PMOS分别用于实现逻辑门的输入和输出。
NMOS和PMOS的工作原理互补，即当NMOS导通时，PMOS截止，当PMOS导通时，NMOS截止。
这样的设计可以在逻辑门的输出上提供高电平和低电平的稳定性，从而提高逻辑门的抗干扰能力。
3.CMOS逻辑门的输入电压范围是多少？CMOS逻辑门的输入电压范围通常是在0V至电源电压之间，即在低电平和高电平之间。
在CMOS逻辑门中，低电平通常定义为输入电压小于0.3Vdd（电源电压的30%），而高电平通常定义为输入电压大于0.7Vdd（电源电压的70%）。
4.如何设计一个基本的CMOS逻辑门？一个基本的CMOS逻辑门可以由一个NMOS和一个PMOS组成。
其中，NMOS的源极连接到地，栅极连接到逻辑门的输入，漏极连接到PMOS的漏极；PMOS的源极连接到电源电压，栅极连接到逻辑门的输入，漏极连接到输出。
这样的设计可以实现逻辑门的基本功能。
5.如何提高CMOS逻辑门的速度？可以采取以下方法来提高CMOS逻辑门的速度：•减小晶体管的尺寸：缩小晶体管的尺寸可以减小晶体管的电容和电阻，从而提高逻辑门的响应速度。
•优化电源电压：增加电源电压可以提高晶体管的驱动能力，从而加快逻辑门的开关速度。
数字集成电路考题(2012)
集成电路考题一、填空题1、世界上第一个自动计算器是1832年。
2、Jack Kilby 提出IC 设想-—集成电路，由此获得诺贝尔奖,标志着数字时代的来临。
3、集成电路的发展按摩尔定律发展变化。
4、数字电路噪声进入的途径有电感耦合、电容耦合、电源和地的干扰。
5、N 型半导体的多子是自由电子，少子是空穴.6、P 型半导体的多子是空穴,少子是自由电子.7、二极管电流D I 与电压D V 的关系表达式为)1(/-=ΦT D V S D e I I 。
8、二极管的反向击穿类型有齐纳击穿和雪崩击穿。
9、互连线电容模型可用平行板电容模型等效，导线总电容的公式为10、互连线电容模型可用微带线模型等效，由平面电容和边缘电容构成。
11、导体为均匀的绝缘介质包围，可知一条导线的电容C 与电感L 的关系为u CL ε=。
12、CMOS 反相器噪声容限的定义有L NM 低电平噪声容限和H NM 高电平噪声容限.13、CMOS 反相器电路总功耗分为三部分,分别为dyn P 由充放电电容引起的动态功耗、dp P 直流通路电容引起的功耗、stat P 静态功耗。
14、静态CMOS 门由上拉网络PUN 和下拉网络PDN 构成。
15、CMOS 互补逻辑实现一个N 输入逻辑门所需MOS 管的个数为2N 个。
16、伪NMOS 逻辑实现一个N 输入逻辑门所需MOS 管的个数为N+1个。
17、动态逻辑实现一个N 输入逻辑门所需MOS 管的个数为N+2个。
18、动态逻辑电路工作过程分为预充电和求值两个阶段。
19、时序电路中与寄存器有关的参数分别为建立时间、维持时间、传播时间。
20、对于时钟偏差不敏感的触发器为Clocked CMOS （或为时钟控制CMOS ）。
21、2C CMOS 实现一个N 输入逻辑门所需MOS 管的个数为N+2个。
2223、半定制的电路设计方法分别是以单元为基础的设计方法和以阵列为基础的设计方法。
二、简答题1、画出双阱CMOS电路工艺顺序简化图.（P31)2、二极管的电流受工作温度的双重影响。
数字集成电路--电路、系统与设计(第二版)课后练习题 第五章 CMOS反相器
C H A P T E R5T H E C M O S I N V E R T E R Quantification of integrity,performance,and energy metrics of an inverterOptimization of an inverter design5.1Exercises and Design Problems5.2The Static CMOS Inverter—An IntuitivePerspective5.3Evaluating the Robustness of the CMOSInverter:The Static Behavior5.3.1Switching Threshold5.3.2Noise Margins5.3.3Robustness Revisited5.4Performance of CMOS Inverter:The DynamicBehavior5.4.1Computing the Capacitances5.4.2Propagation Delay:First-OrderAnalysis5.4.3Propagation Delay from a DesignPerspective5.5Power,Energy,and Energy-Delay5.5.1Dynamic Power Consumption5.5.2Static Consumption5.5.3Putting It All Together5.5.4Analyzing Power Consumption UsingSPICE5.6Perspective:Technology Scaling and itsImpact on the Inverter Metrics180Section 5.1Exercises and Design Problems 1815.1Exercises and Design Problems1.[M,SPICE,3.3.2]The layout of a static CMOS inverter is given in Figure 5.1.(λ=0.125µm).a.Determine the sizes of the NMOS and PMOS transistors.b.Plot the VTC (using HSPICE)and derive its parameters (V OH ,V OL ,V M ,V IH ,and V IL ).c.Is the VTC affected when the output of the gates is connected to the inputs of 4similargates?.d.Resize the inverter to achieve a switching threshold of approximately 0.75V .Do not lay-out the new inverter,use HSPICE for your simulations.How are the noise margins affected by this modification?2.Figure 5.2shows a piecewise linear approximation for the VTC.The transition region isapproximated by a straight line with a slope equal to the inverter gain at V M .The intersectionof this line with the V OH and the V OL lines defines V IH and V IL .a.The noise margins of a CMOS inverter are highly dependent on the sizing ratio,r =k p /k n ,of the NMOS and PMOS e HSPICE with V Tn =|V Tp |to determine the valueof r that results in equal noise margins?Give a qualitative explanation.b.Section 5.3.2of the text uses this piecewise linear approximation to derive simplifiedexpressions for NM H and NM L in terms of the inverter gain.The derivation of the gain isbased on the assumption that both the NMOS and the PMOS devices are velocity saturatedat V M .For what range of r is this assumption valid?What is the resulting range of V M ?c.Derive expressions for the inverter gain at V M for the cases when the sizing ratio is justabove and just below the limits of the range where both devices are velocity saturated.What are the operating regions of the NMOS and the PMOS for each case?Consider theeffect of channel-length modulation by using the following expression for the small-signalresistance in the saturation region:r o,sat =1/(λI D ).Figure 5.1CMOS inverter layout.InOutGND V DD =2.5V.Poly Metal1NMOSPMOSPolyMetal12λ182THE CMOS INVERTER Chapter 53.[M,SPICE,3.3.2]Figure 5.3shows an NMOS inverter with resistive load.a.Qualitatively discuss why this circuit behaves as an inverter.b.Find V OH and V OL calculate V IH and V IL .c.Find NM L and NM H ,and plot the VTC using HSPICE.d.Compute the average power dissipation for:(i)V in =0V and (ii)V in =2.5Ve HSPICE to sketch the VTCs for R L =37k,75k,and 150k on a single graph.ment on the relationship between the critical VTC voltages (i.e.,V OL ,V OH ,V IL ,V IH )and the load resistance,R L .g.Do high or low impedance loads seem to produce more ideal inverter characteristics?4.[E,None,3.3.3]For the inverter of Figure 5.3and an output load of 3pF:a.Calculate t plh ,t phl ,and t p .b.Are the rising and falling delays equal?Why or why not?pute the static and dynamic power dissipation assuming the gate is clocked as fast as possible.5.The next figure shows two implementations of MOS inverters.The first inverter uses onlyNMOS transistors.V OH V OL inV outFigure 5.2A different approach to derive V IL and V IH .V outV in M 1W/L =1.5/0.5+2.5VFigure 5.3Resistive-load inverterR L =75k ΩSection 5.1Exercises and Design Problems183a.Calculate V OH ,V OL ,V M for each case.e HSPICE to obtain the two VTCs.You must assume certain values for the source/drain areas and perimeters since there is no layout.For our scalable CMOS process,λ =0.125μm,and the source/drain extensions are 5λfor the PMOS;for the NMOS the source/drain contact regions are 5λx5λ.c.Find V IH ,V IL ,NM L and NM H for each inverter and comment on the results.How can you increase the noise margins and reduce the undefined region?ment on the differences in the VTCs,robustness and regeneration of each inverter.6.Consider the following NMOS inverter.Assume that the bulk terminals of all NMOS deviceare connected to GND.Assume that the input IN has a 0V to 2.5V swing.a.Set up the equation(s)to compute the voltage on node x .Assume γ=0.5.b.What are the modes of operation of device M2?Assume γ=0.c.What is the value on the output node OUT for the case when IN =0V?Assume γ=0.d.Assuming γ=0,derive an expression for the switching threshold (V M )of the inverter.Recall that the switching threshold is the point where V IN =V OUT .Assume that the devicesizes for M1,M2and M3are (W/L)1,(W/L)2,and (W/L)3respectively.What are the limitson the switching threshold?For this,consider two cases:i)(W/L)1>>(W/L)2V DD =2.5V V IN V OUTV DD =2.5V V IN V OUT M 2M 1M 4M 3W/L=0.375/0.25W/L=0.75/0.25W/L=0.375/0.25W/L=0.75/0.25Figure 5.4Inverter ImplementationsV DD =2.5V OUTM1IN M2M3V DD =2.5Vx184THE CMOS INVERTER Chapter 5ii)(W/L)2>>(W/L)17.Consider the circuit in Figure 5.5.Device M1is a standard NMOS device.Device M2has allthe same properties as M1,except that its device threshold voltage is negative and has a valueof -0.4V.Assume that all the current equations and inequality equations (to determine themode of operation)for the depletion device M2are the same as a regular NMOS.Assume thatthe input IN has a 0V to 2.5V swing.a.Device M2has its gate terminal connected to its source terminal.If V IN =0V ,what is the output voltage?In steady state,what is the mode of operation of device M2for this input?pute the output voltage for V IN =2.5V .You may assume that V OUT is small to simplify your calculation.In steady state,what is the mode of operation of device M2for this input?c.Assuming Pr (IN =0)=0.3,what is the static power dissipation of this circuit?8.[M,None,3.3.3]An NMOS transistor is used to charge a large capacitor,as shown in Figure5.6.a.Determine the t pLH of this circuit,assuming an ideal step from 0to 2.5V at the input node.b.Assume that a resistor R S of 5k Ωis used to discharge the capacitance to ground.Deter-mine t pHL .c.Determine how much energy is taken from the supply during the charging of the capacitor.How much of this is dissipated in M1.How much is dissipated in the pull-down resistanceduring discharge?How does this change when R S is reduced to 1k Ω.d.The NMOS transistor is replaced by a PMOS device,sized so that k p is equal to the k n ofthe original NMOS.Will the resulting structure be faster?Explain why or why not.9.The circuit in Figure 5.7is known as the source follower configuration.It achieves a DC levelshift between the input and the output.The value of this shift is determined by the current I 0.Assume x d =0,γ=0.4,2|φf |=0.6V ,V T 0=0.43V ,k n ’=115μA/V 2and λ=0.V DD =2.5VOUTM1(4μm/1μm)IN M2(2μm/1μm),V Tn =-0.4VFigure 5.5A depletion load NMOSinverterV DD =2.5VOutFigure 5.6Circuit diagram with annotated W/L ratios=5pFSection 5.1Exercises and Design Problems 185a.Suppose we want the nominal level shift between V i and V o to be 0.6V in the circuit in Figure 5.7(a).Neglecting the backgate effect,calculate the width of M2to provide this level shift (Hint:first relate V i to V o in terms of I o ).b.Now assume that an ideal current source replaces M2(Figure 5.7(b)).The NMOS transis-tor M1experiences a shift in V T due to the backgate effect.Find V T as a function of V o for V o ranging from 0to 2.5V with 0.5V intervals.Plot V T vs.V oc.Plot V o vs.V i as V o varies from 0to 2.5V with 0.5V intervals.Plot two curves:one neglecting the body effect and one accounting for it.How does the body effect influence the operation of the level converter?d.At V o (with body effect)=2.5V,find V o (ideal)and thus determine the maximum error introduced by the body effect.10.For this problem assume:V DD =2.5V ,W P /L =1.25/0.25,W N /L =0.375/0.25,L =L eff =0.25μm (i.e.x d =0μm),C L =C inv-gate ,k n ’=115μA/V 2,k p ’=-30μA/V 2,V tn0=|V tp0|=0.4V,λ =0V -1, γ=0.4,2|φf |=0.6V ,and t ox =e the HSPICE model parameters for parasitic capacitance given below (i.e.C gd0,C j ,C jsw ),and assume that V SB =0V for all problems except part (e).Figure 5.7NMOS source follower configuration V DD =2.5V V iV oV DD =2.5VV i V oV bias =(a)(b)I o1um/0.25um M1186THE CMOS INVERTER Chapter 5##Parasitic Capacitance Parameters (F/m)##NMOS:CGDO=3.11x10-10,CGSO=3.11x10-10,CJ=2.02x10-3,CJSW=2.75x10-10PMOS:CGDO=2.68x10-10,CGSO=2.68x10-10,CJ=1.93x10-3,CJSW=2.23x10-10a.What is the V m for this inverter?b.What is the effective load capacitance C Leff of this inverter?(include parasitic capacitance,refer to the text for K eq and m .)Hint:You must assume certain values for the source/drain areas and perimeters since there is no layout.For our scalable CMOS process,λ =0.125μm,and the source/drain extensions are 5λfor the PMOS;for the NMOS the source/drain contact regions are 5λx5λ.c.Calculate t PHL ,t PLH assuming the result of (b)is ‘C Leff =6.5fF’.(Assume an ideal step input,i.e.t rise =t fall =0.Do this part by computing the average current used to charge/dis-charge C Leff .)d.Find (W p /W n )such that t PHL =t PLH .e.Suppose we increase the width of the transistors to reduce the t PHL ,t PLH .Do we get a pro-portional decrease in the delay times?Justify your answer.f.Suppose V SB =1V,what is the value of V tn ,V tp ,V m ?How does this qualitatively affect C Leff ?ing Hspice answer the following questions.a.Simulate the circuit in Problem 10and measure t P and the average power for input V in :pulse(0V DD 5n 0.1n 0.1n 9n 20n),as V DD varies from 1V -2.5V with a 0.25V interval.[t P =(t PHL +t PLH )/2].Using this data,plot ‘t P vs.V DD ’,and ‘Power vs.V DD ’.Specify AS,AD,PS,PD in your spice deck,and manually add C L =6.5fF.Set V SB =0Vfor this problem.b.For Vdd equal to 2.5V determine the maximum fan-out of identical inverters this gate candrive before its delay becomes larger than 2ns.c.Simulate the same circuit for a set of ‘pulse’inputs with rise and fall times of t in_rise,fall =1ns,2ns,5ns,10ns,20ns.For each input,measure (1)the rise and fall times t out_rise andV DD =2.5VV IN V OUTC L =C inv-gateL =L P =L N =0.25μmV SB-+(W p /W n =1.25/0.375)Figure 5.8CMOS inverter with capacitiveSection 5.1Exercises and Design Problems 187t out_fall of the inverter output,(2)the total energy lost E total ,and (3)the energy lost due to short circuit current E short .Using this data,prepare a plot of (1)(t out_rise +t out_fall )/2vs.t in_rise,fall ,(2)E total vs.t in_rise,fall ,(3)E short vs.t in_rise,fall and (4)E short /E total vs.t in_rise,fall.d.Provide simple explanations for:(i)Why the slope for (1)is less than 1?(ii)Why E short increases with t in_rise,fall ?(iii)Why E total increases with t in_rise,fall ?12.Consider the low swing driver of Figure 5.9:a.What is the voltage swing on the output node (V out )?Assume γ=0.b.Estimate (i)the energy drawn from the supply and (ii)energy dissipated for a 0V to 2.5V transition at the input.Assume that the rise and fall times at the input are 0.Repeat the analysis for a 2.5V to 0V transition at the input.pute t pLH (i.e.the time to transition from V OL to (V OH +V OL )/2).Assume the input rise time to be 0.V OL is the output voltage with the input at 0V and V OH is the output volt-age with the input at 2.5V .pute V OH taking into account body effect.Assume γ =0.5V 1/2for both NMOS and PMOS.13.Consider the following low swing driver consisting of NMOS devices M1and M2.Assumean NWELL implementation.Assume that the inputs IN and IN have a 0V to 2.5V swing andthat V IN =0V when V IN =2.5V and vice-versa.Also assume that there is no skew between INand IN (i.e.,the inverter delay to derive IN from IN is zero).a.What voltage is the bulk terminal of M2connected to?V in V out V DD =2.5V W L 3μm 0.25μm =p 2.5V0V C L =100fFW L 1.5μm 0.25μm=n Figure 5.9Low Swing DriverV LOW =0.5VOutM1ININ M225μm/0.25μm 25μm/0.25μmC L =1pFFigure 5.10Low Swing Driver188THE CMOS INVERTER Chapter 5b.What is the voltage swing on the output node as the inputs swing from 0V to 2.5V .Showthe low value and the high value.c.Assume that the inputs IN and IN have zero rise and fall times.Assume a zero skewbetween IN and IN.Determine the low to high propagation delay for charging the outputnode measured from the the 50%point of the input to the 50%point of the output.Assumethat the total load capacitance is 1pF,including the transistor parasitics.d.Assume that,instead of the 1pF load,the low swing driver drives a non-linear capacitor,whose capacitance vs.voltage is plotted pute the energy drawn from the lowsupply for charging up the load capacitor.Ignore the parasitic capacitance of the driver cir-cuit itself.14.The inverter below operates with V DD =0.4V and is composed of |V t |=0.5V devices.Thedevices have identical I 0and n.a.Calculate the switching threshold (V M )of this inverter.b.Calculate V IL and V IH of the inverter.15.Sizing a chain of inverters.a.In order to drive a large capacitance (C L =20pF)from a minimum size gate (with inputcapacitance C i =10fF),you decide to introduce a two-staged buffer as shown in Figure5.12.Assume that the propagation delay of a minimum size inverter is 70ps.Also assumeV DD =0.4VV IN V OUTFigure 5.11Inverter in Weak Inversion RegimeSection 5.1Exercises and Design Problems 189that the input capacitance of a gate is proportional to its size.Determine the sizing of thetwo additional buffer stages that will minimize the propagation delay.b.If you could add any number of stages to achieve the minimum delay,how many stages would you insert?What is the propagation delay in this case?c.Describe the advantages and disadvantages of the methods shown in (a)and (b).d.Determine a closed form expression for the power consumption in the circuit.Consider only gate capacitances in your analysis.What is the power consumption for a supply volt-age of 2.5V and an activity factor of 1?16.[M,None,3.3.5]Consider scaling a CMOS technology by S >1.In order to maintain compat-ibility with existing system components,you decide to use constant voltage scaling.a.In traditional constant voltage scaling,transistor widths scale inversely with S,W ∝1/S.To avoid the power increases associated with constant voltage scaling,however,youdecide to change the scaling factor for W .What should this new scaling factor be to main-tain approximately constant power.Assume long-channel devices (i.e.,neglect velocitysaturation).b.How does delay scale under this new methodology?c.Assuming short-channel devices (i.e.,velocity saturation),how would transistor widthshave to scale to maintain the constant power requirement?1InAdded Buffer StageOUTC L =20pF C i =10fF‘1’is the minimum size inverter.??Figure 5.12Buffer insertion for driving large loads.190THE CMOS INVERTER Chapter5DESIGN PROBLEMUsing the0.25μm CMOS introduced in Chapter2,design a static CMOSinverter that meets the following requirements:1.Matched pull-up and pull-down times(i.e.,t pHL=t pLH).2.t p=5nsec(±0.1nsec).The load capacitance connected to the output is equal to4pF.Notice that thiscapacitance is substantially larger than the internal capacitances of the gate.Determine the W and L of the transistors.To reduce the parasitics,useminimal lengths(L=0.25μm)for all transistors.Verify and optimize the designusing SPICE after proposing a first design using manual -pute also the energy consumed per transition.If you have a layout editor(suchas MAGIC)available,perform the physical design,extract the real circuitparameters,and compare the simulated results with the ones obtained earlier.。
(完整版)集成电路设计复习题及解答
集成电路设计复习题绪论1．画出集成电路设计与制造的主要流程框架。
2．集成电路分类情况如何？集成电路设计1．层次化、结构化设计概念，集成电路设计域和设计层次2．什么是集成电路设计？集成电路设计流程。
（三个设计步骤：系统功能设计逻辑和电路设计版图设计）3．模拟电路和数字电路设计各自的特点和流程4．版图验证和检查包括哪些内容？如何实现？5．版图设计规则的概念，主要内容以及表示方法。
为什么需要指定版图设计规则？6．集成电路设计方法分类？（全定制、半定制、PLD）7．标准单元/门阵列的概念，优点/缺点，设计流程8．PLD设计方法的特点，FPGA/CPLD的概念9．试述门阵列和标准单元设计方法的概念和它们之间的异同点。
10．标准单元库中的单元的主要描述形式有哪些？分别在IC设计的什么阶段应用？11．集成电路的可测性设计是指什么？Soc设计复习题1.什么是SoC？2.SoC设计的发展趋势及面临的挑战？3.SoC设计的特点?4.SoC设计与传统的ASIC设计最大的不同是什么？5.什么是软硬件协同设计？6.常用的可测性设计方法有哪些？7. IP的基本概念和IP分类8.什么是可综合RTL代码?9.么是同步电路，什么是异步电路，各有什么特点？10.逻辑综合的概念。
11.什么是触发器的建立时间（Setup Time），试画图进行说明。
12.什么是触发器的保持时间（Hold Time），试画图进行说明。
13. 什么是验证，什么是测试，两者有何区别？14.试画图简要说明扫描测试原理。
绪论1、 画出集成电路设计与制造的主要流程框架。
2、集成电路分类情况如何？集成电路设计1． 层次化、结构化设计概念，集成电路设计域和设计层次分层分级设计和模块化设计．将一个复杂的集成电路系统的设计问题分解为复杂性较低的设计级别，⎪⎪⎪⎪⎪⎪⎪⎪⎪⎪⎪⎪⎪⎪⎪⎪⎪⎩⎪⎪⎪⎪⎪⎪⎪⎪⎪⎪⎪⎪⎪⎪⎪⎪⎪⎨⎧⎪⎪⎪⎪⎩⎪⎪⎪⎪⎨⎧⎩⎨⎧⎩⎨⎧⎪⎪⎪⎪⎩⎪⎪⎪⎪⎨⎧⎪⎪⎪⎪⎪⎪⎩⎪⎪⎪⎪⎪⎪⎨⎧⎩⎨⎧⎪⎪⎪⎪⎩⎪⎪⎪⎪⎨⎧⎩⎨⎧⎪⎩⎪⎨⎧按应用领域分类数字模拟混合电路非线性电路线性电路模拟电路时序逻辑电路组合逻辑电路数字电路按功能分类GSI ULSI VLSI LSI MSI SSI 按规模分类薄膜混合集成电路厚膜混合集成电路混合集成电路B iCMOS B iMOS 型B iMOS CMOS NMOS PMOS 型MOS双极型单片集成电路按结构分类集成电路这个级别可以再分解到复杂性更低的设计级别；这样的分解一直继续到使最终的设计级别的复杂性足够低，也就是说，能相当容易地由这一级设计出的单元逐级组织起复杂的系统。
数字集成电路--电路、系统与设计(第二版)复习资料
第一章 数字集成电路介绍第一个晶体管，Bell 实验室，1947第一个集成电路，Jack Kilby ，德州仪器，1958 摩尔定律：1965年，Gordon Moore 预言单个芯片上晶体管的数目每18到24个月翻一番。
(随时间呈指数增长)抽象层次：器件、电路、门、功能模块和系统 抽象即在每一个设计层次上，一个复杂模块的内部细节可以被抽象化并用一个黑匣子或模型来代替。
这一模型含有用来在下一层次上处理这一模块所需要的所有信息。
固定成本（非重复性费用）与销售量无关；设计所花费的时间和人工；受设计复杂性、设计技术难度以及设计人员产出率的影响；对于小批量产品，起主导作用。
可变成本 （重复性费用）与产品的产量成正比；直接用于制造产品的费用；包括产品所用部件的成本、组装费用以及测试费用。
每个集成电路的成本=每个集成电路的可变成本+固定成本/产量。
可变成本=（芯片成本+芯片测试成本+封装成本）/最终测试的成品率。
一个门对噪声的灵敏度是由噪声容限NM L （低电平噪声容限）和NM H （高电平噪声容限）来度量的。
为使一个数字电路能工作，噪声容限应当大于零，并且越大越好。
NM H = V OH - V IH NM L = V IL - V OL 再生性保证一个受干扰的信号在通过若干逻辑级后逐渐收敛回到额定电平中的一个。
一个门的VTC 应当具有一个增益绝对值大于1的过渡区(即不确定区)，该过渡区以两个有效的区域为界，合法区域的增益应当小于1。
理想数字门 特性：在过渡区有无限大的增益；门的阈值位于逻辑摆幅的中点；高电平和低电平噪声容限均等于这一摆幅的一半；输入和输出阻抗分别为无穷大和零。
传播延时、上升和下降时间的定义传播延时tp 定义了它对输入端信号变化的响应有多快。
它表示一个信号通过一个门时所经历的延时，定义为输入和输出波形的50%翻转点之间的时间。
上升和下降时间定义为在波形的10%和90%之间。
对于给定的工艺和门的拓扑结构，功耗和延时的乘积一般为一常数。
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1.在MOS晶体管级设计完成功能为)
|
(|BE
BCD
A
F 的ＣＭＯＳ静态逻辑门、为了使设计
出的电路具有最小延时提出个MOS晶体管的尺寸比例。
2.分析下图电路功能，并指出其优缺点和可能存在的问题。
图1 3.版图分析题：
图2
参照图2，
（a）写出版图对应的逻辑表达式；
（b）画出晶体管级电路图；
（c）描述此类电路的特点和主要应用场合。
4.版图分析题：
图3 参照图3，
（a）写出版图对应的逻辑表达式
（b）画出晶体管级电路图
5.版图分析题：
图4
参照图4，
（a ）写出版图对应的逻辑表达式 （b ）画出晶体管级电路图
6. 逻辑设计题：请分别采用标准CMOS 设计方法、镜像电路设计方法、基于传输门的方法
设计一个两输入的XOR 电路。
7. 分析图5电路工作原理，说明该电路完成什么功能。
分析该电路的建立时间、保持时间、
以及clk_q 的时间。
图5
8. 设计两输入CMOS 同或门，要求画出其晶体管电路图。
9. 分析图6，12φφ和为两相时钟，且12φφ超前，分析下面电路工作过程，并说明功能。
1
φ1
2
φ
1
φ2
φN M O S
图6
10. 电路设计题：用CMOS 传输门和反向器设计一个上升沿触发的D 触发器。
11. 使用互补CMOS 电路实现逻辑表达式()()F A B C D B E G =++++，当反相器的
NMOS W/L=2, PMOS W/L=4时输出电阻相同，根据这个确定该网络中各个器件尺寸。
12. 分析下面电路，分析其工作原理，并给出该电路实现的逻辑功能。
（给出分析过程）
A
F
B
B
M2
M3/M4
图2
13 考虑图3，
a ． 下面的CMOS 晶体管网络实现什么逻辑功能？反相器的NMOS W/L=2, PMOS W/L=4
时输出电阻相同，根据这个确定该网络中各个器件尺寸。
b ．最初的输入模式是什么，必须采用哪一种输入才能取得最大传输延时？ 考虑在内部节点中的电容的影响。
（给出分析过程）。